June 2015
The Next Generation Keysight Shares Its Vision for Interview with Roger Nichols, Keysight 5G Program Manager
5G
Mixed-Signal Test Bench Scopes for Mobile Devices
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CONTENTS
Modern Test & Measure
CONTENTS
4
TECH SERIES Mixed-Signal Scopes The Importance of a Varied Test Bench
TECH REPORT
10
Changes in Instrument Design Interface Technology for the Next-generation Engineer
TECH REPORT Resolving Human Body Model Test Challenges Using Latest Traditional Low-parasitic Tester
INDUSTRY INTERVIEW The Next Generation Keysight Shares its Vision for 5G Interview with Roger Nichols
PRODUCT WATCH Wi-Pry Pro from Oscium Simple Solution for Wireless Networking
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Modern Test & Measure
Is Your Test Bench
MIXED-SIGNAL Ready?
4
TECH SERIES
Mixed-signal design is ubiquitous these days, with hybrids of digital and analog circuitry turning up everywhere. A typical mixed-signal designer may be a hardware or software engineer with specific needs. They may be working with 4-bit, 8-bit, 16-bit, and 32-bit microcontrollers in a single embedded controller, or across several embedded systems. They need to capture a host of different signal types and serial-data protocols as well as understanding the timing relationships between them. Then there’s all the different sensor signals, power-supply signals, and PWM control signals to guarantee embedded system performance and reliability.
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Modern Test & Measure
F
urther, mixed-signal design touches a large number of application areas, including appliances, audio, automotive, avionics, consumer electronics, industrial equipment and automation, medical equipment, military hardware, networking equipment, motor control, power conversion, power supplies, and more (Figure 1). So, it behooves just about any designer or design team to ensure that they have test and measurement equipment that is up to the task. Of course, an oscilloscope is a top priority for mixed-signal design. With it, the designer or technician can usually
Figure 1.
6
make do for the analog aspects of the circuitry. For the digital portions, a logic analyzer comes into play. The best option is a mixed-signal oscilloscope that adds dedicated capabilities for acquiring and analyzing digital signals. Besides the obvious addition of some number of digital input lines, a mixed-signal oscilloscope provides such capabilities as analog/digital cross-pattern triggering (Figure 2). With it, you can create complex analog and digital pattern triggers to isolate problems. It enables searching for timing errors by specifying a trigger for an invalid digital state.
TECH SERIES Another key advantage of a mixed-signal oscilloscope is digital pattern search and find. This capability allows the user to search across many digital lines to find specific digital patterns. Once the desired pattern is found, oscilloscopes such as Teledyne LeCroy’s HDO-MS models enable you to automatically zoom in on the relevant portion of the waveform. Digital pattern search and find is ideal for searching for timing problems where invalid patterns may occur.
Figure 2.
With a mixed-signal scope, you can create complex analog and digital pattern triggers to isolate problems.
Figure 3.
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Modern Test & Measure
In the case of the HDO-MS oscilloscopes, all of the instrument’s powerful measurement tools are available for use on the digital lines. Measurements include delay, delta delay, Dtrig time, duty, frequency, half period, period, and width. Functions such as histicons, statistics, tracks, and trends show you how the measurements are changing over time.
Mixed-signal design and debug is best approached with an instrument that is suited for the task.
A useful feature of theHDO-MS HDO-MS oscilloscopes is activity indicators for the digital lines (Figure 3). These indicators let you see the current state (high, low, or transitioning) of all of the digital lines at a glance. They can also help you quickly identify lines that are incorrectly hooked up, such as to ground or to a powersupply line. The indicators are active even when the oscilloscope is not triggering. For these reasons, among others, mixed-signal design and debug is best approached with an instrument that is suited for the task, such as the Teledyne LeCroy HDO-MS (an added benefit on the analog side of the equation is HD4096technology technology). A mixed-signal HD4096 oscilloscope integrates all of the best aspects of a traditional oscilloscope and a dedicated logic analyzer, and thus is among the best options for the mixed-signal testbench.
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Modern Test & Measure
Changes in
INSTRUMENT
DESIGN
New Interface Technology for the Next Generation of Engineers by Jerry Janesch, Keithley Instruments, a Tektronix Company
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TECH REPORT
The test instrumentation market is gradually evolving as the profile of the typical instrument user has broadened. In addition to electrical engineering, many of today’s users have been trained in other disciplines, such as mechanical engineering, electrochemistry, biology, physics, etc. Although they may not have training in electrical engineering, their jobs still demand the ability to make good electrical measurements. For these new classes of users, traditional button and command menu interfaces can be challenging because they require the time and instrument familiarity needed to find the right function from among complex menus of options. They also demand the ability to interpret results that are sometimes presented in less-than-intuitive ways. As touchscreen-equipped electronics like tablets and smartphones have become integral to modern life, instrument users are coming to assume that operating any modern device will be virtually self-explanatory. This assumption is having an impact on the instrument selection process by creating new expectations for ease of use.
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Modern Test & Measure
Instrument developers have been quick to respond to these changing user expectations. At Keithley, we’ve developed an instrument design philosophy based on three principles: TOUCH
TEST
INVENT
Allow the user to reach out and literally touch the data. This means incorporating a touchscreen interface that helps even novice users find the functions they need quickly and view data graphically so they can gain an intuitive understanding of their results.
Help the user to perform a test accurately and get results quickly.
Make the measurement process and interpretation of results easier so users can focus on their next breakthrough.
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The DMM7510 Graphical Sampling Multimeter’s high speed digitizing function allows capturing and displaying voltage and current waveforms.
TECH REPORT
This “Touch, Test, Invent” philosophy underlies our latest Source Measure Unit (SMU) and digital multimeter instruments. With simplified setups configured from the front panel, these instruments support faster time to measurement and significant improvements in test productivity. Their intuitive touchscreen interfaces also offer instant access to context-sensitive help, which eliminates the need to consult a user manual to get an instrument up and running. As new users enter the instrumentation marketplace, a growing number of them will demand that their suppliers offer products that ensure greater ease of use. For a brief demonstration of how changes in instrument design are affecting the test and measurement process, watch this video on configuring a current vs. voltage sweep: https://www.youtube.com/watch?v=2sOWokd9YDM. https://www.youtube.com/watch?v=2sOWokd9YDM
Jerry Janesch is a senior market development manager at Keithley Instruments www.keithley.com, part of the Tektronix test and measurement portfolio. He earned a bachelor’s degree in electrical engineering from Fenn College of Engineering and a master’s of business administration from John Carroll University. He has been with Keithley since 2000.
The Model 2460 SourceMeter® Source Measure Unit (SMU) Instrument’s touchscreen supports “pinch and zoom” operation to allow examining data in the graph in detail.
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Modern Test & Measure
Resolving
HBM ESD Test Challenges
Using Latest Traditional Low-Parasitic Tester By Barry Fernelius, ESD and Latch-Up Manager Evans Analytical Group (EAG)
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TECH REPORT
T
oday’s human body model (HBM) ESD tests are widely performed on automated relay-based testers. While this is the most common test example, these testers can cause false failures due to parasitic impedance from resistance, inductance, and capacitance introduced by the relays, device under test (DUT) board, and sockets. Recent changes in the HBM spec now allow for the use of a low-parasitic HBM tester that, because it is electrically connected at only two points, provides a highly accurate and nearly perfect HBM pulse. However, it also has a drawback because it is slow and not practical to use for parts with high pin counts. Part one of this two-part article series will provide an overview of the HBM spec’s evolution, while part two will describe the challenges of using the associated lowparasitic HBM tester and how to resolve them with a hybrid test approach.
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Modern Test & Measure
Low-Parasitic HBM Testing
Evolution of the HBM Spec
The HBM electrostatic discharge (ESD) test is the oldest and most widely used ESD test in the electronics industry. The JEDEC HBM test isn’t static; it has been revised to keep up with the rapid changes in the semiconductor industry. The latest revision of the spec addresses failures that are caused by parasitic impedances in HBM testers.
The current ANSI/ESDA/JEDEC HBM test, JS-001-2014, evolved from the military ESD testing spec, MIL-STD-883, Method 3017.8. The first JEDEC version of the spec was published in 1995. Over the last twenty years, incremental improvements have been made to the HBM spec based on the data and analysis performed by reliability engineers from
Table: Idealized Model of the HBM Tester
SPEC JESD22-A114
PUBLISHED 1995
CHANGES Almost identical to MIL-STD-883, Method 3015.8
JESD22-A114-A
October 1997
Minor changes to MIL-STD-883
JESD22-A114-B
June 2000
JESD22-A114-C
January 2005
0.1 seconds between pulses; stress both non-supply and no connect pins, detection of the trailing EOS pulse
JESD22A114-C.01
March 2005
Minor editorial corrections only (deleted unused figure 3)
JESD22-A114-D
March 2006
No connect pins to be left floating at all times
JESD22-A114-E
January 2007
JESD22-A114-F
December 2008
1 pulse/pin/polarity, 0.3 seconds minimum between pulses
Elimination of pre-pulse voltage rise; use of 10K ohm shunt resistor Addition of alternate (reverse) pin combinations
JS-001-2010
April 2010
First joint ESDA/JEDEC spec; rewrites of sections on apparatus and equipment qualification
JS-001-2011
March 2011
Reduced non-supply stressing (Table 2A), IO-IO stressing for differential pairs, single polarity supply-supply testing, first allowance of 2 point HBM tester for die only shorted supply pins
JS-001-2012
January 2012
New section added to describe low-parasitic HBM simulators and how they may be used
JS-001-2014
August 2014
Addition of section on testing a statistical sample of cloned nonsupply pins; minor changes to definitions and Ips values
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TECH REPORT a cross-section of the IC industry. One of the main goals has been the reduction of the cost and time required for HBM testing. Other changes have addressed issues with the HBM simulator hardware. The following table summarizes the different revisions of the HBM spec: An idealized model of an HBM tester is shown in Figure 1. In this model, a 100pF capacitor is charged with a high
Figure 1. Idealized HBM Tester
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Modern Test & Measure
voltage power supply, not shown in the diagram. The supply is removed from the circuit, and the capacitor is discharged through a 1500立 resistor. In this case, the device under test is the simplest one possible: a piece of wire. If you measure the current through the piece of wire as a function of time, the waveform looks like the one shown in Figure 2.
Figure 2. HBM Current vs. Time, +1000V HBM
20
A More Realistic Model of the HBM Tester The waveform in Figure 2 shows some ringing, suggesting that there are parasitic impedances in the circuit. Parasitic impedances are any combination of extra unwanted passive devices (resistors, capacitors and inductors) in the signal path. For the discharge of an HBM simulator through a piece of wire, a more realistic circuit is shown in Figure 3.
TECH REPORT Because relays are used to connect the terminals of the device under test (DUT) to the HBM tester, parasitic inductance and resistance is added to the discharge path. In real HBM simulators, the 1500立 resistor is distributed, with approximately 1400立 on the Terminal A side and 100立 on the Terminal B side. The resistance is divided in order to provide an in-spec waveform across the entire relay array.
Most IC devices have more than two terminals, making the situation is more complicated. Every pin on the device has a capacitively-coupled impedance path to the HBM simulator, whether the pin is connected or not. When one pin of a multipin power or ground group is stressed, the other pins in that group are floated, and they add additional capacitance, on the order of 4-8pF per pin. This extra capacitance can significantly change the
Figure 3. A more realistic HBM tester model
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Modern Test & Measure
shape of the waveform. In addition, the DUT board and socket also add additional resistance, inductance, and capacitance, causing additional changes to the HBM waveform. Any circuitry that is sensitive to the waveform slope or to the Terminal B resistance can be affected by parasitic impedances. It is even possible to damage non-stressed pins during HBM testing because of capacitive coupling. All of these can impact the waveform and cause false HBM failures (see Reference 6.) An even more realistic model of the HBM tester is shown in Figure 4.
Figure 4. An even more realistic HBM tester model
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Part two of this article series will more closely examine today’s low-parasitic HBM tester, address the challenges posed by their inadequate speed and impracticality for parts with high pin counts. It will also describe a hybrid test strategy that eliminates the parasitic impedance problems and associated false failures of relay-based testers, without having to slow down testing by moving completely to a low-parasitic 2-point tester.
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Modern Test & Measure
The Next Generation
Keysight Shares Its Vision for
5G
Interview with Roger Nichols Keysight 5G Program Manager
As seen throughout the tech industry, as soon as one solution is introduced into the market, the focus immediately shifts towards developing the next generation of that product. Such is the case for mobile networks. After rolling out the firstever 4G LTE network in the United States starting in 2011, network providers and researchers began working on its successor: 5G. The 4G LTE network saw unprecedented data rates and offered a new standard of Internet access to smartphones, forever changing the inter-device communication that now shapes the mobile industry. As a result, the vision for the Internet of Things began to take shape, and with that vision came the need to bolster what will be the largest network of connected devices—a feat that far exceeds the current 4G capabilities.
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INDUSTRY INTERVIEW
The development of a next-generation 5G network has already begun, and companies are quickly working to develop and test a new set of standards that will revolutionize the mobile industry. At the leading edge of 5G development is Keysight, a test and measurement device and software company based in Santa Rosa, California. The company has made a significant investment in 5G testing by developing software and libraries that developers can use when creating new devices. EEWeb spoke with Roger Nichols, Keysight’s 5G Program Manager, about the company’s vision for the 5G deployment, how it will affect the test and measure industry as a whole, and some of the new 5G testing products they are developing.
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Modern Test & Measure
“To me, 5G will be a revolutionary user experience.”
Given your background—in working with 1G through 4G— what do you think 5G means?
How will 5G enable applications that will truly have an impact on society?
Let’s contrast this with the other generations: 1G was a way to have a mobile telephone. 2G was a way to have a mobile telephone that worked everywhere in the world. 3G was the first serious foray into mobile data. And now we have 4G. From a marketing standpoint, 4G is a term that is used to describe any technology from HSPA+ to WiMax to LTE, and everything in between. The purists will suggest that 4G did not happen until the first commercial launch of LTE Advanced. A good example of that is the carrier aggregation launches that began back in November when AT&T introduced their first multi-carrier LTE system. Still, 2G to 3G and then 3G to 4G has been mostly about higher datarates with an eye to improving capacity.
We have come a long way with mobile communications, from just being able to carry your phone anywhere to now being able to carry your office anywhere. But there are limits in the current commercial systems that create constraints; key examples are speed, latency, reliability, and spectrum and energy efficiency. If you look at those limits together, they put constraints on the application space and the network operator business model. If you really did have a network that was truly reliable and amazingly fast, what kind of innovations would come out that would revolutionize the industry? Eight years ago, we didn’t have Facebook, iPads, or AirBnB—so imagine, what would be the new applications if we turned the functionality of the system up dramatically?
But 5G isn’t just a new technology or a new air-interface; the way that the industry is visualizing 5G is more holistic than in the past. The best way I have heard this described is the way the METIS Consortium in Europe did in their fivepoint list, which included: amazingly fast, great service in a crowd, the best service follows you, super real-time and reliable communications, and ubiquitous things communicating. I like this because the focus is on how 5G enables what the user does versus how fast the downlink data-rate will be. To me, 5G will be a revolutionary user experience.
26
One of my industry colleagues recalled being in a room many years ago where there was a heated argument about whether or not we would ever need more than one megabit per second on a wireless link. Nowadays, we are on the road to upwards of several hundred megabits per second. The demand for data and performance and the need to expand beyond these constraints on the application space is where 5G will deliver.
INDUSTRY INTERVIEW
When will we see 5G commercialized? A lot of industry experts are saying that 2020 is the year. But what does that necessarily mean? In some sense, 5G is going to be a revolution, but it won’t be “overnight”. 2020 is an objective based on balancing the desire for 5G network performance and a practical notion based on how long some of the significant changes in the standards and the resulting technology are going to take. The reality is that these changes are driven by three forces that can be unpredictable. These forces are: technology, network operator business model, and policy, such as spectrum policy and net neutrality. These are forces that we need to pay close attention to.
What is Keysight’s role in the 5G deployment? Since 5G is more than a new air interface, this vision drives technical development in a really wide range of disciplines. This is going to provide great opportunities for most of the Keysight product line, if not all of it. We view test and measurement very broadly— everything from simulation and design to manufacturing and deployment tests, and everything from DC to daylight. The industry is going to certainly require traditional communications technology measurements like frequency, power, bandwidth, modulation accuracy, sensitivity and functional
verification, and conformance testing. But if you think about the new technologies being discussed, these areas and some new areas represent significant opportunity for us.
The millimeter wave space, which provides super high bandwidths for very high data rates, is an area that gets very limited use today in commercial wireless. This requires us in the test and measurement industry to help newcomers get the insight they need for much wider bandwidths. As a test and measurement organization, we are also going to have to develop simulation, design, and measurement capabilities for an industry that has a very different budget and buying cycle than the traditional millimeter wave users in the aerospace & defense industry. The vision for millimeter-wave in access communications also includes using
Pictured below: Roger Nichols and colleagues.
“The test and measurement industry is going to have to move towards addressing a lot more RF channels in very efficient ways.”
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Modern Test & Measure
many more RF channels—a particular example is very high-order MIMO (“massive MIMO”). This means there will be a lot more attention paid on spatial multiplexing that drives higher spectrum and energy efficiency. The test and measurement industry is going to have to move towards addressing a lot more RF channels in very efficient ways.
“The demand for data and performance and the need to expand beyond these constraints on the application space is where 5G will deliver.”
28
Another growing requirement is in making measurements without a physical connection to the device under test. At the millimeter wave end, the antennas are likely to be connected directly to the semiconductor radio and there is no connector in between them. Making calibrated measurements, then, without a connector and a predictable transmission line between device under test and test equipment is a very difficult thing to do. This is the same at the lower frequencies, where for the sake of aesthetics and costs, there is also a lot of pressure to pull antenna connectors out of these devices. 5G deployment will also require much faster digital speeds in the underlying electronic systems. If you are talking about very high bandwidths and very low latencies, 5G is going to place large demands on user equipment, base
stations, backhaul, and data servers. That requires moving a lot of data and digital information around very rapidly. Our test equipment will need to manage bandwidth and data rates for highspeed digital testing, and it will also require us to design internal parts of our equipment to move large amounts of information around very quickly—just for our own architectures. Fiber-optic communication will have to be much higher bandwidth on the backhaul. So this high-speed demand impacts everything from short-distance, inside our devices, to long-distance, connecting our devices.
When you say “massive MIMO,” what is the scale you are talking about? I was recently at a conference in Brooklyn where a question was posed to a panel of industry experts about how big “massive” actually is. The prevailing wisdom in the room was that it meant anywhere between 50 and hundred data streams. I believe these conclusions are driven to a certain extent by what is practical with today’s technology and what people can foresee. I have also read in research papers that the point of diminishing returns kicks in between 100 and 200. It all depends on the research that is being done right now about how this can be realized. The challenge is: the more antennas you put together, the more expensive things get. It also requires a lot more signal processing on multiple streams of data. If you get up into the tens of data streams, the amount of power you use in the digital signal processing may exceed what you use in your RF
INDUSTRY INTERVIEW power amplifiers. You then eliminate one of the major gains of massive MIMO, which is to save how much power you use up in transmission. Today, around 70 percent of the power used in a wireless network is consumed in the power amplifiers that are a part of the radio transmitters, or the air conditioning used to cool down those power amplifiers. The MIMO system that just moves the power consumption from power amplifiers to the DSP hasn’t really accomplished anything aside from making a more spectrally efficient system. We have to move a bit further than that if we are going to add all of the density that is anticipated with 5G
What are you most excited about for 5G and what are some of the biggest challenges ahead of you? The vision for 5G that is forming in the industry means change in technological demand that spans a wide range of disciplines. For me, what is most exciting is the breadth of the impact of the technology—that is what we at Keysight, as a premier measurement company, aim to tackle. The biggest challenge comes with the wireless market dynamics themselves. Having been through four generations of technological and social change in this space, I’ve noticed that a lot of the changes have been driven by fads. The part that is most challenging is the pace at which the network operates and how fast we have to respond to trends in the market.
How will Keysight help its clients develop for 5G? Keysight has work going across our portfolio to make sure our customers get the best insights from our solutions. To ensure this, we engage with our customers and research institutions around the world to test their new ideas. They want to do everything from testing their new ideas to developing new solutions for the complicated problems I’ve been talking about. A public example of this is our work with the China Mobile Research Institute on massive MIMO. We are also looking forward to our participation on a couple of research projects sponsored by the European Commission associated with signaling work as well as millimeter wave.
“Most of the 5G work in the industry is in research, where [Keysight] will provide continuing product releases in both hardware and software...”
In the coming months, quarters, and years, you can expect Keysight to deliver on many of these industry expectations. In the short term, most of the 5G work in the industry is in research, where we will provide continuing product releases in both hardware and software that enable our solutions to show customers what they need to know and implement their new ideas. As the standards work gets underway, you will see the solutions become more optimized to the necessary standards to ensure our customer’s designs perform in accordance to global and industry standards. Lastly, the expertise we have developed in these technical areas and how to simulate, design, and measure puts our people in the equation to yield the best insight for our customers.
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PRODUCT WATCH
WiPry-Pro from Oscium
The Simple Solution to Wireless Networking Have you ever been at the store, ready to check out with two or three items, and then realize that only one very busy checkout lane is open? As you patiently wait your turn, the express lane opens and you are out of the store in five minutes. You just bypassed the complex and took the simple solution. In the test and measure world, Oscium’s WiPry-Pro spectrum analyzer is the simple solution to wireless networking.
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Modern Test & Measure
WiPry-Pro is the express-lane tool for analyzing your invisible wireless environment. Take Jerry as an example; he owns and manages a local internet café and coffee shop in the University Heights neighborhood of San Diego, California. Although Jerry’s shop is open 24 hours a day, his typical customer comes into the store in the evening and stays until the early morning hours of the next day. The place is usually filled to capacity between the hours of 9PM and 4AM. Customers come to Jerry’s store because of the free high-speed Internet access and because it’s open all night, making it a great place to get some rush homework done. Jerry makes his money selling sandwiches and espresso, but customers only buy his food because they need internet, which requires it to be working at top speed. Jerry operates his coffee shop on a tight budget like many business owners. To reduce expenses, Jerry does as much as he can on his own in order to minimize expensive service calls. When the wireless networks are slow or stop working all together, Jerry stops managing the store long enough to see if he can fix the problem himself.
The WiPry product line by Oscium is an uncomplicated tool that performs simple, but effective, network analysis functions.
34
PRODUCT WATCH WLAN Sniffers are wireless networking tools used for network optimization, diagnostic checks and troubleshooting. Sniffers detect wireless networks and provide users information from the highest-level radio frequency broadcasting to the lowest-level packet capture and analysis, and everything in between. Many of these tools have expensive licensing agreements. To be effective with these tools requires the user to have the necessary training and above average knowledge of computer networking. For the routine connectivity issues Jerry deals with day to day, the all-inclusive WLAN sniffer solution is overkill. Their relative cost and complexity are beyond what Jerry can pay or easily understand. Jerry needs a tool that is simple to use, that won’t tie up space in his store, time in his schedule, or a lot of money in his business account. WiPry-Pro is the solution for Jerry and people like him that need an efficient means for surveying wireless networks. The WiPry product line by Oscium is an uncomplicated tool that performs simple, but effective, network analysis functions.
Side View
It is easy to use and works with Apple’s iOS devices, like the iPhone, iPad, iPod. Within minutes of plugging the WiPryPro accessory into his iOS device and installing the free WiPry software, Jerry gets all the information he needs about the health of his wireless network. He can either resolve the connectivity problem or, if necessary, refer it to a network specialist. With WiPry-Pro, Jerry can see that his SSIDs are broadcasting, their signal strength is adequate, and that they aren’t operating close to interference. This allows Jerry to keep his network and business running strong. Think of Oscium’s products as one tool in your toolbox; you have many tools in the box, and while not all of them are appropriate for every job, each is suited for a particular task. Oscium’s WiPry-Pro is designed to be the right tool at the right time. Solving problems with your wireless network should not require a technician visit every time your internet runs slowly. Oscium’s products are simple, effective, and affordable solutions to everyday problems with wireless networks. Bypass the complex and go for the express lane.
Solving problems with your wireless network should not require a technician visit every time your internet runs slowly.
Top View
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