Europe EMC Guide by ITEM Media

Europe EMC Guide

2011 Belgique........................... 145 česká Republika / Slovensko. ...................... 149 Deutschland. ....................49 España............................... 111 France. .................................77 Italia.......................................99 Nederland........................ 137

Österreich....................... 162 Polska................................. 119 Schweiz.............................131 United Kingdom.............. 11

More online at interferencetechnology.eu

The International Journal of Electromagnetic Compatibility

2012 EUROPE EMC GUIDE Bringing the world technical articles and EMC buyersâ&#x20AC;&#x2122; guides from multiple countries, in multiple languages.

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ITEM

Contents 2011 4

Letter from the editor

european reSourceS

Europe EMC Guide

standards organizations, government sites, institutes and trade associations

caLendar of eVentS

164

indeX of adVertiSerS

united Kingdom 12

productS & SerViceS

reSourceS

european emc directiVeS graham mays, emc consultant

hemp fiLter deSign to meet miL-Std-188-125 pci teSt requirementS antoni Jan nalBorczyK, mPe limited

Jedec & tape reeL iSSueS roBert J. vermillion, rmv technology group, llc

deutschland 50

produkte und SerViceS

reSSourcen

neuerungen in der emV emiSSionSmeSStechnik (changes to EMC Emission Measurement ) stePhen Braun, gauss instruments gmbh

emV auf ic-eben (EMC at Chip Level: Assessment of IC Immunity to Pulse Disturbances) sven Konig, langer emv-technik gmbh

neue emV-teSteinrichtung fÜr hybrid-, eLektro- und brennStoffzeLLenantriebe

(New EMC Test System for Hybrid, Electric and Fuel Cell Drives) s. Klein, J. mooser, mooser emc technik gmbh

Translations available at www.interferencetechnology.eu

Subscriptions

ITEM, InterferenceTechnology—The EMC Directory & Design Guide, The EMC Symposium Guide, The EMC Test & Design Guide and the Europe EMC Guide are distributed annually at no charge to engineers and managers who are engaged in the application, selection, design, test, specification or procurement of electronic components, systems, materials, equipment, facilities or related fabrication services. Subscriptions are available through interferencetechnology.com.

interference technology 1interferencetechnology.eu

interference eUroPe emc technology gUide 20111

Contents2011 France 78

produitS et SerViceS

reSSourceS

conception aSSiStée par meSure champ proche

(Aided Design Near Field Measurement) sÉBastien serPaud, loic arnal, nexio; Blaise ravelo, david Baudry, eSigelec/irSeem

eLectromagnetic attackS caSe StudieS on cryptographic hardWare acceLeratorS laurent sauvage, et al, institut telecom, telecom Paristech

italia 100

prodotti e SerVizi / riSorSe

102

come un riceVitore compLetamente digitaLe pienamente conforme può ridurre L’incertezza di miSura neLLe proVe di emiSSione per compatibiLità eLettromagnetica

(Better Measurement Uncertainty Using Fully Digital Receivers in EMC Emission Tests) domenico Festa, iBd international Business development

esPaña 112

productoS y SerVicioS

114

recurSoS

116

diStorSion armónica en SiStemaS de enSayoS de inmunidad

(Harmonic Distortion in Immunity Test Systems ) Jason smith, Pat malloy, Jr., ar/rF microwave instrumentation

PolsKa 120

produkty i uStugi

122

zaSoby

124

StatuS dyrektWy emc

126

KoreKcja Niedopasowań w Torze pomiarowym przewodzoNych zaburzeń radioeleKTryczNych

(Corrections of Mismatches in the Measurement of Conducted Disturbance) Jan sroKa, emc testcenter zurich ag

Translations available at www.interferencetechnology.eu

interference technology

eUroPe emc gUide 2011

Europe EMC Guide

schweiz 132

reSSourcen / produkte und SerViceS

134

Bruno straumann, haefely test ag

the effectS of the neW eSd Standard on eSd SimuLatorS

nederland 138

producten en SerViceS

139

middeLen

140

a change in internationaL emc LegiSLation; do induStriaL premiSeS become outLaWed?

mart coenen, emcmcc bv

BelgiQue 146

reSSourceS

148

produitS et SerViceS

ČESKÁ REPUBLIKA / SLovEnSKo 150

Výrobky a SLužby / zdroJe

154

měřeNí emc v časové oblasTi: Nová meToda cispr vhodNá pro aNalýzu přechodNých rušivých vyzařováNí v oblasTi průmyslu a auTomobilNí eleKTroNiKy

(EMC Measurements in Time Domain) wolFgang winter, marKus herBrig, zuzana wood, emv gmbh

Österreich 163

produkte und SerViceS / reSSourcen Translations available at www.interferencetechnology.eu

InterferenceTechnology—The Annual EMC Guide, The EMC Symposium Guide, and The EMC Test & Design Guide are distributed annually at no charge to qualified engineers and managers who are engaged in the application, selection, design, test, specification or procurement of electronic components, systems, materials, equipment, facilities or related fabrication services. To be placed on the subscriber list, complete the subscription qualification card or subscribe online at InterferenceTechnology.com. ITEM PublIcaTIonS endeavors to offer accurate information, but assumes no liability for errors or omissions in its technical articles. Furthermore, the opinions contained herein do not necessarily reflect those of the publisher. ITEMTM, InterferenceTechnology™—The Annual EMC GuideTM, and Interference Technology.comTM are trademarks of ITEM PublIcaTIonS and may not be used without express permission. ITEM, InterferenceTechnology—The Annual EMC Guide, The EMC Symposium Guide, The EMC Test & Design Guide and InterferenceTechnology.com, are copyrighted publications of ITEM PublIcaTIonS. contents may not be reproduced in any form without express permission.

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interference technology

Letter from the Editor

Publisher Paul Salotto

Sarah Long

Editor Sarah Long Production Manager Amelia McKean Business Development Manager Bob Poust Business Development Executives Tim Bretz Daryl McFadyen Leslie Ringe Jan Ward Administrative Manager Eileen M. Ambler Production Coordinator Jacqueline Gentile Circulation Manager Irene H. Nugent Product Development Manager Helen S. Flood Administrative Assistant Karen Holder Publisher Emeritus Robert D. Goldblum President Graham S. Kilshaw

ITEM

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I T E M TM, I n t e r f e r e n c eTe c h n o l o g y ™ a n d Inter ferenceTechnology.com TM are trademarks of ITEM PUBLICATIONS and may not be used without express permission. ITEM, InterferenceTechnology and InterferenceTechnology.com are copyrighted publications of ITEM PUBLICATIONS. Contents may not be reproduced in any form without express permission.

ITEM Publications WELCOME TO THE EUROPE EMC GUIDE

here is a saying in the USA about the Golden Gate bridge in San Francisco. It is so long that the moment the painters have finished painting it, they need to go back and immediately start all over again. It is a continuous job! And yes, developing a publication about the world of EMC in Europe feels very similar. No sooner had we sent it to press, than updated IEC regulations hit our inboxes. And herein lies both the need for a comprehensive European EMC publication, and at the same time the challenge of how to do it. On the one hand, EMC legislation for electronic products and devices is largely driven by the European EMC Directive (Directive 2004/108/EC). But that’s not the whole picture. Many manufacturers and electronics OEMs must also be cognizant of the ongoing requirements published by the IEC (www.iec.ch), including CISPR, CENELEC (European Committee for ElectroTechnical Standardization, www.cenelec.eu) and ETSI (European Telecommunications Standards Institute www.etsi.org) to mention but a few. In addition, the regulatory bodies of different European countries (BSI, VDE, SEV etc) also have local standards or local interpretations of the European standards. It is an ongoing minefield of information, and therefore a central source of European information would seem to be a helpful thing.

We will be the first to say, however, that the new Europe EMC Guide can barely begin to unravel the continuous web of European and local requirements in a single edition, but we can at least make a start, and here it is – the first ever truly European Interference Technology Europe EMC Guide. You will see as you turn the pages, it’s not just about the regulations – local events, local suppliers and representatives, directories, resources, and technical articles also make up the new Europe EMC Guide. As we researched the idea of a European EMC publication, two key challenges quickly became evident: #1: We surveyed you the readers in Europe and you told us that you want content in your own language. So how could we accommodate multiple language needs? #2: You also told us you wanted it in print (a single, annual edition) that you could carry around, and easily reference. So with all the regulatory activity, how could we keep the information up to date? When I tell you our answers to these challenges, you will see how the Europe EMC Guide works. #1: Language. The Guide is divided into 11 sections, one section for each country, with each section in the language of that country. But this created another problem. How would, for example, an English electronics engineer read the German articles, or a French engineer the Czech articles? Solution: All non-English content is translated into English and in some cases, other languages too, and available online at www.interferencetechnology.eu #2: Updates. The information here in our 2011 edition could never contain everything we would like to publish. Also, since this edition was printed, new information like standards updates, new suppliers, and new information about EMC events have arisen. Solution: Over the next year, we will regularly publish updated versions of this 2011 edition online. Sign up to receive free updates at www.interferencetechnology.eu You can imagine the amount of work required to publish something like this. We would like to take this opportunity to acknowledge all those from Europe and around the world who contributed to this premier edition, and of course our advertisers without whom the publication would not exist.

INTERFERENCE TECHNOLOGY

EUROPE EMC GUIDE 2011

Resources Europe Standards organizations

Government sites

CEN, the European Committee for Standardization

CEOC International

CEN is a provider of European Standards and technical specifications. It is a recognized European organization according to Directive 98/34/EC for the planning, drafting and adoption of European Standards in all areas of economic activity with the exception of electrotechnology (CENELEC) and telecommunication (ETSI). CEN-CENELEC Management Centre, Avenue Marnix 17, B-1000 Brussels, Belgium; + 32 2 550 08 11; Fax: + 32 2 550 08 19; www.cen.eu/cenorm/homepage.htm

CENELEC- European Committee for Electrotechnical Standardization CENELEC’s mission is to prepare voluntary electrotechnical standards that help develop the Single European Market/European Economic Area for electrical and electronic goods and services removing barriers to trade, creating new markets and cutting compliance costs. 17, Avenue Marnix, B-1000 Brussels, Belgium; +32 2 519 68 71; Fax: +32 2 519 69 19; www.cenelec.org

European Telecommunications Standards Institute Recognized as an official European Standards Organization by the European Union, ETSI produces globally applicable standards for Information & Communications Technologies including fixed, mobile, radio, broadcast, internet, aeronautical and other areas. ETSI Secretariat: 650, Route des Lucioles, 06921 Sophia-Antipolis Cedex, France; +33 (0)4 92 94 42 00; Fax: +33 (0)4 93 65 47 16; info@etsi.org; www.etsi.org

International Electrotechnical Commission (IEC) The IEC prepares and publishes International Standards for all electrical, electronic and related technologies — collectively known as electrotechnology. IEC Central Office, 3, rue de Varembé, P.O. Box 131, CH - 1211 Geneva 20, Switzerland; +41 22 919 02 11, Fax: +41 22 919 03 00; info@iec.ch, www.iec.ch • IEC’s EMC Zone: www.iec.ch/zone/emc/emc_entry.htm • CISPR: The principal task of CISPR, the International Special Committee on Radio Interference, is at the higher end of the frequency range, from 9 kHz upwards, preparing standards that offer protection of radio reception from interference sources such as electrical appliances of all types, the electricity supply system, industrial, scientific and electromedical RF, broadcasting receivers (sound and TV) and, increasingly, IT equipment (ITE). www.iec.ch/zone/emc/emc_cis.htm

International Organization for Standardization A developer and publisher of international standards, ISO is comprised of a network of the national standards institutes of 163 countries, one member per country, with a Central Secretariat in Geneva, Switzerland, that coordinates the system. ISO Central Secretariat: 1, ch. de la Voie-Creuse, Case postale 56, CH-1211 Geneva 20, Switzerland; +41 22 749 01 11; Fax +41 22 733 34 30; www.iso.org

interference technology

Secretariat, Rue du Commerce 20-22, B-1000 Brussels, Belgium; +32 2 511 5065; Fax: +32 2 502 5047; info@ceoc.com; www.ceoc.com/

EFTA (European Free Trade Association) Headquarters: 9-11, rue de Varembé, CH-1211 Geneva 20, Switzerland; (+41 22) 332 2626; Fax: (+41 22) 332 2677; mail.gva@efta.int; www.efta.int/

European Commission Secretariat-General, B-1049 Brussels, Belgium; http://ec.europa.eu • European New Legislative Framework for marketing of products: http://ec.europa.eu/enterprise/policies/single-marketgoods/regulatory-policies-common-rules-for-products/ new-legislative-framework/

European Communications Office Nansensgade 19, 3rd floor, 1366 Copenhagen, Denmark; +45 33 89 63 00; Fax: +45 33 89 63 30; ero@ero.dk; www.ero.dk/

European Environment Agency Kongens Nytorv 6, DK - 1050 Copenhagen K, Denmark; +45 3336 7100; Fax: (+45) 33 36 71 99; www.eea.europa.eu/

European Union Council of the European Union: Rue de la Loi / Wetstraat, 175, B-1048 Brussels, Belgium; (32-2) 281 61 11: Fax: (32-2) 281 73 97 / 81; http://europa.eu/

Rapex EU consumer alerts about unsafe products European Commission, Health & Consumers Directorate-General, B – 1049 Brussels, Belgium; http://ec.europa.eu/consumers/ dyna/rapex/rapex_archives_en.cfm

Institutes & trade associations Electromagnetic Compatibility Industry Association (EMCIA) Nutwood UK Limited, Eddystone Court, De Lank Lane, St Breward, Bodmin, Cornwall. PL30 4NQ; +44 (0) 1208 851 530; Fax: +44 (0) 1208 850 871; emcia@emcia.org; www.emcia.org

Electromagnetics Society (ACES) President Osama Mohammed, ECE Department, Florida International University, 10555 W. Flagler Street, EAS-3983, Miami, FL 33174 USA; +1-305-348-3040; mohammed@fiu.edu; http://aces.ee.olemiss.edu/

Energy Institute (EI) 61 New Cavendish Street, London W1G 7AR, United Kingdom; +44 (0) 20 7467 7100; info@energyinst.org; www.energyinst.org

europe emc guide 2011

European Federation for Non-Destructive Testing (EFNDT) European Building Services scrl, 80, avenue de l’Opale, B-1030 Bruxelles; +3227432980; Fax: 3227432990; www.efndt.org/

European Federation of National Associations of Measurement, Testing and Analytical Laboratories (EUROLAB)

CE Marking Directive

European CE Marking Directive 93/68/EEC, http://tiny.cc/xujgp

EMC - Electromagnetic Compatibility Directive

Guidelines for the EMC Directive 2004/108/EC, http://ec.europa. eu /enterprise /sectors /electrical /files /emc_guide_ _up dated_20100208_v3_en.pdf

Eurolab Secretariat, Jean-Marc Aublant, LNE, France, EUROLAB, 1, rue Gaston Boissier, 75724 Paris CEDEX 15 France; +33 1 40 43 39 23; eurolab@lne.fr; www.eurolab.org

E.U. Electrical Safety

IEC System for Conformity testing and Certification of Electrical Equipment (IECEE)

E.U. Electromagnetic Compatibility

Executive Secretary IECEE, c/o IEC Central Office, 3, Rue de Varembé, PO Box 131, 1211 Geneva, Switzerland; +41 22 919 02 34; Fax: +41 22 919 03 00, www.iecee.org

IEEE EMC Society IEEE Corporate Office, 3 Park Avenue, 17th Floor, New York, N.Y. 10016-5997 USA; +1 212 419 7900; Fax: +1 212 752 4929; www. ewh.ieee.org/soc/emcs • I E E E P r o d u c t S a f e t y E n g i n e e r i n g S o c i e t y : http://ewh.ieee.org/soc/pses/

iNARTE, International Association for Radio, Telecommunications and Electromagnetics 840 Queen Street, New Bern, NC 28560 USA; +1-252-672-0200; +1-800-89-NARTE; Fax: +1-252-672-0111; www.narte.org

Institution of Engineering and Technology Michael Faraday House, Stevenage, Herts SG1 2AY United Kingdom; +44 (0)1438 313 311; Fax: +44 (0)1438 765 526; postmaster@theiet.org; www.theiet.org

International Accreditation Forum, Inc. (IAF) IAF Corporate Secretary, John Owen, PO Box 819, Cherrybrook, NSW 2126, Australia; +612 9481 7343; secretary1@iaf.nu; www.iaf.nu/

International Laboratory Accreditation Cooperation (ILAC) The ILAC Secretariat, PO Box 7507, Silverwater, NSW 2128, Australia; +61 2 9736 8374; Fax: +61 2 9736 8373; ilac@nata.com.au; www.ilac.org/home.html

International Telecommunications Union Place des Nations, 1211 Geneva 20, Switzerland; +41 22 730 5111; +41 22 733 7256; itumail@itu.int; www.itu.int/home

European directives & regulations ATEX - Explosive Atmospheres Directive

European ATE X Directive 94/9 /EC, http://ec.europa.eu / enterprise/sectors/mechanical/documents/guidance/atex/ application/

interferencetechnology.eu

ht tp: //ec.europa.eu /enterprise /sectors /electrical /lvd / index_en.htm http://ec.europa.eu/enterprise/sectors/electrical/emc/

E.U. REACH Regulation

(Registration, Evaluation, Authorisation and Restriction of Chemicals), Regulation (EC) No 1907/2006 of the European Parliament and of the Council, http://ec.europa.eu/enterprise/ sectors/chemicals/reach/index_en.htm

EuP - Eco-Design requirements for Energy-using Products Directive European Directive 2009/125/EC (EuP), http://ec.europa.eu/ enterprise/policies/sustainable-business/documents/ecodesign/

General Product Safety Directive

European Directive 2001/95/EC (GPSD), http://ec.europa.eu/ consumers/safety/prod_legis/index_en.htm

LVD - Low Voltage Directive

European Directive 2006/95/EC (LVD), http://ec.europa.eu/ enterprise/sectors/electrical/documents/lvd/legislation/ index_en.htm

Machinery Directive

Text of European revised Machinery Directive 2006 /42 / EC, http://ec.europa.eu /enterprise/sectors /mechanical / documents/legislation/machinery/

RoHS - Restriction of the use of certain hazardous substances in electrical and electronic equipment Frequently Asked Questions on European Directive 2002/95/ EC (RoHS), http://ec.europa.eu/environment /waste/pdf/ faq_weee.pdf

R&TTE

European Directive 1999/5/EC, Radio equipment and Telecommunications Terminal equipment Directive, http://ec.europa. eu/enterprise/sectors/rtte/documents/

WEEE - Waste Electrical and Electronic Equipment Directive Text of European Directive 2002 / 96 /EC (WEEE) , ht tp: // ec.europa.eu/environment/waste/weee/index_en.htm — List compiled with help from Graham Mays

interference technology

Upcoming Events Some important events in the electromagnetic compatibility community. Visit us online at www.interferencetechnology.eu for the latest listings. Please email details of your events to slong@interferencetechnology.com EMC UK 2010 • • •

•

WHEN: 12-13 October WHERE: The Racecourse, Newbury, United Kingdom WHAT: EMC Technology is relevant to all industries; it can affect every piece of electronic and electrical equipment, and it can seriously affect the design cycle, delay production and time to market. In short it can cost money and reduce profits. Keep up to date with the new directives, components, test techniques, test equipment and latest EMC Modelling software. Over 60 companies with experts on their stands that can give you the free advice you need. Plus a full conference program, EMC training courses, and free demonstrations by the IEEE EMC Society UKRI Chapter. INFORMATION: www.emcuk.co.uk

EMC ESD Clinic • • •

•

WHEN: 27 October 2010 WHERE: University of Amsterdam, The Netherlands WHAT: Sponsored by the Dutch EMC ESD Association, the theme of the clinic is Safety & Security. The clinic, a traditional combination of lecture and scholarship, will feature a full program of various workshops, tours and activities and knowledge transfer program. INFORMATION: Contact Gert Gremmen at g.gremmen@ cetest.nl

ISAP 2010 • • •

•

WHEN: 23-26 November WHERE: Macau, China WHAT: ISAP is the premier forum for presentation of the current status and future trends in the field of antenna and propagation. The conference is jointly organized by the University of Macau and the State Key Laboratory of Millimeter Waves at City University of Hong Kong, technically co-sponsored by Institute of Electronics, Information and Communication Engineers (IEICE), IEEE Antennas and Propagation Society (IEEE AP-S), IEEE (HK) Antennas & Propagation / Microwave Theory & Techniques (IEEE HK AP/MTT Chapter). INFORMATION: www.isap2010.org/

•

Instrumentation, Analysis & Testing Exhibition • • •

•

WHEN: 7-10 December WHERE: Yokohama, Japan WHAT: Conference topics will include Active Devices and

WHEN: 23 February 2011 WHERE: Northamptonshire, United Kingdom WHAT: Run by the Engineering Integrity Society, the exhibition provides visitors with an opportunity to see and evaluate the latest industry developments within the Instrumentation, Analysis & Testing environment. INFORMATION: www.e-i-s.org.uk

EMV 2011 • • •

•

WHEN: 15-17 March WHERE: Stuttgart, Germany WHAT: The event offers a wide range of EMC-specific topics. Meet the industry’s leading companies for EMC equipment, components and EMC services. Products and solutions from various fields of EMC will be presented by companies. The workshops of EMV is an applicationoriented platform for information and communication in the area of electromagnetic compatibility. INFORMATION: www.mesago.de/en/EMV/home.htm

Electronic Environment 2011 • • •

Asia-Pacific Microwave Conference 2010 • • •

Circuits (Low-Noise Devices and Circuits, High-Power Devices and Circuits, Microwave Tubes, MMICs, Active and Adaptive Antennas), Passive Components (Filters and Resonators, Ferrite and Acoustic Wave Components, Packaging, Waveguides and Striplines, Optical Components, Metamaterial, RF MEMS, LTCC Devices), Systems (Wireless and Cellular Communication Systems, Signal Processing Circuits and Systems, Microwave Medical and Biological Applications, EMC, Radars and Sensors, Satellite Systems, Digital Broadcasting) and Basic Theory and Techniques (Scattering and Propagation, Electromagnetic Field Theory and CAD, Antenna Theory, Microwave Antennas, Microwave Photonics). INFORMATION: www.apmc2010.org

•

WHEN: 5-6 April WHERE: Stockholm Alvsjo WHAT: This is where practicing engineers, technicians, designers, development and quality managers, buyers, consultants, policy makers and others gather to discuss issues related to EMC, ESD, electrical, mechanical and thermal environments. INFORMATION: www.electronicenv.se Continued on Page 10

interference technology EUrope emc guide 2011

Upcoming Events Continued from Page 8

2011 Asia-Pacific EMC Symposium • • •

•

WHEN: 16-19 May WHERE: Jeju Island, Korea WHAT: Following the tradition of APEMC, the symposium will cover the entire scope of electromagnetic compatibility, including electromagnetic interference, EMC measurement techniques, system-level and PCB-level EMC, lightning and power system EMC, high power EMC, transportation and automotive EMC, antenna and wave propagation issues, computational electromagnetics, nanotechnology for EMC and semiconductor & chip-level EMC. INFORMATION: www.apemc2011.org/main

•

EMC Europe 2011 • • •

CIEN - Carrefour de l’Industrie Electronique & Numérique) • • •

•

WHEN: 24, 25 and 26 May 2011 WHERE: To be determined WHAT: The electronic and numeric industry exhibition strives to bring together all those involved (production equipment manufacturers, components and subassemblies, electronics manufacturing, electronic measurement, engineering and design consultancies, distribution, universities, engineering schools, financing, competitiveness clusters, laboratories and more) to debate, exchange, decide, make contacts and move forward collectively. INFORMATION: www.cien-expo.com

•

WHEN: 20-21 July 2011 WHERE: Tokyo Big Sight, Japan WHAT: TECHNO-FRONTIER is an integrated event of cutting-edge professional exhibitions, technical symposia and a conference, all targeting professionals of the field. While the exhibitions showcase products and technologies, current technological challenges are being discussed at the symposia. INFORMATION: www.jma.or.jp/tf/en/

IEEE International Symposia on EMC • • •

WHEN: 14-19 August 2011 WHERE: Long Beach, California, USA WHAT: The IEEE Electromagnetic Compatibility Society is the world’s largest organization dedicated to the development and distribution of information, tools and techniques for reducing electromagnetic interference. The society’s field of interest includes standards, measurement techniques and test procedures, instrumenta-

WHEN: 26-30 September WHERE: York, England WHAT: The intent of this conference is to bring together those working in the field of EMC as well as spectrum management, monitoring and congestion from European countries and from the countries of other parts of the world and create an excellent forum for useful contacts and exchange of scientific and technical information between researchers and practicing engineers from academia, research laboratories, industry and government agencies. The symposium presents the opportunity to exchange ideas, discuss different points of view and share experiences with colleagues involved in electromagnetic compatibility of devices and systems spectrum management, monitoring and congestion. INFORMATION: www.emceurope2011.york.ac.uk/

European Microwave Week (EuMW) 2011 • • •

Techno-Frontier • • •

tion, equipment and systems characteristics, interference control techniques and components, education, computational analysis, and spectrum management, along with scientific, technical, industrial, professional or other activities that contribute to this field. INFORMATION: http://ewh.ieee.org/soc/emcs/

•

WHEN: 9-14 October WHERE: Manchester, United Kingdom WHAT: Microwave devices, systems for telecommunications (both terrestrial and space borne), transportation, medical, radar and new fields of application are just some of the areas covered in the program. In addition to the conferences, the week showcases a variety of workshops and short courses as well as the European Microwave Exhibition which constitutes the largest trade show on RF and microwaves in Europe. INFORMATION: www.eumweek.com

EMCCompo 2011

8th International Workshop on Electromagnetic Compatibility of Integrated Circuits • • •

•

WHEN: 6-9 November WHERE: Dubrovnik, Croatia WHAT: The achievements in terms of operating frequency and integration of semiconductor technology are constantly creating new challenges in EMC, which must necessarily be addressed at the integrated circuit level. EMC Compo is intended to be a place for exchange of the latest research achievements and experiences in IC-level EMC and it is addressed to researchers both from industry and from academia. INFORMATION: www.emccompo.org

interference technology EUrope emc guide 2011

UNITED KINGDOM 12

PRODUCTS & SERVICES

RESOURCES ARTICLES

Europe EMC Directives The United Kingdomâ&#x20AC;&#x2122;s interpretation of European EMC Directive 2004/108/EC and the policy and structure of the policing and enforcement of the UK EMC Regulations GRAHAM MAYS, EMC CONSULTANT, LANARK, UK

HEMP Filter Design To Meet MIL-STD-188-125 PCI Test Requirements ANTONI JAN NALBORCZYK, CENG, MIET, MPE LIMITED

JEDEC and Tape & Reel Issues Supply chain materials validation for the prevention of nonconforming or suspect counterfeit packaging for in-process manufacturing and long-term storage of ultrasensitive Class 0 ESD devices ROBERT J. VERMILLION, CPP/FELLOW, NASA-AMES RESEARCH CENTER

UNITED KINGDOM | Products and Services 1-9

Arka Technologies

235 Funts Pond Road, Fareham, Hants, PO14 4PJ, Great Britain; sales@arkatech. co.uk ; ht tp : / /arkatech.co.uk / pages / products/emi.asp Products & Services: Shielding

3C Test Ltd

Silverstone Technology Park, Silverstone Circuit, Towcester, Northampton NN12 8GX, United Kingdom; +44(0)1327 857500; Fax: +44(0)1327 857747; Pete Sheppard, sales@3ctest.co.uk; www.3ctest.co.uk Products & Services: Testing

S ys temWare Europe, Bedfordshire, United Kingdom; 44 (0) 1462 734777; Fax: 44 (0) 1462 835777; enquiries@syswareeurope.com; www.AHSystems.com Products & Services: Antennas, Test Instrumentation, Testing

Albacom Ltd

Aaronia UK

Bellringer Road, Trentham, Lakes South, Stoke-on-Trent, ST4 8GB Staffordshire, United Kingdom; +4 4 ( 0 ) 8 45-4 379092; Fax: +44(0)870-8700001; sales@aaronia. co.uk; www.aaronia.co.uk Produc ts & Ser vices : Antennas, Shielding, Test Instrumentation

Accurate Controls Ltd

25 Cowley Road, Poole, Dorset, United Kingdom; + 4 4 ( 0 ) 1202 678108 ; info @ accurate-controls.ltd.uk; www.accuratecontrols.ltd.uk Products & Services : Fiber Optic Systems

ACT Ltd

Unit 4, Cleton Business Park , Cleton Street, Tipton -1, DY4 7TR, United Kingdom; 44-121-557 7064; Fax: 44-121-557 5324; Yasin Zaka, YZaka@applicoat.com Products & Services : Conductive Materials

AEF Solutions

Unit 46 Thomas Way, Lakesview Business Park, Canterbury, Kent CT3 4JJ, United Kingdom; +44 1227 711455; Fax: +44 2380 455022; w w w.aefsolutions.com; Paul Lawrence; paull@aefsolutions.com Products & Services: Filters, Cables & Connectors, Surge & Transients, Miscellaneous

Aeroflex Test Solutions

Longacres House, Six Hills Way, Stevenage, SG1 2AN, United Kingdom; 44-1438772038; Fax: 44-1438-772218; www.aeroflex.com Products & Services: Test Instrumentation

Agilient Technologies UK Ltd

Scotstoun Avenue, South Queensferry, Edinburgh, EH30 9TG, Scotland, United Kingdom; +44 (0)131 331 1000; Fax: +44 (0)131 331 3000 Products & Services: Test Instrumentation

INTERFERENCE TECHNOLOGY

AH Systems

George Buckman Drive, Dundee, DD2 3ST United Kingdom; 44 (0)1382 889311; 44 (0)1382 810171; www.albacom.co.uk; Martin Mackin, m.mackin@albacom.co.uk Products & Services: Amplifiers

BAE Systems

+44 (0)1675 468 200; Ann Timmons, Int’l Marketing, atimmons@cm-products.com; www.cm-products.co.uk Products & Services: Shielding

Cabletec ICS Ltd

Sunnyside Road, Weston-Super-Mare, Somerset, BS23 3PZ, Great Britain; 01934 424900; Fax: 01934 636632; Karen French, Managing Director, sales@cabletec.com; www.cabletec.com Products & Services: Shielding

Caltest Instruments Ltd

Kent, Faraday Test Centre, Airport Works, Roches ter, ME1 2 X X , Great Britain ; +4 4 ( 0 )1634 204 457; Fax: +4 4 ( 0 )1634 203647; Paul Davison, paul.j.davison @ baesystems.com; www.baesystems.com/ faradaytestcentre Products & Services: Testing

PO Box 7717, Lockerbie, DG11 1YF United Kingdom; 44 1387 811 910; Fax: 44 1387 810 195; www.caltest.co.uk; info@caltest. co.uk Products & Services: Test Instrumentation

Bal Seal Engineering

CASS Industries Ltd

29th Floor 1 Canada Square, Canary Wharf, London, E14 5DY, Great Britain; +44 (0)20 7712 1514; Fax: 44 (0)20 7712 1501; W. Young, wyoung@balseal.com; www.balseal.com; Products & Services: Shielding

Blackbrook Trading Estate Weybrook Road, Levenshulme, Manchester, M19 2QD United Kingdom; 44 161 4424 200; Fax: 44 161 4424 283; www.cassindustries.com Products & Services: Testing

Albatross Projects GmbH

BFi OPTiLAS Ltd

CCQS UK Ltd

Daimlerstraße 17, 89564 Nattheim, Germany; +49 - 7321 730 500; Fax: +49 - 7321 730 590; info@albatross-projects.com; www.albatross-projects.de/ Products & Services: Shielded Rooms & Enclosures, Anechoic Chambers

Wolverton Mill South, Milton Keynes, MK12 5 Z Y Uni ted K ingdom ; 4 4 19 0 8 326326; 44 1908 221110; sales.uk@bfioptilas.com; www.bfioptilas.co.uk Produc t s & Ser vic es : Shielding, Testing

Alrad Instruments Ltd

Blackwood Labs

Cherry Clough Consultants

Alder House, Rurnpike Road Industrial Estate, Newbury, Berkshire, RG14 1NS, United Kingdom; 44 1635 32630, sales@ alrad.co.uk, www.alrad.co.uk Products & Services: Test Instrumentation

8 Woodfieldside Business Park, Pontllanfraith, Blackwood, South Wales, NP12 2DG, United Kingdom; +44 (0) 1495 229219; test@blackwood-labs.co.uk; www.blackwood-labs.co.uk; Products & Services: Testing

Stafford, Staffordshire, United Kingdom; +44 1785 660 247; www.cherryclough. com, Keith Armstrong, keith.armstrong@ cherryclough.com Products & Services: Training, Seminars & Workshops, Design and Management Consultancy

Anritsu EMEA Ltd

Brand-Rex Ltd

Cobham Microwave

200 Capability Green, Luton, Beds, LU1 3LU, Great Britain; +44 1582 433200; Fax: +44 1582 731303; salesadministration@ anritsu.com; www.eu.anritsu.com Products & Services: Test Instrumentation, Testing

Ansoft UK

Viewfield Industrial Estate, Glenrothes, Fife., KY6 2RS United Kingdom; 44 (0) 1592 772124; Fax: 44 (0) 1592 775314; Audrey O’Brien, Marketing Communications Manager, aobrien@brand-rex.com; www.brand-rex.com Products & Services: Cables & Connectors

1st Floor, Unit 8 Bracknell Beeches, Old Bracknell Lane West, Bracknell, RG12 7BW, Great Britain; +44 (0)870 010 4456; Fax : + 4 4 ( 0 ) 8 70 010 4 4 5 7; uksales @ ansoft.com Products & Services: EMC Design Software

BRE Ltd

AQL EMC Limited

89 Widney Road, Knowle, Solihull B93 9EA, United Kingdom; +44 1564 773319; Fax: +44 1564 773319; emc@brianjones.co.uk Products & Services: EMC Consultant and Competent Body Signatory specializing in standards and regulations

16 Cobham Road, Ferndown Industrial Estate, Wimborne, Dorset, BH21 7PG United Kingdom; 44 (0)1202 86 11 75; Fax: 44 (o)1202 86 11 76; www.aqlemc.co.uk Products & Services: Consultancy, Testing

AR United Kingdom Ltd

Unit 8 TORC MK , Chippenham Drive, Kingston, Milton Keynes , England Bucks MK10 OAE; +44 (0)1908 282766; Fax: +44 (0)1908 288249; Dr. Tom Cantle, tomc@ uk-ar.co.uk; www.uk-ar.co.uk Products & Services : Amplifiers, Antennas, Cables & Connectors, Shielded Rooms & Enclosures, Surge & Transients, Test Instrumentation

Bucknalls Lane, Wat ford, WD2 5 9X X United Kingdom; 44 1923 664000; enquiries@bre.co.uk; www.bre.co.uk Products & Services: Testing

Brian Jones

Bulgin

Melville Court, Spilsby Road, Romford, Essex, RM3 8SB, Great Britain; +44 (0)1708 343800; Simon, Howard, Managing Director, simonhoward@bulgin.co.uk Products & Services: Filters

C Cable Management Products Ltd

Suite B, Regal Court 112 London Road, Headington, Oxford, OX3 9AW United Kingdom; 44 1865 741 105; Fax: 44 1865 423 693; info@ccqsuk.com Products & Services: Certification Services

148 Stocks Lane, Bracklesham Bay, Chichester, West Sussex, PO20 8NT United Kingdom; 01243 670711; Fax: 01243 672907; www.cobham.com/microwave; Dean Terrett, Key Account Manager, DeanTerrett@ cobham.com] Produc ts & Ser vices : Antennas, Cables & Connectors, Filters, Shielded Rooms & Enclosures

Conformance Services Ltd

24 Tidnock Avenue Congleton, Cheshire, CW12 2HW United Kingdom; 4 4 126 0 270729 ; Fax: 44 1260 270729; enquiries@conformance-services.com; www.conformance-services.com Products & Services: Testing

Coreshield

St. Margaret’s School, Gosfield Hall Park, Gosfield, Halstead, Essex, CO9 1SE, Great Britain; +4 4 ( 0 )1787-472134; Fax: +4 4 (0)1787-73589; www.coreshield.eu; John Corbett, Coreshield@aol.com Products & Services: Shielding

CPI - Communications & Power Industries Europe

28 Manor Road, Walton-on-Thames, Surrey KT12 2QF, United Kingdom; +44 (1932) 256 930 or +44 (1932) 256 939; Fax: +44 (1932) 241 271; www.cpii.com/cmp; Tony Johns, tony.johns@cpii.com Products & Services : Amplifiers, Microwave Power

CMG House, Station Road, Coleshill, Birmingham, B4 6 1HT, Great Britain ;

EUROPE EMC GUIDE 2011

Cranage EMC & Safety

Market Drayton, Shropshire, United Kingdom; +44 1630 658568; Fax: +44 1630 658 921; info@cranage.co.uk; www.cranage.co.uk Products & Services: Testing Laboratories

Cre8 Associates Ltd

Bruntingthorpe Proving Ground, Bath Lane, Lutterworth, Leicestershire, LE17 5QS, Great Britain; +44 (0)1162 479787; David Hobbs, Commercial Manager, davidh@cre8-Associates.com; www.cre8-associates.com Products & Services: Cables & Connectors, Filters, Testing

Credowan Ltd

Stocks Lane, Bracklesham Bay, Chichester, West Sussex P020 8NT, United Kingdom; 4 4 (0 ) 124 3 670711 Fax: +4 4 (0) 1243 672907; www.credowan.co.uk; sales@credowan.co.uk Products & Services: Shielded Rooms & Enclosures

CST UK Ltd

Nottingham, United Kingdom; 44 115 9061 120; info@cst.com; www.cst.com Products & Services: Test Instrumen-

tation, Testing

D DEM Manufacturing

Hargreaves Way, Sawcliffe, Industrial Park, Scunthorpe, North Lincolnshire DN15 8RF United Kingdom; 44 (0) 1724 273200; Fax: 44 (0) 1724 280353; Diane Kilminster, Marketing Executive, sales@dem-uk.com; www.dem-uk.com Products & Services: Filters, Surge & Transients

Dexter Magnetic Technologies

Berkshire, Uni ted K ingdom ; + 4 4 ( 0 ) 1189-602430; @ dextermag.com; www. dextermag.com Products & Services: Ferrites, Shielding, Surge & Transients

E ElectroMagnetic Technologies (EMT) Ltd

Hesperides, Inniscarra, Co. Cork, Ireland;

021 487 1437; http://emtcork.biz/ Products & Services: Consultancy, Testing , Training

Electromagnetic Testing Services Ltd

Pratts Fields Lubberhedges Lane, Stebbing, Essex, CM6 3BT United Kingdom; 44 1371 856061; Fax: 44 1371 856144; www.etsemc.co.uk; ubfi@9

Electronic Test & Calibration Ltd

Caddsdown Industrial Park, Clovelly Road, Bideford, EX393DX, Great Britain; +44 (0)1237 423388; Fax: +44 (0)1237 423434; www.etcal.co.uk; info@etcal.co.uk Products & Services: Antennas, Calibration, Testing, Training

Elmac Services

Wareham, Dorset, United Kingdom; 44 01929 558279; www.elmac.co.uk; consult@elmac.co.uk Products & Services: Consultancy, Training

EM Software & Systems / FEKO

Aubrey Consulting Ltd., 8 Stranding Str., Eastleigh, Hampshire, SO50 5GQ, United Kingdom; + 44 2380 610272; info@aubrey consulting.co.uk; www.feko.info Products & Services: Test Instrumentation, Testing

Electrostatic Solutions Ltd

13 Redhill Crescent, Basset t, Southampton, Hampshire, SO16 7BQ, United Kingdom; +44 (0)23 8090 5600; Dr. Jeremy Smallwood, Smallwood, enq2006@electrostatics.net; www.static-sol.com/index.htm Products & Services: Consultancy

EM Test AG

Frequensys Ltd., 10 Abbey Court, Fraser Road, MK44 3WH Bedford, United Kingdom; +44 (0)1142 353 507; Fax: +44 (0)1234 831 998; info@frequensys.com; www.frequensys.co.uk Products and Ser vices : Surge & Transients, Test Instrumentation, Testing

Ferrites for EMI Suppression Quality

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Service

Fair-Rite Manufactures Components For: EMI Suppression Custom Cores Power Applications Antenna/RFID Applications Custom Machining Available

Visit Our Online Catalog @ www.fair-rite.com

Fair-Rite Products Corp. Your Signal Solutionâ&#x201E;˘

PO Box 288, One Commercial Row, Wallkill, NY 12589-0288 www.fair-rite.com | Ferrites@fair-rite.com (888) FAIRRITE (324-7748) or (845) 895-2055 | Fax (845) 895-2629

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INTERFERENCE TECHNOLOGYâ&#x20AC;&#x192;

UNITED KINGDOM

| Products and Services

EMC Consultants Ltd

Stebbing Hall, Lubberhedges Lane, Stebbing, Essex, CM6 3BU United Kingdom; 01371 856 964; 01371 856 984; http://emc-consultants.co.uk; info@emc-consultants.co.uk Products & Services: Consultancy

EMC Hire Ltd

Unit 1, Ivel Road, Shefford, Bedfordshire, SG17 5JU United Kingdom; 44 1462 817111; 44 1462 817444; www.emchire.co.uk Products & Services: Test Instrumentation

Unit 4, Saffron Business Centre Elizabeth Way, Saffron Walden, Essex, CB10 2BL United Kingdom; 44 1799 523073; Fax: 44 1799 521191; www.euro-emc.co.uk; info@euro-emc.co.uk Products & Services: Shielding

Euroquartz Ltd

Blacknell Lane, Crewkerne, Somerset TA18 7HE, United Kingdom; 44 (0)1460 230000; Fax: 44 (0)1460 230001; John Dale, Sales & Marketing, info@euroquartz.co.uk; www.euroquartz.co.uk/oscillators.aspx Products & Services: Filters

F EMC Partner UK Ltd

1A Golf Link Villas, The Common, Downley, High Wycombe, HP13 5YH, Buckinghamshire United Kingdom; +44 (0)1494 44 42 55; Fax: +44 (0)1494 44 42 77; David Castle, sales@emcpartner.co.uk; www.emcpartner.co.uk Products & Services: Surge & Transients, Test Instrumentation

EMC Resources Ltd

Willow House, Greenrig Road, Hawksland, Lanark, ML11 9QA United Kingdom; +44 ( 0 ) 15 5 5 - 8 9 0 - 515 ; w w w.finda-training-course.co.uk; info@ finda-trainingcourse.co.uk Products & Services: Consultancy

EMC Solutions Ltd

Unit 6, Century Park Starley Way, Bickenhill; Solihull, B37 7HF United Kingdom; 44 (121) 782-2705; www.emcsolutionsltd.com Products & Services: Filters, Testing

Fair-Rite Products Corp.

Dexter Magnetic Technologies Europe, Ltd., Unit 12, Tavistock Industrial Estate Ruscombe Park Twyford, Berkshire RG10 9NJ, United Kingdom; +44(0) 1189 602430; Fax: +44(0) 1189 602431; info@dextermag.com; www.fair-rite.com Schaffner Ltd., Ashville Way, Molly Millars Lane, Wokingham, Berkshire RG41 2PL, United Kingdom; +44 118 977 0070; Fax: +44 118 979 2969; www.fair-rite.com; uksales@schaffner.com Products & Services: Ferrites, Filters, Shielded Rooms & Enclosures, Shielding

GETELEC

Glenair UK Ltd

6 02 Byucksan Digital Valley (V) 6 0-73 Gasan-dong Geumcheon-gu Seoul 153788 Korea; +82- (0)2-2082-5420 (rep); Fax: +82-(0)2-2082-5424; ysnam@esongemc. com; www.esongemc.com Products & Services: Shielding

ETC Ltd

Caddsdown Industrial Park Clovelly Road, Bideford, EX39 3DX United Kingdom; 44 (0)1237 423388; Fax: 44 (0)1237 423434; www.etcal.co.uk/emc_cont.htm; info@etcal.co.uk Products & Services: Testing

ETS - Lindgren Ltd

Unit 4 Eastman Way, Pin Green Industrial Area, Stevenage, SG1 4UH, United Kingdom; +44 (0)1438 730700; Fax: +44 (0)1438 730750; uk@ets-lindgren.com; www.ets-lindgren.com Produc ts & Ser vices : Antennas, Cables & Connectors, Filters, Shielded Rooms & Enclosures, Shielding, Test Instrumentation, Testing

14â&#x20AC;&#x192;

INTERFERENCE TECHNOLOGY

H.T.T. (UK) Ltd, Unit 6, Northend Industrial Estate, Bury Mead Road, Hitchin, Herts., SG5 1 RT, Great Britain; +44 1462 486866; Fax: +44 1462 486054; www.httuk.co.uk; Roland Brunisholz, roland.brunisholz@ httuk.co.uk Products & Services: Surge & Transients, Test Instrumentation

40 Lower Oakham Way, Mansfield, NG18 5BY, Great Britain; +44 (0)1623 638154; Fax: + 4 4 ( 0 )162 3 6 3 8111; Jane Moss, jmoss@glenair.co.uk; www.glenair.com Products & Services: Cables & Connectors

Globec (UK) Ltd

Unit 15, Watchfield, Oxfordshire, SN6 8TZ, Great Britain; +44 1793 780790; Fax: 44 1793 780776; Peter Harris, peterh@ globec.co.uk; www.globec.co.uk/emc/ filters/filter7.html Products & Services: Cables & Connectors, Filters

H Habia Cable Inc.

Unit 10 Short Way Thornbury Industrial Estate, Bristol, BS35 3UT United Kingdom; 44 1909 483 896; www.habia.com Products & Services: Cables & Connectors

3 Bramfield Road East, Rayleigh, Essex, SS 6 8RG, Great Britain ; + 4 4 ( 0 )12 6 8 7478 3 9 ; Fax : 4 4 ( 0 )126 8 777124 ; John Woodga te, consul t an t , jm w @ m wa. demon.co.uk; www.jmwa.demon.co.uk Products & Services: Consultancy

Fitzherbert Road, Farlington, Portsmouth, PO6 1RT, Great Britain; +44 (0) 23 9231 4545; www.harwin.com Products & Services: Cables & Connectors

15 Wentworth Road, South Park Industrial Estate, Scunthorpe, Great Britain; +44 (0)1724 851678; Fax: +44 (0)1724 280586; www.hitek-ltd.co.uk; John Terry, sales@ hitek-ltd.co.uk Products & Services : Conductive Materials

Horiba Insruments UK Service Center

Kyoto Close, Summerhouse Road Moulton Park, Northampton, NN3 6FL United Kingdom; 44 1604 542 500; www.horiba.com Products & Services: Testing

HTT (UK) Ltd

Unit 6 Northend Industrial Estate, Bury Mead Road, Hitchin, SG5 1R T, Great Britain ; + 4 4 ( 0 )14 6 2 4 8 6 8 6 6 ; Roland Brunisholz, sales@httuk.co.uk; www.httuk.co.uk Products & Services: Test Instrumentation, Testing Unit 16, Brickfield Lane Chandlers Ford, Eastleigh, Hampshire, SO53 4DP United Kingdom; 44 23 8027 1111; Fax: 44 23 8027 1144; www.hursley-emc.co.uk; sales@ hursley-emc.co.uk Products & Services: Consultancy, Testing

Global EMC

Prospect Close Lowmoor Road Industrial Estate, Kirby-in-Ashfield, NG17 7LF United Kingdom; 44 1623 755539; Fax: 44 1623 755719; www.globalemc.co.uk/home.html Produc t s & Ser vic es : Shielding, Testing

J. M. Woodgate and Associates

Harwin

Hursley EMC Services 375 rue Morane Saulnier BP 80235, 78532 Buc, France; (33168) 505-4299; www.getelec.com Products & Services: Shielding

E-Song EMC Co. Ltd

Haefely EMC Division

HITEK Electronic Materials Ltd

ERA Technology Ltd

Leatherhead, Surrey, United Kingdom; +44 (0) 1372 367030; www.cobham.com/ technicalservices Products & Services: Consultancy

European EMC Products

IFI - Instruments for Industry

Dowding & Mills, Wilbury Way Hitchin Hertfordshire SG4 OTA; +44 462421234; Fax: +44 462420012; Brian Epton, brian.epton@ dowdingandmills.com; www.dowdingandmills.com

Kemtron Ltd

19-21 Finch Drive, Springwood Industrial Estate, Braintree, Essex, CM7 2SF, United Kingdom; +44 1376 348115; Fax: +44 1376 345885; www.kemtron.co.uk; sales@kemtron.co.uk Products & Services: Conductive Materials, Ferrites, Filters, Shielding

KnitMesh Technologies

Greenfield, Holywell, Flintshire CH8 9DP United Kingdom; 01732 717600; Fax: 01732 714 9 0 9 ; Colin Barnes, colin.barnes @ knitmeshtechnologies.com; www.knitmeshtechnologies.com Products & Services: Shielding, Conductive Materials

KTL (TracGlobal)

Saxon Way Priory Park West, Hull, HU13 9PB United Kingdom; 44-1482-801801; www.ktl.com Products & Services: Testing

L Laplace Instruments Ltd

3B, Middlebrook Way, Cromer, Norfolk, NR27 9JR, United Kingdom; +44 (0) 12 63 51 51 60; www.laplaceinstruments.com; tech@laplace.co.uk Products & Services : Amplifiers, Antennas, Shielded Rooms & Enclosures, Test Instrumentation

Link Microtek Ltd

High Point, Church Street, Basingstoke, RG21 7QN, Great Britain; +4 4 ( 0 )1256 355771; Fax: +44 (0)1256 355118; Hugo Bibby, sales@linkmicrotek.com; www.linkmicrotek.com Products & Services: Test Instrumentation

M M.Buttkereit Ltd

Products & Services : Amplifiers, Antennas, Filters, Shielded Rooms & Enclosures, Test Instrumentation, Testing

Unit 2, Britannia Road, Ind. Est. Sale Cheshire, M33 2AA, Great Britain; 0161 969 5418; info@buttkereit.co.uk Products & Services: Cables & Connectors

Instrument Plastics Ltd

Magnetic Shields Ltd

Unit 35, Kings Grove Industrial Est, Maidenhead, Berkshire, Maidenhead, United Kingdom SL6 4DP; www.instrumentplastics.co.uk; sales@instrumentplastics.co.uk Products & Services: Shielding

Headcorn Road, Staplehurst, Kent TN12 ODS United Kingdom; 00 44 01580 891521; Fax: 00 44 01580 893345; enq@magneticshields.co.uk; www.magneticshields.co.uk Products & Services: Shielding

MDL Technologies Ltd

Technologies House, 60 Manton Road, Herts, SG4 9N, Great Britain; +44 1462 4 31981; Fax: +4 4 560 315 2515; www. mdltechnologies.co.uk/company.html

EUROPE EMC GUIDE 2011

Products and Services | UNITED KINGDOM Products & Services: Testing

Mead Testing Ltd

Unit 25 Mead Industrial Park River Way, Harlow, Essex, CM20 2SE United Kingdom; 44 1279 635864; 44 1279 635874; www.meadtest.com Products & Services: Testing

Mentor Graphics Mechanical Analysis Div.

81 Bridge Road, Hampton Court, Surrey, KT8 9HH, Great Britain; 44 208 487 3108; Fax: 44 208 487 3001; John Parry, Research Manager, john _ parr y @ men tor.com ; www.mentor.com/products/mechanical Products & Services: Software

METECC

4 Chestnut Grove, Hurstpierpoint, BN6 9SS, Great Britain; +44 (0)7725 079956; Peter Metcalfe, peter@metecc.eu; www.metecc.eu Products & Services: Testing, Training

Milmega Ltd

Ryde Business Park, Nicholson Road, R yde, United Kingdom ; + 4 4 ( 0 )19 8 3 618004; Fax: 44 (0)1983-811521; sales@ milmega.co.uk; www.milmega.com Products & Services: Amplifiers

MIRA Ltd

Watling Street Nuneaton, Warwickshire, CV10 0TU United Kingdom; 44 (0)24 7635 5576; Fax: 44 (0)24 7635 8576; www.mira.co.uk Products & Services: Testing, Training

MPE Ltd

Hammond Road, Knowsley Industrial Park, Liverpool, Merseyside, L33 7UL, United Kingdom; +44 (0) 151 632 9100; Fax: +44 (0) 151 632 9112; www.mpe.co.uk; John Jephcott, sales@mpe.co.uk Products & Services: Filters

Murata Electronics UK

Oak House, Ancells Road, Ancells, Business Park, Fleet, GU51 2QW, Great Britain; +44 (0) 1252 8111666; Aya Tonooka, Marketing Of ficer UK , ayatonooka @ murata.co.uk Products & Services: Amplifiers, Ferrites, Filters, Surge & Transients

O Optical Filters Ltd

14 Bertie Road, Thame, 0X9 3FR United Kingdom; 44 1844 260 377; Fax: 44 1844 260 355; www.opticalfilters.co.uk/home.html Products & Services: Filters, Shielding

Oxley Developments Co.

Priory Park, Cumbria, Ulverston, L A12 9QG, United Kingdom; +44 0 1229 840519; www.oxleygroup.com; sales@oxley.co.uk Products & Services: Ferrites, Filters, Surge & Transients

P & P Technology Ltd

Braintree, Essex, United Kingdom; +44 ( 0 ) 13 76 5 5 0 5 2 5 ; + 8 6 -512- 6 3 3 2 79 6 6 ; www.p-p-t.co.uk Products & Services : Conductive Materials, Die Cut Shielding Material, EMI Gaskets, Shielding

Panashield (UK) Ltd

erset, TA1 1SZ, Great Britain; +44 01823 358912; info@tech-rep.co.uk Bickland Industrial Park, Falmouth, Cornwall, TR11 4RY, Great Britain; +44 0 1823 352 572; Heidi Acton, TechRep (sister comp), heidi@tech-rep.co.uk; www.phi-falmouth.co.uk/scifs Products & Services: Shielded Rooms & Enclosures

PPI (Power Products International) Ltd

The Bothy, 38 Smarts, Heath Road, Woking, GU22 0NP, Great Britain; +44 (0)1483 722020; Fax: +44 (0)1483 770330; sales@panashield.co.uk Products & Services: Filters, Shielded Rooms & Enclosures, Shielding, Testing

Commerce Way, Edenbridge, Kent, TN8 6ED, Great Britain; 01732 866424; Fax: 01732 866399; Geoff Robinson, gkrobinson@ppi-uk.com; www.ppi-uk.com/premo-filters.php Products & Services: Filters

Peak Electromagnetics

PPM (Pulse Power & Measurement) Ltd

139 Bank Street Macclesfield, Cheshire, SK11 7AY United Kingdom; 44 1625 269808; www.peak-em.co.uk; sales@peak-em.co.uk Products & Services: Consultancy

PGMC Ltd

Product Compliance, Suite 34, Gunnery House, 9 Gunnery Terrace, London, SE18 6SW, United Kingdom; +44 (0) 20 7193 1730 ; Fax: +4 4 (0) 7713 628173; Pablo Garcia, pablog@o2.co.uk Products & Services: Consultancy, Information Technology and Telecommunications

65 Shrivenham Hundred Business Park, Watchfield, Swindon, SN6 8T Y, United Kingdom; +44 1793 784389; sales@ppm. co.uk; www.point2point.co.uk Products & Services: Cables & Connectors, Shielded Rooms & Enclosure, Shielding, Test Instrumentation, Testing

Precision Micro

PO Box 162 30 Curzon St., Birmingham, B4 7XD United Kingdom; 44 114 284 4484; Fax: 44 114 286 9447; www.precisionmicro.com Products & Services: Shielding

PHI @ Falmouth

Tech-Rep UK Ltd, 1 Marco Polo House, Cook Way, Bindon Road, Taunton, Som-

Tempest Power Line Filters Maximum design flow, Minimum solution time For antenna design and antenna placement • FEKO provides comprehensive EM simulations and is a market leader in the analysis of antennas in their operating environment. • Antenna Magus has a wide range of antennas which can be explored to find and design according to specifications. Designs can then be exported as FEKO models.

Expertise is one click away: www.ets-lindgren.com/filters

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www.feko.info

INTERFERENCE TECHNOLOGY

UNITED KINGDOM

| Products and Services

Q Q-par Angus Ltd

Barons Cross Laboratories, Leominster, Herefordshire, HR6 8RS, United Kingdom; 01568 612138; julian.robbins@q-par.com; www.q-par.com Produc ts & Ser vices : Antennas, Filters, Testing

Products & Services : Conductive Materials, Shielding

Schurter UK Ltd

Navigation House, Canal View Road, Newbury, Berkshire, RG14 5UR, Great Britain; w w w.teledynereynolds.co.uk; Olivier Dilun, Southern Europe regional sales manager, odilun@teledyne.com Products & Services: Cables & Connectors

Unit 8 Clock Park, Shripney Road, Bognor Regis, PO2 2 9NH, Great Britain ; + 4 4 (0)1273 810810; Fax: +44 (0)1273 810800; Richard Baldwin, sales@schurter.co.uk Products & Services: Filters, Shielding

Sematron UK Ltd

QinetiQ

CodyTechnology, Park Rm 1005, A5 Bldg, Ively, Farnborough, GU14 OL X , Great Britain Products & Services: Testing

Rainford EMC Systems

St. Helens, United Kingdom; +44 (0)1942 296190; www.rainfordemc.com Products & Services: Shielding

Rasmi Electronics Ltd

Morrison Road, Annfield Plain, Stanley, Durham, DH9 7RX, Great Britain; 01207 291300; Dr. Surendra, Managing Director, sales@rasmi.com; www.rasmi.com Products & Services: Antennas, Filters, Shielded Rooms & Enclosures

RFI Global Services Ltd

Basingstoke, Hampshire, United Kingdom; 919-622-4088; www.rfi-global.com Products & Services: Testing

Richard Marshall Ltd

The Dappled House, 30 Ox Lane, Harpenden, Herts. AL5 4HE, United Kingdom; w w w.design-emc.co.uk; + 4 4 ( 0 )15 8 2 460815; richard.marshall@iee.org Products & Services: Consultancy

Rittal Ltd

Braithwell Way Hellaby Industrial Estate, Hellaby, Rotherham, Yorks S66 8QY United Kingdom; 44 1709 70 40 00; www.rittal. co.uk; information@rittal.co.uk Products & Services: Shielded Rooms & Enclosures

RN Electronics Ltd

Arnolds Court, Arnolds Farm Lane, Brentwood, Essex CM13 1UT United Kingdom; 01277 352219; Fax: 01277 352968; Paul Darragh, paul@RNelectronics.com; www.rnelectronics.com Products & Services: Testing

RS Coatings Ltd

Unit 8, Miras Business Estate, Lower Keys Park, Cannock, Staffordshire, WS12 2FS United Kingdom; 01543 274 999; http:// rscoatings.com/default.asp?pgid=3; Laurie Richardson, rscgroup@btconnect.com Products & Services: Shielding

Schlegel Electronic Materials

Kemtron L imited, 19 -21 F inch Drive, Braintree, Essex, CM7 2SF; +44 (0)1376 348115; Fax: +44(0)1376 345885; David Wall, dbw@kemtron.co.uk;

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www.kemtron.co.uk Products & Services : Conductive Materials, Shielding

INTERFERENCE TECHNOLOGY

Sandpiper House, Aviary Court, Wade Road, Basingstoke, RG24 8GX, Great Britain; +44 (0)1256 812222; Fax: +44 (0)1256 812666; www.sematron.com; Glenn Toal, gtoal@sematron.com Products & Services: Cables & Connectors, Test Instrumentation

Teledyne Reynolds

Telonic Instruments Ltd

Toutley Industrial Estate, Toutley Road, Wokingham, RG41 1QN, Great Britain; +44 (0)118 978 6911; www.telonic.co.uk; Bob Lovell, info@telonic.co.uk Products & Services: Filters, Test Instrumentation

TUV Product Service Ltd

Octagon House, Concorde Way, Segensworth North, Fareham, Hampshire, PO15 5RL, Great Britain; Fax: 44 (0)1489 558100; www.tuvps.co.uk Products & Services: Testing

U Uvox Ltd

Building 14/Unit 3, Stanmore Industrial Estate, Bridgnorth, Shropshire, WV15 5HR, Great Britain; +44 (0) 1746 769 369; Fax: +44 (0) 1746 766 001; Robin Shedden, Sales Manager, sales@uvox.co.uk; www.uvox.co.uk Products & Services: Shielding

Slater Plastics

Unit 7, Hanborough Business Park Lodge Road, Long Hanborough, Oxon, OX8 8LG United Kingdom; +44 1785 213 861; Fax: 44 1785 243 204; www.slaterplastics.com; info@slaterplastics.com Products & Services: Filters, Shielding, Test Instrumentation

Sulis Consultants Ltd

Mead House, Longwater Road, Eversley, Hampshire, RG2 7 0N W; + 4 4 ( 0 )7 9 4 6 624317; Charlie Blackham, charlie@sulisconsultants.com; www.sulisconsultants.com Products & Services: Product Approvals, CE Marking, Regulatory Compliance Management

Suppression Devices

Unit 8 - York St Business Centre, Clitheroe, Lancashire, Great Britain; 44 1200 444497; http://suppression-devices.com; Campbell Barker, sales@suppression-devices.com Products & Services: Filters

Syfer Technology Ltd

Old Stoke Road, Arminghall, Norwich, NR14 8SQ, United Kingdom; +4 4 1603 723310; Fax: +44 1603 723301; www.syfer.com; sales@syfer.co.uk Products & Services: Filters

T T C Shielding, Ltd

Unit 2, Ashburton Industrial Estate Ross on Wye, Herefordshire, HR9 7BW United Kingdom; 44 1989 563 941; info@tcshield ing.com; www.tcshielding.com Products & Services: Shielding

TBA Electro-Conductive Products

PO Box 56 Rooley Moor Road, Rochdale, OL12 7E4 United Kingdom; (4 4) 170 6647718; Fax: (44) 1706-646170; www.tbaecp.co.uk Products & Services : Conductive Materials, Shielding, Surge & Transients

Tecan Inc

Tecan Way, Weymouth, INTL DT4 9TU United Kingdom; 44 1305 765432; Fax: 877-990-4700; www.tecan.co.uk Products & Services: Shielding

Tech-Etch, Inc.

TBA Electro Conductive Products, P.O. Box 56, Rooley Moor Road, Rochdale, Spotland, Lancs. OL12 7EY England; +441706 647718; Fax: +441706 646170; www.tech-etch. com; davidhurst@tbaecp.co.uk

V Teseq Ltd

5 Ashville Way, Molly Millars L ane, Wokingham, Berkshire, RG41 2PL, Great Britain; +44 (0)8450 740660; Michael Hill, uksales@teseq.com; www.teseq.co.uk Products & Services : Amplifiers, Antennas, Test Instrumentation, Testing

The Lighting Association Laboratories

Stafford Park 7, Telford, Shropshire, TF3 3BQ, Great Britain; +44 (0) 1952 290907; Fax: +44 (0) 1952 290908; www.lightingassociation.com; lab@lightingassociation.com Products & Services: Surge & Transients

Thurlby-Thandar Instruments (TTI)

Glebe Road, Huntingdon, Cambridgeshire, INTL PE29 7DR United Kingdom; 44 1480 412451; www.tti-test.com Products & Services: Test Instrumentation, Testing

Tioga Ltd

St Thomas House, Mansfield Road, Derby, DE1 3TN, Great Britain; 01332 360884; Fax: 01332 360885; www.tioga.co.uk; Angela Bond, angela@tioga.co.uk Products & Services: Testing

TMD Technologies Ltd

Swallowfield Way, Hayes, Middlesex UB3 1DQ, United Kingdom; +44 20 8573 5555; Fax: +44 20 8569 1839; www.tmd.co.uk; heather.skinner@tmd.co.uk Products & Services : Amplifiers, Antennas, Filters, Test Instrumentation

Toroid International Ltd

7 George House Princes Court, Beam Heath Way, Nantwich, CW5 6GD United Kingdom; 01270 611368; www.toroid.co.uk; sales@toroid.co.uk Products & Services: Ferrites, Surge & Transients

TRAC Global, Ltd

100 Frobisher Business Park, Leigh Sinton Road, Malvern, Worcestershire, WR14 1BX, Great Britain; 44 1684 571700; Fax: 4 4 1684 571701; www.tracglobal.com; environmental@tracglobal.com Products & Services: Testing

TRW Conekt

Stratford Road, Solihull, B90 4GW United Kingdom; 44 (0) 121 627 4242; Fax: 44 (0) 121 627 424; www.conekt.net Products & Services: Consultancy, Testing

Vector Fields Ltd / Cobham Technical Services

24 Bankside, Kidlington, OX5 1JE United Kingdom; 44 1865 370 151; Fax: 44-1865370277; www.vectorfields.com Products & Services: Shielding

Visteon Engineering Services Ltd

Visteon Technical Centre, Laindon, Basildon, SS15 6EE , Great Britain ; 0124 5 359363; www.visteon.com/testing; Martin Black, mblack7@visteon.com Products & Services: Testing

W Wemtech

Bordesley Hall The Holloway, Alvechurch, B48 7QQ United Kingdom; 44 1527 595066; 44 1527 595033; www.wemtech.co.uk Products & Services: Consultancy, Training

Westbay Technology Ltd

Main St. Baycliff Nr Ulverston, Ulverston, LA12 9RN United Kingdom; +44 1229 869-108; Fax: +44 1229- 869-108; www.westbay.ndirect.co.uk Products & Services: Testing

Wurth Electronics UK Ltd

4th Avenue, The Village, Trafford Park, Manchester, M17 1DB, Great Britain; +44 (0)161 872 0431; Fax: +44 (0)161 872 0433; sales-uk@we-online.com Products & Services: Cables & Connectors, Ferrites

Y York EMC Services Ltd

York, North Yorkshire, United Kingdom; 01904 434440; www.yorkemc.co.uk Products & Services: Signal Generators

Z Zytronic Displays Ltd

Whitely Road Blaydon-on-Tyne, Tyne & Wear, NE21 5NJ United Kingdom; 44-191414-5511; Fax: 44-191-414-0545; www.zytronic.co.uk Products & Services: Filters Contact Sarah Long at slong@ interferencetechnology.com for additions and corrections to the Products and Services directory.

EUROPE EMC GUIDE 2011

UNITED KINGDOM Resources AssOCIATIONs ELECTROMAGNETIC COMPATIBILITY INDUsTRY AssOCIATION

Nutwood UK Limited, Eddystone Court, De Lank Lane, St Breward, Bodmin, Cornwall. PL30 4NQ; +44 (0) 1208 851 530; Fax: +44 (0) 1208 850 871; emcia@emcia.org; www.emcia.org

INsTITUTION OF ENGINEERING AND TECHNOLOGY

Michael Faraday House, Stevenage, Herts, SG1 2AY, UK; +44 (0)1438 313 311; Fax: +44 (0)1438 765 526; postmaster@theiet. org; www.theiet.org

CEM INTERNATIONAL LTD

The Atrium Business Centre Curtis Road, Dorking Surrey RH4 1XA, United Kingdom; Phone: +44 (0) 1306 646388; Fax: +44 (0) 1306 646389; tony.gilliver@cem-international.co.uk Notified Body number: 1942 Directives: 2000/14/EC Noise emission in the environment by equipment for use outdoors 2006/95/EC (ex-73/23/EEC) Low voltage directive 2004/108/EC Electromagnetic compatibility 2006/42/EC Machinery

COBHAM TECHNICAL sERVICEs

3 Abbey Court, Fraser Road, Priory Business Park, Bedford MK44 3WH, England; 01234 832700; Fax: 01234 831496; sales@rsgb. org.uk; www.rsgb.org

Cleeve Road, Leatherhead Surrey KT22 7SA, United Kingdom; Phone: +44 (0)1372 367000; Fax: +44 (0)1372 367099; era.info@ cobham.com; www.cobham.com/technicalservices Notified Body number: 1893 Directive: 2004/108/EC Electromagnetic compatibility

UNITED KINGDOM & REPUBLIC OF IRELAND

CONFORMANCE sERVICEs LTD

RADIO sOCIETY OF GREAT BRITAIN

Paul Duxbury (term expires 31 December 2010), CST UK Ltd, Strelley Hall, Main Street, Strelley, Nottingham NG8 6PE, United Kingdom; +44 115-906128; Fax: +44 115-9061115; paul.duxbury@ ieee.org

24 Tidnock Ave., Congleton Cheshire CW12 2HW, United Kingdom; Phone: +44 (0)1260 270729; Fax: +44 (0)1260 270729; mike@ conformance-services.com; www.conformance-services.com Notified Body number: 1894 Directive: 2004/108/EC Electromagnetic compatibility

NOTIFIED BODIEs

EMC PROJECTs LTD

IEEE EMC sOCIETY CHAPTER

BLACKWOOD COMPLIANCE LABORATORIEs

Unit 8 Woodfieldside Business Park Pontllanfraith, Blackwood NP12 2DG, United Kingdom; Phone: +44 (0) 1495 229219; Fax: +44 (0) 1495 228331; info@ blackwood-labs.co.uk; www. blackwood-labs.co.uk Notified Body number: 1902 Directive: 2004/108/EC Electromagnetic compatibility

BRITIsH APPROVALs BOARD FOR TELECOMMUNICATIONs

Balfour House Churchfield Road, Walton-on-Thames Surrey KT12 2TD, United Kingdom; Phone: +44 (0) 1932 251200; Fax: +44 (0) 1932 251201; contact@babt.com; www.babt.com Notified Body number: 0168 Directives: 96/98/EC Marine Equipment 99/5/EC Radio and telecommunications terminal equipment 2004/108/EC Electromagnetic compatibility

CCQs UK LTD

Suite B, Regal Court, 112 London Road, Headington, Oxford OX3 9AW UK, United Kingdom; Phone: +44 (0)1865 741 105; Fax: +44 (0)1865 423 693; info@ccqs.co.uk; www.ccqs.co.uk Notified Body number: 1105 Directives: 2004/108/EC Electromagnetic compatibility 2006/42/EC Machinery

interferencetechnology.eu

Holly Grove Farm Verwood Road, Ashley Ringwood BH24 2DB, United Kingdom; +44 (0) 1425 479979; Fax : +44 (0) 1425 480637; mike@emc-project.co.uk Notified Body number : 0886 Directives: 2004/108/EC Electromagnetic compatibility 99/5/EC Radio and telecommunications terminal equipment

ERICssON LIMITED

BETE (UK) Approvals Test Centre Stratford House New Century Park, Coventry CV3 1JG, United Kingdom; Phone: +44 (0) 24 76 562 000; kirit.surelia@ericsson.com Notified Body number: 1916 Directive: 2004/108/EC Electromagnetic compatibility

HURsLEY EMC sERVICEs LTD

Brickfield Lane, Chandler’s Ford Hampshire SO53 4DP, United Kingdom; Phone: +44 (0)23 8027 1111; Fax: +44 (0)23 8027 1144; sales@hursley-emc.co.uk Notified Body number: 1890 Directive: 2004/108/EC Electromagnetic compatibility

INTERTEK TEsTING & CERTIFICATION LTD

Intertek House, Cleeve Road, Leatherhead, Surrey KT22 7SB, United Kingdom; Phone: +44 (0) 1372 370900; Fax: +44 (0) 1372 370999; daniel.griffin@intertek.com; www.intertek.com Notified Body number: 0359 Directives: 89/106/EEC Construction products

interference technology

UNITED KINGDOM

| Resources

2009/142/EC (ex-90/396/EEC) Appliances burning gaseous fuels 92/42/EEC Hot-water boilers 93/42/EEC Medical devices 94/9/EC Equipment and protective systems intended for use in potentially explosive atmospheres 99/5/EC Radio and telecommunications terminal equipment 2000/14/EC Noise emission in the environment by equipment for use outdoors 2006/95/EC (ex-73/23/EEC) Low voltage directive 2004/108/EC Electromagnetic compatibility 2006/42/EC Machinery

LAIDLER CERTIFICATION

Belaisis Business Centre Coxwold Way Billingham, Cleveland TS23 4EA, United Kingdom; Phone: + 44 (0) 8700 111375; Fax: + 44 (0) 8700 111395; enquire@laidler.co.uk; www.laidler.co.uk Notified Body number: 0870 Directives: 2004/108/EC Electromagnetic compatibility 2006/42/EC Machinery

Directives: 2009/105/EC (ex-87/404/EEC) Simple pressure vessels 89/106/EEC Construction products 94/9/EC Equipment and protective systems intended for use in potentially explosive atmospheres 96/98/EC Marine Equipment 96/48/EC Interoperability of the Trans-European high-speed rail system 99/36/EC Transportable pressure equipment 2001/16/EC Interoperability of the trans-European conventional rail system 2008/57/EC Interoperability of the rail system within the Community (Recast) 2004/108/EC Electromagnetic compatibility 2006/42/EC Machinery

MIRA LIMITED

Watling Street, Nuneaton Warwickshire CV10 0TU, United Kingdom; Phone: +44 (0) 247 635 5482; Fax: +44 (0) 247 635 8482; certification@mira.co.uk; www.mira.co.uk Notified Body number: 0888 LLOYD’s REGISTER VERIFICATION LIMITED Directives: 89/106/EEC Construction products 71 Fenchurch St., London EC3M 4BS, United Kingdom; +44 99/5/EC Radio and telecommunications terminal equipment (0)24 7651 8612; Fax: +44 (0) 24 7630 5854; ecdirectives@lr.org; 2000/14/EC Noise emission in the environment by equipment www.lr.org use outdoors Kemtron Europe 10:04 Page 1 Notified Body number:EMC 0038Guide.qxd:Layout 1 3/6/10 for 2006/95/EC (ex-73/23/EEC) Low voltage directive 2004/108/EC Electromagnetic compatibility 2006/42/EC Machinery

MMRA LTD

Manufacturers of EMI gaskets, components and environmental seals and supply them FAST...

...a signal feat.

Devon House 12-15 Dartmouth St., London SW1H 9BL, United Kingdom; Phone: +44 (0)20 7340 2267; Fax: +44 (0)20 7233 0574; dave.weaver@mottmac.com Notified Body number: 2192 Directive: 2004/108/EC Electromagnetic compatibility

RFI GLOBAL SERVICES LTD

Pavilion A, Ashwood Park, Ashwood Way, Basingstoke RG23 8BG, United Kingdom; Phone: +44 (0) 1256 312000; Fax: +44 (0) 1256 312001; contactus@ rfi-global.com; www.rfi-global.com Notified Body number: 0889 Directives: 99/5/EC Radio and telecommunications terminal equipment 2004/108/EC Electromagnetic compatibility 1999-94-EC Vehicle Directive

SAFENET LIMITED

With over 30 years experience who puts the customer first, providing solutions to emc and environmental sealing issues.

Service, Solution, Satisfaction. tel: +44 (0)1376 348115 • fax: +44 (0)1376 345885 email: info@kemtron.co.uk 18

Denford Garage, Denford, Kettering, Northants NN14 4EQ, United Kingdom; Phone: +44 (0) 1832 732 174; office@safenet.co.uk; www.safenet.co.uk Notified Body number: 1674 Directives: 2006/95/EC (ex-73/23/EEC) Low voltage directive 2004/108/EC Electromagnetic compatibility 2006/42/EC Machinery

SAI GLOBAL ASSURANCE SERVICES LTD

Winterhill House Snowdon Drive, Milton Keynes MK6 1AX, United Kingdom; Phone: +44 (0) 1908 249912; Fax: +44 (0) 1908 609825; product@saiglobal.com;

interference technology Europe emc guide 2011

Resources | UNITED KINGDOM

www.saiglobal.com Notified Body number: 2056 Directives: 2009/105/EC (ex-87/404/EEC) Simple pressure vessels 89/106/EEC Construction products 89/686/EEC Personal protective equipment 2006/95/EC (ex-73/23/EEC) Low voltage directive 2004/108/EC Electromagnetic compatibility 2006/42/EC Machinery

TRaC TELECOM & RADIO LTD

Unit E South Orbital Trading Park Hedon Road, Hull HU9 1NJ, United Kingdom; Phone: +44 (0)1482 801801; Fax: +44 (0)1482 801806; ken.anderson@tracglobal.com; nigel.parrott@tracglobal.com; www.tracglobal.com Notified Body number: 1321 Directives: 99/5/EC Radio and telecommunications terminal equipment 2006/95/EC (ex-73/23/EEC) Low voltage directive 2004/108/EC Electromagnetic compatibility

SAMSUNG ELECTRONICS EURO QA LAB

Blackbushe Business Park Saxony Way, Yateley Hampshire GU46 6GG, United Kingdom; Phone: +44 (0)1252 863 800; Fax: +44 (0)1252 863 805; s.colclough@samsung.com Notified Body number: 1891 Directive: 2004/108/EC Electromagnetic compatibility

TUV PRODUCT SERVICE LTD

SGS UNITED KINGDOM LIMITED

South Industrial Estate Bowburn, County Durham DH6 5AD, United Kingdom; Phone: +44 (0) 191 377 2000; Fax: +44 (0) 191 377 2020; keith.hutchinson@sgs.com; www.uk.sgs.com Notified Body number: 0890 Directives: 99/5/EC Radio and telecommunications terminal equipment 2004/108/EC Electromagnetic compatibility

TECHNOLOGY INTERNATIONAL (EUROPE) LTD

56 Shrivenham Hundred Business Park Shrivenham, Swindon Wiltshire SN6 8TY, United Kingdom; Phone: +44 (0) 1793 783 137; Fax: +44 (0) 1793 782 310; sales@iti.co.uk; www.iti.co.uk Notified Body number: 0673 Directives: 99/5/EC Radio and telecommunications terminal equipment (31/12/2090) 2006/95/EC (ex-73/23/EEC) Low voltage directive 2004/108/EC Electromagnetic compatibility 2006/42/EC Machinery

3C TEST LIMITED

Silverstone Technology Park Silverstone Circuit, Silverstone Northamptonshire NN12 8GX, United Kingdom; Phone: +44 (0)1327 857500; Fax: +44 (0)1327 857747; sales@3ctest.co.uk; www.3ctest.co.uk Notified Body number: 1889 Directive: 2004/108/EC Electromagnetic compatibility

Octagon House Concorde Way Segensworth North, Fareham Hampshire PO15 5RL, United Kingdom; Phone: +44 (0)1489 558230; Fax: +44 (0)1489 570586; info@tuvps.co.uk; www. tuvps.co.uk Notified Body number: 1895 Directives: 2004/108/EC - Electromagnetic compatibility 2006/96/EC – Low Voltage 93/42/EEC – Medical Devices 90/385/EEC – Medical Devices – Active Implantable 98/79/EC – Medical Devices – In Vitro Diagnostic 1999/5/EC – R&TTE

YORK EMC SERVICES (2007) LTD

Market Square University of York, Heslington York YO10 5DD, United Kingdom; Phone: +44 (0) 1904 434440; Fax: +44 (0) 1904 434434; enquiry@yorkemc.co.uk; www.yorkemc.co.uk Notified Body number: 1892 Directive: 2004/108/EC Electromagnetic compatibility

other Commission for Communications Regulation

Block DEF, Abbey Court, Irish Life Centre, Lower Abbey Street, Dublin Ireland; +353 1 804 9610; Fax: +353 1 804 9671; Gerard Costello, gerard.costello@comreg.ie

Environmental and Technical Regulation

Department of Trade and Industry (DTI) 151 Buckingham Palace Road, UK-London SW1W 9SS; +44 171 215 13 49; Fax: +44 171 215 13 40; Peter Howick, peter.howick@ berr.gsi.gov.uk

TRaC EMC & SAFETY LTD

100 Frobisher Business Park Leigh Sinton Road, Malvern Worcestershire WR14 1BX, United Kingdom; Phone: +44 (0) 1684 571000; Fax: +44 (0) 1684 571701; test@ tracglobal.com; www.tracglobal.com Notified Body number: 0891 Directives: 94/9/EC Equipment and protective systems intended for use in potentially explosive atmospheres (31/12/2090) 99/5/EC Radio and telecommunications terminal equipment 2000/14/EC Noise emission in the environment by equipment for use outdoors 2006/95/EC (ex-73/23/EEC) Low voltage directive 2004/108/EC Electromagnetic compatibility 2006/42/EC Machinery interferencetechnology.eu

Montrose Compliance Services, Inc. Electromagnetic Compatibility and Product Safety

Mark I. Montrose Consulting and Design Services Seminars (In-house/Private) Printed Circuit Board Layout and Design for SI/EMI/EMC In Situ CE Test Laboratory (ISO 17025 Assessed) Specializing in ITE and Industrial Products for CE Compliance

www.montrosecompliance.com 2353 Mission Glen Drive Santa Clara, CA 95051-1214

and FAX +1 (408) 247-5715 mmontrose@earthlink.net

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United Kingdom

European EmC Directives The United Kingdom’s interpretation of European EMC Directive 2004/108/EC and the policy and structure of the policing and enforcement of the UK EMC Regulations

Graham mays EMC Consultant Lanark, United Kingdom

aBsTraCT his article initially describes the concept of European Directives and their legal status. It then discusses the European EMC Directive 2004/108/EC [EMCD] and how the United Kingdom interprets the EMCD’s requirements during its transposition into the UK EMC Regulations [EMCR]. Finally, it reports on the policy and structure of the policing and enforcement of the EMCR, and how this varies across the UK. The article will only concentrate on the main points of both the EMCD and the EMCR; and it is beyond its scope to describe all the possible exceptions and exclusions. A European Directive is a legislative act of the European Union, which requires Member States [MS] to achieve a particular result without dictating the means of achieving that result. Directives normally leave MS with a certain amount of leeway as to the exact national rules to be adopted. Thus individual MS can, and do, enact subtly different national rules. When adopted, Directives give MS a timetable for the implementation of the intended outcome. MS are required to make changes to their laws — commonly referred to as “transposition” — in order for the Directive to be implemented correctly. If a MS fails to pass the required national legislation

inTERfEREnCE TEChnoLogy

the European Commission may initiate legal action against the MS in the European Court of Justice. Directives were originally conceived only to be legally binding on MS of the E.U. and not on Organisations, Companies or Individuals. The latter were bound by the national laws that were transposed from the Directives. However, the European Court of Justice has since developed the doctrine of “direct effect” where unimplemented or badly implemented Directives can actually have direct legal force. The court found that MS could be liable to pay damages to individuals and companies who had been adversely affected by the nonimplementation of a Directive. The EMCD was adopted on 15 December 2004 and published in the Official Journal (OJ) of the European Union on 6 January 2005. It replaces and repeals Directive 89/336/EC, the previous EMCD. Considering that EMC is a complex high technology topic it is quite remarkable that the EMCD covers its legislation with this non technical document. The EMCD was originally adopted by the E.U. to harmonise its national laws for protection against electromagnetic disturbance in order to “guarantee the free movement of electrical and electronic products” without lowering existing justified levels of protection in the MS. It is important to note at the start, that unlike other “New Approach” Directives, this Directive does NOT deal with safety. In other words, compliance EURopE EMC gUiDE 2011

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United Kingdom with the EMCD does not mean that a product is “safe” to use. The fundamental aims of the EMCD are enshrined in the “essential requirements”, and they are so important that they are stated verbatim below 1. Protection requirements Equipment shall be so designed and manufactured, having regard to the state of the art, as to ensure that: a) the electromagnetic disturbance generated does not exceed the level above which radio and telecommunications equipment or other equipment cannot operate as intended; b) it has a level of immunity to the electromagnetic disturbance to be expected in its intended use which allows it to operate without unacceptable degradation of its intended use. 2. Specific requirements for fixed installations Installation and intended use of components A fixed installation shall be installed applying good engineering practices and respecting the information on the intended use of its components, with a view to meeting the protection requirements set out in Point 1. Those good engineering practices shall be documented and the documentation shall be held by the person(s) responsible at the disposal of the relevant national authorities for inspection purposes for

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inTERfEREnCE TEChnoLogy

E u r o p E a n EMC D i r E C t i v E s

as long as the fixed installation is in operation. You will notice that there are specific requirements for fixed installations in addition to all other apparatus. This is so because, whereas apparatus may move freely within the Community - a prime motivator for the EMCD’s adoption; fixed installations on the other hand are installed for permanent use at a predefined location, but of course they could still exceed the required protection requirements. Does the EMCD state how a manufacturer can show compliance? Yes, by simply saying that compliance must be shown by conducting an electromagnetic compatibility assessment of the product. Whilst it doesn’t mandate how this assessment should be conducted, it does clearly promote using the relevant European harmonised standards by declaring that the correct application of these standards “shall be equivalent” to the carrying out of the assessment. This “standards route” to compliance as it is known only works with standards that are adopted by the various European standardisation bodies, European Committee for Standardisation (CEN), European Committee for Electro-technical Standardisation (CENELEC) and European Telecommunications Standards Institute (ETSI). CEN, CENELEC and ETSI are recognised as the competent institutions in the field of the EMCD for the adoption of harmonised standards. Once the reference to such a standard has been published in the OJ, compliance with it should raise a “presumption of conformity” with the relevant essential requirements, although other means of demonstrating such conformity should be permitted. Although conformity assessment should be the responsibility of the manufacturer, without any need to involve an independent conformity assessment body, manufacturers should be free to use the services of such a body if they so choose. The whole process of conformity assessment, followed if appropriate by CE Marking and a Declaration of Conformity etc., is a “self certification” exercise. Article 3 instructs MS to take “all appropriate measures” to ensure that equipment is placed on the market and/or put into service only if it is compliant “when properly installed, maintained and used for its intended purpose”. This clearly extends the manufacturers responsibilities into the lifetime of the product whilst protecting them from any misuse. Article 8, the ‘CE’ marking article states that compliant products must carry the CE mark as proof of compliance; whilst Annex IV describes the Technical Documentation and EC Declaration of Conformity that must be produced along with the CE mark. Due to their specific characteristics, fixed installations need not be subject to the affixation of the ‘CE’ marking or to the Declaration of Conformity. Finally Article 16 deals with the Transposition of the EMCD by instructing MS to “adopt and publish the laws, regulations and administrative provisions necessary to comply with this Directive by 20 January 2007.” EURopE EMC gUiDE 2011

United Kingdom

M ay s

As with the previous EMCD the EU has published and continually updates a “Guide for the EMC Directive 2004/108/EC” last updated 8th February 2010 (at time of writing). It is beyond the scope of this article to include this document in any detail; but it is worth noting very briefly that the document starts with a significant number of disclaimers and caveats. Chief amongst those are: • These guidelines assist in the interpretation of the Directive but do not substitute for it; they explain and clarify some of the most important aspects related to its application. • These Guidelines are publicly available, but they are not binding in the sense of legal acts adopted by the Community. The legally binding provisions are those transposing the EMC Directive at national level. • The Commission accepts no responsibility or liability whatsoever with regard to the information in this guide. • This information is not necessarily comprehensive, complete, accurate or up to date; • This information is not professional or legal advice. It is noteworthy that whilst the EMCD itself runs to 14 pages, the associated “guidance” document runs to 67 pages! The EMCD was transposed into UK law by the publication of STATUTORY INSTRUMENTS 2006 No. 3418 ELECTROMAGNETIC COMPATIBILITY, known as The Electromagnetic Compatibility Regulations 2006 [EMCR]

There are, in fact, contained within this Statutory Instrument some 65 Regulations divided into 7 Parts. We will concentrate on the parts that add, enhance or are different to the requirements of the EMCD. Part I sets out the implementation of the regulations. These Regulations implement the current EMCD and they revoke and replace the 2005 regulations. Regulations 4 and 5 impose the same “essential requirements” concerning the EMC of equipment as the EMCD This Part does contain some important definitions including:• “authorised representative” means a person established within the Community and appointed by the manufacturer (whether or not established in the Community) to act on his behalf; • “responsible person” means— • (g) in relation to apparatus (i) the manufacturer established in the Community; (ii) the manufacturer’s authorised representative; or iii) where the manufacturer is not established in the Community and he has not appointed an authorised representative, the person who places the apparatus on the market or puts it into service; (h) in relation to a fixed installation, the person who, by virtue of their control of the fixed installation is able to determine that the configuration of the installation is such that when used it complies with the essential re-

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United Kingdom quirements N.B. The above definitions clearly mean that the UK authorities will hold somebody who is resident in the E.U. as being responsible for CE Marking and all relevant Documentation. • “equipment” means any apparatus or fixed installation Part II covers the application of the Regulations and the exclusions. These are fundamentally the same as the EMCD. Part III sets out the general requirements relating to equipment. Regulations 15 and 16 state that equipment may not be placed on the market/ put into service unless the essential requirements are complied with under the same conditions as the EMCD. Regulations 18, 19 and 20 repeat the EMCD’s methodology for showing compliance, including the optional use of a notified body. Regulations 21, 22 and 23 cover CE marking and the issue and retention of an EC declaration of conformity by the “responsible person.” Part IV sets out the provisions relating to the appointment and functions of United Kingdom notified bodies. This part is outside of the scope of this article. Part V sets out the general requirements relating to the putting into service of fixed installations. It explains the exemptions for certain equipment and the required evidence of compliance. (Regulations 34, 35 + 36) These are all in direct accord with the EMCD. To better understand some of the complexities of the powers of both the courts and the enforcement authorities in the UK, it is necessary to have a basic understanding of the structure of the United Kingdom. The UK is a political and economic union of four previously independent countries, England, Scotland, Wales and Northern Ireland. Despite being in a very close and long standing union, each of these countries retains, amongst other things, it own legal system - thus complicating any UK Rules and Regulations; as you will see. Another complication is that the term “Great Britain” is commonly used instead of the word “UK”. However they are NOT the same at all, in that Northern Ireland is NOT part of Great Britain but obviously is part of the UK. Part VI sets out provisions relating to the enforcement of the Regulations. Regulation 37 appoints the enforcement authorities as follows: • (1)(a) in Great Britain: • (i) OFCOM [Office of Communications] in connection with the the protection of the radio spectrum; and (ii) local weights and measures authorities; • (1)(b) in Northern Ireland: • (i) OFCOM as above; and (ii) the Department of Enterprise, Trade and Investment. • (2) The Secretary of State may enforce these Regulations with the exception of electricity meters; which have their own authorities. So what is the remit and operating principles for the above authorities. It can easily be seen that the major portion of enforcement falls upon local weights and measures authorities; known as Trading Standards Officers [TSO]. TSO are “local government” employees reporting to local county and borough councils. Local government is largely independent from central government; therefore the UK 24

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E u r o p E a n EMC D i r E C t i v E s

Government has no direct authority over them. A very large part of a TSO workload is determined by the level of complaints received from the local community on a very broad range of trading standards. Few, if any TSO have received any particular training concerning these regulations, and no additional budget was allocated to local councils for this enforcement activity. The consequences are that enforcement is “complaint driven”, has a very low priority and varies between each and every local council. The above authorities have the following powers: • Make test purchases • Enter any premises other than a person’s residence to inspect equipment or documentation. • Seize and detain any equipment, or incapacitate any fixed installation, where reasonable grounds exist of noncompliance. • Seize and detain any equipment and/or documentation that is required (i) as possible evidence (ii) by an authority from another MS (iii) which has reasonable grounds for suspecting that it may be liable to be forfeited • Require any person having authority to do so to open any container; and/or themselves open or break open any such container • A warrant may be issued by a Justice of the Peace [JP], if he is satisfied by any written information on oath, where it is suspected that an offence has been committed on any premises [including residential property] giving authority to enter the premises, if need be by force. Note 1 - In Scotland reference to the JP should read a Sheriff and “any written information on oath” should read “evidence on oath”. Note 2 - In Northern Ireland reference to “any written information on oath” should read “any complaint on oath”. • Issue Compliance notices. These notices consist of either (i) a suspension notice or (ii) notice of court proceedings. In the case of (ii) this can only be done if previous notice in writing has been served upon the responsible person and the non-conformity continues beyond a specified time. A suspension notice can be issued on the user or responsible person where an enforcement authority has reasonable grounds for suspecting non-compliance; this suspends the manufacture/use etc. of the equipment for not more than six months. • Require production of all relevant documents and information which includes an EC declaration of conformity, or technical documentation, or evidence of compliance, or such information as he may reasonably require from the (i) “responsible person” or (ii) any person who is in possession of such documentation. Any person shall be guilty of an offence if they • Place on the market or put into service any non-compliant equipment • Contravene a suspension notice • Make any statement which he knows is false or misleading • Falsely or wrongfully affixes the CE Mark • Issues a false, improper or incomplete EC declaration of conformity • Intentionally obstructs, fails or refuses to comply with any requirement or fails or refuses to give any other assisEURopE EMC gUiDE 2011

tance to any officer of an enforcement authority ernment control, no mandatory surveillance activity and no • Falsely pretend to be an officer of an enforcement support for testing etc.. Any occasional enforcement activauthority ity that does occur, is as a result of the relevant authority • Fail to retain, or make available to the enforcement receiving a “complaint” of interference. authority on request, any relevant documentation or evidence of compliance. Graham Mays has spent most of his 48 year career in EMC and RF & Regulation 52 provides for a defence of “due diligence.” Microwave Communications. After spending 12 years as a CommunicaThis is an unusual rule in that it provides for a defence tions Engineer in the Royal Air Force, he went on to work in a variety of against a prosecution! senior positions for leading International Companies including Rohde & In proceedings against any person for an offence, it Schwarz, Chase EMC (now part of Teseq), and the Intertek Group. shall be a defence for that person to show that he took all For more than 10 years, Graham has run his own successful sales reasonable steps and exercised all due diligence to avoid and consultancy company; enjoying particular success as the European committing the offence. Distributor for the TILE EMC Software suite. He is currently enjoying We are advised by UK Government sources that the developing a web based training and consultancy business at www.findawording “all reasonable steps” was included to ensure that training-course.co.uk. there was no discrimination against very small enterprises - e.g. it was thought to be an unreasonable burden that a very small enterprise should be expected to undertake the same intense EMC assessment as a very large multi-national TELL US WHAT YOU THINK company. The difficulty with this defence is there is no guidance available as to what is “reasonable”, except for any Your comments and feedback are very important precedent set in previous court decisions! to us. Please go to www.interferencetechnology.eu If a guilty verdict is declared in court, the court has the and fill out a brief survey that will help us improve following powers: the EMC Europe Guide. • Penalties - Depending upon the offence, the guilty party can be either or both: • (i) imprisoned for a term not exceeding three months; or (ii) fined not exceeding level 5 on the standard scale. In addition he/she can be made to remedy the non-compliance. • Forfeiture - In England, Wales and Northern Ireland a Magistrates Court has the authority to make an order for the forfeiture of any noncompliant equipment . • In Scotland an application for forfeiture is The most ergonomic ESD guns on the market, designed made by the procurator-fiscal to the court. If to ensure the highest level of comfort when testing, and found proven the Sheriff then issues an order provide outstanding performance due to the high quality for forfeiture. All forfeit equipment is either: (i) design by the pioneers of EMC test equipment. most commonly destroyed, or maybe (ii) sent for repairing or reconditioning or (iii) scrapped. • Additional Costs - The court may order the > 16 and 30 kV guilty party, in addition to all fines and other > All in one design financial losses, to reimburse an enforcement > No base unit authority for any expenditure which has been > Touch screen incurred by that authority in investigating the > Modular offence, and, in having the apparatus tested. > Meets all latest Part VII covers the Miscellaneous and Supplestandards mental Regulations > Battery and mains operation sUmmary > Optical interface When the original EMCD was adopted by the EU, > Smart multi-function key the UK already had some “interference” regulations > Automatic polarity switching in place which the UK Government of the day con-

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sidered adequate. Thus the new requirements were seen as both “excessive” and “potentially damaging” to the UK electronics industry. To overcome this the Government decided that whilst they had no choice in passing new legislation, they would take a “light touch” approach to its enforcement. Thus the enforcement system described above, which continues to this day, has no central Govinterferencetechnology.eu

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HEMP Filter Design To Meet MIL-STD-188-125 PCI Test Requirements

Antoni Jan Nalborczyk Technical Director MPE Limited Liverpool, United Kingdom

hilosophies for the best method of HEMP protection have been around for a long time. MILSTD-188-125 -1 and -2 are more recent specifications for defining requirements for HEMP protection. They specify PCI (pulse current injection) testing techniques to demonstrate the integrity of the protection system, but require specialist test equipment capable of injecting high voltage high current pulses. The residual current let-through of the protection system plus other parameters are monitored as a measure of the effectiveness and compliance of the protection system. Because the demand for HEMP protection systems is specialised and not high volume, the practical method of meeting the MIL-STD-188-125-1

Figure 1. E1 pulse injection testing.

26â&#x20AC;&#x192;

and -2 specifications has normally been based on adapting certain types of standard catalogue EMI facility filters. However, most catalogue EMI filters are designed for CW insertion loss performance, so are usually not ideal for pulse applications. The approach described here is to design filters to meet a pulse attenuation performance rather than to meet an insertion loss specification. This enables a filter circuit and components to be used which are optimised for pulse applications to achieve a more efficient design with a good pulse performance. This article describes the design process and validation of the design by testing using the MIL-STD-188-125 specified pulses. I. INTRODUCTION MIL-STD-188-125-1 and -2 specifications [1] & [2] cover HEMP protection requirements for fixed and transportable ground based installations respectively. They define three PCI pulse types for testing the integrity of the protection system, E1 (short pulse) 20/500ns 2.5kA peak, E2 (intermediate pulse) 1.5/4000Âľs 250A peak, and E3 (long pulse) 0.2/20s 1000A peak. The filter design discussed in this article addresses protection against the E1 and E2 pulses. Different techniques are needed to address the E3 pulse. The procedure for checking compliance of a HEMP filter with the specification for the E1 pulse is to inject the pulse into the front end of the filter and monitor the residual current flowing through a 2 ohm resistive

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H EMP F i lt e r D e s i g n

MPE Laboratory Test Pulses

MIL-STD-188-125 E1 Pulse

Pulse Shape (Double exponential)

8/20µs~1Ω source (high energy) 5/200ns (low energy)

20/500ns 60Ω source

Peak Applied Current

Up to 5kA line to ground (8/20µs) <1kA (5/200ns)

2.5kA line to ground 5kA with coupled lines

Peak Applied Voltage

Up to 5kV (8/20µs) ~12kV (5/200ns)

Up to 150kV (300kV for 5kA)

Residual Let-through Current

Measure residual voltage and residual current for comparison with MIL STD

10A into 2Ω load

Table 1. Comparison of MPE Laboratory pulse tests with MIL-STD-188-125 E1 pulse.

Figure 2. Initial circuit configuration.

load connected between the output terminal and earth – see figure 1. For higher current filters the resistive load is replaced by one of value given by V/I where V and I are the voltage and current ratings of the filter. The simplified circuit shown is indicative only to show the key lumped elements. For the E1 pulse, the generator source resistance is specified as 60 ohms as shown in Figure 1, so the peak applied voltage supplied by the generator needs

Figure 3. MPE pulse test results on test circuit. Trace 1 = Voltage across varistor = 880V peak Trace 2 = Residual voltage across 2 ohm load = 134V peak Trace 3 = Applied 8/20µs current pulse = 2360A peak Trace 4 = Residual current through 2 ohm load = 65A peak

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to be 150kV. The maximum acceptable residual current through the 2 ohm load is 10A peak, and there are also limitations on residual pulse risetime and energy. For the E2 test, pulses are injected in a similar manner but there is no requirement to monitor the residual pulse. However, the filter must survive the pulse without damage. To strictly comply with the requirements of the MIL-STD, every filter

needs pulse testing both before and after installation. II. NORMAL APROACH TO HEMP PROTECTION It is usually considered that there is insufficient demand for EMP protection systems to justify dedicated designs, so it is normal to select a standard catalogue EMI filter and adapt it as necessary to meet the requirement. It is generally recognised that it is best to use an inductive input filter where possible and fit high energy transient suppressors at the front end to provide the pulse protection. When tested, the pulse attenuation performance offered may not be sufficient to meet the MIL-STD requirement, so remedial measures in the form of additional filter and suppression components may be needed to ensure compliance. Although with this approach there is little initial design cost, there may be major hidden costs in terms of the remedial action required to achieve compliance. III. DEDICATED DESIGN APPROACH Because most catalogue EMI filters are designed for CW insertion loss performance rather than pulse handling, it was decided to design a range of filters from first principles to suit the pulse requirement of MILSTD-188-125, i.e. to attenuate the magnitude of a 2500A 20/500ns E1 pulse to less than 10A, and to tolerate the E2 pulse. The transient suppressor, and filter capacitive and inductive components were treated as an integrated solution. Circuits were built and tested and pulse currents and voltages were monitored at each stage in the circuit to analyse the effect and contribution of each component and also the interaction between components. IV. DESIGN PHILOSOPHY It was not practical to carry out development testing using the defined MIL-STD pulse waveforms because of their specialist nature, so it was necessary to use commercially available test equipment. This comprised an 8/20µs pulse tester for bulk current handling tests with a pulse current of up to 5kA, and a 5/200ns pulse tester for risetime checks. The energy content of the 8/20µs pulse is higher than the MILEUrope emc guide 2011

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a. Standard performance design, 20dB 10kHz, 80dB 10MHz – 1GHz.

b. Enhanced performance design, 50dB 10kHz, 100dB 40kHz – 1GHz.

Figure 4. Three final HEMP filter designs.

c. Very High Performance Design, 100dB 10kHz – 10GHz.

Figure 4abc. Three final HEMP filter designs.

STD E1 pulse but its risetime is much slower. The 5/200ns pulse was used to demonstrate the speed of response of the system although its energy was very low, so most testing was concentrated on the 8/20µs pulse with a view to meeting the E1 residual current limit of 10A. A comparison of MPE laboratory testing capability compared to the MIL-STD pulse requirement is given in table 1. To meet the requirements of the E1 and E2 pulses, many types of transient suppression device were evaluated including spark gaps, metal oxide varistors (MOV’s), and silicon avalanche diodes. The varistor was finally chosen for this filter design because of its good combination of reaction time, when mounted effectively, and energy handling characteristics, making it suitable for both the E1 and E2 pulse requirements. V. DEVELOPMENT TESTING Circuits were built and tested based on the circuit shown in figure 2, as it was initially thought that two stages of transient suppression would be needed to meet the difficult residual pulse current requirement of the MIL-STD. Different values of capacitance and inductance and different types of transient suppressor were tried in more than fifty different circuit configurations. Each time the current and voltage in each part of the circuit was monitored. 30

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H EMP F i lt e r D e s i g n

When testing the initial circuit, an injected 8/20µs pulse current, I1 in figure 2, of 2280A was reduced to a residual current, I2, of 256A in the 2 ohm load resistor. Subsequently, by carefully adjusting the filter components, the second stage of transient suppression was eliminated, and the circuit was further improved and simplified, resulting in a 65A residual current for an injected pulse current of 2360A. Plots of the pulses measured on the improved circuit are shown in figure 3. It is not easy to read across the laboratory 8/20µs pulse test results to the MIL STD E1 pulse because of the difference in energy content of the pulse, the non-linear behaviour of the filter inductors, saturation of inductor core material, and parasitic capacitance of the inductors. However, for the 8/20µs pulse, a significantly higher residual current than 10A was expected due to the energy content of the pulse. What was not certain was what value of residual current for the 8/20µs waveform would relate to the 10A requirement when testing with the proper MIL-STD E1 waveform. Because there is no filter insertion loss requirement within MIL-STD-188-125, a standard design was developed to be commensurate with the MIL-STD-188-125 shielding attenuation requirement of 20dB at 10kHz and 80dB from 10MHz to 1GHz. Accepting that there would be other applications requiring higher insertion loss to satisfy supplementary requirements such as EMI, two additional designs with higher insertion loss performance, were also developed. These designs are shown in Figure 4. Figure 5 shows the test set-up of one of the three final designs in a screened test room in the MPE laboratory. The current and voltage monitoring probes and also the two pulse testers can be seen in the photograph. VI. ACCEPTANCE TESTING After completing the filter designs and testing in the MPE laboratory, it was necessary to validate the designs by subjecting them to the correct MIL-STD pulses. This procedure is described in MIL-STD-188-125 as Acceptance Testing.

Figure 5. Pulse test set-up. EUrope emc guide 2011

Solid State Tetrode Tube and Combination Amplifiers Model Number

Freq Range (MHz)

Min Pwr Out (Watts)

Min Sat Gain (dB)

M/TCCX/SCCX Series • .01-220 MHz SCCX300 .01-220 300 55 SCCX500 .01-220 500 57 M404 .01-220 500 57 M406 .01-220 1000 60 TCCX2000 .01-220 2000 63 TCCX2200 .01-220 2200 63 TCCX2500 .01-220 2500 64 CMX/SMX Series • .01-1000 MHz

SMX301 SMX302 SMX303 SMX501 SMX502 SMX503 CMX10001 CMX100010

.01-1000 300/100 .01-1000 300/200 .01-1000 300/300 .01-1000 500/100 .01-1000 500/200 .01-1000 500/300 .01-1000 1000/100 .01-1000 1000/1000

55/50 55/53 55/55 57/50 57/53 57/55 60/50 60/60

Solid State Amplifiers

Microwave Solid State and TWT Amplifiers Model Number

Freq Range (GHz)

Min Pwr Min Sat Out Gain (Watts) (dB)

T-200 Series • 200-300 Watts CW 1-21.5 GHz T251-250 1-2.5 250 54 T82-250 2-8 250 54 T188-250 7.5-18 250 54 T2118-250 18.0-21.7 250 54 T-500 Series • 500 Watts CW 1-18 GHz T251-500 1-2.5 500 57 T7525-500 2.5-7.5 500 57 T188-500 7.5-18 500 57 MMT Series • 5-150 Watts, 18-40 GHz T2618-40 18-26.5 40 46 T4026-40 26.5-40 40 46 S/T-50 Series • 40-60 Watts CW 1-18 GHz S21-50 1-2 50 47 T82-50 2-8 50 47 T188-50 8-18 50 47

Model Number

Freq Range (MHz)

Min Pwr Out (Watts)

Min Sat Gain (dB)

SMCC Series • 200-1000 MHz SMCC350 200-1000 350 55 SMCC600 200-1000 600 58 SMCC1000 200-1000 1000 60 SMCC2000 200-1000 2000 63 SMC Series • 80-1000 MHz SMC250 80-1000 250 54 SMC500 80-1000 500 57 SMC1000 80-1000 1000 60 SMX-CMX Series • .01-1000 MHz SMX100 .01-1000 100 50 SMX200 .01-1000 200 53 SMX500 .01-1000 500 57 SVC-SMV Series • 100-1000 MHz SVC500 100-500 500 57 SMV500 500-1000 500 57

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Nalborczyk

United Kingdom the residual current for different applied peak currents can be seen graphically in figure 6. The residual currents are significantly better than those expected from a modified catalogue filter. The higher performance circuits gave even better pulse performance than the standard design as well as offering a higher insertion loss. The testing as described above was carried out on filters of 16A current rating. Further tests were subsequently carried out on a range of filter designs in current ratings from 6A to 200A, all of which passed the tests in a similar manner to the 16A filters. As the filter rated current increases, it becomes more difficult to achieve the residual current requirement. However, in all designs up to 200A current rating, a residual current lower than 4.5A was achieved providing a comfortable safety margin within the specification requirement.

Figure 6. Measured residual current response for various E1 pulses injected into the standard filter circuit.

VIII. CONCLUSIONS The final standard filter design, as shown in figure 7, proved to offer an extremely low residual pulse current performance, much better than would be expected from an adapted catalogue filter. This was achieved in a smaller and lighter package than would be possible for a modified catalogue EMI filter. The circuit design also provided additional benefits of lower leakage current and lower heat dissipation compared to normal catalogue EMI filters. The smaller size and weight provide benefits of ease of installation and a potentially more cost effective solution to HEMP protection. Most EMP protection applications will benefit from such a design but the ones which will benefit the most are those where size and weight are critical parameters. These include mobile shelters, vehicles, telecoms cabinets, and Homeland Defence. Applications which only need compliance with MIL-STD-188-125-1 or -2 can benefit from the small size and low weight of the standard circuit. ApplicaFigure 7. Final design of standard performance HEMP filter cut away to show tions which need additional insertion loss perforMOVs in the input terminal compartment. mance to satisfy EMI, shielding or other requirements can still benefit from the good pulse performance of All three new designs were subjected to the correct MIL- the new design philosophy with one of the higher perforSTD E1 and E2 pulses at an independent test laboratory. mance circuits. This consisted of applying the E1 pulse at various current levels up to 2.5kA to check that the design worked over a IX. SUMMARY range of pulse currents. The residual current was monitored A dedicated HEMP power filter design can give better along with the dI/dt (risetime) and root integral (energy pulse performance than an adapted catalogue EMI filter and content) of the residual pulse. The circuits were then sepa- provide additional benefits in terms of size, weight, leakage rately subjected to the E2 pulse. The insertion loss of the current, power dissipation and cost-effectiveness. filters and varistor parameters were measured before and after application of the pulses as a check that the circuits REFERENCES had not suffered degradation as a result of either the E1 or • [1] MIL-STD-188-125-1 17 July 1998 “High-Altitude Electromagnetic the E2 pulse testing. Pulse (HEMP) Protection For Ground Based C4I Facilities Performing

VII. ACCEPTANCE TESTING RESULTS All three designs were found to pass all tests very comfortably, being within the limits by a large safety margin. The most important parameter is the residual current and even the standard circuit achieved a residual current of less than 1.5A with a 2.5kA injected pulse, compared with the specification requirement of less than 10A. The results of 32

Critical, Time-Urgent Missions, Part 1 Fixed Facilities” • [2] MIL-STD-188-125-2 3 March 1999 “High-Altitude Electromagnetic Pulse (HEMP) Protection For Ground Based C4I Facilities Performing Critical, Time-Urgent Missions, Part 2 Transportable Systems” JAN NALBORCZYK graduated from Birmingham University with a BSc degree in Physics in 1973. He has worked for MPE Limited since 1979 and is currently Technical Director for MPE Limited in Liverpool, UK.

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JeDeC and tape & Reel issues Supply chain materials validation for the prevention of non-conforming or suspect counterfeit packaging for in-process manufacturing and long-term storage of Ultra-sensitive (Class 0) ESD devices

RobeRt J. VeRmillion, CPP/Fellow Certified ESD & Product Safety Engineer RMV Technology Group, LLC NASA-Ames Research Center (ARC) Moffett Field, California, USA Editor’s Note: This article is the second part of “The Dip Tube,” which appeared in May in the 2010 Interference Technology EMC Directory & Design Guide. A digital version is available at www.interferencetechnology.com.

ver the past several years, both European- and U.S.-based organizations have sacrificed the traditional “internal auditing process” with over reliance on offshore contract manufacturers, distributors and suppliers to do the right thing. To compound the problem, organizations will accept supplier specifications as adequate proof in utilizing a product within their supply chain. Since it is now common for organizations to utilize Ultra-sensitive (Class 0) devices at <50 volts (Reference 1), the inspection of Ultra-sensitive (Class 0) ESD susceptible parts is very important. However, without special safeguards, the additional handling to remove and repack the product for validation can cause both physical and ESD damage in the process. For parts, including those that are sensitive to static electricity, measures must be implemented to detect, inspect and validate the packaging, as well as the incoming parts. Preventative protection measures against suspect counterfeiting during transport for electronic circuit cards and ESD sensitive devices must be considered. Dog food, medical products, 34

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jewelry, consumer goods and other items have made the news. Three industry sectors are of absolute concern: aerospace & defense, medical device and pharmaceutical drugs. In this segment, the article will focus on two major packaging types that are utilized to protect Ultra-sensitive devices to and from the distributor by the device manufacturers, then received by the customer for in-process manufacturing. To the surprise of aerospace and distributor alike, non-compliant or suspect counterfeit conductive or static dissipative JEDEC Trays and antistatic Tape & Reel (T&R) pose real issues during incoming inspection and manufacturing of Ultra-sensitive ESD devices. In the May edition of the Interference Technology 2010 EMC Directory & Design Guide, non-conformance of antistatic Dip Tube rails was illustrated to compromise compliant ESD sensitive components by using suspect counterfeit, non-conforming or recycled ESD packaging products. Several aerospace engineers stated that this problem had never been considered in developing a Suspect Counterfeit inspection process. In comparison to the pharmaceutical and medical device sectors, aerospace is a relative newcomer to the implementation of anti-counterfeiting measures. In the 1990s, the semiconductor sector incorporated countermeasures to identify suspect counterfeit packaging and materials. By using innovative packaging engineering designs and advanced EURoPE EMC GUiDE 2011

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J E D E C a n D Ta p E & R E E l I s s u E s

ITRS Technology Roadmap for Semiconductors – Electrostatics - 2005

Reference 1. ESD Sensitivity Roadmap from ITRS.

materials to protect ESD-sensitive devices, tampering and substitution was mitigated. Due to proprietary technology sets, many industry sectors do not share information. Whereas some major aerospace organizations may not employ packaging engineers, a major pharmaceutical company could have as many as 50 degreed packaging engineers on staff that develop innovative designs to prevent tampering. In the pharmaceutical sector, some packaging supplier machine centers produce fiberboard and corrugated packaging graphics of high lithographic quality. It is not uncommon for machine centers to cost up to $10 million or more. For suspect counterfeit protective package using innovative materials, RFID antenna circuit lines can be preprinted onto engineered paperboard, post printed or applied during manufacturing. By identification of packaging vendors that supply both pharmaceutical and medical device sectors, Figure 1. (top) JEDEC Tray being validated (bottom left) Tape & Reel (noncompliant storage) (bottom right) Tape & Reels in static shielding bags for compliance Courtesy of Frontier Electronics Systems Corp., OK, USA

the aerospace and defense sectors could reduce costs per unit, especially when the product is space bound and return material authorizations (RMAs) would have no value. Traditionally, the aerospace and defense sectors have relied upon packaging expertise from suppliers or distributors who rely upon their vendors for innovative ideas. In most cases, this does not pose an issue with simple packaging schemes. However, with advanced suspect counterfeit mitigating technologies such as electrostatic shielding corrugated packaging, holographic labels and the real possibility of LEDs printed onto paperboard substrates [1] as countermeasures, a suspect counterfeiter’s efforts can be kept at bay (for now). It is not uncommon for unauthorized substitutions or replacement packaging practices to occur without customer knowledge. On 18-19 November 2010, a Suspect Counterfeit Aerospace & Defense materials and packaging course is scheduled for Oxford University School of Continuing Education. For details, see the ad at the end of this article. “Repackaging ban most powerful tool to prevent counterfeiting in Europe” Phil Taylor, 24 Jun 2008 In-Pharmatechnologist.com “European pharmaceutical manufacturers stepped up calls for a blanket ban on repackaging of pharmaceuticals last week, suggesting that this would be the single most effective way to seal the supply chain for counterfeiting drugs. “As an industry we are prepared to make the necessary investment so that we can track and trace our products. But that will have no value if people are allowed to take and destroy our packaging,” he stressed. Increasingly for the past few years, the author has consulted with both aerospace/defense and space agencies for supplier non-compliance. Products have been placed in quarantine, launches have been delayed and product failures with satellites have been identified. Even though requirements for correct procedures and validation methods are pushed down to the contract manufacturer, countermeasures by the aerospace OEM need to insure that a formalized material qualification process is in place. This process requires a customer to take physical measurements. A frequent occurrence with OEMs, however, is the reliance upon a vendor to resolve corrective actions without proper oversight. Resolution without corrective

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United Kingdom actions may not take place without verification. In 2008, for example, long-term storage issues had contaminated products for a launch. Because the space agency had very little expertise in packaging engineering disciplines, the issue lingered for months when third party packaging engineer-

Figure 2. 2-Point Resistance of JEDEC Tray (failed)

Figure 3. Non-compliant JEDEC Tray charged to +1kV and grounded with tweezers making contact to the leads of ESD sensitive devices to cause a spark as seen in red.

Figure 4. JEDEC Tray Box with non-compliant pink PE foam and failing bubble wrap.

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ing expertise could have put the issue to rest within weeks. Antistat migration was found to be the source of the problem for the space agency. Moreover, there was very little evidence, if any, that the antistat wrap had been tested for contamination and undergone accelerated aging. In fact, the vendor’s product specification sheet appeared to be the only criteria for acceptance. Leadership in clearly defining an Anti-counterfeiting Roadmap must be driven down by the customer! In my opinion, distributor practices must be subjected to physical audits of packaging materials, not just processes, to insure supplier conformance. If a supplier does not have the necessary resources or “know how” to bring innovative methods to the table, the user must define requirements and physically audit the supply chain. CASe StUDY: JeDeC nonConfoRmAnCe Will removal during inspection of ESD sensitive components cause failures if the JEDEC tray is noncompliant or suspect counterfeit? In Figure 2, the black JEDEC tray was not static dissipative and had a 2-point resistance (ANSI/ ESD STM11.13-2004) of 6.2 x 1011 ohms; this finding is insulative or above the limit of 1.0 x 1011 ohms. The packaged components were also found to be suspect. Consequently, it was very unlikely that the suspect counterfeit JEDEC tray packaging was designed to be ANSI/ESD S541-2008 compliant. Thereafter, intimate contact with a metal tweezers tip and the leads of the surface mount device resulted in an ESD event at 561 volts (see Figure 3). The suspect non-shielding corrugated Lock Front Mailer with an antistatic Polyethylene (PE) foam insert measured insulative at 1.09 x 1012 ohms and 1.2 x 1012 ohms for the base and lid (Figure 4). The inner antistatic bubblewrap measured insulative at 1.1 x 1012 ohms and 1.7 x 1012 ohms. Both 2-point and surface resistance readings were insulative. Each measurement was taken between 50%RH to 53.3%RH. This finding is significant since testing for ANSI/ESD S541-2008 compliance or qualification requires 12%RH, +/-3%RH at 730F, +/-50F after 48 to 72 hours of preconditioning. European winter conditions can easily produce environments of <7%RH. One would expect better readings for humidity dependent materials at moderate relative humidities. For example, testing another PE foam sample produced surface resistance readings of 5.1 x 1010 ohms at 50%RH and 1.3 x 1012 ohms (failing) for 12%RH after 48 hours of preconditioning. The aerospace and defense engineer needs to understand that non-conforming or suspect counterfeit packaging materials are a major cause for concern. Compliant ESD sensitive components are at risk if the packaging was qualified by accepting a vendor’s specification sheet without validation by in-house or 3rd party testing. Consequently, one can expect the unexpected. JEDEC packaging may be subjected to charging during the box sealing or taping process. Therefore, a corrugated container should be electrostatic discharge shielding or the JEDEC tray needs to be placed into a metalized Type 1 shielding bag. During the box sealing validation process, approximately 20 microprocessors inserted into a vacuum formed antistatic polymer insert were subjected to the taping process EURoPE EMC GUiDE 2011

was measured at 6.8kV. As a result, all 20 microprocessors were nonoperational. Later, 20 new prototype microprocessors were placed inside a validated static shielding (with an inner conductive liner) corrugated Bflute RSC where all flaps met. In this case, however, there were no failures observed after the taping process. Af ter undergoing ESD S20.20 training, the distributor identified a non-conforming JEDEC box (see Figure 6). The product was quarantined and evaluation of the strapping using a non-contact computer interfaced voltage probe system recorded a peak charge of -3000 volts. Unfortunately, strapping had been affixed to the JEDEC tray directly over ESD sensitive devices at 6 positions. The OEM should have inserted the JEDEC tray into a Figure 5. (top) Packing Tape off reel charging to over 20,000 volts; (center) 6.8kV penetrating Type 1 Aluminum moisture barrier a Kraft corrugated box with no shielding protection to cause all the microprocessors to fail; bag and then applied the strapping (bottom) Only 0.98kV penetrating the box while being taped in proximity to 80kV voltages where under ionization. Visual inspection of no microprocessors failed. the JEDEC tray should alert receiving inspection that the package was non(see Figure 5). Because adhesion is important, large rolls of conforming and also could be â&#x20AC;&#x153;suspectâ&#x20AC;? counterfeit. Applying an ANSI/ESD S541-2008 compliant electrotape are positioned opposite the top and bottom box flaps static shielding paperboard pad and shielding layer making in a conveyor system. Another school of thought is that the distance between intimate contact with static dissipative JEDEC trays would the top and bottom of the corrugated container at a said be an accepted minimal practice. However, lack of sound distance offers enough space to withstand ESD events. This ESD compliant safeguards made it necessary to place the may have some validity in an ESD Protected Area (EPA) JEDEC box in quarantine In short, ESD packaging engiwhere charge can be controlled. However, the rolls of tape neering protocols and innovative design methods can be without ionization were measured over the measuring ca- utilized to insure protection against suspect counterfeitpability of a chopper stabilized electrostatic field meter at ing or supplier non-conformance. One practice worthy of +20kV, blowing a sensor. Later, at 6 inches, using an indus- consideration is the development of a change notification trial grade static locater, the voltage was found to be 80kV. that lists detailed packaging engineering modifications and The microprocessors were placed inside the vacuum provides traceable testing results of the package. Customers need to be informed of countermeasure formed insert and the Kraft (non-shielding) B-Flute Regular Slotted Container (RSC) was closed by hand. Peak voltage implementation. For example, the use of RFID tags would seen inside the box during the automatic taping process constitute a sound protective package safeguard. Likewise,

Figure 6. (left) Strapping under the corrugated pad in close proximity to ESD sensitive devices; (right) -3000 volts recorded for a JEDEC tray white strapping which did not use a corrugated shielding pad. interferencetechnology.eu

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subjecting oneâ&#x20AC;&#x2122;s supplier to a formalized qualification sequence for JEDEC trays reinforced with a certificate of conformance (COC) authentication can prevent suspect counterfeit or nonconforming ESD materials and packaging from being utilized in combination with Ultra-sensitive ESD devices.

Figure 7. What a Tape & Reel looks like when mounted in the factory.

Figure 8. (left) Concentric ring measurement of inside of the reel; (right) Using a 2-point probe to measure difficult to reach areas in the reel.

Figure 9. Using small profile resistance probe to measure inside the carrier cavities. Probe on the top is 2-point probe and the bottom right photo probe is 1-Point for volume resistance.

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tAPe & Reel PACKAGinG iSSUeS Despite claims that issues with Tape & Reel have been put to rest, supplier non-conformance, suspect counterfeit ESD sensitive devices and packaging present major problems in producing a quality product. Problems present themselves when a suspect counterfeit or non-conforming Tape & Reel package pose issues during the parts inspection process with ESD sensitive devices. The act of tape removal from the carrier can generate electrostatic fields that kill ESD sensitive devices upon contact with tweezers or during pick and place. The separation process (see Figure 7) can be likened to pulling Scotch Tape from a dispenser if the cover tape is non-compliant. As seen in the previous section, packing tape was witnessed to charge over 20kV. To mitigate potential issues, subjecting the Tape & Reel to resistance validation per ANSI/ESD STM11.11-2006 (IEC 61340-2-3), ANSI/ESD STM11.122007 (IEC 61340-2-3) and ANSI/ESD STM11.13-2004 (2-point resistance) can lead to better yields. Figure 8 illustrates how an organization validates a static dissipative reel before incorporation into the manufacturing process. The lower left figure is a surface resistance measurement in accordance with ANSI/ESD STM11.11. To the right, one can see the use of a 2-point probe per ANSI/ESD STM11.13. As a result, the product failed at 11.7%RH and at 50.3%RH for a blue antistatic coated reel (Table 1). It is clear from the findings (see Table 11) that a topically coated antistatic reel exhibits humidity dependence as the results fluctuated from 50%RH to 11.7%RH for failing readings. Subjecting product to a formalized qualification sequence can prevent costly ESD related issues during manufacturing and assembly. A package (see Figure 10) was received by incoming inspection. The EURoPE EMC GUiDE 2011

United Kingdom the cover tape (using ANSI/ESD STM11.13) produced an insulative reading of 2.1 x 1011 ohms for the outside and 9.4 x 1011 ohms on the inside of the cover tape (Figure 12). The next step is to see what happens to the cover tape upon separation from the carrier (see Figure 13). Separation generated a peak of -4055 volts. The reel was placed upon a grounded stand and contact between one of the componentâ&#x20AC;&#x2122;s lead was made with tweezers while wearing a wriststrap. An ESD event of 293 volts is illustrated by the Novx antenna (see Figure 13). The current discussion represents what could take place during the inspection and validation process by Incoming Receiving. One needs to consider if packaging used to protect ESD sensitive components is suspect counterfeit or non-conforming. The inspection and validation process of removing a device from a problematic package can lead to failures with Ultra-sensitive (Class 0) devices. In March 2010, the author gave a presentation at NASA Cape Canaveral titled â&#x20AC;&#x153;Non-compliant or Suspect Counterfeit Materials Can Lead to ESD Hazards and Long-Term

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Figure 10. Non-conforming moisture barrier bag with 3-seams when 2-seams are required for ESD compliance. The bottom right photo shows a vacuum was pulled too much which crushes the devices. A trustworthy supplier would not pull an excessive vacuum. Thus, visual inspection to the knowledgeable incoming inspector would identify this package as suspect! (Courtesy of Ed Dimmler, PCX, Inc. QA &ESD Program Manager)

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VERmIllIon

outside of the Type 1 bag. As illustrated in Figure 11b, six (6) conforming Tape & Reel Location STM11.11(Ω) C.V. Location STM11.11(Ω) C.V. Type 1 humidity independent 4.90E+10 100v Inner Surface A 9.20E+12 100v Inner Surface A (IDP) ESD Moisture Barrier 1.30E+11 100v Inner Surface B Inner Surface B 3.30E+13 100v Inner Surface C 1.30E+09 100v 100v Inner Surface C 1.50E+11 Bags (MBB) were evaluated at 100v Outer Surface A 4.50E+10 100v Outer Surface A 4.10E+12 3.5%RH over 72 hours at 73.40F 1.90E+13 9.60E+10 100v 100v Outer Surface B Outer Surface B to simulate the environment 2.20E+10 Outer Surface C 100v 100v Outer Surface C 7.40E+12 inside a MBB when a vacuum 100v 100v Outer Surface D Outer Surface D 4.70E+11 1.10E+11 is pulled before inserting a Average 1.05E+13 6.48E+10 Average desiccant. A suspect counter4.90E+10 Median Median 7.40E+12 feit Type 1 bag may appear Minimum Minimum 1.50E+11 1.30E+09 compliant, however, aside from Maximum 1.30E+11 Maximum 3.30E+13 St. Dev. a typical 3-seam appearance, 4.79E+10 1.18E+13 St. Dev. the only way to verify compliTable 1. RMV test finding for TI white paper, courtesy of Albert Escusa. ance is by taking resistance measurements. QA distribution manager noticed that the Type 1 metalGuidelines that a suspect counterfeiter will likely ignore lized moisture barrier bag had drawn a vacuum that would can be found in MIL-PRF-81705D, w/AMENDMENT 1, crush the components in the carrier tape. Upon review, the 14 July 2004 for PERFORMANCE SPECIFICATION of author found the bag to have three seams. This observation BARRIER MATERIALS, FLEXIBLE, ELECTROSTATIC would be a red flag because an electrostatic shielding bag PROTECTIVE, HEAT-SEALABLE. requires two seams. Electrical continuity is essential to inThe results in Table 2 were favorable at 3.5%RH which sure charge bleed off. Consequently, the bag was tested for represents an environment seen inside a moisture barrier surface resistance on the inside and outside of the shielding bag after drawing a vacuum. If the bag looks suspect and structure as illustrated in Figure 11a. tests as non-conforming (see Figure 11a), then one would The results in Figure 11a were failing for the inside and test the cover tape as a validation step. As a result, at 55%RH, Antistatic-Coated Reel, Dipped Blue Ambient Conditions [50.3%RH, 71.5°F]

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Low RH [11.7%RH, 73.2°F after 48 Hours]

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Figure 11a. (left) Measuring a 3-seam suspect counterfeited bag for surface resistance which produced failing results. Figure 11b. (above) Humidity Independent (IDP) moisture barrier bag.

Compliant Results at 3.5%RH for 72 Hours of Preconditioning

Table 2. Compliant Results at 3.5%RH for 72 hours of preconditioning.

Table 3. Surface Resistance & Volume Resistance.

44â&#x20AC;&#x192;

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Storage Issues.” Feedback from the aerospace community constituted a lack of awareness that suspect counterfeit materials and packaging were being utilized throughout the supply chain. The next phase will focus upon actual readings secured during an assessment at a DoD contract manufacturer’s Tape & Reel operation. Despite the reel’s black appearance indicating a carbon loaded static dissipative or conductive material, the reel measured insulative (see Figure 15). During actual production using a non-conforming Tape & Reel package (see Figure 16), ESD events were numerous. Even if the devices were found to be compliant, the non-conforming or suspect counterfeit Tape & Reel package promotes Triboelectrification leading to Field Induced Model Discharges. Suspect counterfeit packaging can cause production delays and component failure due to electrostatic discharge. In contrast, a conforming Tape & Reel (see Figure 17) utilized in the

Figure 12. 2-point resistance of the carrier cover tape (outside and inside)

manufacturing process did not produce significant issues and was under a +/-100 volt threshold as set forth in the company’s ESD program manual.

In short, it appears that Tape & Reel packaging has been targeted for suspect counterfeiting. ESD packaging materials must undergo validation to

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Figure 13. (left) Shows the charge of -4055 (top) on the carrier tape as captured by a yellow colored non-contact voltage probe and the corresponding ESD event of 293 volts (as captured by the black ESD event antenna) when a stainless steel tweezers makes contact with one of the lead of the ESD sensitive devices that the Tape & Reel is packaging. Figure 14. (right) Charge separation of the carrier tape of –400 volts.

Figure 15. 2-point resistance of non-compliant or suspect counterfeit Reel

rigorous standards to insure ESD compliance. RefeRenCeS • 1. Xth International Seminar on the Technology of Inherently Conductive Polymers, Progress in Light Emitting Polymer and Dendrimer Technology, 23-25 June 2003, Presentation by Cambridge Display Technology • 2. Non-compliant or Suspect Counterfeit Materials Can Lead to ESD Hazards and Long-Term Storage Issues, Bob Vermillion, NASA QLF, Kennedy Space Center, 18 March 2010 • 3. Electronic Part Damage by Antistat Vapor, John Kolyer, Ph.D., Arie Passchier, Ph.D. and W. Greg Peterson, The Boeing Company • 4. ESD from A to Z, Dr. John Kolyer and Watson, 2nd Edition • 5. Mil Handbook 1686C-1995 • 6. Mil Handbook 263B-1994 • 7. EIA STANDARD • 8. Packaging Materials Standards for ESD Sensitive Items, EIA-541, June 24, 1988, Appendix C “Triboelectric Charge Testing of Intimate Packaging Materials” • 9. ANSI/ESD S20.20-2007 [IEC or EN 61340-5-1:2007 & TR 613405-2 © IEC:2007] • 10. ANSI/ESD S3.1-2006 [EN 61340-5-1:2007] • 11. ANSI/ESD STM4.1-2006 • 12. ANSI/ESD STM11.11-2006 [ANSI/ESD STM11.11-2006 [CEI IEC 61340-2-3] • 13. ANSI/ESD STM11.12-2007 [ANSI/ESD STM11.11-2006 [CEI IEC 61340-2-3]

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• 14. ANSI/ESD STM11.13-2004 • 15. ESDA Adv. 11.2-1995 • 16. Using An ESD Packaging Materials Qualification Matrix for Contract Manufacturing and Supplier Conformance, Sep 1, 2006, Albert Escusa, Texas Instruments and Bob Vermillion, RMV Technology Group, LLC • 17. Ed Dimmler, PCX Inc. for Suspect Counterfeit Tape & Reel and Type 1 Bag Specimen • 18. Dr. John M. Kolyer, Ph.D., Rockwell International, telephone interview in 2004 • 19 The Charged Device Model & Work Surface Selection, John Kolyer and Donald Watson, October 1991, pp. 110-117 • 20. Humidity & Temperature Effects on Surface Resistivity, John Kolyer and Ronald Rushworth, Evaluation Engineering, October 1990, pp. 106-110 • 21. Military Handbook-263B-1994 • 22. Triboelectric Testing at KSC Under Low Pressure and Temperature, ESD Association Proceedings 2002, Dr. Ray Gompf, PE • 23. ITRS Technical Requirements – Electrostatics, The ITRS is devised and intended for technology assessment only and is without regard to any commercial considerations pertaining to individual products or equipment • 24. Intel Website, Moore’s Law • 25. 25. Intrinsically Static-Dissipative Reel, Texas Instruments, January 2004, Albert Escusa and Lance Wright from RMV Technology Group, LLC Lab work (Courtesy of Albert Escusa) • 26. Carrier Specimens (Figure 9), Kurt Edwards, Lubrizol

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Vermillion

United Kingdom Figure 16 (left). Non-conforming tape & reel carrier results during actual production and placement of ESD sensitive devices which generated many discharges with no ionization. . Figure 17 (below). Using ionization with a compliant tape & reel, very low magnitude ESD events with rare occurrences took place. • 27. Novx Series 7000 Screen Capture with ESD Event Antenna, NOVX Figures 3 and 13 Special Thanks to Daibochi Plastics for running and providing six special Humidity Independent (IDP) Tape & Reel Type 1 Moisture Barrier Bag Specimens and Selected Illustrations and Data Bob Vermillion, CPP/Fellow, is a Certified ESD & Product Safety Engineer-iNARTE with expertise in the mitigation of Triboelectrification for a Mars surface and in troubleshooting robotics or systems in aerospace, disk drive, medical device & pharmaceutical, automotive and semiconductor sectors. A co-author of several ANSI level ESD documents, Bob serves on the BoD with iNARTE and is a member of the ESD Association Standards Committee and conducts ESD Seminars in the USA and abroad. Bob is Chief Technology Officer of RMV Technology Group, LLC, a 3rd Party ESD Materials Testing and Consulting Company. You can reach Bob at 650-964-4792 or bob@ esdrmv.com.

Suspect Counterfeit Detection, Avoidance and Mitigation

18-19 November 2010, Department for Continuing Education, Rewley House, University of Oxford Are you or your supply chain properly handling Class 0 ESD sensitive devices with validated packaging during the parts inspection process? This two-day course is in an interactive case study format and will review non-conformance related issues, as well as validation methods often overlooked in a Suspect Counterfeit Countermeasure Program. Course provides in-depth technical review of validation issues: • Where do counterfeits come from? • How can counterfeits be identified? • How can counterfeiting be combated? • Are proper ESD measures being employed? • Does your inspection process compromise Class 0 ESD sensitive devices? • How are parts coded, tracked and safeguarded by employing RFID? Who is this course for? Engineers & quality assurance, procurement engineering and supply chain management professionals who utilize or purchase components from systems integrators, manufacturers and distributors. Industry sectors: Aerospace & defense, semiconductor, medical device, disk drive, automotive and telecommunications. Course presenters Bob Vermillion, RMV Technology Group, LLC at NASA-Ames Research Center (ARC) Douglas Smith, author of “High Frequency Measurements and Noise in Electronic Circuits”

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Issues: • Supplier Non-Conformance • Long Term Storage Issues • Outdated Standards • Lack of Class 0 Device Training • Incoming Inspection Practices • Inadequate Inspection of • Sensitive Components • Packaging Inspection? • Validation beyond Parts! • Physical Audits of Packaging Materials – Not Just Processes! Further Information http://cpd.conted.ox.ac.uk/electronics/ courses/counterfeit_detection.asp; Tel: +44 (0)1865 286958; Email: technology@ conted.ox.ac.uk

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Neuerungen in der EMV Emissionsmesstechnik STEPHAN BRAUN, GAUSS INSTRUMENTS GMBH, MÜNCHEN

EMV auf IC-Ebene Teil 1: Pulsstörfestigkeit von IC mit unterschiedlichen Packages SVEN KÖNIG, LANGER EMV-TECHNIK GMBH

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Robert Bosch Strasse 6, Goeppingen, 73037 Deutschland; +49 7161 95 59 206; Fax: +49 7161 9559 455; Olaf Schmidt, olaf.schmidt@eberspaecher.com; www.eberspacher.com Produkte und Services: Testen

interference technology

Emil-Figge-Str. 76, Dortmund, D-44227, Deutschland; Fax: 49 (0) 231 / 97 42-755; 49 (0) 231 / 97 42-750; www.emc-test.de; service@emc-test.com Produkte und Services: Testen

EMC Testhaus Schreiber GmbH

Eiserfelderstrasse 316, D-57080 Siegen, Deutschland ; Fax : 4 9 ( 0 ) 2 71/ 3 8 2 75 8 ; 49(0)271/38270; www.emc-testhaus.de; info@emc-testhaus.de Produkte und Services: Testen

EMCCons Dr. Rasek GmbH & Co

Moggas t , Boelwiese 8, 913 2 0 Ebermannstadt, Deutschland; 011 49 9194 9016; Fax: 011 49 9194 8125; W.Rasek@emcc.de; www.emcc.ed Produkte und Services: Verstärker, Testen, Testausstattung

EMCO Elektronik GmbH

Bunsens t r as se 5 , P lanegg , 8 2 15 2 , Deutschland; 0049 89 895 565 0; 0049 89 895 90 376; Diego Waser, info@emcoelektronik.de; www.emco-elektronik.de Produkte und Services: Verstärker, A ntennen, Kabel und S tecker, Testausstattung

emitec ag EM Software & Systems GmbH

Otto-Lilienthal-Strasse 36, D-71034 Böblingen, Deutschland; +49 7031 714 5200; Fax: +49 7031 714 5249; Dr. U. Jakobus, info@emss.de; www.emss.de Produkte und Services: Testausstattung, Testen

Birkenstrasse 47, Rotkreuz, INTL 6343, Deutschland, 41 41 748 6010, www.emitec.ch, info@emitec.ch Produkte und Services: Testen

EMI-tec GmbH

Motzener Str 17, Berlin, 12277, Deutschland, Fax: 49 30 723949 19, 49-30-7239490, Robert Kahl, Sales Manager, info@emi-tec.de; www.emi-tec.de Produkte und Services: Testen

emscreen GmbH

EM Test GmbH

L ünener S trasse 211, 5 9174 Kamen, Deutschland; +49 (0)2307 / 26070-0; Fax: +49 (0)2307 / 17050 ; www.emtest.de; info@emtest.de Produkte und Services: Überspannung und Einschaltstöße, Testen

Wallbergstraße 7, Taufkirchen, 82024 Deutschland; +49 89 614171-0; Fax: +49 89 614171-71; www.emscreen.com; Ariane Wahrmann, info@emscreen.de Produkte und Services: Abgeschirmte Räume und Gehäuse, Abschirmung

emv - Elektronische Meßgeräte Vertriebs GmbH

CEcert GmbH

Alter Holzhafen 19, Wismar, D-23966, Deutschland; www.cecert.com; Fax:49 (0)3841 - 2242 926; 49 (0)3841 - 2242 906; info@cecert.de Produkte und Services: Testen

EMC Test NRW GmbH

CST - Computer Simulation Technology

Carl Zeiss Optronics GmbH

Meckenloher Str. 11, Rednitzhembach, D-91126, Deutschland; 011-499-12297960; Fax: 011-499-122979660; www.alfatec.de; Holger Schuh, info@alfatec.de Produkte und Services: Testausstattung F raunhofers t rasse 2 2 , Mar t insried, INTL, D-82152, Deutschland; 011-498989577561; Fax:011-498-989577199; Silke Steingrover, ssteingroever@ams.de Produkte und Services: Verstärker, Kabel und Stecker, Filter, Testausstattung, Sonstiges

Communications & Power Industries International

Alfatec Kerafol GmbH

AMS Technologies AG

Im Teelbruch 116, Essen, 45219, Deutschland; Fax: 49 (0) 20 54 95 19-997; 49 (0) 20 54 95 19-0; www.cetecom.com; info @ cetecom.com Produkte und Services: Testen

info@hundh-highvoltage.de; www.hundh-highvoltage.de Produkte und Services: Überspannung und Einschaltstöße, Testausstattung

EMC Partner

H+H High Voltage Technology GmbH, Herr Volker Henker, Im kurzen Busch 15, DE - 58640 Iserlohn Deutschland; +49 2371 7853-0; Fax: +49 2371 157722;

Wallbergstraße 7, Taufkirchen 82024 Deutschland; +49 89 614171-0; Fax: +49 89 614171-71; www.emvgmbh.com; Ariane Wahrmann, info@emvgmbh.de Produkte und Services: Testausstattung, Verstärker, Antennen

eUroPe eMc gUiDe 2011

Produkte und Services | DEUTSCHLAND

EMV Testhaus GmbH

Gus tav-Her t z-S traBe 3 5, S traubing, D-94315, Deutschland; Fax: 49 9421 56868100, 49 9421 56868-0; charlotte.klein@ emv-testhaus.com, Charlotte Klein; www. emv-testhaus.com Produkte und Services: Testen

Produkte und Services: Antennen

FUSS-EMV

Johann-Hittorf-Strasse 6, D-12489 Berlin, Deutschland, +49 30 - 4 04 40 04, Fax: +49 30 - 4 04 31 50, www.fuss-emv.de, info(a) fuss-emv.de Produkte und Services: Filter

G ETS - Lindgren Ltd.

Unit 4 Eastman Way, Pin Green Industrial Area, Stevenage, SG1 4UH, Great Britain; +4 4 ( 0 )14 38 730700 ; Fax: +4 4 ( 0 )14 38 730750; Malcolm Charsley, info@ets-lindgren.co.uk Produkte und Services: Antennen, Kabel und Stecker, Filter, Abgeschirmte Räume und Gehäuse, Abschirmung, Testausstattung, Testen

GAUSS Instruments GmbH

Haferweg 19, Munich, 81929 Deutschland ; + 4 9.8 9.9 9 6 2 78 2 6 ; Fax : + 4 9.18 0 3.5 518 4 4 5 8 5 ; Dipl.-Ing. Arnd Frech, frech@ tdemi.com; www.gaussinstruments.com Produkte und Services: Testausstattung; Testen

Hennebergstrasse 6, D 76131, Karlsruhe, Deutschland; Fax: 49 0721 931 09-39; 49 721 931 09; www.hilo-test.de; Edourd Pohlner, epohlner@hilo-test.de Produkte und Services: Testausstattung

Hirschmann Car Communication GmbH

S tut tgar ter S trae 4 5 -51, Neckar tenzlingen, 7265 4, Deutschland; Fax : 4 9 7127 14 – 1689; 49 7127 14 1437; www. hirschmann-car.com; holger.bischoff@ hirschmann-car.com US Contact: 1116 Centre Road, Auburn Hills, MI, 48326, Fax: 248 276-2350, 248 373-715 0, w w w.hirschmann-car.com, sales@hirschmann-mi.com Produkte und Services: Testen

euro EMC GmbH

Schlossstr. 4, Oberkoellnbach, 8 410 3 Postau, Deutschland, Fax: 49 (0) 87749 6 8 5 5 -9, 4 9 ( 0 ) 8 7 74 -9 6 8 5 5 - 0 ; w w w. emc-positioning.de/, info@euro-emc.com Produkte und Services: Antennen, Verstärker

Fair-Rite Products Corp.

Industrial Electronics, Hauptstr. 71 - 79 D-65760 Eschborn Deutschland; +49619 6-9 2 79 0 0 ; Fax : + 4 9 -619 6-9 2 79 2 9 ; w.uhlig@industrialelectronics.de Schaf fner Elektronik GmbH, Schoemperienstrasse 12B D-76185 Karlsruhe Deutschland; +49 7215 6910; Fax: +49 7215 69110 ; germanysales @ schaffner.com; www.fair-rite.com Produkte und Services: Ferrit, Filter, A bgeschirm te Räume und Gehäuse, Abschirmung

I i. thomas gmbh

GETELEC

375 rue Morane Saulnier BP 80235, 78532 Buc, France; (33168) 505-4299; www.getelec.com Produkte und Services: Abschirmung

germania elektronik GmbH

Gutenbergring 41, Norderstedt, 22848, Deutschland; +49 40 5935 58 0; Fax: +49 40 5935 58 20; www.germania-elektronik.de; info@germania-elektronik.de Produkte und Services: Abschirmung, Leitungsmaterialien, Ferrit, Filter

GIGACOMP GmbH

Richard-Wagner-Str. 31, D-82049 Pullach, Deutschland; +49 89 32208783; Fax: +49 89 32208958; www.gigacomp.de; info@gigacomp.de Produkte und Services: Testausstattung

Canisiusstr 21, Mainz, INTL, D-55122, Deutschland, 49 6131 18 0; markus.ohl@ bnetza.de; www.bundesnetzagentur.de Produkte und Services: CE marking

Feuerherdt GmbH

Mot zener S trae 2 6 b, Berlin, 12 2 7 7, Deutschland; Fax: 49 30 710 96 45 – 99; 49 30 710 96 45 – 51; Clemens Feuerherdt, clemens.feuerherdt @ feuerherdt .de ; www.shielding-online.com Produkte und Services: Leitungsmaterialien, Abschirmung

Frankonia EMC

Industrie Strasse, 16, Heideck, D-91180, Deutschland; Fax: 011-(49) 91 77-98520; (49) 91 77-98 500; www.frankonia-emc. com; Philippe Capron, philippe.capron@ frankonia-emc.com Produkte und Services: Testausstattung

FS Antennentechnik GmbH

Morsestr. 6, D-85716, Unterschleissheim, Deutschland, +49-089-37 44 86-0; Fax: + 4 9-0 89-37 4 4 8 6-55 ; info @ fsant.de; www.fsant.de

interferencetechnology.eu

A n der B 7 3 - 2 0 0 a, D -216 8 4 S t ade, Deutschland; Fax: +49 04141 – 84461; +49 04141 – 82920; www.schirmkabinen.de; Witt@schirmkabinen.com Produkte und Services: Filter, Abschirmung, Software

IBH Elektrotechnik GmbH

Gutenbergring 35, Norderstedt, INTL, 2 2 8 4 8 , Deu t schland ; F a x : 0 11- 4 9 4 052 39709 ; 011-49 4-052 305228 ; w ww. ibh-elektrotechnik.de; Michaela Kluckert, mkluckert@ibh-elektrotechnik.de Produkte und Services: Kabel und Stecker

IFI - Instruments for Industry

Haefely EMC Division

EMCO Elektronik GmbH, Bunsenstrasse 5, D-82152 Planegg, Deutschland; +49 089 895565 0; Fax: +49 089 89590376; Christine Seel, info@emco-elektronik.de; www.emco-elektronik.de Produkte und Services: Überspannung und Einschaltstöße, Testausstattung

H+H High Voltage Technology GmbH

Im kurzen Busch 15, D-58640 Iserlohn, Deutschland; Fax: 49 (0)2371.157722; 49 (0)2371.7853-0; www.hundh-highvoltage. de; info @ hundh-highvoltage.de; Klaus Hornickel, Managing Director Produkte und Services: Testausstattung

HF-SHIELDING Joachim Broede GmbH

Industriestraße 6, D-49170 Hagen a.T.W., Deutschland; Fax: 49 54 05 - 99 99 06; 49 54 05 - 99 99 04; www.hf-shielding.de; Joachim Broede, broede@hf-shielding.de Produkte und Services: Testen

Jacob GmbH

Elektrotechnische Fabrik, Gottlieb-Daimler-Str. 11, 71394 Kernen, Deutschland; +49 (0)7151 56806-60; Fax: +49 (0)7151 56806-79; www.jacob-gmbh.de; jacob@ jacob-gmbh.de Produkte und Services: Testausstattung

K KE Kitagawa GmbH

Elbinger Strasse 3-5, D-63110 RodgauJügesheim, Deutschland; 06106-8524-0; Fax: 06106-8524-30; sales@kitagawa.de; www.kitagawa.de Produkte und Services: Ferrit

L Langer EMV-Technik GmbH Noethnitzer Hang 31, Bannewitz, 01728, DE, 0351-430093-23; www.langer-emv. de; michak@langer-emv.de Produkte und Services: Test and measurement, training

Luethi ElektronikFeinmechanik AG

Parkstrasse 6, 4402 Frenkendorf / BL, Deutschland; 061 902 1210; Fax: 061 902 1211; www.luethi-ag.ch Produkte und Services: Test and measurement

M Maschek Elektronik

Adolf-Scholz-Allee 4a, 86825, Bad Wörishofen, Deutschland; +49 (0) 82 47 - 95 98 07; Fax: +49 (0) 82 47 - 95 98 09; www. maschek.de; info@maschek.de Produkte und Services: Testausstattung

Federal Network Agency

HILO-TEST

EMCO Elektronik, Bunsenstr. 5, D-82152 Planegg Deutschland; +49 898955650 Fax : + 4 9 8 9 8 9 5 9 0 3 7 6 ; Diego Waser, dwaser @ emco-elek tronik .de ; w w w. emco-elektronik.de Pischzan Technologies - EMV Messtechnik und mehr, Thomas-Mann-Straße 57 D-63477 Maintal Deutschland; +49 (0) 61 09 - 77 19 48; Fax: +49 (0) 61 09 - 77 19 49; Gregor Pischzan, g.pischzan@pischzantechnologies.de; www.pischzan-technologies.de Produkte und Services: Verstärker, Antennen, Filter, Abgeschirmte Räume und Gehäuse, Testausstattung, Testen

maturo GmbH

Bahnhofstr. 26, 92536, Pfreimd, Deutschland; Fax: 49 (0) 9606/923913-29; 49 (0) 9606 923913-0; www.maturo-gmbh.de; Markus Saller, m.saller@maturo-gmbh.de Produkte und Services: Antennen, Testen

MB-technology GmbH

Kolumbusstr. 19+21, 71063 Sindelﬁngen, Deutschland; Fax: 49 7031 686-4500; 49 7031 686-3000; www.mbtech-group.com; media@mbtech-group.com Produkte und Services: Testen

IMST GmbH

Carl-Friedrich-Gauss-Str. 2, D-47475, Kamp-Lintfort, Deutschland; Fax: 49 2842 981 199; 49 2842 981 0; www.imst.com, borkes@imst.com; marketing@imst.com Produkte und Services: Software

inn-co GmbH

Erlenweg 12 , Schwarzenfeld, 9 2 5 21, Deutschland; Fax: +49 - (0)9435-306699; +49 - (0)9435-3066-0; www.inncosystems.de; m.maibom@innco.de Produkte und Services: Testen

Mesago Messe Frankfurt GmbH

Ro tebuehls t rasse 8 3 - 8 5 , S t u t tgar t , D-70178, Deutschland, Fax: 49 711 61946 806, 49 711 61946 26, www.mesago-online. de, parashoudi@mesago.de Produkte und Services: Events

interference technology

DEUTSCHLAND

| Produkte und Services

Mician GmbH

Schlachte 21, 28195 Bremen, Deutschland; +49 (421) 168 993 51; Fax: +49 (421) 168 993 52; sales@mician.com; www.mician.com Produkte und Services: Software

MOOSER Consulting GmbH

A mtmanns trabe 5, Egling / T hanning, 82544, Deutschland; 49-8176 92250; Fax: 49-8176 92252; http://mooser-consulting. de; Mario Kantner, m.kantner@mooseremctechnik.de, Produkte und Services: Verstärker, Testen

MTS Systemtechnik GmbH

Gewerbepark Ost 8, D-8669 0 Mer tingen, + 4 9 ( 0 ) 9 0 78.912 9 4 - 0, Fax : +49 (0)9078.91294-7, www.mts-systemtechnik.de, info@mts-systemtechnik.de Produkte und Services: Antennen, Testausstattung

N Narda Safety Test Solutions GmbH

Sandwiesenstrasse 7, 72793, Pfullingen, Deutschland, +49 (0) 7121-97 32-777 Fax: +49 (0) 7121-97 32-790, www.narda-sts. de, support@narda-sts.de Produkte und Services: Antennen, Testausstattung, Sonstiges

Neosid Pemetzrieder GmbH & Co. KG

P.O. Box 1354, D-58543 Halver, Deutschland; Fax: 49 2353 7154; 49 2353 71-0, ; sales@neosid.de; www.neosid.de US Location: Electronic Coils, Inc., 53 Main Line Drive, Westﬁeld, MA 01086, Fax:(413) 562 7749, (413) 562 7684, WebSales @ eciworld.com Produkte und Services: Ferrit, Filter

Neuhaus Elektronik GmbH

Drontheimer S tr. 21, D-13 3 5 9 Berlin, Deutschland ; Fax : 4 9 ( 0 ) 3 0 4 9 7 6 9530; 49 (0) 30 497 695-0; www.neuhauselektronik.de; neuhaus-elektronik@ tonline.de Produkte und Services: Leitungsmaterialien

Pontis - Audiv GmbH

Audivo GmbH,Irrenloher Damm 17, 92521 Schwarzenfeld, Deutschland; +49 (0) 9435 / 5419-0; Fax +49 (0) 9435 / 5419-19; www. audivo.com; info@audivo.com Produkte und Services: Abschirmung

R Rohde & Schwarz GmbH

Emco Elektronik, Bunsenstr.5, D-82152 Planegg, Deutschland; +49 89 8 95 56 50; Fax : +49 89 8 95 90 376; www.emcoelektronik.de; info@emco-elektronik.de Produkte und Services: Testausstattung, F ilter, Überspannung und Einschaltstöße

P PFLITSCH GmbH & Co. KG

Ernst-Pfl itsch-Straße 1 industriegebie, Nord 1, D-42499 Hückeswagen, Deutschland; +49 2192 911-0; Fax: +49 2192 911220; www.pfl itsch.de; info@pfl itsch.de Produkte und Services: Kabel und Stecker

Phoenix Testlab GmbH

Konigswinkel 10, Blomberg, D-32825, Deutschland; Fax: 49 (0) 5235-9500-20; 49(0)5235-9500-0; www.phoenix-testlab. de; ofﬁce@phoenix-testlab.de Produkte und Services: Testen

interference technology

SINUS Electronic GmbH

Schiefweg 10, Untereisesheim, D-7427, Deutschland, 49 7132 9969 0, 49 7132 9969 50, www.sinus-electronic.de, info@ sinus-electronic.de Produkte und Services: Filter, Überspannung und Einschaltstöße

Muhldorfstrasse 15, Munchen, D-81671, Deutschland; Fax: 49 89 4129-121 64, 4989 4129 12 748, www2.rohde-schwarz.com, sigrun.Berghammer @ rohde-schwarz. com Produkte und Services: Antennen, Abgeschirmte Räume und Gehäuse, Abschirmung, Testausstattung

Sonderhoff Chemicals GmbH

ROLEC GEHÄUSESYSTEME GmbH

SOSHIN Electronics Europe GmbH

Kreuzbreite 2, 31737 Rinteln, Deutschland; +49 (0) 5751 4003-0; www.rolecenclosures.co.uk; info@rolec.de Produkte und Services: Abgeschirmte Räume und Gehäuse

Schlegel Electronic Materials

Electrade GmbH, Lochhamer Schlag 10b, 82166 Graefelﬁng, Deutschland; +49 (0) 89 898 10 50; Fax: +49 (0) 89 854 49 22; Frau Anja Schmidt, Anfrage@electrade.com; www.electrade.com Produkte und Services: Leitungsmaterialien, Abschirmung

Schlenk Metallfolien GmbH & Co. KG

Barnsdorfer Hauptstr. 5, D-91154 Roth, Deutschland, Fax: 49 9171 808 200, 49 9171 808 280, www.schlenk.de, gerhard. loeckler@schlenk.de, Gerhard Loeckler US Sales Contact : 330 498 0980 ; Fax: 330 494 0468, glennarussell @ schlenkfoilsusa.com Produkte und Services: Abschirmung

Schlöder GmbH Nexio

4 9 ( 9131) 7-3 2 9 7 7, w w w.automation. siemens.com, karlheinz.gravenhorst @ siemens.com Produkte und Services: Testen

Hauptstrasse 71, D-75210, Keltern-Weiler, Deutschland, Fax; 49 (0) 7236 / 9396 – 90, 49 (0) 7236 / 9396 – 0, www.schloederemv.de, info@schloeder-emv.de, Friedrich Schloeder, President Produk te und Ser vices : Testen, Testausstattung

Schwarzbeck Mess Elektronik

An der Klinge 2 9, D 69 2 5 0, Schönau, Deutschland, Fax: 49 (0) 6228 / 1003, 49 (0) 6228 / 1001, www.schwarzbeck.de, info@ schwarzbeck.de Produkte und Services: Antennen, Testausstattung

ServiceForce.Com GmbH

Kleyerstraße 92, 60326, Frankfurt am Main, Deutschland, +49 69 365090-5500, www.serviceforce-com.de Produkte und Services: Testen

Siemens Energy & Automation EMC-Centre

Director test centers, Guenther-Scharow sk y - S t r. 2 1, Er langen, D - 9 10 5 8 , Deutschland, Fax : 4 9 ( 9131) 7-2 5 0 07,

Richard-Byrd-Straße 26, 5 0 829 Köln, Deutschland, +49 221 95685-0, Fax +49 221 95685-599, www.sonderhoff.com, info@ sonderhoff.com Produkte und Services: Testen

Westerbachstrasse 32, D-61476, Kronberg im Taunus, Deutschland, 49-6173-993108, Fax: 49-6173-993206, www.soshin-ele. com Produkte und Services: Filter

Spitzenberger & Spies GmbH & Co

Schmidstraße 32-34, D-94234, Viechtach, Deutschland, +49 (0) 9942 / 956, www. spitzenberger.de, info@spitzenberger.de Produkte und Services: Verstärker, Testausstattung

Statex Produktions & Vertriebs GmbH

Kleiner Ort 11 , 28357 Bremen, Deutschland, Fax: 49 (0)421-273643, 49 (0)421275047/8, info@statex.de , www.statex. de Produkte und Services: Abgeschirmte Räume und Gehäuse, Abschirmung, Leitungsmaterialien

Stolberg HF-Technik AG

Muensterau 168, 52224, Stolberg-Vicht, Deutschland, Fax: 49-2402-99777-900, 4 9 -24 0 2-9 9 7 7 7- 0, w w w.s tolberg-hf. com, harald.landes @ stolberg-hf.com, Harald Landes Produkte und Services: Verstärker, Kabel und Stecker, Testausstattung

T Tactron Elektronik

Bunsenstraße 5 / 2. Stock, 82152 Planegg, Deutschland, +49 (0)89/895569-0, Fax:+49 (0)89/857760-5, www.tactron.de, info@ tactron.de TDK Produkte und Services: Software

TDK Electronics Europe

Wanheimer Strasse 57, Dusseldorf, INTL, D-40472, Deutschland, 44 1344 381515, w w w.tdk .de, sjackson @ eu.tdk .com, Stuart Jackson International Location: Summit House, London Road, Bracknell, Berkshire, INTL, RG12 2XH, GB, 44 1978 810 147, collins@ eu.tdk.com, Andy Collins Produkte und Services: Verstärker, Antennen, Ferrit, Filter, Abgeschirmte Räume und Gehäuse, Abschirmung, Testausstattung, Testen

Tech-Etch, Inc.

Feuerherdt GmbH, Motzener Str. 26 b, 12277 Berlin, Deutschland; +49 30 710 964 5 52; Fax: +49 30 710 964 5 - 99; emc@

feuerherdt.de Produkte und Services: Leitungsmaterialien, Abschirmung

Telemeter Electronic GmbH

Joseph-Gansler-Strasse 10, Donauworth, D-86609, Deutschland, 49 906 70693 0, Fax: 49 906 70693 50, www.telemeter.info, info@telemeter.de Produkte und Services:

TESTEC Elektronik GmbH

Westerbachstr. 58, 60489 Frankfurt am Main,vDeutschland, Fax: 49 (0)69 943335 55, 49 (0) 69 943335 0, www.testec.de, info@testec.de Produkte und Services: Testausstattung

Teseq GmbH

Landsberger Strasse 255, 12623 Berlin / Deutschland, +49 30 5659 8835, Fax: +49 30 5659 8834, desales@teseq.com, www.teseq.de Produkte und Services: Verstärker, Antennen, Testausstattung, Testen

THORA Elektronik GmbH

Winn 6, Herrieden, 91567, Deutschland, Fax : 0 9 8 2 5 / 9 2 8 0 -9 0, 0 9 8 2 5 / 9 2 8 0 -19, www.thora.com, Edyta Danner, edyta. danner@thora.com Produkte und Services: Ferrit, Connectors

TTV GmbH

S u de t e n s t r. 5 3 , 8 2 5 3 8 ger e t s r i e d , Deutschland, +49-8171-3469-0, Fax:+498171-3469-29, info@go-ttv.com, www. go-ttv.com Produkte und Services: Filter

TÜV SÜD SENTON GmbH

Äußere Frühlingstraße 45, 94315 Straubing, Deutschland; 09421-5522-22; Fax: 09421-5522-99; http://www.tuev-sued. de /senton; Stefan Kammerl, senton @ tuev-sued.de Produkte und Services: Testen

V Vacuumschmelze GmbH

Gruner Weg 37, Hanau, D-63450, Deutschland, Fax: (49) 6181/38-2645, (49) 6181/3822 75, www.vacuumschmelze.com, info_ vertrieb@vacuumschmelze.com Produkte und Services:

W Willtek Communications

Gutenbergstr. 2 – 4, Tucson, INTL, 85737, Deutschland, Fax: 49 (0)89 99641 440, 49 (0)89 99641 200, www.willtek.com, agrolman@wtcom.com, Achim Grolman Produkte und Services: Abschirmung

Wurth Elektronik GmbH & Co. KG

Max Eyth Str. 1-3, Waldenburg, 74638, Deutschland, Fax: 49 7942-945430, +49 7942-945120, www.we-online.de, alexander.gerfer@ we-online.de, Alexander Gerfer Produkte und Services: Ferrit, Kabel und Stecker

eUroPe eMc gUiDe 2011

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DEUTSCHLAND Ressourcen AssociAtion iEEE EMc sociEtY cHAPtER GERMANY

Frank Sabath, Federal Ministry of Defense, Armament Directorate IV 6, Am Steinberg 9, Garstedt 21441, Germany; +49 4173-5817-20; Fax: +49 4173-58-17-21; Frank.Sabath@ieee.org

notifiEd bodiEs cEtEcoM GMbH

Im Teelbruch 116, 45219 ESSEN, Germany; +49-2054 9519.283; Fax: +49-2054 9519 903; klaus.piotrowsky@cetecom.de; www. cetecom.de Notified Body number : 0680 Directive: 004/108/EC Electromagnetic compatibility

EMc tEst nRW GMbH

Emil-Figge-Straße 76, 44227 Dortmund, Germany; +49 (231) 9742753; Fax: +49 (231) 9742755; service@emc-test.de; www.emc-test.de Notified Body number : 1946 Directive: 2004/108/EC Electromagnetic compatibility

EMccERt dR. RAsEK GMbH

B o e l w i e s e 5 , 9 1 3 2 0 E B E R M A N S TA D T, G e r m a n y ; +49:9194:9016;Fax: +49:9194:8125; emc.cert@emcc.de; www. emcc.de Notified Body number : 0678 Directives: 99/5/EC Radio and telecommunications terminal equipment (31/12/2099) 2004/108/EC Electromagnetic compatibility

EuRofins PRoduct sERvicE GMbH

Storkower Straße 38c, 15526 REICHENWALDE, Germany; +49 33 63 18 88 700; Fax: +49 33 63 18 88 660; joergkusig@eurofins. de; www.pt.eurofins.com Notified Body number : 0681 Directives: 99/5/EC Radio and telecommunications terminal equipment (31/12/2099) 2006/95/EC (ex-73/23/EEC) Low voltage directive 2004/108/EC Electromagnetic compatibility

KRAuss-MAffEi WEGMAnn GMbH & co. KG

August-Bode-Straße 1, 34127 Kasse, Germany ; +49 (561) 1052713; Fax: +49 (561) 1052832; thomas.guettler@kmweg.de; www.kmweg.de Notified Body number : 1947 Directive: 2004/108/EC Electromagnetic compatibility

MiKEs-tEstinGPARtnERs GMbH

Ohmstraße 2-4, 94342 Strasskirchen, Germany; +49 (9424) 94810; Fax: +49 (9424) 9481240; eduard.stangl@mikes-tp.com; www.mikes-testing-partners.com

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Notified Body number : 1948 Directives: 2004/22/EC Measuring Instruments Directive 2004/108/EC Electromagnetic compatibility

MitsubisHi ElEctRic EuRoPE b.v.

Mündelheimer Weg 35, 40472 Düsseldorf, Germany; +49 (211) 17149712; Fax:+49 (211) 17149727; wolfgang.landgrebe@meg. mee.com; www.mitsubishielectric.de Notified Body number : 1965 Directive: 2004/108/EC Electromagnetic compatibility

obERinG. bERG & luKoWiAK GMbH

Löhner Straße 157, 32609 Hüllhorst, Germany; +49 (5744) 92960; Fax: +49 (5744) 929615; lukowiak@obl-gmbh.de; www. obl-gmbh.de Notified Body number : 1949 Directive: 2004/108/EC Electromagnetic compatibility

PAnAsonic custoMER sERvicEs EuRoPE

a Division of Panasonic Marketing Europe GmbH Winsbergring 15, 22525 Hamburg, Germany; +49 (40) 85493590; Fax: +49 (40) 85493540; wolfgang.hoepfner@eu.panasonic.com; www.panasonic.de Notified Body number : 1966 Directive: 2004/108/EC Electromagnetic compatibility

PHoEniX tEstlAb GMbH

Köningswinkel 10, 32825 Blomberg, Germany; +49 5235 9500 24; Fax: +49 5235 9500 28; office@phoenix-testlab.de; www. phoenix-testlab.de Notified Body number : 0700 Directives: 99/5/EC Radio and telecommunications terminal equipment (31/12/2099) 2004/108/EC Electromagnetic compatibility

sGs GERMAnY GMbH ZERtifiZiERunGsstEllE MüncHEn

Hofmannstraße 50 81379 München, Germany; +4 9 ( 89 ) 787475132; Fax: +49 (89) 787475122; melanie.beier@sgs.com; http://www.sgs-certification-body.de/ Notified Body number : 2150 Directives: 99/5/EC Radio and telecommunications terminal equipment 2004/108/EC Electromagnetic compatibility

siEMEns AG

San-Carlos-Straße 7, 91058 Erlangen, Germany ; +49 (9131) 733177; Fax:+49 (9131) 733265; peter.linnert@siemens.com; www.siemens.de Notified Body number : 196 Directive: 20 0 4 /10 8 / EC Electromagnetic compatibilit y SLG PRÜF UND ZERTIFIZIERUNGS GMBH Burgstädter Strasse 20, 09232 Hartmannsdorf, Germany; +49:3722:7323-0; Fax:+49:3722:7323-899; service@slg.de.com; europe emc guide 2011

Ressourcen |

www.slg.de.com Notified Body number: 0494 Directives: 88/378/EEC Safety of toys 93/42/EEC Medical devices 97/23/EC Pressure equipment 2000/14/EC Noise emission in the environment by equipment for use outdoors (31/12/2099) 2004/108/EC Electromagnetic Compatibility 2006/95/EC (ex-73/23/EEC) Low voltage directive 2006/42/EC Machinery

sonY dEutscHlAnd GMbH

Hedelfinger Straße 61, 70327 Stuttgart, Germany; +49 (711) 5858336; Fax:+ 49 (711) 5858203; hubert.klamm@eu.sony.com; www.stuttgart.sony.de Notified Body number : 1968 Directive: 2004/108/EC Electromagnetic compatibility

tüv RHEinlAnd lGA PRoducts GMbH

Tillystraße 2, 90431 Nürnberg, Germany; +49:221:806 2048; Fax: +49:221:806 3935; ksc@de.tuv.com; www.tuv.com Notified Body number: 0197 Directives: 88/378/EEC Safety of toys 89/686/EEC Personal protective equipment 90/385/EEC Active implantable medical devices 93/42/EEC Medical devices 98/79/EC In vitro diagnostic medical devices 99/5/EC Radio and telecommunications terminal equipment (31/12/2099) 2000/14/EC Noise emission in the environment by equipment for use outdoors (31/12/2099) 2006/95/EC (ex-73/23/EEC) Low voltage directive 2004/108/EC Electromagnetic compatibility 2006/42/EC Machinery

DEUTSCHLAND

97/23/EC Pressure equipment 99/36/EC Transportable pressure equipment (31/12/2099) 2004/108/EC Electromagnetic compatibility

vdE - PRüf- und ZERtifiZiERunGsinstitut GMbH

Merianstraße, 28, 63069 Offenbach (AM MAIN), Germany; +49:69:8306 228; Fax: +49:69:8306 855; vde-institut@vde.com, www.vde-institut.de Notified Body number: 0366 Directives: 88/378/EEC Safety of toys 2000/14/EC Noise emission in the environment by equipment for use outdoors 2006/95/EC (ex-73/23/EEC) Low voltage directive (31/12/2099) 2004/108/EC Electromagnetic compatibility 2006/42/EC Machinery

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tüv tEcHniscHE übERWAcHunG HEssEn GMbH Rüdesheimer Straße, 119, 64285 Darmstadt, Germany; +49:61:51 6000; Fax: +49:61:51 600323; Email: mailbox@tuevhessen.de Notified Body number: 0091 Directives: 95/16/EC Lifts interferencetechnology.eu

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interference technology

Deutschland

neuerungen in der eMV emissionsmesstechnik

Stephan Braun GAUSS Instruments GmbH München, Deutschland

Translations available at www.interferencetechnology.eu

I. eInLeItunG Mit der Aufnahme des “FFT-based Measuring Instruments” in die Fachgrundnorm 16-1-1 sind die Weichen für einen Technologiewechsel im Bereich der Funkstörmessempfänger gestellt. Solche neuartigen Messgeräte können die Zuverlässigkeit von Emissionsmessungen für komplexe Systeme erhöhen, die Prüfzeiten reduzieren, und damit die heutigen Anforderungen an immer kürzeren Innovationszyklen im Bereich der Produktentwicklung erfüllen. In diesem Artikel wird zum einen ein Überblick über die Historie der Technologie über die letzten 10 Jahre gegeben. Die Entwicklung schneller Digitaltechnik, sowie von Hochleistungs A/D Wandlern ermöglichte es in den letzten Jahren derartige Messgeräte zu entwickeln. Zum anderen wird ein kurzer Abriss über die historische Entwicklung im Bereich der Normen zu diesem Thema gegeben. Ferner wird erklärt, warum das FFT-based Measuring Instrument kein anderes Prüfverfahren ist, sondern die Fachgrundnorm CISPR 16-1-1 lediglich im Rahmen eines Maintenance Cycle Reports um diese Technologie erweitert wurde. II. eMV-eMISSIOnSMeSSunG Zur Qualifizierung von elektrischen und elektronischen Geräten und Anla-

Interference tecHnoloGy

gen werden frequenzselektive Messungen durchgeführt. Hierzu werden Funkstörmessempfänger eingesetzt, welche üblicherweise Superheterodynempfänger sind. Funkstörmessempfänger führen eine frequenzselektive Messung durch, in dem das Eingangssignal auf eine Zwischenfrequenz gemischt wird, mittels eines Zwischenfrequenzfilters gefiltert wird und anschließend mittels eines oder mehrerer Detektoren ausgewertet wird. Erste Messempfänger wurden bereits in den 30er Jahren des letzten Jahrhunderts von Siemens, General Electric [1] sowie Stoddard hergestellt und zur Messung elektromagnetischer Störungen eingesetzt. Moderne Funkstörmessempfänger führen die Filterung des Zwischenfrequenzsignals sowie die Bewertung mittels der Detektoren digital durch [2]. Dadurch konnte eine Verbesserung der Reproduzierbarkeit von Emissionsmessungen erreicht werden. Da bei einer Emissionsmessung mehrere tausend Frequenzpunkte gleichzeitig gemessen werden müssen und dies bei Funkstörmessempfängern üblicherweise sequentiell erfolgt, ergeben sich bei der Messung mittels Funkstörmessempfängern für eine Charakterisierung der Störaussendungen eines Messobjektes mehrere Stunden Messzeit. Zur Reduktion der Testzeiten wurde ein Verfahren entwickelt, welches zunächst eine schnelle nicht normgerechte Vormessung durchgeführt und anschließend eine normgerechte Nachmessung erfolgt [3]. In der Praxis zeigt sich, dass dieses Verfahren zuverlässig bei stationären Schmalbandstörern eUrope eMc GUIDe 2011

Alle sprechen über Qualität, wir jedoch glauben nur, was wir sehen. Viele Lieferanten nehmen für sich in Anspruch, „Qualitätsprodukte“ herzustellen. Aber ist Qualität noch dasselbe wie einst? Bei AR bestimmt ja. Wir haben mehr als 40 Jahre lang den Ruf für zuverlässige Erzeugnisse aufgebaut, die keinen Vergleich zu scheuen brauchen. (Und dann noch einige) Erzeugnisse, die schneller, kleiner und effizienter sind. Erzeugnisse, die viel länger halten, viel mehr leisten und viel besser funktionieren als die anderer Unternehmen. Und dazu hat jedes einzelne weltweiten Support und die besten ernsthaften Garantien der Branche. Nach unserem Dafürhalten zeigt sich Qualität in den Ergebnissen. Wenn ein Erzeugnis in der realen Welt nicht Hervorragendes leistet, erhält man nicht das erwünschte Echo. Und wir sprechen auch nicht die loyalen Kunden an, die wir suchen. Es geht jetzt also um Unternehmen und Kunden, die Qualität noch immer beachten – und fordern.

Neuer ATR26M6G-1 26 MHz - 6 GHz, bis zu 5000 Watt •Höchste Eingabeleistungskapazität für stärker bestrahlte Felder. •60 % niedriger als Standard Log-Periodika. •Erfüllen Sie die allermeisten Ihrer Testbedürfnisse mit einer einzigen Antenne.

Neue Verstärker der Serie S 0,8 – 4,2 GHz, bis zu 800 Watt •Handlicher und tragbar. •Bessere Leistung dank erhöhter Effizienz. •Linear mit niedriger Harmonik und 100 % Fehlanpassungskapazität.

Neue Verstärker der Serie A 10 kHz - 250 MHz, bis zu 16 000 Watt. •Breitere Frequenzbandbreite – Test nach allen Standards. •25 % bis 50 % kleiner – passt in Ihren Kontrollraum. •Die Einheiten haben eine hochstehende Hybridkühlsystemtechnologie, die für größere Zuverlässigkeit und Lebensdauer sorgt.

Subampability™: (sub-amp-ability). Substantiv: Fähigkeit, einen Verstärker individuell zu verwenden oder als Baublock, wo die Leistung inkrementell hinzugefügt werden kann.

HF-leitungsgebundene Störfestigkeitsprüfungssysteme 3 unabhängige Modelle mit integriertem Leistungsmessgerät und Signalgenerator. Frequenz- und Stufenwertbildung für Fehleranalyse.

Verstärker Serie W Gleichstrom - 1000 MHz, bis 4000 Watt •Subampability: erstreckt sich im Laufe der Zeit von 1000 bis 4000 Watt. •Intelligenter Verstärker - Selbstdiagnose. •Zuverlässig

Hybridmodule •Leistung bis 37 dBm von 6 bis 18 GHz. •Ausgezeichnete Linearität, ausgezeichneter Zugewinn und ausgezeichnete Flachheit. •Als Baublock irgendwo in Ihrem Plan verwenden. •Individuell anpassbar in unserem eigenen Mikroelektroniklabor, das dem neuesten Stand der Technik entspricht.

AS Systeme •Alles, was Sie benötigen, in einem umfassenden Testsystem. •Lösungen von der Stange oder individuelle Lösungen. •Größte Palette an Ausrüstung von einer einzigen Gesellschaft verfügbar.

EMI-Empfänger •Sie haben nichts mit Tasten, Schaltern und Druckknöpfen zu tun. •CISPR kompatibel, erfüllt MIL-STD, Anforderungen des PKW und DO-160.

Weltgrößte Auswahl von Feldtests •Größter verfügbarer Frequenzbereich- 5 kHz bis 60 GHz. •Unglaublich kompakt, erfordert nie Batterien. •Verbesserter mechanischer Aufbau und verbesserte Achsenkennzeichnung. •Erkennt Felder von 2 V/m bis 1000 V/m. •Automatische Geräuschreduktion und automatischer Temperaturausgleich.

Hornantennen •Volle Auswahl von 200 MHz bis 40 GHz. •Leistung bis 3000 Watt. •Justierungseinstellung erhalten. •Kurzfristig Höhen- und Rotationsanpassungen vornehmen. •Spart Zeit und Geld, bewahrt die Testgenauigkeit.

Wanderfeldröhrenverstärker •Liefert mehr Leistung als Festkörper (CW und Puls). •Frequenzbereiche bis zu 45 GHz. •Schlafmodus – bewahrt die Langlebigkeit, schützt die Röhre.

ar europe Andere ar Abteilungen: • modular rf • receiver systems National Technology Park, Ashling Building, Limerick, Irland • 353-61-504300 • www.ar-europe.ie

Deutschland

Abbildung 1. EMV-Zeitbereichsmesssystem

Abbildung 2. Filterbank

Abbildung 3. Emission eines Elektromotors

funktioniert. Bei intermittierenden Störern sowie driftenden Schmalbandstörern kann dieses Verfahren allerdings zu Fehlmessungen führen falls die Verweilzeit bei der Vormessung zu gering ist oder der Störer sich zwischen Vor- und Nachmessung ändert. Ein derartiges Verfahren verlangt vom Operator Erfahrung, sowie Kenntnisse über das Emissionsverhalten des Prüflings. Zur Vormessung werden auch Spektrumanalysatoren eingesetzt, da diese üblicherweise schneller sweepen können. Durch die eingschränkte Pulsdynamik ist hier insbesondere bei pulsförmigen Störern auf die Übersteuerung zu achten. Ferner können diese auch nur an einem Frequenzpunkt gleichzeitig eine Messung durchführen. Mittels diskreter Fourier Transformation (DFT) lässt 58

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N E U E R U N G E N I N D E R EM V E M I S S I O N S M E S S T E C H N I K

sich das Spektrum aus einem Signal im Zeitbereich berechnen. Ein Berechnungsverfahren der DFT, welches die Anzahl der Multiplikationen reduziert, ist die schnelle Fourier Transformation (engl. fast Fourier transform, FFT) [4]. Ein weiteres Verfahren, welches aus einem Signal im Zeitbereich ein Spektrogramm berechnet, ist die KurzzeitFFT (engl. Short time FFT, STFFT) [5]. Ein Überblick über wissenschaftliche Veröffentlichungen auf dem Gebiet der Emissionsmesstechnik ist in Tabelle I dargestellt. Erste Systeme basierten auf einem Aufbau bestehend aus einem Speicheroszilloskop und einem PC zur digitalen Signalverarbeitung [23],[17],[13]. Im Jahr 2005 wurde eine Anordnung aus mehreren Analog-digital-Wandlern vorgestellt, welche es ermöglicht-digital [8] transiente Vorgänge mit hohem Signal-Rausch-Abstand zu digitalisieren, und damit die Dynamikanforderungen für Pulse zu erreichen. Lückenlose Auswertung auf FPGAs wurde in [6] vorgestellt. Dabei ist es erstmalig möglich alle Funktionen eines konventionellen Messempfängers digital an mehreren Frequenzpunkten gleichzeitig zu realisieren. III. EMV-ZEITBEREICHSMESSSYSTEM TDEMI Das Eingangssignal wird mittels einer Analog-DigitalWandler-Einheit zur Messung im Frequenzbereich 9 kHz -1 GHz abgetastet und digitalisiert. Für Messungen oberhalb 1 GHz erfolgt eine breitbandige Frequenzumsetzung. Die spektrale Berechnung erfolgt mittels KurzzeitFFT. Ein Blockschaltbild eines EMV-Zeitbereichsmesssystems ist in Abbildung 1 dargestellt. Für gestrahlte Emissionsmessung verwendet man typischerweise eine breitbandige logarithmischperiodische Antenne. Alternativ können Messungen mittels Absorberzange oder Netznachbildung durchgeführt werden. Zur Untersuchung der Einkopplung an Antennen im KFZ kann das EMV-Zeitbereichsmesssystem direkt angeschlossen werden. Das Eingangssignal wird mittels eines mehrstufigen Analog-Digital-Wandler-Systems digitalisiert. Durch das mehrstufige Analog-DigitalWandler-System erfolgt die Digitalisierung in eine Gleitkommazahl [24]. Dies erlaubt es einen äquivalenten Dynamikbereich von ca. 20 Bit zu erreichen. Damit ist es möglich die eine hohe Sensistivität von ca. −20 dBμV (Band B) zu erreichen und gleichzeitig Pulse von mehreren Volt zu erfassen. Mittels leistungsfähiger FPGAs mit einer Rechenleistung, welche ca. 20 handelsüblichen PCs entspricht, erfolgt die Auswertung in einer Bandbreite von 162,5 MHz lückenlos in Echtzeit. Ein derartiges EMVZeitbereichsmesssystem wurde erstmalig in [6] vorgestellt. Die Messung konnte hierbei um einen Faktor 1000 beschleunigt werden. Das kommerziell erhältliche System TDEMI 1G arbeitet über den gesamten Frequenzbereich mit Basisbandabtastung und reduziert die Messzeit um bis zu einen Faktor 4000. Das System TDEMI 18G mit zusätzlicher Frequenzumsetzung deckt den Frequenzbereich bis 18 GHz ab.

EUROPE EMC GUIDE 2011

Deutschland

N e u e r u n g e n i n d e r EM V E m i s s i o n s m e s s t e c h n i k

Jahr

Beschreibung

Autor [Ref.]

2006

STFFT, lückenlos

Braun, [6], [7]

2005

STFFT, Hohe Dynamik

Braun, [8], [9], [10]

2004

FFT, Abschätzung

Keller [11]

2004

FFT, statistisches Modell

Braun, Krug [12]

2002

FFT

Krug [13]

2002

FFT

Parvis [14]

2002

STFFT, frequenzumsetzend

Nickel [15], [16]

2001

FFT

Keller [17], [18], [19], [20]

1989

FFT

Bronaugh [21], [22]

Tabelle 1. Wissenschaftliche Veröffentlichungen auf dem Gebiet der Emissionsmessung im Zeitbereich

A. Kurzzeit-FFT Die Kurzzeit-FFT wird als eine FFT-Berechnung über einen begrenzten Abschnitt verstanden, welche im Zeitbereich verschoben wird. Mittels Kurzzeit-FFT wird ein Spektrogramm berechnet, welches einer Darstellung des Spektrums über der Zeit entspricht. Während stationäre Signale ein konstantes Spektrum über der Zeit aufweisen, zeigt sich beim Spektrogramm das instationäre Verhalten des Störsignals. Die mathematische Definition der Kurzzeit-FFT is gegeben durch: Getelec-94x140 ALL:getelec pub 31/08/10 17:09 Page1

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Da die Fensterfunktion w[n] symmetrisch ist, existieren mehrere Möglichkeiten Gl. 1 umzuformen. Zur realen Berechnung erfolgt die Umwandlung derart, dass nicht die Fensterfunktion verschoben wird, sondern das Eingangssignal. Weitere Vereinfachungen sind möglich, insbesondere für die Applikation der Störemssionsmessung, da hier die Phase nicht weiter ausgewertet wird. w[n] ist die Fensterfunktion, welche das ZF-Filter eines Messempfängers nachbildet [12]. B. Vergleich zu einem konventionellen Messemfänger Es ist aus der Literatur bekannt, dass die Kurzzeit-FFT äquivalent zu einer Anordnung von Basisbandmischern und einer Filterbank ist [5],[25]. Die Kurzzeit-FFT kann ebenfalls aus einer Anordnung einer Filterbank hergeleitet [26] werden. Ein Blockschaltbild einer derartigen Anordnung ist in Abbildung 2 dargestellt. Das Verhältnis des Dezimators ist gegeben durch: M = fs/fsbb,

(2)

wobei fs die Abtastrate des Analog-Digital-Wandlers ist, und fsbb die inverse Schrittweite der Kurzzeit-FFT, welche der Basisbandabtastfrequenz entspricht. W[f] ist die diskretisierte Übertragungsfunktion. Die Basisbandabtastfrequenz fsbb muss so groß sein, dass die Nyquistbedingung im Basisband beispielsweise bei der digitalen Implementierung des Quasispitzenwertdetektors eingehalten wird. Ein zu geringe Abtastrate führt zu Messfehlern bei transienten Signalen. IV. NORMGERECHTE MESSUNGEN NACH CISPR • Die CISPR 16-1-1 [27] verlangt ein bestimmtes Anzeigeverhalten eines Instruments für unterschiedliche Prüfsignale. Man unterscheidet zwischen: • Anzeigeverhalten für Sinus und Pulsfolgen • Anforderungen an die Dynamik • Anforderungen für Ein- und Ausgänge Diese Punkte werden von den TDEMI Geräten eingehalten. A. Historie Als in den Jahren 2002 - 2004 EMV Zeitbereichsmesssysteme vorgestellt wurden, hatten diese aufgrund des damaligen Stand der Technik noch Einschränkungen gegenüber der CISPR 16-1-1. So war es damals nur möglich über sehr schmalbandige Bereiche eine kontinuierliche Auswertung durchzuführen [15], [15]. Derartige System konnten aufgrund der begrenzten Dynamik auch nicht vollständig die CISPR 16-1-1 hinsichtlich Dynamik erreichen. Ein weiterer Ansatz war eine sehr breitbandige Digitalisierung mit 1 GHz Bandbreite. Allerdings aufgrund der sehr großen Datenmengen, wurde eine Datenreduktion durchgeführt [12]. Der Nachteil bestand darin, dass bestimmte Anforderungen der Norm wie z.B. die Knackratenanalyse eine lückenlose

interference technology Europe emc guide 2011

Deutschland

N E U E R U N G E N I N D E R EM V E M I S S I O N S M E S S T E C H N I K

Auswertung benötigen. In den Jahren 2004 - 2005 fanden weitere Arbeitskreissitzungen statt. Bei diese wurde diskutiert, ob die Norm CISPR 16-1-1 geändert werden soll, um derartige Prüfverfahren in die Norm zu integrieren. Auf der einen Seite stand die Reduktion der Testzeiten, und damit ein wichtiger wirtschaftlicher Faktor. Gleichzeitig musste man sicherstellen, dass die Prüfqualität nicht durch ein derartiges neues Verfahren verringert wird. Es wurde darüber nachgedacht Verfahren, welche nicht mathematisch äquivalent sind in sogenannten round robin tests auf Zuverlässigkeit zu prüfen. In den Jahren 2005 und 2006 wurden an der Technischen Universität München die Verfahren derart weiterentwickelt, dass die damals gültige Norm CISPR 16-1-1 vollständig hinsichtlich Anzeigeverhalten, Dynamik zu erreichen. Ferner war ein Ziel, dass die durchgeführte Signalverarbeitung mathematisch vollständig der eines Funkstörmessempfängers entspricht. In ersten Veröffentlichungen wurde [8], [9], [10] gezeigt, dass es möglich ist, mittels mehrer Analog-Digital-Wandler ausreichend Dynamik für pulsförmige Störer zu erreichen. Im Jahr 2006 [6], [7] wurde dann gezeigt, dass eine lücklose Auswertung an mehreren tausend Frequenzpunkten möglich ist, dies allerdings ca. eine Rechenleistung von 20 PCs benötigt, bzw. die tausendfache Rechenleistung des integrierten DSPs eines damaligen Funkstörmessempfängers. Derartige technische Neuerungen beendeten die Diskussion um die Einführung mathematisch nicht äquivalenter Messverfahren, und es wurde immer deutlicher, dass derartige

Abbildung 4. Emissionsmessung Kaffeautomat

Abbildung 5. Leitungsgebundene Emissionsmessung

INTERFERENCE TECHNOLOGY

Messgeräte auch die Norm CISPR 16-1-1 vollständig erfüllen können und müssen. B. Maintainance Cycle Report In weiteren Arbeitskreissitzungen in den Jahren 2006 und 2007 wurde unter den neuen Gesichtspunkten über eine Integration in die Norm CISPR 16-1-1 diskutiert. Da es nunmehr möglich geworden war, STFFT basierende Messgeräte bereitzustellen, welche damals fast vollständig die Dynamik erreichten und lückenlos die Berechnung durchführten und in der Berechnung an je einem Frequenzpunkt der Berechnung welche intern in einem Funkstörmessempfänger durchgeführt wurde entsprachen, wurde die geplante Änderung der Norm dahingehend abgewandelt, dass die Norm nur noch um die technischen Errungenschaften erweitert werden sollte. Ein Erreichen der Dynamik für den Isolated Impulse war aufgrund der Weiterentwicklungen absehbar. Da nun keine Änderungen der Norm CISPR 16-1-1 hinsichtlich der Anforderungen mehr nötig waren, und es nur darum ging eine neue Technologie zu würdigen wurde ein Maintainance Cycle Report (MCR) erzeugt, welcher in den folgenden Jahren in der JTF FFT (initiert von CISPR/A und CISPR/D) ausgearbeitet wurden. Die neuen Möglichkeiten von Prüfstrategien wurden in CISPR 16-2-X ebenfalls als MCR erzeugt. Um die mathematische Äquivalenz und den Stand der Technik zu dokumentieren wurde die Norm CISPR 16-3 um einen technischen Report zu diesen Verfahren erweitert. C. Heutige Normen Die Entwürfe der MCRs wurden im April 2010 je mit 100 Prozent der internationalen Stimmen angenommen. Aufgrund dieser Tatsache wurde der FDIS Status übersprungen, und die Normen treten derzeit in Kraft. Mit der CISPR 16-1-1 am. 1 ed. 3 ist nunmehr die Norm um das “FFT-based measuring Instrument” erweitert, welches ein “Receiver” ist [28]. Mit der CISPR 16-2-3 am. 1 ed. 3 werden Verfahren beschrieben welche die Emissionsmessung an gestrahlten Messobjekten mittes des FFT-based measuring instruments beschleunigen können [29]. Der Einsatz für leitungsgeführte Messungen, sowie Messungen mit der Absorberzange wird in den Normerweiterungen zu CISPR 16-2-2 und CISPR 16-2-1 beschrieben, welche in den nächsten Monaten Standard werden wird. V. MESSBEISPIELE Ein Vorteil welcher sich bei derartigen Messsystemen zeigt, ist die Möglichkeit, dass EMV-Störungen wirtschaftlich mit den geforderten Verweilzeiten gemessen werden können. Grundsätzlich wird dies von den Normen CISPR 16-2-X heute schon gefordert, ist aber aufgrund des sequentiellen Scans eines Funkstörmessempfängers nicht wirtschaftlich durchführbar. Der Effekt bei Messungen mit zugeringer Messzeit, welche in der Norm CISPR 16-2-X dokumentiert sind, wurde hier mittels des TDEMI untersucht. Dabei wurde die Reproduzierbarkeit einer Messung in Abhängigkeit der Verweilzeit ausgewertet. Die Messungen erfolgten mit dem Spitzenwertdetektor. Die Messergebnisse sind in Abbildung 3 dargestellt. EUROPE EMC GUIDE 2011

Braun

Derartige Untersuchungen können nur mit Zeitbereichsmessmethoden effizient durchgeführt werden. Die Messung mit 2 s Verweilzeit würde mit einem Messempfänger ca. 9 Stunden dauern. Mit dem TDEMI-System dauerte die Untersuchung weniger als 3 Minuten. Unterschiedliche Betriebszyklen können mittels des gewichteten Spektrogrammodus in Echtzeit gemessen und über die Zeit beobachtet werden. In Abbildung 4 ist die Emission eines Kaffeeautomaten über der Zeit dargestellt. In den ersten 3 Sekunden wird der Kaffee gemahlen. Anschließend erfolgt das Vorbrühen und Brühen. Nach 14 Sekunden wird das verbrauchte Kaffepulver ausgeworfen. Nach 18 Sekunden wird die Mechanik in den ursprünglichen Zustand zurückgefahren. Energiesparlampen erzeugen Schmalbandstörer, welche driften und zusätzlich verjittert sind. Im folgenden wurde eine Emissionsmessung in Anlehnung an CISPR 15 [30] oder EN55015 durchgeführt. Der Vorteil bei einem Zeitbereichsmesssystem besteht insbesondere darin, dass die Messung mit den Detektoren Quasispitzenwert und Mittelwert jeweils in 2 Scans erfolgen kann. Die vollständige Messzeit beträgt ca. 32 s pro Leiter. Durch die Ansteuerung der LISN und den automtisierten Programmablauf, wird die Messung für eine 2-Leiter Netznachbildung in weniger als 2 Minuten durchgeführt. Aus den Messdaten wird ein Report generiert, welcher den Anforderungen der CISPR 16-2-1 genügt. Das Ergebnis der Messung ist in Abbildung 5 dargestellt. A. Zusammenfassung Emissionsmessungen im Zeitbereich ermöglichen es Messzeiten zu reduzieren, sowie die Zuverlässigkeit von Messungen zu erhöhen. Die Erweiterung der Norm CISPR 16-1-1 um diese Technologie schafft Klarheit hinsichtlicher der Spezifikation für derartige Messgeräte. Das TDEMI erfüllt diese Anforderungen. In den Normerweiterungen CISPR 16-2-X werden die Möglichkeiten beim Einsatz derartiger Messgeräte für Abnahmemessungen (engl. Compliance Measurements) gezeigt. Eine Reduktion der Messzeit sowie eine Vereinfachung der Prüfverfahren ist nun möglich. Durch die Möglichkeit sehr schneller Scans und normgerechter Messungen in einem einzigen Scan ist es nunmehr möglich zuverlässig und schnell unbekannte Störungen zu messen und eine Beurteilung gemäß den Fachgrundnormen und Produktnormen durchzuführen. Durch den gewichteten Spektrogrammodus ist es z.B. möglich bei Automaten einzelne Funktionszyklen zu analysieren und damit die einzelnen Komponenten auf EMVkonformität zu untersuchen. Dies ermöglicht es bereits in der Entwicklungsphase eines Produktes derartige Störquellen zu erkennen und zu entstören.

Deutschland Switzerland, 20.–22.2.2001, pp. –, no. 68K5, 2001. • [3] M. Stecher, “Automated measurement of emissions from equipment and systems,” in 2002 IEEE International Symposium On Electromagnetic Compatibility Digest, August 19–23, Minneapolis, USA, pp. 593–598, 2002. • [4] J. W. Cooley and J. W. Tukey, “An Algorithm for the Machine Calculation of Complex Fourier Series,” in Math. Computation, vol. 19, pp. 297–301, 1965. • [5] A. V. Oppenheim and R. W. Schafer, Discrete–Time Signal Processing. ISBN 0-13-214107-8, Prentice-Hall, 1999. • [6] S. Braun, M. Al-Qedra, and P. Russer, “A novel realtime time-domain emi measurement system based on field programmable gate arrays,” in • 17th International Zurich Symposium on Electromagnetic Compatibility, Digest, (Singapore), pp. 501–504, Feb. 2006. • [7] S. Braun and P. Russer, “Taking time-domain emi measurements according to international emc standards,” Compliance Engineering Journal, vol. XXIII 2006 Annual Reference Guide, pp. 45–54, March 2006. • [8] S. Braun and P. Russer, “The dynamic range of a time-domain emi measurement system using several parallel analog to digital converters,” in 16th International Zurich Symposium on Electromagnetic Compatibility, February 13-18,Zürich, Switzerland, 2005. • [9] S. Braun, P. Russer, “A fpga based time-domain emi measurement system for quasi-peak detection and disturbance analysis,” in GermanMicrowave Conference Gemic 2005, April 5-7, Ulm, Germany, 2005. • [10] S. Braun, F. Krug, and P. Russer, “A novel multiresolution highdynamic ultra-broadband time-domain emi measurement system,” in

Referenzen • [1] C. R. Barhydt, “Radio noise meter and its application,” in General Electric Rev. Vol. 36, pp. 201–205, 1933. • [2] H. F. Boss, “Development of a novel digital quasi-peak detector for EMI-measurements,” in 14th International Zurich Symposium On Electromagnetic Compatibility, Zurich, interferencetechnology.eu

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• •

•

• •

•

IEEE MTT-S 2005 International Microwave Symposium, Long Beach, USA, 2005. [11] C. Keller, Schnelle EMV-Emissionsmessung im Zeitbereich. ISBN 3- 8322-3149-8, Shaker Verlag, 2004. [12] S. Braun, F. Krug, and P. Russer, “A novel automatic digital quasi-peak detector for a time domain measurement system,” in 2004 IEEE International Symposium On Electromagnetic Compatibility Digest, August 9–14, Santa Clara, USA, vol. 3, pp. 919–924, Aug. 2004. [13] F. Krug and P. Russer, “Ultra-fast broadband EMI time-domain measurement system,” in 2002 International Symposium On Electromagnetic Compatibility Digest, September 9–13, Sorrento, Italy, pp. 379–384, 2002. [14] M. Parvis, G. Perrone, and A. Vallan, “A precompliance EMC testset based on a sampling oscillocope,” in 2002 IEEE Instrumentation and Measurement Technology Conference Proceeding, May 21–23, Anchorage, USA, pp. 1197–1201, 2002. [15] G. Vogl and J.-C. Nickel, “EMV-Messung im Zeitraffer,” Elektronik Praxis, vol. 16, pp. 26 – 30, August 2002. [16] J.-C. Nickel, “EMV-Messung mit Nachbrenner: FFT für Abstrahlungsmessungen,” in EMV 2004, Elektromagnetische Verträglichkeit, 12. Internationale Fachmesse und Kongress für Elektromagnetische Verträglichkeit, (Messe Düsseldorf), pp. 90 – 95, February 2004. [17] C. Keller and K. Feser, “Fast Emission Measurement In Time Domain,” in 14th International Zurich Symposium On Electromagnetic Compatibility, Zurich, Switzerland, 20.–22.2.2001, pp. –, no. 70K7, 2001. [18] C. Keller and K. Feser, “A New Method of Emission Measurement,” in 2002 IEEE International Symposium On Electromagnetic Compatibility Digest, August 19–23, Minneapolis, USA, pp. 599–604, 2002.

N e u e r u n g e n i n d e r EM V E m i s s i o n s m e s s t e c h n i k

• [19] C. Keller and K. Feser, “Schnelle Emissionsmessung im Zeitbereich,” in 10. Internationale Fachmesse und Kongress für Elektromagnetische Verträglichkeit, Düsseldorf, Germany, 9.–11.4.2002, pp. 347–354, 2002. • [20] C. Keller and K. Feser, “Improvements in the Fast Emission Measurement in Time Domain,” in 2002 International Symposium On Electromagnetic Compatibility Digest, September 9–13, Sorrento, Italy, pp. 397–402, 2002. • [21] E. L. Bronaugh and J. D. M. Osburn, “New Ideas in EMC Instrumentation and Measurement,” in 10th International Zurich Symposium On Electromagnetic Compatibility, Zurich, Switzerland, 1993, pp. 323–326, no. 58J1, 1993. • [22] E. L. Bronaugh, “An Advanced Electromagnetic Interference Meter for the Twenty-First Century,” in 8th International Zurich Symposium On Electromagnetic Compatibility, Zurich, Switzerland, 1989, pp. 215–219, no. 42H5, 1989. • [23] U. Reinhardt, K. Feser, and K. Feurer, “Vergleich von EMV-Messungen im Frequenz- und Zeitbereich anhand praktischer Beispiele aus der Fahrzeugtechnik,” in 5. Internationale Fachmesse und Kongress für Elektromagnetische Verträglichkeit, Düsseldorf, Germany, 20.–22.2.1996, pp. 729–738, 1996. • [24] S. Braun and P. Russer, “A Low-Noise Multiresolution High-Dynamic Ultra-Broad-Band Time-Domain EMI Measurement System,” IEEE Transactions on Microwave Theory and Techniques, vol. 53, pp. 3354–3363, Nov 2005. • [25] F. J. Harris, “On the Use of Windows for Harmonic Analysis with the Discrete Fourier Transform,” in Proceeding of the IEEE, vol. 66, no. 1, pp. 51–83, 1978. • [26] J. Allen and L. Rabiner, “A unified approach to short-time Fourier analysis and synthesis,” in Proceedings of the IEEE, vol. 65, pp. 1558–1564, 1977. • [27] C.-.-. E. 3, Specification for radio disturbance and immunity measuring apparatus and methods Part 1-1: Radio disturbance and immunity measuring apparatus – Measuring apparatus. International Electrotechnical Commission, 2010. • [28] CISPR16-1-1 Ed. 3 am. 1, Specification for radio disturbance and immunity measuring apparatus and methods Part 1-1: Radio disturbance and immunity measuring apparatus – Measuring apparatus. International Electrotechnical Commission, 2010. • [29] CISPR 16-2-3-am1 ed3.0, Amendment 1 - Specification for radio disturbance and immunity measuring apparatus and methods - Part 2-3: Methods of measurement of disturbances and immunity – Radiated disturbance measurements. International Electrotechnical Commission, 2010. • [30] CISPR 15 Consol. Ed. 7.1, Limits and methods of measurement of radio disturbance characteristics of electrical lighting and similar equipment . International Electrotechnical Commission, 2007. STEPHAN BRAUN studierte Elektro- und Informationstechnik an der Technischen Universität München, und erhielt 2003 seinen Abschluss als Dipl.-Ing. Von 2003 bis 2007 arbeitete er als Wissenschaftlicher Assistent am Lehrstuhl für Hochfrequenztechnik und erhielt 2007 den Titel des Dr.-Ing. Derzeit ist er Geschäftsführer der Firma GAUSS Instruments GmbH. Stephan Braun erhielt für seine Dissertation den E.ON Future Award. Seine wissenschaftlichen Interessen umfasssen, EMV Emissionsmesstechnik, Hochfrequenzschaltungen, Signalverarbeitung sowie schnelle digitale Schaltkreise. Stephan Braun ist Mitglied beim VDE und IEEE. Er arbeitet im Gremium UK767.4 mit sowie bei CISPR/A WG1 und WG2.

interference technology Europe emc guide 2011

EMV 2011 – Themen, Trends und Technologie in Stuttgart Energieeffizienz, alternative Energien, E-Mobility – dies sind nur einige der Themen, die die EMVIndustrie vor neue Herausforderungen stellt. Die Antworten der Branche finden Sie auf der EMV, Europas führender Messe mit Workshops für elektromagnetische Verträglichkeit. Die Messe. Eine gelungene Arbeitsatmosphäre und gute Stimmung waren die Merkmale der EMV 2010. 3.425 Interessierte besuchten die Messe vom 9. bis 11. März 2010 in Düsseldorf. Die Mehrheit der Fachbesucher kam aus den Bereichen der Elektronik und Elektrotechnik und arbeitet in der Konstruktion und Entwicklung. Mit 76% war der Anteil der an Unternehmensentscheidungen beteiligten Besucher sehr hoch. Entsprechend hoch war die Zufriedenheit der Aussteller mit der Qualität der Besucher. Mit einem Auslandsanteil von 50% der Aussteller bietet die EMV nicht nur ein breites, sondern auch ein internationales Angebotsspektrum. „Die EMV 2010 war zukunfts-orientiert und hatte eine professionelle Atmosphäre für Aussteller und Besucher. Für uns, TKD Electronic Europe, waren es drei erfolgreiche Tage mit hohem Kundenpotential,“ fasste Dietmar Rebl von TKD Electronic Europe seine Erfahrungen vor Ort zusammen. Gute Aussichten für die nächste EMV verspricht die Tatsache, dass sich direkt nach der Veranstaltung bereits 80% der Aussteller für eine Teilnahme an der EMV 2011 vom 15. bis 17. März in Stuttgart ausgesprochen haben. Mehr als 100 Aussteller werden wieder erwartet. Der Kongress. Mit 1.048 Buchungen hat der EMV Kongress 2010 seine Bedeutung für die Branche bestätigt. Das Programm bestand aus 92 Sessions, 12 Tutorials, 8 Workshops und einem Seminar des EMV Fördervereins NRW e.V. Mehr als 100 Referenten deckten Themen aus u.a. den Bereichen Mess- und Prüftechnik, Kraftfahrzeugtechnik sowie EMV-Richtlinien und -Standardisierung ab. Auf der EMV 2011 stehen wieder 36 Halbtags-Workshops auf dem Programm. Diese Workshops vermitteln praxisorientiertes Fachwissen und sind eine hervorragende Weiterbildungsmöglichkeit. Die Auswahl und Zusammenstellung des Workshopprogramms übernimmt ein Komitee, zusammen-gesetzt aus Experten der Branche, unter Vorsitz von Prof. Dr. Marco Leone von der Otto-von-Guericke Universität Magdeburg. Weitere Informationen: www.e-emv.com

Interview mit Prof. Dr.-Ing. Marco Leone Herr Prof. Leone, was sind die TrendThemen der EMV-Branche? Wie wird sich die Bedeutung der EMV in Zukunft entwickeln? Die EU-Staaten haben sich gemeinsam verpflichtet, ihren CO2-Ausstoß um 8% im Vergleich zu 1990 zu senken und bis 2020 will die EU den Treibhausgasausstoß sogar um mindestens 20% reduzieren. Das gesetzte Ziel ist, den Anteil an erneuerbaren Energien bis 2020 auf 20% zu erhöhen. Somit gewinnen die Themen Solar- und Windenergie, Smart Grids und Elektromobilität an Bedeutung. Diese neuen Technologien werfen neue Fragestellungen hinsichtlich der EMV auf. Sie sind nicht nur rein technischer Natur, sondern haben auch Auswirkungen auf die Normung, z.B. was die Festlegung von Grenzwerten und die Wahl geeigneter Mess- und Analyseverfahren angeht. Insgesamt wird die Bedeutung der EMV angesichts immer komplexerer Systeme und zunehmender Integration weiter wachsen. Was macht die Arbeit im Komitee der EMV so interessant? Das Komitee setzt sich aus Angehörigen von Hochschulen, Industrie und Forschungseinrichtungen zusammen. Sie alle sind ausgewiesene Spezialisten auf den unterschiedlichen Gebieten der EMV. Neben dem Austausch untereinander ist es eine spannende Aufgabe alle Interessengebiete unter einen Hut zu bringen und die Veranstaltung auf die richtigen Trends auszurichten. Abschließend noch eine persönliche Frage: Was ist Ihr Steckenpferd im Bereich EMV? Es ist gerade die thematische Vielfalt, die dieses Fachgebiet so interessant macht und immer wieder neuartige Fragestellungen hervorbringt. Nichtsdestotrotz fußt alles auf dem sicheren Fundament der elektrotechnischen Grundlagen. Es ist daher keine Problemstellung – so komplex sie auch sein mag – nicht prinzipiell systematisch lösbar. Meine Arbeitsrichtung ist die physikalische Durchdringung von Störphänomenen, um so einfache und effektive Möglichkeiten der Ursachenbekämpfung identifizieren bzw. Optimierungen vornehmen zu können. Hier spielt die rechnerische Analyse und Simulation eine immer größere Rolle. Viele EMV-Probleme haben ihren Ursprung im elektronischen Schaltkreis. Daher widme ich mich seit vielen Jahren der EMV-Analyse auf Leiterplattenebene.

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EMV auf IC-Ebene Teil 1: Pulsstörfestigkeit von IC mit unterschiedlichen Packages

Sven König Langer EMV-Technik GmbH Bannewitz, Deutschland

Einleitung ikrocontroller begleiten uns heute auf Schritt und Tritt. Ob in einem MP3-Player, einem Mobiltelefon, in der Waschmaschine oder in einem Auto - überall arbeiten die kleinen Controller und erleichtern uns das Leben. Die Eigenschaften der in dieser Elektronik eingesetzten integrierten Schaltkreise (IC; engl. Integrated Circuit) bestimmen in hohem Maße die EMV-Eigenschaften eines gesamten Gerätes. Bei Mikrocontrollern geht die Entwicklung der Siliziumstrukturen unter 100 nm. Aktuelle Chipsätze im PC-Segment weisen derzeit Strukturen von 45 nm und weniger auf. Die damit verbundene Senkung der Betriebsspannungen und der Schaltschwellen erhöht die Empfindlichkeit der Mikrocontroller gegenüber Störbeeinflussung teilweise um das 10-fache im Vergleich zu den Vorgängermodellen. Der Logikpegel, die Schaltzeiten und damit der Störabstand wurden reduziert. Dadurch können die in den IC eingedrungenen Störimpulse mit einer Flankensteilheit kleiner einer Nanosekunde die Funktionen des IC beeinflussen. Die immer höher werdende Integrationsdichte von Schaltkreisen in elektronischen Geräten treibt die Entwicklung und Verwendung von ICs im Ball Grid Array (BGA)-Gehäuse weiter

English translation available at www.interferencetechnology.eu

EMC at Chip Level: Assessment of IC Immunity to Pulse Disturbances

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voran. Untersucht werden soll deshalb ein aktueller 32-bit Mikrocontroller, welcher auf einem ARM® Cortex®-M3 Prozessor basiert. Dieser arbeitet mit CPU-Frequenzen bis 96 MHz und bietet neben einem Highspeed USB Controller alles was heutige Mikrocontroller ausmacht. Angeboten wird der IC in unterschiedlichen Gehäusetypen. Von Interesse sind hier die Varianten des Controllers im 144 Pin Low Profile Quad Flat Package (LQFP) sowie im 144 Pin Low-Profile Fine-Pitch BGA (LFBGA)-Gehäuse. Wie verhalten sich unterschiedliche Gehäusetypen der ICs hinsichtlich der Störfestigkeit (Teil 1) und der Störaussendung (Teil 2)? Ist ein IC im BGA-Gehäuse störfester als sein Pendant im QFP? Oder wird die Empfindlichkeit hier gar erhöht? Welche Auswirkungen hat die Verwendung der teils wesentlich kleineren BGA-Typen auf die Störaussendung gegenüber eines QFP-Typs? Ziel der Störfestigkeitsprüfung von ICs Das Ziel ist es, die Prüfimpulse, wie sie bei den ESD- und Burstprüfungen für Geräte an den ICs auftreten, nachzubilden. Dies ermöglicht die Störfestigkeitsprüfung der einzelnen ICs, unabhängig vom Gerät oder der Baugruppe. Durch genauere Fehleranalyse können die Schwachstellen der ICs erkannt werden. Daraus ist es möglich, in der Applikation gezielt Gegenmaßnahmen zu ergreifen. Sind die EMVEurope emc guide 2011

Konig

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Eigenschaften eines IC bekannt, können diese während der Entwicklung beim Hersteller bzw. für den Einsatz beim Anwender berücksichtigt werden. Nur so lassen sich erhebliche wirtschaftliche Risiken in Grenzen halten und letztendlich eine sichere Funktion gewährleisten. teStSYSteMe und Bedingungen Die Festlegung der Prüfimpulse für ICs erfolgt aus den Prüfverfahren für Geräte. Die entsprechenden Prüfanordnungen erzeugen im Gerät elektrische und magnetische Störgrößen. Diese Störgrößen wirken auch lokal an der Schnittstelle zum IC-Gehäuse. Prüfgeneratoren für ICs müssen diese elektrischen und magnetischen Störungen allgemeingültig und reproduzierbar nachbilden. Abbildung 1 zeigt den prinzipiellen Verlauf einer Burst- oder ESD- Einkopplung in ein Gerät. Der angelegte Prüfimpuls uG(t) erzeugt einen durch die Baugruppe fließenden Stromimpuls i(t). Im Gerät entsteht ein Spannungsabfall ∆u(t). Aus der Spannung ∆u(t) entstehen elektrische Pulsfelder E(t). Aus dem Strom i(t) entsteht das Pulsmagnetfeld H(t). Diese Pulsfelder wirken indirekt über die von außen angeschlossenen Leiterzüge auf den IC oder direkt auf das IC-Gehäuse. Das Magnetfeld induziert Störspannung in bestehende Leiterschleifen. Über das elektrische Feld gelangt Verschiebestrom direkt in die Leiterzüge. Der resultierende Störstrom fließt über die angeschlossenen Leitungen in die IC-internen Strukturen und beeinflusst die Funktion des ICs. Bei der direkten Störbeeinflussung des ICs spielen die elektrischen und magnetischen Felder von sehr schnellen Vorgängen (z.B. der ESD-Kontaktentladung) eine besondere Rolle. Durch den internen konstruktiven Aufbau des ICs (Pin – Bonddraht – Lidframe – Chip...) entstehen Schleifen, die vom Störmagnetfeld durchsetzt und in denen Störspannungen induziert werden. Auf Grund der Bauhöhe des ICs sind seine internen Strukturen einer höheren Feldbelastung ausgesetzt als z.B. Leitungen auf der Leiterplatte. Die E- und H-Felder können auch direkt vom Testgenerator ausgehen und zur Beeinflussung führen. Um die Störbeeinflussungen, wie sie am IC bei der ESDbzw. Burstprüfung für Geräte auftreten, nachzubilden, entwickelte die Firma Langer EMV-Technik GmbH das IC-Testsystem. Mit diesem System ist es möglich, unter definierten Bedingungen und mit reproduzierbaren Ergebnissen, die Störfestigkeit von ICs zu testen. Für die leitungsgebundene Störbeeinflussung stehen die Generatoren (Probes) der Serie P200/P300 zur Verfügung. Mit den Probes P200 werden niederohmige Pins, wie z.B. die Versorgungsleitungen, getestet. Für hochohmige Eingangs- und Ausgangsports werden die Probes P300 verwendet. Diese Generatoren unterscheiden sich in ihrer Störcharakteristik. Als Pulsfeldquelle dient die Probe P1200 zur Einkopplung von Störmagnetfeld in den IC oder die P1300 zur Beaufschlagung mit elektrischen Feld. In Abbildung 2 ist der Aufbau zur direkten Störeinkopplung in den LFBGA-Baustein zu sehen. Der IC ist auf eine dafür angefertigte IC-Adapterleiterkarte aufgebracht und die Balls werden zu den jeweiligen Einkoppelpads auf der gegenüberliegenden Seite durchkontaktiert. In diese Einkoppelpads können die Störgrößen mit den Probes der Serien P200/P300 direkt in die Balls des BGAs injiziert werden. Der Chip arbeitet mit seiner vom Hersteller festgeleginterferencetechnology.eu

Abbildung 1. Entstehung der physikalische Störgrößen im Gerät

Abbildung 2. Aufbau zur leitungsgebundene Störpulseinkopplung

Abbildung 3. Schematischer Aufbau zur E-Puls-Feldeinkopplung

ten externen Beschaltung. Zusätzlich sind Filterelemente in Versorgungs- und Signalleitungen vorgesehen, um das Abfließen des Störimpulses zu verhindern und so definierte Bedingungen herzustellen. Die Adapterleiterkarten inklusive des ICs werden in eine Ground-Plane eingelegt und sind einfach austauschbar. Die Einkopplung in die Pins des LQFP gestaltet sich dagegen einfacher, da diese direkt mit der Probe erreichbar sind. Der gleiche Aufbau wird auch zur Puls-Feldeinkopplung InTErfErEnCE TECHnoLoGy

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EM V A U F iC - E B E n E

Tabelle 1. Störfestigkeit des Mikrocontrollers im LFBGA- und LQFP-Gehäuse

benutzt (siehe z.B. Abbildung 3). Dies ermöglicht eine kostengünstige und schnelle Prüfung der ICs auf ihre leitungs- sowie feldgebundene Störfestigkeit. ergeBniSSe Der bereits erwähnte 32-bit Mikrocontroller im LFBGAund LQFP-Gehäuse wurde hinsichtlich seiner leitungs- und feldgebundenen Störfestigkeit untersucht. In Tabelle 1 sind die Ergebnisse einiger ausgewählter Pins sowie die Empfindlichkeiten des Controllers auf elektrisches und magnetisches Feld in beiden Gehäuseformen zum Vergleich aufgeführt. Es zeigten sich nur geringe Unterschiede zwischen den Gehäusetypen bei der leitungsgebundenen Störpulseinkopplung auf die Pins (oberer Teil in Tabelle 1). Beide Controller reagierten bei denselben Störpegeln mit den identischen Fehlersymptomen. Bei genauerer Betrachtung der Ergebnisse wird man aber feststellen, dass die Fehlerschwellen beim Controller im LQFP-Gehäuse gleich oder z.T. geringfügig höher liegen als beim BGA. Das kann daran liegen, dass die Impedanz der wesentlich längeren Bonddrähte im LQFPGehäuse die leitungsgebundenen Störungen bedämpft. Erhebliche Unterschiede sind jedoch bei verschiedenen Pins desselben Controllers festzustellen. Die Core-Versorgung (VDDCORE) ist im Gegensatz zur Versorgung der GPIO-Ports (VDDIO) sehr empfindlich und muss vom Anwender im Layout kritischer betrachtet werden. Auch die Oszillatorpins XIN und XOUT unterscheiden sich in ihrer 68

InTErfErEnCE TECHnoLoGy

Störfestigkeit erheblich. Die in Tabelle 1 dargestellten Fehlerarten reichen dabei von einfachen Datenfehlern, über eine Resetauslösung bis hin zu Hardwarefehlern, bei denen der Controller einfach stehen bleibt. Bei hohen Störpegeln kommt es teilweise auch zu irreversiblen Fehlern wie ein Latch Up oder dem Defekt der internen Oszillatorschaltung. Bestimmte Regionen des Controllers reagieren empfindlicher. Eine Ursache kann der in dieser Region liegende Kern des Controllers mit seiner Peripherie sein. Maßnahmen, die vom Anwender getroffen werden müssen, um die Störfestigkeit der Geräte sicherzustellen, sind individuell abhängig von Aufbau und Funktion des gesamten Gerätes. Empfindliche Leitungen müssen z.B. zwischen GND-Lagen eingeschlossen sein, um elektrisches oder magnetisches Feld abzublocken. Des weiteren können diese Leitungen zusätzlich über Filterelemente geschützt werden. Die Abblockkondensatoren nahe am Versorgungspin verringern die Schleifengröße, in die eventuell Störspannungen induziert werden können. Wesentliche Unterschiede gibt es auch bei der Störfestigkeitsmessung der ICs auf Pulsfelder im Abstand von 3 mm (unterer Teil in Tabelle 1). Hier ist die größere Fläche des LQFP, und damit die größeren Schleifen und Koppelflächen im Inneren des Gehäuses, von Nachteil. Der IC im LFBGA zeigte bei der Einkopplung von elektrischem Feld erst bei hohen Spannungen eine Beeinflussung. Bei dem LQFP-Gehäuse EuroPE EMC GuIDE 2011

Deutschland

Konig

sind die ersten Fehler bei 5,1 kV feststellbar. Gegenüber ESD-Magnetfeldern ist der LQFP ebenso der empfindlichere Controller. Hier macht sich zudem eine Richtungsänderung des magnetischen Feldes deutlich im Test bemerkbar. In der Ursprungsrichtung 0° traten die ersten Fehler bei eingestellten 4,4 kV ein. Dreht man die Sonde um 90°, lässt sich der Controller auch von den maximal 9,5 kV nicht in seiner Funktion stören. Diese Erkenntnisse zum Verhalten des ICs auf Pulsfeldbeeinflussungen sind für die Platzierung des Schaltkreises auf der Leiterplatte bzw. der Baugruppe entscheidend. E-Feld empfindliche ICs sollten nicht in Bereichen mit hoher Feldstärke wie z.B. nahe eines nicht mit Ground verbundenen Metallgehäuses angeordnet werden. Eine weitere Möglichkeit wäre das Schirmen des IC gegen die Feldeinkopplung. Ein mit Ground verbundenes Bauelement wie z.B. ein Elektrolytkondensator in der Nähe der ICs kann als Schutzmaßnahme schon Helfen. Der getestete Controller im LQFP-Gehäuse würde durch ein stromtragendes Metallteil in seiner Ursprungsrichtung einen Fehler bei Plusmagnetfeldbeeinflussung auslösen. Die Drehung des ICs um 90° auf der Leiterplatte könnte das Problem vollständig lösen. Des weiteren sollten diese Bauelemente nicht am Rand der Leiterplatte angeordnet werden, da hier erfahrungsgemäß die Stärke des elektrischen oder magnetischen Feldes und damit

EMCC

DR. RAŠEK

EMI? ELECTRIC

die Störbeeinflussung am Größten ist. Zusammenfassung Die vorliegenden Messergebnisse zur Störfestigkeit eines aktuellen Mikrocontrollers zeigen, dass die Gehäuseart nur einen geringen Einfluss auf die leitungsgebundene Störfestigkeit hat. Der Mikrocontroller im LQFP zeigte höhere Empfindlichkeiten auf ESD-H- sowie ESD-E-Felder. Es kann also bedenkenlos auf Mikrocontroller im BGA-Gehäuse zugegriffen werden. Um die ICs störfester zu entwickeln, muss bei den ICHerstellern das entsprechende Know-how vorhanden sein. Die Erkenntnisse aus den Messungen mit dem Testsystem der Firma Langer EMV-Technik GmbH können in die IC-Entwicklung einbezogen werden. Elektronikentwickler können diese Erkenntnisse für die EMV-gerechte Layoutgestaltung ihrer Baugruppen verwenden. Die Firma Langer EMV-Technik GmbH bietet die entsprechenden Testmittel mit denen die EMV-Eigenschaften von ICs evaluiert werden können. SVEN KÖNIG is responsible for the tests and measurement equipment for electronic semiconductors at Langer EMV-Technik GmbH in Bannewitz. König was born in Dresden and studied electrical engineering at the “Studienakademie” in Bautzen. He has been an engineer at the Langer EMV-Technik GmbH since 2007.

EMP/Tempest Power Line Filters

INTERFERENCE? EMC Consulting and Testing EMC Certification EMC Components EMC Calibration EMC Seminars ElectroMagnetic Compatibility: Quality in Electronics EMCC DR. RAŠEK: Quality in EMC

The EMC Professionals Leaders since 1977 EMCC DR. RAŠEK Moggast, Boelwiese 8 • 91320 Ebermannstadt Germany T: +49 9194 9016 • F: +49 9194 8125 emc.cons@emcc.de • www.emcc.de

Expertise is one click away: www.ets-lindgren.com/filters

EMC, RADIO, TELECOM ENVIRONMENT, SAFETY interferencetechnology.eu interference technology

Deutschland

Neue EMV-Testeinrichtung für Hybrid-, Elektro- und Brennstoffzellenantriebe: 0 – 1000 V, ± 300 A, 100 kW S. Klein, J. Mooser Mooser EMC Technik GmbH Ludwigsburg, Deutschland

Prüfstandstechnik für die Zukunft Hybrid-, Elektro- und Brennstoffzellenantriebe im Automobil erfordern für die Gewährleistung der elektromagnetischen Verträglichkeit neue Testeinrichtungen. Die Mooser EMC Technik GmbH in Ludwigsburg hat dafür das zurzeit wohl modernste und leistungsfähigste EMV-Prüfzentrum in Betrieb genommen. Es erfüllt alle derzeitigen und in den nächsten Jahren zu erwartenden Anforderungen. Durch den hohen Zeit- und Kos-

tendruck in der Automobilindustrie ist es üblich, die EMV-Erprobung nicht erst im Auto durchzuführen, sondern möglichst früh auf Komponentenebene. Das gilt auch für die neue Hochvolttechnologie bei Hybrid-, Elektro- und Brennstoffzellenantrieben, wo Versorgungsspannungen von mehreren hundert Volt, Ströme von einigen hundert Ampere und Elektromotoren mit Leistungen von 50 Kilowatt und mehr keine Seltenheit sind. Mit einem Testbereich von bis zu 1000 Volt, 300 Ampere und 100 Kilowatt Leistung der Hochvoltversorgung und des Bremsmotors bietet das Prüfzentrum von Mooser optimale Voraussetzungen für EMVTests von Wechselrichtern, Motoren,

English translation available at www.interferencetechnology.com

New EMC Test System for Hybrid, Electric and Fuel Cell Drives: 0 – 1000 V, ± 300 A, 100 kW

Abbildung 1. Prinzipaufbau der neuen Absorberkabine

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Europe emc guide 2011

Durchdachte Lösungen für Messtechnik & Systeme EMV- und HF-Messtechnik HF- und Mikrowellenverstärker Programmierbare AC-/DC-Quellen Antennen-Messsysteme Halbleitertester (ESD und Latch-Up) Schlüsselfertige Komplettsysteme Technischer Service

emv GmbH Elektronische Meßgeräte Vertriebs GmbH

Wallbergstraße 7 82024 Taufkirchen Tel: +49 89 614171-0

Fax: +49 89 614171-71 Info@emvgmbh.de www.emvgmbh.de

Deutschland Hochvoltbatterien und Gesamtsystemen. Herkömmliche EMV-Messkabinen mit einer Auslegung nur auf 12- und 24-Volt-Bordnetze eignen sich nicht dafür. Da der Umgang mit so hohen Spannungen und Strömen – zumindest am Anfang – etwas gewöhnungsbedürftig ist, sind die Einrichtungen entsprechend abgesichert und das Personal wurde extra geschult. Gekoppelt und doch entkoppelt Um die Wechselrichter, Motoren, Hochvoltbatterien und Gesamtsysteme unter realen Bedingungen prüfen zu können, sind neben der externen Stromversorgung (eine Batterienachbildung mit der Möglichkeit der Rückspeisung von elektrischer Energie), ein Motorprüfstand in der Kabine und ein externer Motor erforderlich. Der externe Motor dient im Fahrbetrieb als Bremse und im Bremsbetrieb (Rekuperationsphase) als Antrieb für den Prüfling. Die Aufspannvorrichtung für den Prüfling ist bewusst universell ausgelegt. Zudem ist für die Prüflinge eine externe Flüssigkeits-Kühlanlage vorhanden. Für Tests, bei denen noch kein Elektromotor zur Verfügung steht, besteht die Möglichkeit, einen Wechselrichter mit einer Lastnachbil-

N e u e EM V-Te s t e i n r i c h t u n g

dung zu prüfen. Im Bild ist auch eine geschirmte HV-LISN zu erkennen. (Aus Gründen der Geheimhaltung sind die Prüflinge im Bild verfremdet.) Eine wichtige Anforderung ist die mechanische Koppelung beider Motoren, ohne dadurch die Schirmwirkung der EMV-Kabine zu beeinträchtigen. Dazu müssen die Motoren aber schwingungstechnisch gedämpft und voneinander entkoppelt sein, was durch zwei getrennte Motorfundamente mit einigen Tonnen Gesamtgewicht gewährleistet wird. Die Absorberkabine mit den speziellen Hochvoltfiltern und den Hochvoltdurchführungen hat Albatross Projects konstruiert. Ebenso die mechanische Durchführung von Motor 2 (Prüfling) zu Motor 1 (Brems- und Antriebsmaschine). Die Anforderungen an diese Durchführung waren Neuland. Bei einer Drehzahl von einigen tausend Umdrehungen pro Minute und einem Drehmoment von bis zu 300 Newtonmeter ist eine Schirmwirkung der Kabine von ≥ 100 dB angeraten. Dank des Filterkonzepts und der speziellen Durchführung für den Motorantrieb wird auch ein Eindringen der Wellenströme des externen Motors in die Kabine verhindert.

Abbildung 2. Testaufbau in der neuen AbsorberkabineIm Bild ist auch eine geschirmte HV-LISN zu erkennen.(Aus Gründen der Geheimhaltung sind die Prüflinge im Bild verfremdet.)

Komplett abgeschirmt Um den ungestörten Radio- und Funkempfang im Fahrzeug zu gewährleisten, müssen die Komponenten bestimmte Grenzwerte einhalten. Bei den Elektroantrieben wird aus einer hohen Gleichspannung durch Zerhacken eine 3-Phasen-Wechselspannung mit variabler Frequenz erzeugt. Dadurch entstehen sehr hohe und breite hochfrequente Störspektren. Allein durch die wesentlich höheren Spannungen sind die Störungen in der Größenordnung Faktor 50 (34dB) höher als bei herkömmlicher Kraftfahrzeug-Elektronik. Der komplette Hochvoltbereich (High Voltage-Bereich, HV), einschließlich der Steckverbinder, ist deshalb geschirmt. Das geschlossene Schirmkonzept ist eine Grundvoraussetzung bei den EMV-Messungen und hat weitere Sonderentwicklungen zur Folge, etwa Impedanzanpassungen der HVGleichspannungs-Versorgungsleitungen. Zwischen dem Elektroantrieb (HV-

Abbildung 3. Leerfeld in der Kabine mit drehendem externen Motor. In das Messdiagramm sind die Grenzwertkurven 5 für Peak und AverageBewertung nach CISPR 25 eingezeichnet.

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Europe emc guide 2011

nexio

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N e u e EM V-Te s t e i n r i c h t u n g

Abbildung 4. Störabstrahlung nach CISPR 25 mit einem Referenzstrahler. Grün: Referenzkurve vergleichbare Absorberhalle

bei 600 Volt pro Meter. In den internationalen Normen CISPR 25 (Comité International Spécia l des Per turbations Rad ioélec t riques) u nd den ISO-Normen 11452 sind auch die prinzipiellen Messauf bauten für Komponententests von herkömmlicher Automobil-Elektronik beschrieben. Die Messeinrichtungen des EMV-Prüfzentrums erfüllen selbstverständlich auch diese Anforderungen. Bei der Halterung für die Elektromotoren handelt es sich um eine massive Stahlkonstruktion auf einem Maschinenbett mit mehreren Tonnen Gewicht. Die Konstruktion ist so gelöst, dass sie die Messergebnisse nur unwesentlich beeinflusst.

Mit Energie versorgt Die Energieversorgung für die Prüflinge ist ein e r p r o b t e s u n d l e i c ht modifiziertes System des P r ü f t e c h n i k a n bie t e r s Kratzer Automation aus München. Die Eckdaten sind eine variable Spannung von Null bis 1000 Volt, Ströme von Null bis 300 Ampere und ein Elektromotor mit 100 Kilowatt Leistung. Die Anlage versorgt die Prüflinge mit Energie und kann während Abbildung 5. Störfestigkeitskurven nach ISO 11452-2. Benötigte Ansteuerleistung für 50 V/m im der Rekuperationsphase Referenzpunkt. Grün: Referenzkurve vergleichbare Absorberhalle. Rot: Messkurve der Absorberhalle für HVdie zurückgespeiste EnKomponenten und E-Antriebe. ergie aufnehmen. Auch Bereich) und dem 12-Volt-Bordnetz (Low-Voltage-Bereich, schnelle Lastsprünge sind möglich. Die Energieversorgung, LV) gibt es zahlreiche funktionale Verbindungen, weshalb der externe Steuerrechner und die Prüfsoftware von Kratzer beide Bereiche durch Schirme und Filter ebenfalls konse- Automation bilden mit dem externen 100 Kilowatt-Motor quent getrennt sein müssen. Diese Trennung ist ebenfalls und dessen Steuerung von ABB einen kompletten MotorTeil der EMV-Prüfungen. Bei den Prüfungen ist deshalb prüfstand in einer EMV-Kabine. Über die Schnittstellen das Gesamtsystem aufgebaut, bestehend aus HV- und LV- zum Steuerrechner können die Ingenieure die TestproKomponenten. gramme auf dem EMV-Prüfstand abfahren. Parallel zu der Absorberkabine hat Mooser einen Bitte keine Störung! Prüfstand für elektrische Tests an Hochvoltkomponenten Die Rahmenbedingungen bei Störaussendungsmessungen aufgebaut. Auf diesem Prüfstand wird bei HV-Geräten nach CISPR 25 gelten analog auch für die Messverfahren die Störfestigkeit gegen Restwechselspannungen, Dips der Störfestigkeit. In den ISO-Normen 11452 sind die Basis- und Drops und andere Eventualitäten geprüft. Diese Tests Messverfahren für die Störfestigkeit an Kfz-Komponenten sind auch in einem 1000-Liter-Temperaturschrank mit beschrieben. Die geforderte Störfestigkeit liegt meistens einem Temperaturbereich von -45 bis +185 Grad Celsius zwischen 100 und 300 Volt pro Meter, in einigen Fällen auch durchführbar. 74

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Europe emc guide 2011

deutschland

MOOser

ende Anforderungen an ein EMV-Prüfzentrum für Hochvoltanwendungen. Die aus den EMV-Tests von Wechselrichtern, Motoren, Hochvoltbatterien und Gesamtsystemen gewonnenen Erkenntnisse fließen nicht nur in die Entwicklungsprojekte der Kunden ein, sondern werden auch für die Weiterentwicklung der nationalen und internationalen Normenarbeit verwendet.

Abbildung 6. Energieversorgung 0 – 1000 V, +- 300 A, 100 kW

faZit Mit dem neuen EMV-Prüfzentrum für Hybrid-, Elektro- und Brennstoff zellenantriebe dürfte die Mooser EMC Technik GmbH die zurzeit wohl modernste und leistungsfähigste Anlage dieser Art betreiben. Durch ihre zukunftsweisende Konzeption erfüllt sie alle derzeitigen und in den nächsten Jahren zu erwart-

S. Klein is an EMC engineer at Mooser EMC Technik GmbH. J. Mooser is managing director of Mooser EMC Technik GmbH and Mooser Consulting GmbH . He ha s worked with a focus on EMC for more than 30 years, especially for the automotive industry. Mooser is a member of several national and international E MC standardization comAbbildung 7. Elektrische Tests wie Dips, Drops, mittees in the automotive industry.

Restwechselspannung an HV-Komponente unter Temperaturbedingungen

WÄHLEN SIE FÜR EMV-TESTS DIE A-KLASSE – DIE CBA-SERIE DER TESEQLEISTUNGSVERSTÄRKER! Die CBA-Serie von Teseq umfasst die komplette Palette Halbleiter-Powerverstärker der Klasse A. Diese sind punkto Frequenz und Leistung speziell auf EMV-Störfestigkeitstests zugeschnitten. Mit ihrer robusten und zuverlässigen Art garantiert die Serie jederzeit zuverlässigen Einsatz. Und dies verblüffend günstig! Auch in Zukunft hat Teseq die Nase vorn. Als weltweiter Leader halten wir unser Verstärkerportfolio konsequent auf dem neusten Stand der Frequenz- und Leistungsanforderungen.

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ment de contrôle, Contrôles

Le Segala Pradines, F-46090D-8 FRANCE, Fax : 3 3 -5 6 5 -5 3 9 9 9 0 2 2 , 3 3 -5 6 5 -5 3 2 2 2 3, 33-672700156, www.cst.com, info@france. cst.com, schrack@simlab.de, Klaus Schrack

K au t h e n b e r g s t r. 14 , S t r ick s ch e i d , DE-5 4 5 9 7 Germany, Vanessa Bauer ; Fax:++49(0)6556-93034; ++49(0)65569 3 0 3 3 ; V B @ aa r o n i a . d e ; T h o r s t e n Chmielus, owner, TC@aaronia.de; Manuel Pinten, Materials contact, mp@aaronia. de; www.aaronia.de Produits et services: Antennes, Protection, Instrument de contrôle

CST / SimLab Software GmbH

NEXIO

46 Avenue du General de Croutte, Toulous, 31100 France; +33 561 440 247; Fax: +33 561 440 567; www.nexio-online.com; Frederic Amoros, President, frederic.amoros-routie@nexio.fr Produits et services: Instrument de contrôle, Divers

P Prana

Z.I. La Marquisie, Avenue du 4 Juillet 1776B.P.24, Brive Cedex 19101 France; Fax: 33 555 86 4930, 33 5 55 86 4932; w w w.prana-rd.com ; Dennis Dumont, ddumont@prana-rd.com Produits et services: Amplificateurs

Schlegel Electronic Materials

Yelloz Component - MILMEGA, 4 Rue de Mayotte Z.I.de Courtaboeuf, FR- 91940 Les Ulis; +33 1 64 46 04 42; Fax: +33 1 64 46 92 70; www.yellozgroup.com; Eric Stunault, estunault@yellozgroup.com Produits et services: Matériaux conducteurs, Protection

Tech-Etch, Inc.

Yelloz Components, Za de Courtaboeuf, 4 Rue de Mayotte, F-91940 Les Ulis, France; +330164 4 604 42; Fax: +330160923801; yellozcomponents@yellowzgroup.com Produits et services: Matériaux conducteurs, Protection

Teseq Holding AG

Teseq Sarl, 50, route de Pontoise, 95870 Bezons / France; +33 1 39 47 42 21; Fax: +33 1 39 47 40 92; www.teseq.fr; francesales@teseq.com Produits et services: Amplificateurs, Antennes, Instrument de contrôle, Contrôles, Divers

EUROPE EMC GUIDE 2011

On aurait peut-être dû l’appeler la série « A+ ».

Notre nouvelle Série « A » consomme moins d’énergie, produit plus de puissance, est plus légère, plus petite, et fournit un meilleur rapport prix / performance. Nos nouveaux amplificateurs reconfigurés de la Série « A » sont tellement puissants et tellement efficaces que nous pouvons les rendre 25% à 50% plus petits tout en conservant la même puissance de sortie. Ils sont maintenant plus légers, plus portables, et tiennent facilement dans une salle de commande, ce qui se traduit par un très bon rapport qualité /prix pour vous. Et pourtant, ils produisent toujours 500, 1 000 et 2 500 watts de puissance, et même plus, selon le modèle que vous choisissez. Nous nous sommes également plus étendus. Nos amplificateurs de Série « A » couvrent maintenant la gamme des fréquences entre 10 kHz et 250 kHz. Ce qui vous permet de faire des essais en fonction de pratiquement n’importe quelle norme. Ils bénéficient de la technologie TEC de pointe, et peuvent être contrôlés à distance avec des interfaces IEEE, RS-232, USB et autres interfaces Ethernet. En plus de toutes ces caractéristiques innovatrices, nos amplificateurs de Série « A » consomment moins d’énergie, ce qui est un avantage pour vous et pour l’environnement. Notre nouvelle série « A » est également équipée d’une technologie de refroidissement améliorée. À 40 ans, AR dépasse encore les attentes en matière de qualité, de valeur, de technologie, de savoir-faire et de service après vente. Ce qui fait de ces nouveaux amplificateurs de Série « A » une évidence. En France, contactez AR France, contact@arfrance.eu ou appelez le +33-1-47-91-75-30 Tous droits réservés © 2010 AR. La bande orange sur les produits AR est enregistrée au US Patent & Trademark Office

ar europe Autres divisions ar : • modular rf • receiver systems National Technology Park, Ashling Building, Limerick, Ireland • 353-61-504300 • www.ar-europe.ie

Certifié ISO 9001:2008

FRANCE Ressources AssociAtions AssociAtion FrAnçAise de lA compAtibilitÉ electromAGnÉtiQUe (AFcem)

France; 33 4 76 27 83 83; Fax: 33 4 76 27 77 00; aemc.lab@wanadoo.fr Notified Body number : 1900

Pour la promotion et le développement de la Compatibilité ElectroMagnétique Association régie par la loi du 1er juillet 190128, route de Marolles - 94 440 Santeny; 01 43 86 13 96; Fax: 01 43 86 09 40; contact@afcem.org; www.afcem.org/index.asp

AseFA

ieee emc societY cHApter FrAnce

AseFA - plAte Forme F 03 - scHneider electric indUstries

André Berthon, Admittance, 11 rue Bertron, F-92330 Sceaux, France; +331 43345231; aberthon@club-internet.fr

notiFied bodies Aemc lAb

19 rue françois Blumet, ZI de l’Argentière, F38360, Sassenage,

33 avenue du Général Leclerc, 92260 Fontenay-aux-Roses, France; +33 1 40 95 63 34; Fax: +33 1 40 95 88 18; asefa@lcie.fr Notified Body number : 1969

37 quai Paul Louis Merlin, 38050 Grenoble cedex 9, France ; +33 4 76 39 85 51; Fax: +33 4 76 57 99 38; www.schneider-electric. com; william.magnon@schneider-electric.com Notified Body number : 1970

AseFA - plAte Forme n 01 - Alstom trAnsport

Ferrites for EMI Suppression Quality

Engineering

Service

23-25 avenue Morane Saulnier, 92364 Meudon-la-Forêt cedex, France; +33 1 46 29 15 03; Fax: +33 1 46 29 12 74; michel.mehez@transport.alstom.com; www.alstom.transport.com Notified Body number : 1971

AseFA - plAte Forme p 01 - leGrAnd

128 avenue du Maréchal de Lattre de Tassigny, F87045 Limoges cedex, France; +33 5 55 06 87 87; Fax: +33 5 55 06 88 88; didier.leblanc@legrand.fr Notified Body number : 1903

centre tecHniQUe des indUstries mecAniQUes

Fair-Rite Manufactures Components For: EMI Suppression Custom Cores Power Applications Antenna/RFID Applications Custom Machining Available

Visit Our Online Catalog @ www.fair-rite.com

52 avenue Felix Louat - BP 80067, F60304 SENLIS CEDEX, France; +33 3 44 67 30 00; Fax: +33 3 44 67 34 00; sqr@cetim.fr; www.cetim.fr Notified Body number: 0526

emitecH AtlAntiQUe

Rue de la Claie 15, ZI Angers-Beaucouzé, 49070 BEAUCOUZE, France; +33-2.41.73.26.27; Fax: +332.41.73.26.40; atlantique@emitech.fr; www.emitech.fr Notified Body number: 0726

emitecH - cHAssieU

Fair-Rite Products Corp. Your Signal Solution!

PO Box 288, One Commercial Row, Wallkill, NY 12589-0288 www.fair-rite.com | Ferrites@fair-rite.com (888) FAIRRITE (324-7748) or (845) 895-2055 | Fax (845) 895-2629

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7, rue Georges Méliès, F 69680 CHASSIEU, France; 33 4 78 40 66 55; Fax: 33 4 72 47 00 39; chassieu@emitech.fr; www.emitech.fr Notified Body number: 0573

emitecH GrAnd sUd

Rue du Massacan 145, ZI Vallée du Salaison, BP 25, 34741 VENDARGUES CEDEX, France; +33-4.67.87.11.02; Fax: +33-4.67.70.94.55; grand-sud@emitech.fr; www.emitech.fr

europe emc guide 2011

Ressources | FRANCE France; 33 3 89 28 33 60; Fax: 33 3 89 28 33 50; jacques.castelain@thurmelec.com; www.thurmelec.fr Notified Body number: 1897

Notified Body number: 0725

emitecH ile de FrAnce

Z.A. de l’Observatoire 3 rue des Coudriers, 78180 MONTIGNY LE BRETONNEUX, France; +33 1 30 57 55 55; Fax: +33 1 30 43 74 48; contact@emitech.fr; www.emitech.fr Notified Body number: 0536

emitecH - le rHeU

2 allée du Chêne Vert F35650 le Rheu, Le Rheu, France; 33 2 99 14 59 14; 33 2 99 14 64 54; lerheu@emitech.fr; www.emitech.fr Notified Body number: 1899

eUrocem

364, rue Armand Japy Technoland, 25460 Etupes, France; +33 3 81 90 75 90; Fax: +33 3 81 32 36 28; commercial@eurocem.fr; www.eurocem.fr Notified Body number: 1120 Directive: 2004/108/EC Electromagnetic compatibility GYL Technologies Parc d’activités de Lanserre 21 rue de la Fuye F49610 Juigne sur Loire, Juigne sur loire, France; 33 2 41 57 57 40; Fax: 33 2 41 45 25 77; gyl@gyl.fr Notified Body number: 1896

GroUpe d’etUdes et de recHercHes AppliQUÉes à lA compAtibilitÉ

Union tecHniQUe de l’AUtomobile, dU motocYcle et dU cYcle Autodrome de Linas-Montlhéry BP 20212, 91311 Montlhéry Cedex, France; +33 1 69 80 17 00; Fax: +33 1 69 80 17 17; www.utac.com Notified Body number: 0069

otHer ministÉre de l’economie, des FinAnces et de l’indUstrie diGitip/spic/sQUAlpi diGitip 5 Le Bervil, 12 rue Villiot, F-75572 Paris Cedex 12; +33 01 53 44 97 03; Fax: + 33 01 53 44 98 88; Michel Berger, michel.berger@finances.gouv.fr

FAITES-NOUS PART DE VOTRE RÉFLEXION Vos commentaires et vos avis revêtent une grande importance à nos yeux. Merci de bien vouloir consulter le site www.interferencetechnology.eu et remplir un petit questionnaire qui nous permettra d’améliorer le guide Europe CEM.

105 avenue du Général Eisenhower BP 23705 F 31037 Toulouse cedex 01, Toulouse, France, 33 5 61 19 46 50; Fax: 33 5 61 19 46 68; toulouse@gerac.com Notified Body number: 1898

institUt nAtionAl de l’enVironnement indUstriel et des risQUes

Parc Technologique Alata BP 2 , F 6 0 5 5 0 Verneuil-en-Halatte, France; +33.3.44.55.66.77; Fax: +33.3.44.55.66.99; pierre.gruet@ineris.fr; www.ineris.fr Notified Body number: 0080

PIONEER TECHNOLOGY The most ergonomic ESD guns on the market, designed to ensure the highest level of comfort when testing, and provide outstanding performance due to the high quality design by the pioneers of EMC test equipment.

lAborAtoire centrAl des indUstries electriQUes 33 avenue du Général Leclerc BP 8, F92266 Fontenayaux-Roses cedex, France; +33 1 40 95 60 60; Fax: +33 1 40 95 54 07; contact@lcie.fr; www.lcie.fr Notified Body number: 0081

> 16 and 30 kV > All in one design > No base unit > Touch screen > Modular > Meets all latest standards > Battery and mains operation > Optical interface > Smart multi-function key > Automatic polarity switching

lAborAtoire nAtionAl de mÉtroloGie et d’essAis

1, rue Gaston Boissier, 75724 PARIS CEDEX 15, France; +33 1 40 43 37 00; Fax: +33 1 40 43 37 37; info@lne.fr; www.lne.fr Notified Body number: 0071

lAborAtoire centrAl des indUstries electriQUes - etAbissement sUd-est

ZI Centr’Alp 170 rue de Chatagnon, F38430 Moirans, France; +33 4 76 07 36 36; Fax: +33 4 76 55 90 88; contact@lcie.fr; www.lcie.fr Notified Body number : 1905

tHUrmelec

Aire de la Thur BP 8 F68840 Pulversheim, Pulversheim, interferencetechnology.eu

www.haefely-onyx.com www.haefelyemc.com tel. +41 61 373 4111 mail. emcsales@haefely.com

interference technology

Conception Assistée par Mesure Champ Proches

France

ESIGELEC/IRSEEM Rouen, France

Les travaux présentés dans ce papier ont été réalisé dans le cadre du projet EPEA (EMC Platform for Embedded Applications) du pôle de compétitivité “Aerospace Valley”. Une des taches de ce projet était de développer un moyen d’essai pour réaliser des mesures en champ proche et de travailler sur le traitement des données de mesure.

I. Introduction l existe un grand nombre de méthodes de mesure normalisées permettant de valider le bon fonctionnement électromagnétique d’un produit. Ces méthodes sont très bien adaptées pour évaluer un produit dans son environnement d’utilisation. Toutefois en cas d’échec du test, ces méthodes se prêtent difficilement à la localisation et à l’identification précise de la source. Le temps d’investigation peut être long et couteux. L’utilisation d’outils de simulation se heurte malheureusement à la complexité des systèmes. La modélisation d’un système d’essai normalisé est souvent trop complexe pour pouvoir être reproduit fidèlement en simulation. Sans prendre en compte les problématiques liées à la simulation, la modélisation d’un équipement industriel est une tâche complexe nécessitant une pluridisciplinarité liée à la nature très diverse des composants constituant ce système (composants actif/passif, microcontrôleur, PCB, connecteurs, câbles, boitiers…).

II. MESURE EN CHAMP PROCHE Les mesures en champ proche sont un moyen simple de caractériser les émissions électromagnétiques émises par un produit. Cette méthode d’investigation permet une mesure du champ proche environnant le produit afin d’évaluer sa pollution électromagnétique. Les informations apportées sont ainsi très utiles pour caractériser et analyser le comportement CEM d’un produit. Ce moyen d’essai a plusieurs avantages intéressants dans un contexte industriel. A l’instar des méthodes normatives, il n’est pas nécessaire de développer une carte de test spécifique. Les mesures peuvent être réalisées sur un système industriel dans son environnement. A la différence des mesures en champ lointain, le champ proche contient des informations sur la source qui l’a fait naitre. Conjugué avec la mesure en cartographie, cette méthode d’essais permet de localiser et de caractériser avec une très bonne précision les sources de forte émission. Depuis une dizaine d’années, les mesures en champ proche connaissent un important développement poussé

NEXIO Toulouse, France

Blaise Ravelo David Baudry

Translations available at www.interferencetechnology.eu

Figure 1. Banc de mesure champ proche..

interference technology

Europe emc guide 2011

France

Conception Assistée par Mesure Champ Proches

champ dans la zone demandée. Remarque : Cette méthode de mesure peut être complétée par un algorithme de post traitement par interpolation. Comme nous venons de le souligner, la dernière piste pour réduire le temps de mesure se trouve dans l’utilisation d’algorithme de post traitement. Nous présenterons plus loin dans ce papier un deuxième algorithme (§3) permettant de réduire le nombre de composante de champ à mesurer. Figure 2. Synoptique d’un essai en mesure champ proche

Figure 3. Algorithme de déplacement adaptatif

par un fort intérêt industriel. Les principaux développements se sont portés sur la calibration et le développement de nouvelles sondes toujours plus performantes [3][4][5][6] [7][8][9][10] Toutefois il reste un long chemin pour utiliser cette quantité importante d’informations que constituent les données champ proche dans les processus de modélisation de composants et équipements électroniques. Trois étapes préliminaires doivent être franchies afin d’atteindre cet objectif dans un contexte industriel. a. Réduction du temps de mesure La réduction du temps de mesure est le premier défit dans un contexte industriel. Une cartographie en champ proche par nature demande un temps certain inhérent à la répétition des phases de capture du signal reçu par la sonde pour chaque point de mesure. Suivant le type de source, les mesures demandent une très grande résolution. Le nombre de point de mesure peut vite devenir important. La première piste pour réduire le temps de mesure est l’optimisation des équipements de test. L’optimisation des paramètres du contrôleur moteur des axes, comme le réglage précis des correcteurs numériques (PID, rampe de vitesse…), permet de gagner jusqu'à 15% du temps de mesure. Le récepteur de mesure peut également être optimisé pour réduire le temps de capture et de transfert des données. Les algorithmes de mesure peuvent également être optimisés pour répondre aux contraintes liées aux mesures champ proche. Nous travaillons sur des algorithmes pouvant réduire le temps de mesure d’un facteur 4. Couplé avec un post-traitement des données, ces algorithmes de mesure peuvent réduire très significativement les phases d’investigation sans pour autant dégrader la qualité des mesures. Le plus simple des algorithmes est l’algorithme adaptatif qui permet de réaliser une cartographie par passe successive. A chaque passe la résolution est réduite d’un facteur . Cet algorithme est adapté dans les phases d’investigation. Il permet d’avoir rapidement un aperçu du 84

interference technology

b. Mesure vectorielle en champ proche Les mesures en champ proche sont communément réalisées en amplitude à l’aide d’un analyseur de spectre. Pour obtenir un modèle utilisable sur des outils de simulation ou pour traiter les résultats de mesure, il est nécessaire d’obtenir la phase du champ en plus de son amplitude. Le problème de la mesure de phase est l’obtention d’une référence de synchronisation. Dans un contexte industriel, il est très contraignant, voir impossible, de se connecter directement sur le produit pour recueillir ce signal de référence (horloge par exemple). Une méthode consiste à introduire une seconde sonde de mesure qui servira de référence. Elle sera positionnée au dessus d’un composant bruyant représentatif de l’activité que l’on veut mesurer (quartz, µC, régulateur à découpage…). Cette sonde de référence est connectée à l’entrée R de l’analyseur de réseau. La deuxième sonde de mesure sera connecté à l’entrée A de l’analyseur de réseau. L’acquisition des signaux A et A/R est réalisé afin de permettre l’extraction du champ en module et phase (en complexe plus exactement). A l’aide de cette méthode de mesure, il est ainsi possible d’utiliser les mesures en champ proche dans des outils de modélisation numérique. c. Echange des données champ proche La dernière étape est relative à l’échange de données. Pour pouvoir manipuler et échanger les données, il est vital de définir un format de donnée des mesures champ proche. La première initiative a été lancé par le groupe PASTEUR, il y a maintenant plusieurs années. Le flambeau a été repris par le groupe de normalisation français UTE/IEC. Une annexe technique nommé IEC 61967-1-1 Ed. 1.0 est sortie en 2009. Elle défini cette proposition de standard et tente de faire référence comme format d’échange pour les données champ proche (en émission et immunité). Afin de promouvoir ce format, nous avons développé l’outil NFSViewer distribué gratuitement sur notre site [1]. Cet éditeur de données champ proche respecte les préconisations du format défini par l’IEC. NFSViewer est ouvert au développement collaboratif. Académiques et industriels peuvent y ajouter leur propre algorithme de post-traitement. Nous avons également travaillé avec les éditeurs de logiciel de simulation comme CST pour qu’ils intègrent ce format de données. L’intégration de ce format dans leur suite logicielle est en cours et nous espérons que d’autres éditeurs suivent le pas. III. ALGORITHME DE POST-TRAITEMENT Le traitement des données de mesures est très important. Il permet de convertir les résultats de mesure en données exploitables en simulation (traitements des fonctions de Europe emc guide 2011

Advertorial

EMV 2011 – sujets, tendances et technologies à Stuttgart L’efficacité énergétique, les énergies alternatives, l’EMobility – ce sont que quelques-unes des sujets qui représentent les nouveaux défis pour la branche EMC. Pour connaître ses répliques, visitez l’EMV, la foire européenne la plus importante avec des ateliers pour la compatibilité électromagnétique. La foire. L’EMV 2010 a été caractérisée par une atmosphère de travail efficace et conviviale. 3 425 visiteurs se sont rendus à la foire qui se tenait du 9 au 11 mars 2010 à Düsseldorf. La majorité des visiteurs provenait des domaines de l’électronique et du génie électrique et travaille dans la construction et le développement. A la grande satisfaction des exposants, le public était d’une qualité élevée avec une part très élevée de décideurs (76%). Avec une part des étrangers de 50% des exposants, l’EMV offre non seulement un large éventail de produits, mais aussi une offre d’envergure internationale. « L’EMV 2010 a été tournée vers l’avenir, offrant une atmosphère professionnelle pour les exposants et les visiteurs. Pour TKD Electronic Europe, ce furent trois jours de succès avec un nombre de clients potentiels élevés », résume Dietmar Rebl TKD Europe Electronic son expérience sur place. De bonnes perspectives pour la prochaine EMV, car immédiatement après l’événement, 80% des exposants ont déclaré vouloir participer à la prochaine EMV 2011 du 15 au 17 mars à Stuttgart. On s’attend alors à plus de 100 exposants. Le congrès. Avec 1 048 entrées, le congrès EMV de 2010 a confirmé son importance pour la branche. Le programme consistait en 92 séances, 12 didacticiels, 8 ateliers et un séminaire de l’association de soutien à l’EMV NRW e.V. Plus de 100 orateurs ont abordés des sujets dans les domaines de la mesure et du contrôle, dans la technologie automobile, les directives EMV et les normalisations. L’EMV 2011 proposera à nouveau 36 ateliers. Ils permettent d’acquérir des compétences pratiques et constituent un excellent outil de formation. Le comité responsable de la sélection et la compilation des programmes des ateliers est composé d’experts de la branche et est présidé par le Professeur Marco Leone de l’Université Otto-von-Guericke de Magdebourg. Pour de plus amples informations, adressez-vous à : www.e-emc.com

Interview avec Prof Dr Marco Leone M. Prof Leone, quelles sont les sujets principaux de la branche EMC? Comment la signification de l’EMV vat-elle se développer à l’avenir ? Les pays membres de l’UE se sont engagés conjointement à réduire leurs émissions de CO2 de 8% jusqu’en 2020 par rapport à 1990. L’UE vise même à réduire les émissions de gaz à effet de serre jusqu’à 20%. L’objectif fixé est d’accroître la part des énergies renouvelables à 20% d’ici 2020. Ainsi, les sujets « Energie solaire et éolienne », les réseaux intelligents et les véhicules électriques gagnent en importance. Ces nouvelles technologies soulèvent de nouvelles questions quant à la compatibilité électromagnétique. Elles ne sont pas seulement de nature purement technique, mais elles ont aussi des implications sur la normalisation, par exemple la fixation de valeurs limite et le choix des mesures et d’analyses appropriées. Dans l’ensemble, l’importance de l’EMV va continuer à croître en raison des systèmes de plus en plus complexes et de l’intégration croissante. Qu’est-ce qui rend le travail dans le comité de l’EMV si intéressant ? Le comité est composé de membres du milieu universitaire, industriel et celui des instituts de recherche. Ce sont tous des spécialistes chevronnés dans les différents domaines de l’EMV. En plus des leurs échanges, c’est un défi passionnant de réunir tous ces domaines d’intérêt et d’ajuster l’événement selon les tendances actuelles. Pour conclure, voilà une question personnelle : Quelle est votre violon d’Ingres dans le domaine de l’EMV ? C’est précisément la diversité thématique qui rend ce domaine si intéressant et qui pose toujours de nouveaux défis. Cependant, tout est basé sur le fondement solide du génie électrique. Il n’existe donc aucun problème – aussi complexe ne soit-il – qui ne puisse pas être résolu de façon systématique. Je travaille dans le domaine de la pénétration physique des phénomènes d’interférences pour identifier les moyens les plus simples et les plus efficaces de lutter contre leurs origines et pour apporter des améliorations. Ici, l’analyse mathématique et la simulation sont de plus en plus importantes. De nombreux problèmes d’EMV ont leur origine dans les circuits électroniques. Par conséquent, je me consacre depuis de nombreuses années à l’analyse de l’EMV au niveau des circuits imprimés.

France

Conception Assistée par Mesure Champ Proches

Figure 4. Principe de mesure vectoriel en champ proche

transfert des sondes/câbles/amplificateur/récepteur, filtrage du bruit, interpolation/extrapolation …). Nous proposons d’illustrer un exemple d’algorithme permettant de réduire le nombre de plans de mesure. La méthode de décomposition du champ en spectre d’ondes planes (PWS) est particulièrement bien adaptée à la propagation d’une source si cette dernière est connue dans un plan [11][12][13]. En considérant la propagation d’une onde monochromatique dans un espace libre, il est possible de trouver une solution à l’équation d’Helmholtz et de définir la décomposition du champ en spectre d’ondes planes comme le montre l’équation suivante :

En considérant dans l’équation d’Helmholtz, on peut définir la relation entre les vecteurs d’onde relatifs et les différentes composantes du champ. Δ

L’expression du vecteur d’onde pour une composante peut être définie en fonction du champ magnétique comme le montre l’équation suivante :

Le champ magnétique à une distance z > 0 peut être facilement calculé en utilisant l’équation suivante :

Il est ainsi possible de calculer analytiquement la composante Hz du champ magnétique en fonction des composantes tangentielles Hx et Hy dans le plan z=0 mais aussi Hx, Hy et Hz pour tout plan à z>0. Cet outil mathématique nous permet de réduire significativement le temps de mesure. Deux plans sont suffisants pour pouvoir calculer les trois composantes du champ n’importe où au dessus du plan de mesure. Cette théorie peut également s’appliquer 86

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Figure 5. NFSViewer - outil d’analyse des résultats de mesure en champ proche.

sur le champ électrique. Les figure 6 et figure 7 présentent quelques résultats d’utilisation de la théorie du PWS pour la génération de la troisième composante du champ. Nous constatons qu’il y a très peu de différences entre les cartographies du champ simulées et les cartographies du champ calculées que ce soit à partir de cartographie du champ magnétique ou du champ électrique. La figure 8 illustre les résultats d’extrapolation des cartographies du champ au dessus du plan de mesure. Là encore les résultats sont tout à fait satisfaisants. Avant d’implémenter l’algorithme sur le logiciel NFSViewer, nous avons étudié l’influence de différents paramètres sur la précision des résultats en utilisant sur le logiciel Scilab. b. Etude d’influence du zéro-padding : Le calcul du PWS introduit l’utilisation de la transformée de Fourrier 2D. Il est usuel de réaliser une opération de « zéro-padding » afin d’améliorer la résolution spectrale. Cette opération consiste à augmenter la dimension des données d’entrées par un remplissage de zéro. Remarque : même si il y a plus d’échantillon en sortie, il n’y a pas plus d’information ajouté par l’opération du zéro-padding. Il y a simplement plus de points calculés et donc une meilleure résolution comme le montre la figure 9 sur une FFT 1D. Le zéro-padding permet de résoudre le problème dit « d’effet de bord. Sans l’opération d’ajout de zéro, la matrice d’origine peut ne pas être correctement conditionnée et l’on obtient un repliement de spectre après application de la transformé de Fourier. La figure 10 illustre ce propos. Cette opération à un coût de calcul non négligeable. Le fait de rajouter uniformément des données autour de la matrice d’origine augmente très fortement la taille de la matrice sur laquelle on effectuera la FFT 2D. Le calcul du PWS introduit un iFFT (3) suivi d’une FFT (1). Il est donc doublement couteux, mais cependant nécessaire, d’augmenter la taille de la matrice d’origine. Afin de dimensionner correctement cette opération, nous avons étudié l’influence de ce paramètre. La figure 11 présente un des résultats de cette analyse. Les résultats montrent que l’amplitude n’est pas fortement affectée par la dimension du zéro-padding. Très vite, les effets de bord sont supprimés. La phase présente toutefois Europe emc guide 2011

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AUTOMATISATION ESSAIS Concepteur de la gamme BAT-EMC, logiciel leader en France pour l’automatisation des essais CEM/RF dans tous les domaines et diffusé largement dans les laboratoires privés, les grands groupes et les PME.

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Automobile Investigation d’un défaut d’immunité composant face à une injection BCI par mesure et simulation de paramètres S. Investigation numérique ESD sur équipement automobile et définition de règles de routage Modélisation de lignes de transmission couplées par méthode de Kron (MKCE)

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champ proche en émission. Bien que les t ravau x sur l’immunité en champ proche soient moins avancés que ne le sont ceux de mesures en émission, il faut noter que le développement des mesures champ proche en immunité est en forte augmentation depuis q uelq ue s a n né e s [14][15][16]. Cette tendance est portée par un fort intérêt des industriels pour cette méthode d’investigation de la susceptibilité des composants et des cartes électroniques « in-situ».

Figure 6. Calcul de la composante Hz en fonction de Hx et Hy.

REFERENCES

Figure 7. Calcul de la composante Ez en fonction de Ex et Ey.

une plus grande sensibilité. L’erreur devient acceptable après un padding de 500%. c. Etude d’influence du bruit de mesure : Afin de simplifier la validation de l’algorithme, nous avons travaillé sur des données de simulation. Toutefois cet algorithme est destiné à être utilisé sur des résultats de mesures. Pour évaluer l’influence de ce bruit de mesure sur les résultats du calcul, nous avons utilisé des résultats de simulation sur lesquels nous avons ajoutés un bruit banc caractéristique d’un bruit de mesure. Là encore, nous avons constaté que la phase présenté une plus grande sensibilité au bruit que l’amplitude. Toutefois l’algorithme reste très robuste au bruit additif et multiplicatif pouvant affecter les mesures. IV. CONCLUSION Dans un contexte industriel, il est nécessaire de disposer d’outils fiables et ergonomiques. Le projet EPEA a été l’occasion de capitaliser et d’appuyer les dernières innovations en mesure champ proche (BAT-Scan [2] et NFSviewer[1]). Cet article a présenté les avancées dans la mesure de l’émission champ proche en vue d’utiliser ces informations pour la modélisation des émissions. Ces développements récents ont été éprouvés pour des applications industrielles. Nous n’avons présenté volontairement que les mesures 88

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•

• [1] NFSViewer http://www.nexio.fr/nfsviewer/ • [2] BAT-SCA Nhttp://www.nexio.fr/ • [3] R. R. Goulette, "The Measurement Of Radiated Emissions From Integrated Circuits", IEEE Int. Symp. on EMC, August 1992. [4] J.J. Laurin, Z. Ouardhiri, J. Colinas, “Near-field Imaging of Radiated Emission Sources on Printed-Circuit Boards”, in Proc. IEEE Int. Symp. on EMC, 2001, pp. 368-373. [5] JR. Regué, M. Ribó, “A Genetic Algorithm Based Method for Source Identification and Far-Field Radiated Emissions Prediction from Near-Field Measurements for PCB Characterization”, IEEE Trans. Electromagn. Comp., vol. 43, pp. 520-530, November 2001. [6] J. Shi, M.A. Cracraft, J. Zhang, R.E. DuBroff, K. Slattery, M. Yamaguchi, “Using Near-Field Scanning to Predict Radiated Fields”, in Proc. IEEE Int. Symp. on EMC, Santa Clara, USA, vol. 1, August 2004, pp. 14-18. [7] D. Baudry, A. Louis, and B. Mazari, “Characterization of the openended coaxial probe used for near-field measurements in emc applications” Progress In Electromagnetics Research, PIER 60, 311–333, 2006 [8] B. Essakhi, D. Baudry, O. Maurice, A. Louis, L. Pichon and B. Mazari, "Characterization of radiated emissions from power electronic devices: synthesis of an equivalent model from near-field measurement", in Eur. Phys. J. Appl. Phys., vol. 38, pp. 275-281, May 2007. [9] D. Baudry, P. Fernandez-Lopez, B. Ejarque, N. Bigou, L. Bouchelouk, M. Ramdani, S. Serpaud, "Near-field probes characterization and inter-laboratory comparisons of measurements", in Proc. EMC Compo 09, Toulouse, November 2009. [10] M. Kanda, “Standard Probes for Electromagnetic Field Measurements”, IEEE Trans. Ant. Prop., Vol. 41, Issue 10, oct. 1993, pp. 1349-1364 Europe emc guide 2011

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Conception Assistée par Mesure Champ Proches

Figure 8. Extrapolation de plans Hx, Hy, Hz à 3 et 4mm à partir des plans Hx et Hy à 2mm • [11] D. T. Paris, W. Leach, E. Joy, "Basic theory of probe-compensated near-field measurements", IEEE Trans. On Antennas and Propagation, vol. 26, May 1978, pp. 373-379 • [12] J. J. H. Wang, "An examination of the theory and practices of planar near-field measurement", IEEE Trans. On Antennas and Propagation, Vol. 36, NO. 6, June 1988, pp. 746-753 • [13] D. Baudry, M. Kadi, Z. Riah, C. Arcambal, Y. Vives-Gilabert, A. Louis, B. Mazari, "Plane wave spectrum theory applied to near-field measurements for EMC investigations", IET Science, Measurement & Tech-

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nology, vol. 3, Issue 1, p. 72-83, January 2009 • [14] F. Lafon, F. De-Daran, J. Dupois, "Near Field Immunity cartography method to characterize an IC to fields radiated by an ESD", ICONIC, UPC, Barcelona, Spain, June 8-10, 2005. • [15] Boyer, A. Bendhia, S. Sicard, E., "Characterisation of electromagnetic susceptibility of integrated circuits using near-field scan", in Electronic Letters, vol. 1, January 2007, pp. 15-16. • [16] D. Baudry, A. Louis and B. Mazari, "Using a near field test bench for immunity investigation", in Proc. ICONIC 2007 conf., St. Louis, MO, USA, pp. 290-295, June 2007.

S.SERPAUD et L.ARNAL sont ingénieurs à NEXIO. NEXIO est une société française intervenant exclusivement dans le domaine de la CEM/ RF/FOUDRE. Autour de 3 activités stratégiques (Automatisation d’essais, Ingénierie Essais et Études-Simulation), NEXIO s’est imposé comme un acteur majeur du domaine auprès de grands groupes Aéronautique, Spatial, Automobile et Industrie électronique. Depuis 2006, la stratégie NEXIO est soutenue par son pôle Innovation et sa présence à l’export (Europe, USA, Asie). Dr D. Baudry et Blaise Ravelo sont enseignant-chercheur à l’ESIGELEC.L’ESIGELEC (Ecole Supérieure d’ingénieurs en Génie électrique) a défini ses trois (bientôt quatre) théEurope emc guide 2011

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Figure 9. EM field at X = 0.416 cm and Y = 1 cm.

Figure 10. Calcul de Hz avec et sans zéro-padding. Figure 11. Analyse de l’application du zéro-padding. matiques d’activités (Electronique, Automatique, Instrumentation et Informatique et bientôt Energie) en liaison étroite avec ses partenaires

industriels et universitaires. De nombreux partenariats aussi bien académiques qu’industriels en France et à l’international ont été établis et l’intégralité de l’activité est consacré à la recherche, au développement et au transfert.

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ElectroMagnetic Attacks Case Studies

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ElectroMagnetic Attacks Case Studies on Non-Protected and Protected Cryptographic Hardware Accelerators Laurent Sauvage Institut TELECOM, TELECOM ParisTech Secure-IC S.A.S., Paris, France

Olivier Meynard Institut TELECOM, TELECOM ParisTech DGA CELAR, Bruz, France

Sylvain Guilley Institut TELECOM, TELECOM ParisTech Secure-IC S.A.S., Paris, France

Jean-Luc Danger Institut TELECOM, TELECOM ParisTech Secure-IC S.A.S., Paris, France

Abstract lectromagnetic analysis (EMA) is an important class of attacks against cryptographic devices. In this article, we present two attacks to disclose the key of cryptographic implementations in FPGAs by taking advantage of EMA. The first one shows how the Correlation-based on EMA (CEMA) on a non-protected hardware AES module is possible from a distance as far as 50 cm. An analysis of the leakage structure shows that the Hamming distance model, although suitable for small distances gets more and more distorted when the antenna is displaced far from the device. We pre-characterized a physical model using a first order templates construction which allowed us to enhance the CEMA by a factor up to ten. Therefore, we conclude that EMA at large distance is feasible with our amplification strategy coupled to an

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innovative training phase. The second case is about a 3DES cryptoprocessor protected with Dual-rail with Precharge Logic (DPL). We experimentally show that this countermeasure can be broken by an EMA method which relies on two stages, the first being a localisation phase by means of the chip’s cartography, and the second being the EMA attack itself on the most relevant area. We conclude that both far and near field attacks are possible: the first ones exploit the radiation of the board, while the second one the radiation of the cryptographic component. I. Introduction Nowadays the design of mathematical cryptographic algorithm is very secure and believed unbreakable, but their hardware implementation leads to a latent vulnerability against physical attacks. Physical attacks designate the analysis of the variation of different physical magnitudes during the computation of the data by a cryptographic component. An attacker is able to eavesdrop different side channels such as timing, power or electromagnetic emanation. From those measurements, she can guess cryptographic secrets thanks to statistical tools that are used as distinguishers between several hypotheses. In 1999, Kocher et al described a side channel attack (SCA) suitable for smartcards: the power line, supplied from the card reader, was spied. Hence © 2010 IEEE. Reprinted, with permission, from 20109 IEEE EMC Society Symposium.

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Figure 2 (above). CEMA on sbox #1 at a distance d = 50 cm.

Figure 1. Far-field EM measurement test bench with its antenna on a plastic rod..

the name Differential Power analysis (DPA) given to this attack. With this cryptanalysis method an attacker can successfully reconstruct the secure data [1]. Two years later, Gandolfi et al introduces the principles of the EMA, ElectroMagnetic Analysis [2]. In fact Gandolfi applies the very method of the DPA to Electromagnetic emanations. EMA exploits correlation between secret data and variation in power radiation emitted. Several laboratories have worked on this topic, thus in [3], [4], Agrawal Getelec-94x140 FR:getelec pub 31/08/10 17:24 Page1

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Table 1. Comparison of the Number of Traces to Break a Sub Key Thanks to CPA vs Pre-Characterized Model.

Figure 3. Pre-characterized leakage model at 50 cm for the Sbox #1.

highlights that a EM probe can yield multiple EM signals via demodulation of different carriers in near and in far fields. With the contribution of Brier et al, who introduced the CPA Correlation Power Analysis [5], Electromagnetic analysis becomes an important class of attacks against cryptographic, and more particularly Correlation-based on ElectroMagnetic Analysis (CEMA). Thanks to this cryptanalysis technique and the wealth of components in the spectrum of the Electromagnetic waves, we are now able to perform attack at Distance from the chip and in near field to defeat the protection used to avoid easy attack. In section II, we present the last results on the CEMA at distance. It is noticeable that current experimental setups allow to manage an attack at 50 cm on unprotected cryptographic components. Moreover in this section we propose a way to enhance the attack by reducing the number of measurements. Then, the section III describes the EMA applied to disclose the protection in Near Field, by cartography. Finally, section IV gives with the conclusion and the perspectives for further works. II. CEMA AT DISTANCE ON A NON-PROTECTED AES HARDWARE MODULE Correlation-based on ElectroMagnetic Analysis (CEMA) has been well studied in near-field. Some far-field experiments have been shown to be promising. However, no indepth analysis has been carried out so far about EMA at distance. Here we introduce such kind of systematic study. A. Model of Power Consumption or EM Radiation Classically most power analysis exploit a dependence of the Hamming weight of a sensitive variable. This is referred 94

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Figure 4. Correlation obtained on sbox #1 at 50 cm with the precharacterized model.

to as the “Hamming weight model”, that consist in the number of bits in a data word set to ‘1’. But since 1998 and the introduction of CPA by Brier et al, the Hamming distance model is more widely used. It is assumed that the data leakage through the power side channel depends on the number of bits switching from one state to another one at a given time. If we consider the fact that the transition from state to state are triggered by events such as the edges of the clock signal, we can deduce that the current consumed is related to the energy required to flip the bit from one state to the next. After having introduced the model of consumption, we can now present the statistical process based on Pearson Correlation Factor for guessing the secret key. B. Pearson Empirical Correlation Factor Classical statistics introduce the Pearson correlation factor ρ(W, H) between the Hamming distance model and the measured power. It is defined as:

where W represents the measurement and H the Hamming distance. To obtain the Hamming distance model few hypotheses on the key are done. We notice that ρ(W, H) follows the Cauchy-Schwarz inequality: -1 ≤ ρ(W, H) ≤ +1. The correct key is obtained when for the right key hypothesis tends to ±1. For further experiments we use this tool to conduct attacks. C. The Test Bench The device whose EM emanations are studied is caEurope emc guide 2011

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denced by a clock running at 24 MHz. For these low frequencies, the usage of a Faraday cage [6] is not needed as it would induce some EM reflections and could alter the measurements. Furthermore, the size of the absorber would be too Figure 5. Schematic of a large for this range of frequencies. DPL AND gate. The material is placed on a plastic table that limits the reflection of EM radiation and avoids the conducted radiation. A plastic rod is placed perpendicularly to the board and is considered as a vertical axis to move the antenna by steps of 5 cm, as shown in Figure 1. The targeted device is a Field Programmable Gate Array (FPGA) Virtex II by Xilinx. It embeds one AES [7] Rijndael supporting 128-bit keys. The attacked chip has no countermeasure against EMA: its implementation adheres in a straightforward manner to the NIST FIPS 197 standard. Moreover a trigger signal is outputted, each time an encryption is beginning. This saves synchronisation problems. We take care of keeping far away the supply power from the chip board, in order to avoid any coupling between the radiated waves and the power supply. We record the emanations on the side with the decoupling capacitors, because the signal on this part of the board has the best quality. D. The Attack at distance on the Cryptographic Implementation of AES Firstly we check that for different distances, the curves for the same plaintext are scaled down, according to an inverse power law. We notice, as expected, that the useful signal decreases following 1/di law of attenuation (where d is the distance and i a positive real number). We make the assumption that the noise reaches a limit. Indeed, the closer we get to the electronic board, the more the noise level increases, because we capture the perturbations from the board components in addition to the ambient noise. To confirm these hypotheses, we have performed an attack on the AES, when the antenna was placed much further away, at 50 cm from the FPGA board. In practice, the signal was amplified of 60 dB and averaged by a factor of 4,096. The attack needs 51,519 measurements to break the substitution box (sbox, called SubBytes in AES) #1, whereas only 1,000 are required at d = 0 cm. The correlation curve is represented in Figure 2. The correlation does not clearly stand out. At this large distance we assume that the attack requires too many traces to fully disclose the key because the Hamming model is not holding anymore. That is why we propose a method to build an improved model based on the construction of 28 = 256 templates [8]. We indeed assume the leak of individual bit amongst the 8 that are targeted still complies with that described in II-A. Thus our approach differs from that of [9], which takes into account a dissymmetry on the transitions edges, we will describe in Sec. III (notably in Fig. 9). However, the contribution of each bit and possible interference between them is encompassed by our template construction. We search the index tc of the maximal correlation, that corresponds to the moment when the data are stored in the register on the last round. We compute for this index the average and the variance for the

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Figure 6. Floorplan of the system-on-chip programmed in a Stratix.

256 possible Hamming distances, the key and the message being known. This precharacterized leakage model is shown in Figure 3. We observe that the standard deviation is almost independent of the byte distances. Therefore, most of the model information is contained in the mean leakage value. As a consequence, we adopt a tabulated leakage model consisting in a look-up to the corresponding estimated averages. After this characterization, we launched a correlation attack on sbox #1 with the newly obtained model. The attack is considerably enhanced: the key byte entering this sbox is disclosed with as few as 5,003 traces. The correlation curve for the correct key guess is shown in Figure 4. The peak at t = tc is clearly visible, especially when contrasted with the correlation curve obtained with a classical CEMA in Figure 2. These experiments confirm that the leakage model based on the Hamming distance model is not optimal at distance (Refer to Table I for attacks figures). III. EMA CARTOGRAPHY ON A PROTECTED 3DES HARDWARE MODULE In this section, we propose a method to locate any cryptographic coprocessor protected with Dual-rail with Precharge Logic. We first present the principle of this sidechannel analysis countermeasure, and the cryptographic application we intend to attack. Then, we expose our localization technique, and finally give experimental results showing the gain it is able to achieve. A. Dual-rail with Precharge Logic The objective of Dual-rail with Precharge Logic (DPL) is to make constant the power consumption, and in turn the electromagnetic radiations, of an integrated circuit. To

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ElectroMagnetic Attacks Case Studies

a complete System on Programmable Chip (SoPC) including a master processor for I/O communication and three cryptoprocessors achieving the triple Data Encryption Standard (3DES) [10]. Although DES has been replaced by the Advanced Encryption Standard (AES) [7] since year 2001, the American National Institute of Standards and Technology (NIST) considers 3DES to be appropriate through year 2030, and the electronic payments industry still uses it for its compactness when implemented in hardware, with an area representing a quarter of AES’s. DES1 and DES2, on the top left and bottom left corners of Figure 6, are two unprotected modules which serve as reference to evaluate the security gain conveyed by the protected one. WDDL (Wave Dynamic Differential Logic [11]), the module protected by DPL, is located on the right of the SoPC floorplan. The placement is constrained by the LogicLock (LL) feature of Quartus. We have programmed this real-life application in an EP1S25 “Stratix” Altera FPGA (130-nanometer technology), embedded on a “SHIX2.0”, an 8-layer PCB (Printed Circuit Board) professional board. Note that this FPGA is not EM-shielded, thus our attack is totally non-invasive. Figure 7. The antenna over the “SHIX2.0” board and the FPGA.

Figure 8. EM field at 4.333 MHz.

reach this goal, each bit is represented by a couple of signals, and calculations alternate between a precharge (PRE) and an evaluation (EVA) phase. Figure 5 is an example of a DPL AND gate. In PRE, all of the inputs on the left are forced to ‘0’, which in turn forces the true output yT and the false output yF to ‘0’. Then, in EVA, after inputs toggle, only exclusively yT or yF will be set to ‘1’. This way, whatever the temporal transition, either EVA to PRE or PRE to EVA, and whatever the processed data, only one of the differential outputs commutes, yielding a constant transition count. As the power consumption is directly related to the number of transitions in CMOS technology, the activity is constant as well, whatever the variables’ values. B. The FPGA-based Cryptographic SoPC To illustrate the efficiency of our method, we apply it to 96

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C. Spotting by Cartography The principle of EM cartography is to measure the EM field for every point of a 2D grid covering all or only a part of the chip. This grid corresponds to the set of positions of the antenna placed by means of an X-Y motor driven table. The measurements are typically made with a spectrum analyser when working in the frequency domain, or with a digital oscilloscope in the temporal domain. Lastly, post-processing has to be applied on these measurements to obtain the final map. In the EMC area, it traditionally corresponds to extract the maximum amplitude of the EM field for each frequency component, and check it does not exceed thresholds required by standards. In the SCA topic, the post-processing has to bring out point(s) where the EM field is correlated to the cryptoprocessor activity. To locate a cryptoprocessor protected with DPL, our technique simply consists in targeting the activity of the signals controlling the alternate between the precharge and evaluation phase. In our implementation, these phases occur on the rising edge of the SoPC clock, whose frequency is 8.333 MHz. Therefore, the internal frequency of the DPL DES cryptoprocessor can be viewed as being equal to half of that of the SoPC clock, and thus equal to 4.166 MHz.The map for this latter is given in Figure 8. The dashed rectangle is a landmark which delimits the ASIC of the FPGA. On the right, the scale gives the voltage dynamic range at the output of the antenna (proportional to the EM field). The EM field has been collected using an antenna of the “HZ-15 Probe Set” from “Rohde and Schwarz” [12], a 60 dB – 100 kHz to 3 GHz pre-amplifier, and an “54855 Infiniium Agilent” [13] oscilloscope, whose bandwidth is 6 GHz and maximal sample rate is 40 GSa/s. The antenna is mounted on a 2D motorized table and moved over the FPGA through an area of 2.08 cm x 2.00 cm. The resolution is of 50 points on X and on Y. In other words, the mechanical step equals 400 µm. Figure 7 is a photograph of the EMA experimental setup, with the antenna over the most leaking point. In Figure 8, five areas stand out: two at the top, two at the bottom, and one large to the right of the figure. A first Europe emc guide 2011

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(a) Unprotected DES Module — CPA in 4-bit Hamming Distance Parameter \ SBox #

S1 478,720 5.58 6.22

Measurements To Disclose Covariance factor [%] SNR @ Disclosure

S2 S3 S4 197,056 464,128 614,720 6.23 5.84 4.78 6.41 6.23 7.03

S5 S6 S7 709,056 418,944 348,288 5.42 4.47 4.58 6.37 5.29 4.57

S8 134,080 8.23 8.08

(b) WDDL DES Module — CPA in 1-bit Hamming Weight S1

Parameter \ SBox #

S3 S4

5,469,440 1,368,000 557,248 3,597,184

Measurements To Disclose Covariance factor [%] SNR @ Disclosure

1.89 3.66

0.88 3.27 1.08 3.79 3.70 4.69

1,116,672 2,876480 5,508,224 2.48 4.80

S8 134,080

1.75 1.77 3.94 4.18

1.64 4.63

Table 2. Statistics for the Power Analysis on a 3DES Module.

(a) Unprotected DES Module — DEMA (DPA with EMA signals) in 4-bit Hamming Distance Parameter \ SBox #

Measurements To Disclose Covariance factor [%] SNR @ Disclosure

2,610

5,422

1,454 4,902 3,056

3,637

2,804

655

7.81

6.32

5.65 7.43 7.17

4.69

4.24

7.83

S4 S5 S6 S7 S8

(b) WDDL DES Module — CPA in 1-bit Hamming Weight Parameter \ SBox # Measurements To Disclose Covariance factor [%] SNR @ Disclosure

S1 62,976

32,768

S4 S5 S6 S7 S8 37,120

27,648

25.65

28.93

30.25 60.97 37.23

45,312 14,592 27,136 3,840 32.16

26.87

44.69

5.80

4.20

3.63 4.75 5.04

4.13

5.08

5.39

Table 3. Statistics for the Electromagnetic Analysis on a 3DES Module.

validation of our method is that highlighted areas are mostly on the right, which corresponds to the place of the DPL DES module in the floorplan (refer to Figure 6). The validation will be completed by analysing the results of the attack on these five points. We detail them in the following section.

33 19

D. EMA Attack For all the relevant areas, new acquisitions have been launched to perform a classical CEMA. For clarity of explanation, only the best results will be presented in the rest of the paper. They have been obtained for the large area marked “Most leaking area” in Figure 8, whose center is located at X=0.416 cm and Y=1 cm. With an eye to illustrate particular phenomenons, a 256 times averaged temporal trace of the EM field at this point is depicted in Figure 9, on the left. We can observe that the EM field is positive for the precharge, negative for the evaluation. This could be explained by the current inversion of the CMOS capacitors. At the beginning of the precharge phase, the CMOS gates of DPL go from 1 to 0, whereas this is the other way round when switching from the precharge phase to the evaluation phase. Tab. II reports the statistics for a classical Power Analysis (PA): the number of Measurements To Disclose (MTDs) the key, with the worst value grayed, the Signal over Noise Ratio (SNR) and the covariance factor at disclosure. The SNR indicator illustrates the ratio between the level obtained with the right key and those from the strongest wrong key. Results for the EMA are reported in Tab. III. Its superiority to the C/DPA is well illustrated as the number of MTDs for the unprotected interferencetechnology.eu interference technology

ElectroMagnetic Attacks Case Studies

France

Figure 9. EM field at X = 0.416 cm and Y = 1 cm.

DES module is hundreds of times less. For DPL, CEMA able to retrieve the secret key in less than 62,976 encryptions. By considering the worst MTDs and cross-comparing them, we can conclude that the security gain of our implementation of DPL equals 7.8 against CPA, 11.6 against CEMA. It confirms that DPL brings a certain protection against EMA, yet insufficient with respect to the 5,508,224 measurements needed to disclose the key with CPA. To conclude, the proposed method is thus experimentally validated by successfully attacking a FPGA-based DPL 3DES cryptoprocessor. The accurate X-Y location of the antenna permits to gather the activity of only the targeted module, discarding the activity of others parts of the FPGA, acting as noise for an attacker. IV. CONCLUSION & FUTURE WORKS This paper shows that the electromagnetic measurements represent a very efficient manner to capture the activity of a device in order to extract the secret information it conceals. We illustrate a first attack that succeeds with an antenna located at 50 cm from the targeted device. This proves that the attacker can be relatively far from the circuit by taking advantage of this non-intrusive method. The second attack is performed near the chip and allows the adversary to recover the key of a cryptoprocessor protected by DPL. Compared to DPA or CPA, the 98

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corresponding DEMA or CEMA needs much less traces. In both cases there is an evidence that the leakage is largely broadcast via the electromagnetic side channel. However some extra processing is needed to fully exploits the leaked information as it is either the sum of many electromagnetic sources (far EMA) or has to be spatially detected (near EMA). The far-field EMA exploits the global EM radiations emitted by the complete PCB, notably the power lines and the decoupling capacitors. On the contrary, the near-field EMA exploits the local EM radiations emitted by the chip’s power network. The traces obtained from electromagnetic acquisitions have not yet revealed all their potential as there are also many parameters like the phase and frequency which could produce relevant information. Future works will then improve in a concomitant manner the processing of the traces and the attack algorithms. This implies a better knowledge of how the electromagnetic signal is generated and where are the exact sources or the best locations to consider. REFERENCES • [1] P. C. Kocher, J. Jaffe, and B. Jun, “Differential Power Analysis,” in Proceedings of CRYPTO’99, ser. LNCS, vol. 1666. SpringerVerlag, 1999, pp. 388–397, (PDF). • [2] K. Gandolfi, C. Mourtel, and F. Olivier, “Electromagnetic Analysis: Concrete Results,” in CHES, ser. LNCS, vol. 2162. Springer, May 14-16 2001, pp. 251–261,

Paris, France. • [3] D. Agrawal, B. Archambeault, J. R. Rao, and P. Rohatgi, “The EM Side–Channel(s),” in Cryptographic Hardware and Embedded Systems – CHES, ser. LNCS, B. S. Kaliski Jr., C¸ etin Kaya Koc¸, and C. Paar, Eds., vol. 2523. Springer, 2002, pp. 29–45, Redwood Shores, USA. • [4] D. Agrawal, J. R. Rao, and P. Rohatgi, “Multi-channel attacks,” in CHES, ser. LNCS, vol. 2779. Springer, 2003, pp. 2–16. • [5] E. Brier, C. Clavier, and F. Olivier, “Correlation Power Analysis with a Leakage Model,” in CHES, ser. LNCS, vol. 3156. Springer, August 11–13 2004, pp. 16–29, Cambridge, MA, USA. • [6] Y. Souissi, J.-L. Danger, S. Mekki, S. Guilley, and M. Nassar, “Techniques for electromagnetic attacks enhancement,” in DTIS (Design & Technologies of Integrated Systems), ser. IEEE. IEEE, March 23-25 2010, Hammamet, Tunisia. • [7] NIST/ITL/CSD, “Advanced Encryption Standard (AES). FIPS PUB • 197,” Nov 2001, http://csrc.nist.gov/publications/fips/fips197/fips-197.pdf. • [8] S. Chari, J. R. Rao, and P. Rohatgi, “Template Attacks,” in CHES, ser. LNCS, vol. 2523. Springer, August 2002, pp. 13–28, San Francisco Bay (Redwood City), USA. • [9] E. Peeters, F.-X. Standaert, and J.-J. Quisquater, “Power and electromagnetic analysis: Improved model, consequences and comparisons,” Integration, The VLSI Journal, special issue on “Embedded Cryptographic Hardware”, vol. 40, pp. 52–60, January 2007, DOI: http: //dx.doi.org/10.1016/j. vlsi.2005.12.01310.1016/j.vlsi.2005.12.013. • [10] NIST/ITL/CSD, “Data Encryption Standard. FIPS PUB 46-3,” Oct 1999, http:// csrc.nist.gov/publications/fips/fips46-3/ fips46-3.pdf. • [11] K. Tiri and I. Verbauwhede, “A Logic Level Design Methodology for a Secure DPA Resistant ASIC or FPGA Implementation,” in DATE’04. IEEE Computer Society, February 2004, pp. 246–251, Paris, France. DOI: 10.1109/DATE.2004.1268856. • [12] Rohde and Schwarz: http://www.rohdeschwarz.com/. • [13] Agilent Technologies: http://www. agilent.com/.

EN SAVOIR PLUS EN LIGNE Pour obtenir les listes mises à jour de produits et de services ainsi que les traductions en anglais des articles techniques, veuillez consulter le site www.interferencetechnology.eu.

Europe emc guide 2011

ITALIA 100

PRODOTTI E SERVIZI

100

RISORSE

ARTICOL0

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Come un ricevitore completamente digitale pienamente conforme può ridurre l’incertezza di misura nelle prove di emissione per Compatibilità Elettromagnetica DOMENICO FESTA, IBD INTERNATIONAL BUSINESS DEVELOPMENT

Translations available at www.interferencetechnology.eu

ITALIA Prodotti e Servizi A

Strumentazione per test

Prodotti e servizi: Schermatura

berto Grego, roberto.grego@narda-sts.it Prodotti e servizi: Amplificatori, Antenne, Strumentazione per test

S ETS - Lindgren AR / RF Microwave Instrumentation

Teseo S.p.A., C.so Alexander Fleming, 25/27/29, Druento, Italia 10040, +39-011994-1911, Fax: +39-011-994-1900,www. teseo.net, Marco Dealessi, mdealessi@ teseo.net Prodotti e servizi : Amplificatori , Antenne, Cavi e connettori , Stanze e spazi schermati , Oscillazioni di tensione e sovratensioni temporanee , Strumentazione per test

Unit 4, Eastman Way, Pin Green Industrial Area, Stevenage, Hertfordshire, SG1 4UH, United Kingdom; +44- (0) -1438-730700; Fax : + 4 4 - ( 0 ) -14 3 8 7 3 0 7 5 0 ; uk @ et slindgren.com; www.ets-lindgren.com Prodotti e servizi: Antenne, Cavi e connettori, Filtri, Stanze e spazi schermati, Schermatura, Strumentazione per test, Test

S cha f f ner E M C S r l , V ia Gal i leo Gal i le1,471-20092 Cinisello Balsamo (MI), Italia; +39 02 6604 3045; Fax: +39 02 6123 943; italysales@schaffner.com Technopartner, Via Delle Imprese, 44/46 Ang Murari, Brembate Sotto 24041 Italia; +39 035.4874010; Fax: +39 035.4826473; market ing@technopartner.it; www.fair-rite.com

AH Systems, Inc.

Filtemc Electronic Equipment Co., Ltd

#9 Lanxiang Road,Tianqiao Industrial Area Jinan, Shandong, 250032, China 0086531-85708588, 85715366 85707366; Fax: 0086-531-85717366; www.filtemc.com; filtemc@filtemc.com; info@finmotor.com Prodotti e servizi: Filtri, Test

Finmotor srl Em Test AG

Volta S.p.A., Via del Vigneto 23, 39100 Bolzano, Italia; +39 0471 56 11 20; Fax: +39 0471 56 11 00; gba@volta.it; www.volta.it Prodotti e servizi: Oscillazioni di tensione

Via Edison, 217, 20019 Settimo Milanese, (Milano) - Italia, +39.02.48910020, Fax: +39.02.48910053, http://finmotor.com, info@finmotor.com Prodotti e servizi: Filtri

e sovratensioni temporanee, Strumentazione per test, Test

EMC Partner

AFJ Istruments Srl, Mr. Marco Mozzi, Via Corno di Cavento 5; IT - 20148 Milano Italia; +39 02 91 43 48 50; Fax: +39 02 91 43 48 77; info@afj-instruments.com; www.afj-instruments.com Prodot ti e ser vizi : Oscillazioni di tensione e sovratensioni temporanee,

100

Prodot ti e ser vizi : Oscillazioni di tensione e sovratensioni temporanee, Strumentazione per test

Fair-Rite Products Corp.

Prodotti e servizi : Ferritici, Filtri, Stanze e spazi schermati, Stanze e spazi schermati

NARDA Safety Test Solutions, Segrate, Italia; + 3 9 0 2 2 6 9 9 8 70 2 ; Fax : + 3 9 0 2 26998700; support@narda-sts.it TESEO S.p.A., Druento, Italia; 39 011 99.41.911; Fax: 39 011 99.41.900; fchinaglia@teseo.net; www.AHSystems.com Prodotti e servizi: Antenne , Strumentazione per test , Test

Insitec Elettronica S.r.l., Via del parco degli Scout 7, 20091 - Bresso - Milano, Italia; +39 02 6650 1075; +39 02 6650 1096; Roberto Landriscina, insitec@insitec.it; www.insitec.it

Schlegel Electronic Materials

Sirces Srl, Via C. Boncompagni 3/B, 20139 Milano Italia; +39 02 55231395; Fax: +39 02 55231395; Mario Crippa, mario.crippa@ sirces.it; www.sirces.it Prodotti e servizi: Materiali conduttivi, Schermatura

AFJ INTERNATIONAL Srl

Via G. Watt, Milano, 12 -20143 Italia; 39 02 89159140; Fax: 39 02 89159226; www.afj.it; info@afj.it Prodotti e servizi: Filtri, Strumentazione per test

Haefely EMC Division

GETELEC

375 rue Morane Saulnier BP 80235, 78532 Buc, France; (33168) 505-4299; www.getelec.com Prodotti e servizi: Schermatura

Ghiringhelli Mario

Via Luigi Riva, 10 - 21013 Gallarate - (VA) Italia; +39 0331 700525; Fax: +39 0331 70 052 6 ; w w w.ghiringhellimario.com ; info@ghiringhellimario.com

INTERFERENCE TECHNOLOGY

Soliani EMC SRL

IFI - Instruments for Industry

L .P. Instruments, Rome Of fice, 0 0155 Roma (RM) - Via Bardanzellu, 46; +39 0640800491; Fax: +39 0640800493; paolo.cruciani@lpinstruments.it; www.lpinstruments.it Trezzano Office, 20090 Trezzano Sul Naviglio (MI) - Viale Leonardo Da Vinci, 255/a; +39 0248401713; Fax: +39 0248401852; franco.parroco@lpinstruments.it; www. lpinstruments.it Prodot ti e ser vizi : Amplificatori, Amplificatori, Filters, Stanze e spazi schermati, Strumentazione per test, Test

International Business Development

Via San Rocco, 8/a, 25032 Chiari (BS), Italia; +39 (030) 71 00 618; Fax: +39 (030) 700 28 03; www.ibdonline.it; ibd@iol.it Prodotti e servizi: Test

Via Varesina 122, 22100 Como, Italia; +39.031.5001112; Fax: +39.031.505467; www.solianiemc.com; info@solianiemc.com Prodotti e servizi: Materiali conduttivi, Stanze e spazi schermati, Schermatura

Tech-Etch, Inc.

Sirces Srl. Italia, Via C. Boncompagni 3/B, 20139 Milano - MI, Italia; +0039 02 55231395; Fax: +0039 02 56816112; nicola.iacovino@sirces.it Prodotti e servizi: Materiali conduttivi, Schermatura

Technopartner srl

Via Delle Imprese, 44/46, 24041, Brembate Sotto (BG), Italia; +39 035 4874010; Fax: +39 035 4826473; www.technopartner.it; marketing@technopartner.it Prodotti e servizi: Schermatura

TEMAS Engineering

Via Milano 72, 22070 Bregnano CO, Italia; +39-031-772348; Fax: +39-031-773897; www.temas.it; info@temas.it Prodotti e servizi: Schermatura

LP Instruments

Milano: Via Via Leonardo Da Vinci, 255A, 20090 Trezzano sul Naviglio (MI) ; 024 8 4 0 .1713 ; Fax 0 2- 4 8 4 0 .18 5 2 ; info @ lpinstruments.it; www.lpinstruments.it Roma: Viale Bat tista Bardanzellu, 4 6, 0 015 5 Roma ; 0 6 - 4 0 8 0 . 0 4 91; Fax 0 6 4080.0493; info@lpinstruments.it Prodotti e servizi: Test

N Narda Safety Test Solutions S.r.l.

Via Leonardo da Vinci, 21/23 - 20090 Segrate (Milano), Italia; +39 02 2699871; Fax: +39 02 26998700; www.narda-sts.it; Ro-

TESEO S.p.A.

Corso Alexander Fleming, 25/27/29 10040 Druento (TO) Italia; +39-011-99.41.911; Fax: +39-011-99.41.900; www.teseo.net; info@teseo.net Prodotti e servizi: Test

Teseq Ltd

Narda Safety Test Solutions S.r.l., +39 02 26 99 87 71; roberto.grego@narda-sts.it; www.narda-sts.it Prodot ti e ser vizi : Amplificatori, Antenne, Strumentazione per test, Test

EUROPE EMC GUIDE 2011

I TWTA (Tubo ad onda viaggiante) della AR sono accompagnati da molti vantaggi.

Quando inzierete a utilizzare l’amplificatore Traveling Wave Tube (TWT – Tubo ad onda viaggiante) dell’AR, scoprirete di aver acquistato un prodotto che vale molto più del suo prezzo. Forse avete acquistato il TWTA di AR perché copre una gamma più ampia di applicazioni per test a potenze elevate rispetto a qualsiasi altra marca. Oppure l’avete acquistato perché sapete che i prodotti AR sono coperti da una garanzia comprensiva, senza clausole nascose... e supportati da un team globale addetto ai servizi di prima categoria. Una volta acquistato un prodotto AR, avrete sempre AR dalla vostra parte. È una vera sorpresa scoprire tante caratteristiche. Come la modalità “sospensione” per risparmiare energia, il che rende la navigazione semplice e mantiene le informazioni chiare. Il display a pannello anteriore permette di rilevare i dati in qualsiasi momento proprio quando ne avete bisogno. Dopo aver avuto un sistema TWTA di AR per tanti anni, scoprirete un’altra caratteristica speciale: la sua solida struttura lo rende praticamente indistruttibile. Ciò gli permette di continuare a funzionare più a lungo rispetto a prodotti simili di altre marche. Quindi prima di scegliere un TWTA, informatevi sempre su tutte le sue caratteristiche e sui vantaggi che otterrete. Se volete un TWTA che vi porti lontano, scegliete i prodotti AR... solo essi vi garantiranno tutta l’esperienza e la stabilità AR. Grazie alle risorse combinate di tutte le sue consociate AR rappresenta una garanzia per amplificatori, antenne, sistemi completi per test, sonde, monitor, software, e ricevitori per moduli amplificatori che possono essere personalizzati per soddisfare le specifiche più difficili. In Italia, contattare Teseo S.p.A., www.teseo.net o chiamare il numero +39-011-994-1911 Certificazione ISO 9001:2008 Copyright © 2010 AR. La striscia arancione sui prodotti AR è un marchio registrato e brevettato negli Stati Uniti.

ar europe Altre divisioni ar: • modular rf • receiver systems National Technology Park, Ashling Building, Limerick, Ireland • 353-61-504300 • www.ar-europe.ie

italia

come un ricevitore completamente digitale pienamente conforme può ridurre l’incertezza di misura nelle prove di emissione per compatibilità elettromagnetica Domenico Festa IBD International Business Development Chiari, Italia

English translation available at www.interferencetechnology.eu

Better Measurement Uncertainty Using Fully Digital Receivers in EMC Emission Tests

ommario — L’incertezza è ormai parte integrante e significativa del modo di esporre i risultati delle misure EMC: richiesta da norme e enti di accreditamento, essa è divenuta elemento imprescindibile e qualificante per quei laboratori che riescono a ottenere valori di incertezza particolarmente interessanti. Considerato che il ricevitore di misura - l’elemento tecnicamente più complesso di una catena di ricezione - gioca un ruolo di rilievo nel mantenere l’incertezza a livelli bassi, questo articolo fa un confronto della figura di incertezza ottenibile con un ricevitore analogico con quella che consegue all’uso di un ricevitore digitale di nuova concezione pienamente conforme alle norme CISPR. Vengono brevemente indicati i miglioramenti e i vantaggi che si possono ottenere utilizzando un ricevitore completamente digitale nelle prove di emissione EMC, a beneficio sia dei laboratori di misura, sia dei costruttori delle apparecchiature in prova, sia del cliente finale. Premessa Il problema delle interferenze radioelettriche alle trasmissioni radio è vecchio quanto la radio stessa, tant’è vero che il CISPR, Comitato Internazionale Speciale per le Perturbazioni Radioelettriche, venne costituito già nei primi anni ’30 per studiare i fenomeni di interferenza elettro-

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magnetica e redigere delle norme che regolamentassero la materia (il CISPR è un Comitato Speciale della IEC, l’International Electrotechnical Commission). Chiaramente in quegli anni era decisamente prematuro parlare di incertezza di misura in senso stretto, ma gli estensori della prima norma CISPR – con una preveggenza assolutamente fuori dal comune – studiarono i limiti di disturbo in modo tale che le grandi variabilità insite in una misura di emissione EMC fossero in qualche modo già “incluse” nel limite stesso: rispettare il limite significava dunque avere la ragionevole certezza di non creare disturbi alle radio riceventi. Poi, col passare degli anni, limiti, metodi di misura e caratteristiche della strumentazione vennero continuamente aggiornati e adattati – ad esempio per includere anche le interferenze alle trasmissioni televisive e così via - ma sempre utilizzando il concetto iniziale di considerare l’incertezza di misura già inclusa nel limite: questo approccio si è rivelato vincente sino ai giorni nostri, anche se adesso questo modo di operare inizia a mostrare segni di inadeguatezza. D’altra parte, negli ultimi vent’anni l’approccio all’incertezza di misura è cambiato drasticamente e ciò è ben rappresentato dai concetti espressi nella famosa “GUM”, la Guida all’Espressione dell’Incertezza di Misura, e relative appendici e supplementi [1]. Spinti anche dag li enti di accreditamento – che richiedono taseurope emC guIDe 2011

Via L. da Vinci, 255/a - 20090 Trezzano S/n – Milano Tel (+39) 02 4840.1713 – Fax (+(39) 02 4840.1852 Viale Battista Bardanzellu, 46 - 00155 Roma Tel. (+39) 06 4080.0491 – Fax (+39) 06 4080.0493 Our Company was founded in the year 1982 and our core business consists in the selling and after sales support of microwave test and measurement equipments in the field of the Defense, Telecommunication and EMC markets. We’ve offices as in Milan than in Rome and the coverange of the territory is assured by our direct sales engineers. Our Company has the supplier NATO code (NCAGE n° AB849) and the quality certification ISO 9001

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www.lpinstruments.it – info@lpinstruments.it

italia

C o m e u n r i C e v i t o r e C o m p l e ta m e n t e

Figura 1. Diagramma a blocchi del ricevitore completamente digitale PMM 9010.

sativamente di esprimere l’incertezza di ogni misura – pure nel mondo EMC ci si è via via resi conto che non era più possibile trascurare di dichiarare l’incertezza di misura che un laboratorio era in grado di ottenere, e pertanto si è iniziato un lungo lavoro preparatorio che sta iniziando a Getelec-94x140 ITA:getelec pub 31/08/10 17:28 Page1

Fabricante di guarnizioni conductive schermati

Guarnizione EMI per il vostro attrezzature militare Anticorrosione

2 funzioni per uno guarnizione

375 rue Morane Saulnier - BP 80235 - 78532 Buc - France Tél. : (33) 1 39 20 42 42 - Fax : (33) 1 39 20 42 43

E-mail : info@getelec.com - www.getelec.com

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dare i primi frutti sotto forma di norme internazionali EMC che includono specifici capitoli a riguardo dell’incertezza di misura [2]. La parte incertezza di misura inclusa nelle norme EMC informa l’utilizzatore su come approcciare il problema, come stabilire dei valori di incertezza massimi accettabili, da suggerimenti operativi e quant’altro necessario ad impostare correttamente il lavoro. Ad ingarbugliare ulteriormente un poco le cose occorre ricordare che il settore della Compatibilità Elettromagnetica tratta due grossi temi: emissione e immunità. Mentre per il primo aspetto, l’emissione, ci si confronta con una caratteristica misurabile dell’apparecchiatura in prova e quindi si adotta un approccio consolidato già in molti altri ambiti – seppure complicato dal fatto che qui si hanno incertezze estremamente ampie, specie se ci si rapporta ad altre discipline – per ciò che riguarda l’immunità diviene difficile introdurre il concetto di incertezza per la “condizione” passa/non passa che si determina a carico dell’apparecchiatura in prova quando sottoposta a diversi stimoli esterni; semmai si può indicare l’incertezza con la quale si è in grado di generare lo stimolo applicato all’apparecchiatura in prova. In questo articolo tutte le considerazioni sono riferite a strumentazione (ricevitore, antenna, LISN, camera semianecoica, ecc.) completamente conforme ai dettami delle rispettive norme della serie CISPR 16-1-x e ai relativi metodi di misura in pieno accordo con quanto riportato nella serie CISPR 16-2-x. Per disporre di riferimenti precisi, si prende come riferimento il ricevitore PMM 9010 (10 Hz – 30 MHz), che è completamente digitale, e il suo complemento per le alte frequenze PMM 9030, che va da 30 MHz a 3 GHz (o PMM 9060, da 30 MHz a 6 GHz), che, per limiti tecnologici, è solo parzialmente digitale ma adotta specifiche soluzioni circuitali per poterlo accoppiare al PMM 9010 mantenendo i vantaggi dell’approccio nueUrope emc gUide 2011

F e S ta

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merico. Questi ricevitori sono pienamente conformi alle norme CISPR da 10 Hz sino a 3 GHz o a 6 GHz e, grazie alla particolare architettura, consentono di collegare il ricevitore alta frequenza direttamente all’antenna e di utilizzare poi una discesa in fibra ottica dall’antenna – o da qualsiasi altro trasduttore – sino al laboratorio. Un nUoVo ricEVitorE di misUra complEtamEntE digitalE È da molti anni che nei ricevitori di misura e negli analizzatori di spettro si stanno via via introducendo sottoassiemi digitali per svolgere questa o quella funzione specifica (dai DSP in frequenza intermedia, alla gestione digitale dei Figura 2. la perfetta risposta del ﬁltro CISPR a 200 Hz modellato rivelatori, ecc.), ma il “cuore” dello strumento matematicamente con la tecnica FIR. resta pur sempre analogico e sostanzialmente dalle caratteristiche pressoché perfette; basato su un’architettura supereterodina che prevede uno • Rivelatori emulati matematicamente, la cui risposta o più oscillatori locali e uno o più miscelatori. non varia al variare del segnale d’ingresso e che perCon la componentistica disponibile oggigiorno è però tanto lavorano sempre in modo ideale, senza necessità possibile costruire ricevitori completamente digitali fino ad di taratura alcuna per tutta la vita dello strumento in alcune decine di MHz, ricevitori cioè dove il segnale venga virtù della loro stabilità; subito convertito in digitale e poi gestito attraverso alcuni • Riferimento interno di frequenza termicamente comadatti algoritmi matematici; in figura 1 un possibile schema pensato per le massime prestazioni. a blocchi, che nel caso specifico è quello del ricevitore PMM Come detto, non è possibile al momento operare una 9010 qui preso come riferimento. Come si può intuire, dopo un attenuatore e un preselettore di ingresso che non possono che essere analogici – e rimanere tali anche per l’avvenire – vi è subito una conversione analogico-digitale, dopodiché tutte le operazioni e i comportamenti di un ricevitore sono modellati 33 matematicamente attraverso opportuni algoritmi appositamente studiati. Inutile dire che un ricevitore di questo tipo consente di rispettare pienamente qualsiasi prescrizione CISPR presente o futura, perché il ricevitore emula in tutto e per tutto il comportamento del corrispettivo strumento analogico: il miscelatore è simulato numericamente; i fi ltri sono descritti utilizzando la tecnica FIR (Finite Impulse Response) e rispondono alle specifiche CISPR con una perfezione assoluta; i rivelatori sono routine software che seguono esattamente il comportamento teorico indicato dalla norma. Questo modo di operare, accuratamente studiato e progettato, porta numerosissimi vantaggi, con l’unico inconveniente che, purtroppo, la componentistica odierna non consente di utilizzare questo approccio oltre i 30-50 MHz, limite oltre il quale i convertitori analogico-digitali inizierebbero a rispondere in modo improprio. Dato che però 30 MHz è il limite di misura per i disturbi condotti, è comunque possibile adottare l’approccio completamente digitale sino a tale frequenza, con i seguenti rilevanti vantaggi: • Dopo preselettore e attenuatore d’ingresso nessuna necessità di taratura periodica del ricevitore per l’intera vita dello strumento (i numeri non invecchiano!); • Filtri IF dalla risposta eccezionale e inalterabile nel tempo: la figura 2 mostra il fi ltro a 200 Hz, interferencetechnology.eu

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Figura 3. Diagramma a blocchi del ricevitore PMM 9030/9060, con IF a banda larghissima.

immediata conversione analogicodigitale per frequenze che arrivano ai GHz, ma è però possibile, con tecniche semi-convenzionali, convertire opportunamente tali frequenze e poi far gestire i segnali ottenuti al ricevitore completamente digitale. Questo è esattamente il modo di operare del PMM 9030 (o PMM 9060), il cui schema a blocchi viene raffigurato nella successiva figura 3. Le dimensioni particolarmente compatte e l’alimentazione a batteria consentono il suo montaggio direttamente sull’antenna di misura (o su qualsiasi altro trasduttore, es. pinza per la misura della potenza radiata); il collegamento con l’unità base avviene per mezzo di una fibra ottica su cui viene fatto circolare un segnale con apposito protocollo ideato per servire al meglio le attività di misura. La larghezza di banda delle frequenze intermedie utilizzate nel PMM 9030 è tale da non introdurre praticamente alcuna incertezza aggiuntiva. I vantaggi di questa soluzione combinata non devono essere sottovalutati: ai benefici propri di un ricevitore digitale si aggiungono ulteriori vantaggi dovuti al fatto che per collegare il trasduttore al ricevitore tra 30 MHz e 3 o 6 GHz non si utilizzano più i cavi coassiali, notoriamente uno degli anelli “più deboli” della catena in termini di incertezza e problematiche connesse. Basta infatti considerare che in una tipica configurazione “tradizionale” troviamo, partendo dal ricevitore, un primo spezzone di cavo coassiale che collega detto ricevitore alla paratia con la camera semianecoica di misura; poi si trova un altro spezzone che da questa paratia con106

interference technology

duce al pozzetto posto in prossimità del palo d’antenna; da notare che solo pochissimi costruttori di camere si preoccupano di installare cavi tarati a bassa perdita e a bassa incertezza, e anche questo è un elemento da considerare attentamente. Poi dal pozzetto dell’antenna si ha un ultimo spezzone di cavo – che deve necessariamente essere particolarmente ﬂessibile – che collega l’antenna e che segue i movimenti di scansione verticale della stessa; sovente quest’ultimo pezzo di cavo viene corredato di numerose ferriti per ridurre al minimo le correnti indesiderate che derivano dall’accoppiamento con l’antenna (e con l’EUT, in alcuni casi). In totale dunque almeno 6 connessioni N-N (il connettore N è obbligatorio per queste applicazioni, preferibilmente la versione a 10 GHz o meglio a 18 GHz): antenna-cavo, cavo-pozzetto, pozzetto-cavo, cavo-paratia, paratiacavo e infine cavo-ricevitore. Oltre a ciò occorre considerare che il cavo dall’antenna al pozzetto è sottoposto a continui movimenti e stress meccanici, variando in continuazione le posizioni relative con l’antenna e con il piano di massa con conseguenti accoppiamenti indesiderati continuamente variabili ad ogni scansione d’antenna (le ferriti sul cavo non eliminano questi accoppiamenti ma evitano che le correnti conseguenti siano eccessivamente ampie). A questo punto diviene assolutamente evidente il grosso vantaggio che deriva dal collegare il ricevitore direttamente all’antenna di misura (o a qualsiasi altro trasduttore: si pensi, come già accennato, alla pinza di corrente per le prove di potenza radiata

dal cavo): non solo il rapporto S/N è decisamente migliore, ma anche l’incertezza ne guadagna in modo considerevole, e tutto ciò non varia con la frequenza! È noto infatti che se sino ad 1 GHz le perdite del cavo sono in qualche modo più o meno sempre accettabili, al di sopra di tale frequenza si hanno crescite vertiginose delle perdite, sino ad arrivare a non poter più effettuare la misura se non utilizzando adatti preamplificatori a bassa figura di rumore e ad amplissima banda passante. Da ultimo, ma non per questo meno importante, il vantaggio del non dover più tarare tutti questi cavi e connessioni per valutarne la perdita in funzione della frequenza. Queste tarature e verifiche devono essere infatti relativamente frequenti in particolare per il cavo che collega l’antenna, che può danneggiarsi e per il quale qualche ferrite può spostarsi o anche rompersi a seguito degli urti, ecc. sorgEnti di incErtEzza in Una proVa di EmissionE Emc Da quanto già accennato si può continuare osservando che in una prova di emissione EMC si possono identificare 3 aree principali che contribuiscono in modo significativo alla figura di incertezza globale (per una più completa trattazione della materia si veda ad esempio la [3]): A. L’EUT, inteso come un assieme composto da hardware – principale e ausiliario, ove necessario - software e cablaggi, in una specifica configurazione, allestito in un determinato modo opportuno e fatto funzionare secondo criteri definiti; eUrope emc gUide 2011

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EMV 2011 – Temi, tendenze e tecnologia a Stoccarda Efficienza energetica, energie alternative, e-mobility: questi sono solo alcuni dei temi che l’industria EMC presenta come nuove sfide, Le risposte del settore le trovate all’EMV, la fiera europea leader con workshop per la compatibilità elettromagnetica. La fiera. L’EMV del 2010 è stata caratterizzata da un'ottima atmosfera di lavoro e da buon umore. Sono state 3.425 le persone che hanno visitato la fiera dal 9 all’11 marzo 2010 a Düsseldorf. La maggior parte dei visitatori professionali provenivano dai settori dell’elettronica e dell’elettrotecnica e lavorano nel settore della costruzione e dello sviluppo. La percentuale dei visitatori che si occupano di decisioni aziendali è stata molto alta: 76%. E altrettanto elevato è stato il grado di soddisfazione degli espositori con la qualità dei visitatori. L’EMV, con una percentuale di espositori stranieri del 50%, offre non solo una gamma di offerta ampia, bensì anche internazionale. Dietmar Rebl della TKD Electronic Europe ha riassunto la sua diretta esperienza con le seguenti parole „L’EMV 2010 è stata una fiera orientata al futuro e presentava un’atmosfera professionale sia per gli espositori che per i visitatori. Per noi della TKD Electronic Europe sono stati tre giorni molto fruttuosi con un elevato potenziale di clienti“. Le prospettive per la prossima EMV sono buone, infatti immediatamente in seguito alla conclusione della manifestazione, già l’80% degli espositori ha confermato la propria partecipazione all’EMV 2011 che si terrà dal 15 al 17 marzo a Stoccarda. Sono più di 100 gli espositori attesi. Il congresso. Con 1.048 prenotazioni il congresso EMV 2010 ha confermato la sua importanza nel settore. Il programma era composto da 92 sessioni, 12 tutorial, 8 workshop e un seminario dell'associazione promotrice MV Fördervereins NRW e.V. Più di 100 relatori hanno coperto temi del settore della tecnica di misurazione e collaudo, della tecnologia automobilistica, delle direttive EMC e della standardizzazione. Per l’EMV 2011 sono di nuovo in programma 36 workshop di mezza giornata. Questi workshop trasmettono conoscenze specialistiche orientate alla pratica e rappresentano una formidabile possibilità di perfezionamento. La scelta e la combinazione del programma dei workshop spetta al comitato composto da esperti del settore, sotto la presidenza del prof. Marco Leone dell’Università Ottovon-Guericke di Magdeburgo. Per maggiori informazioni: www.e-emc.com

Intervista con il prof. Marco Leone Prof. Leone, quali sono i temi attuali del settore EMC? Come evolverà in futuro l’importanza dell’EMC? Gli stati membri UE hanno assunto l’impegno di limitare le emissioni di CO2 dell’8%, rispetto al 1990, entro il 2012. Entro il 2020 l’UE vuole ridurre le emissioni dei gas serra di addirittura il 20%. Si è inoltre posta l’obiettivo di aumentare la quota di energie rinnovabili del 20% entro il 2020. In questo contesto temi quali tecnologia solare, tecnologia eolica, smart grid ed elettromobilità assumono notevole importanza. Queste nuove tecnologie sollevano nuove questioni rispetto all’EMC. Non sono di natura puramente tecnica, infatti influenzano anche la standardizzazione, p.es. per ciò che concerne la determinazione dei valori limite e la scelta dei procedimenti di misurazione e di analisi adatti. Complessivamente, considerando i sistemi sempre più complessi e la crescente integrazione, l’importanza dell’EMC continuerà ad aumentare. Che cosa rende tanto interessante il lavoro nel comitato dell’EMV? Il comitato è composto da membri di università, dell’industria e di centri di ricerca. Sono tutti grandi specialisti dei più svariati settori dell’EMC. Oltre all’intercambio con colleghi di altri settori specialistici è un compito appassionante radunare assieme tutti i settori d’interesse e indirizzare la manifestazione secondo le giuste tendenze. Per concludere ancora una domanda personale: qual è il suo settore nell’ambito dell’EMC? È proprio la varietà tematica che rende questo settore tanto interessante e che crea sempre nuove questioni. Ciò nonostante tutto poggia sulla base sicura dei principi elettrotecnici. Quindi non si tratta di un problema, per quanto complesso possa essere, che non può essere risolto regolarmente in modo sistematico. Il mio settore di lavoro è quello della comprensione fisica dei fenomeni di disturbo per poter identificare le possibilità più semplici ed effettive per contrastarli e per procedere all’ottimizzazione. In questo campo l’analisi e la simulazione a computer giocano un ruolo sempre maggiore. Molti problemi relativi all’EMC hanno origine nel circuito elettronico. Per questo motivo da molti anni mi dedico all’analisi EMC a livello di circuiti stampati.

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B. L’ambiente di prova: il banco di misura, la camera schermata o semianecoica, la cella TEM, le condizioni al contorno; C. Le apparecchiature di misura: ricevitore, cavi, antenne o sensori o trasduttori vari, il software di misura, ecc. A. L’EUT Quando l ’EUT è un apparecchio semplice e senza software (o con un software minimo), la situazione è relativamente semplice, perché di solito questo genere di apparecchiature non ha collegati molti cavi. In questi casi l’incertezza dovuta all’EUT è di solito piuttosto ridotta o è comunque agevole ripetere più volte la misura sull’EUT per verificare se ci siano elementi di criticità in questo senso. Nel caso invece di EUT complessi, con molte funzioni, software e/o firmare operativo articolato e numerosi cavi di ingresso/uscita, allora la situazione può essere veramente intricata perché le condizioni operative e di

Figura 4. Come eliminare il cavo coassiale di collegamento tra l’antenna e il ricevitore PMM 9010.

configurazione possono essere letteralmente migliaia. Inoltre anche l’allestimento di prova può incidere in modo estremamente rilevante e può addirittura rappresentare di gran lunga il maggior contributo di incertezza in una prova di emissione. Per questa ragione di solito le norme e le procedure che definiscono una misura cercano, nel limite del possibile, di stabilire delle regole di configurazione e di allestimento che possano aiutare l’operatore a contenere l’incertezza di misura entro limiti accettabili, anche se la cosa non

è sempre né possibile né facile. Per gli scopi di questo articolo il contributo dovuto all’EUT può però essere “trascurato” in quanto non varia al variare delle apparecchiature di misura. B. L’ambiente di misura Negli ultimi anni si sono scritte migliaia di pagine sull’influenza che l’ambiente di misura (es. camera semianecoica, cella TEM, banco di prova, ecc.), ha sulle misure e sul contributo dello stesso alla figura di incertezza finale. Fermo restando che una misura

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corretta e ben fatta non può prescindere da un ambiente di misura idoneo, ben costruito e allestito, di prestazioni note e stabili nel tempo e ben tenuto, per gli scopi di questo articolo si può trascurare anche il contributo all’incertezza dovuto all’ambiente di misura perché, come per l’EUT, non varia al variare dell’apparecchiatura di misura.

italia ad una taratura periodica del ricevitore presso un idoneo centro SIT. In [3] vengono forniti degli esempi per i parametri usualmente considerati come sorgente di incertezza, sempre tenendo presente che in un ricevitore analogico tradizionale la variazione delle prestazioni nel tempo prevista tra una taratura e la successiva può subire un’accelerazione, anche considerevole, dovuta a fenomeni non prevedibili. Per ciò che concerne i cavi di collegamento, non solo il loro contributo può essere molto significativo, ma sovente può anche essere del tutto imprevedibile, con variazioni di parametri notevoli in funzione di accoppiamenti indesiderati e incontrollati tra cavo e trasduttore (cavo e antenna allineati, ad esempio), per via di esposizione a fonti di calore (un cavo al sole in poche ore cambia in modo rilevante le proprie caratteristiche alle alte frequenze), a causa di stress meccanici (pieghe, schiacciamenti), e così via. Tutti questi contributi sono usualmente di diﬃcile – se non impossibile - controllo e non possono pertanto essere tabulati a priori: si confronti ad esempio la [3], dove – in modo se vogliamo poco realistico ma molto pragmatico - si è seguito l’approccio di considerare il cavo sempre perfettamente adattato e non si sono considerati quegli elementi del tutto imprevedibili. È chiaro che nell’operatività quotidiana occorrerà aggiungere un “margine” di incertezza dovuto a questi aspetti di diﬃcile valutazione, con la conseguenza

C. L’apparecchiatura di misura In una tipica configurazione di misura di emissione il contributo all’incertezza dovuto alle apparecchiature di misura si può ulteriormente suddividere in 3 elementi cardine: a) un trasduttore (di solito un’antenna, una LISN, una pinza di corrente o un sensore); b) l’apparecchio di misura vero e proprio (il ricevitore di misura o, in alternativa, un analizzatore di spettro); e c) i cavi di connessione tra il trasduttore e il ricevitore. Le prestazioni e le caratteristiche del trasduttore sono ben specificate nelle apposite norme di riferimento (per lo più la serie CEI EN 55016-1-x): il loro contributo alla figura totale di incertezza è noto, o valutabile a partire dai dati di ingresso, e in condizioni normali resta relativamente stabile per la durata della misura, a patto che i segnali raccolti dal trasduttore restino entro le specifiche operative dello stesso e non siano tali da ingenerare fenomeni di sovraccarico, saturazione o altro. Va inoltre notato che in molti casi il trasduttore (si pensi ad un’antenna) è un dispositivo passivo caratterizzato da prestazioni che sono funzione delle caratteristiche meccaniche – dimensioni, materiali, geometria, ecc. – e che non mostra significative variazioni di tali prestazioni al passare del tempo, sempre a patto che la sua integrità meccanica sia preservata. Le prestazioni del trasduttore non variano al In our ISO 9001:2000-certificated factory, FILTEMC variare del ricevitore di misura, mentre invece design and manufacture emi/emc filter for consumer goods, automation, l’accoppiamento tra il trasduttore e il cavo coastelecom and machinery etc in China. Most products have UL/CUL and CE certifications and comply with the RoHS Directive. siale di collegamento – un contributo di incertezza a volte molto importante – può essere totalmente Please contact us for a catalog, or inquire your OEM/ODM needs. eliminato quando si possa sostituire il cavo coassiale con una fibra ottica. Essendo il pezzo più complesso e delicato della catena di misura, il ricevitore è anche l’elemento su cui focalizzarsi maggiormente per ben valutare una figura totale di incertezza: le sue prestazioni possono variare col tempo, con la temperatura, in funzione del segnale misurato, in presenza di componenti di disturbo e così via, anche se usualmente il comportamento di un ricevitore è molto più prevedibile – e molto più controlProduct range: labile - di quello, ad esempio, dei cavi coassiali di ▪ AC single-phase filter collegamento. ▪ AC three- phase filter ▪ Inverter input/output filter Di grande importanza è anche l’invecchiamento ▪ Photovoltaic inverter della strumentazione: un ricevitore analogisystem filter ▪ Household appliance filter co tradizionale è un circuito estremamente ▪ Medical appliance filter complesso, con numerosi circuiti e migliaia e ▪ Terminal block series filter ▪ IEC inlet filter/power migliaia di componenti. Le derive che conseguono entry modules all’invecchiamento dei vari circuiti sono avvert▪ DC filter ▪ PCB filter ibili e misurabili e giocano un ruolo importante nel determinare il valore dell’incertezza di misura JINAN Filtemc Electronic Equipment Co., Ltd. # 9 Lanxiang Road,Tianqiao Industrial Area, associata. L’unico modo per tenere sempre sotto Jinan,250032,Shandong,China Tel: 0086-531-85738859 | Fax: 0086-531-85717366 controllo questo comportamento e per avere dati Email: filtemc@filtemc.com | Website: www.filtemc.com RoHS di incertezza aggiornati e aﬃdabili è provvedere

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Grandezza

Analogico Digitale (PMM 9030) Digitale (PMM 9010)

Incertezza sulla lettura Invecchiamento

±0,1 TBD

Uguale o migliore Assente

Attenuazione: Antenna-ricevitore (LISN-ricevitore è analogo) ±0,1 TBD Cavi TBD Connessioni

Uguale Assente Assente

Uguale sino a 30 MHz Uguale sino a 30 MHz Uguale sino a 30 MHz

Correzioni al ricevitore: Tensione sinusoidale Risposta all’impulso - ampiezza Risposta all’impulso – ripetizione (@ 20 Hz)

±1,0 ±1,5 ±1,5

±0,3 ±0,5 ±0,2

±0,15 ±0,2 ±0,2

Disaccoppiamento: antenna-ricevitore antenna-cavo cavo-cavo

+0,9/-1,0 TBD TBD

Uguale Assente Assente

±0,9 TBD

Migliore Assente

TBD

Assente

Bilanciamento dell’antenna Accoppiamento tra cavi e massa Accoppiamento tra cavi e antenna

TBD significa che c’è sicuramente un contributo all’incertezza, ma esso è da determinare

Tabella 1. Ricevitore analogico e ricevitore digitale a confronto.

di aumentare la figura totale di incertezza associata al risultato della misura. Utilizzando un ricevitore sufficientemente piccolo da poter essere collegato direttamente al trasduttore di misura - come illustrato in Figura 4 - e veicolando poi il segnale misurato con una fibra ottica, tutti questi numerosi elementi di incertezza sono automaticamente cancellati, con grande vantaggio in termini di incertezza di misura.

Un Esempio di Budget di Incertezza Piuttosto che compilare una tabella con solamente dei valori quantitativi, può essere istruttivo fare anche un confronto tra ricevitore analogico con cavo coassiale e ricevitore digitale con fibra ottica. In questo caso i valori esatti di incertezza potranno essere calcolati caso per caso, in funzione delle apparecchiature ausiliarie di prova e della configurazione in esame. Si noti che i parametri indicati nella seguente tabella 1 sono gli stessi riportati in [3], tabella da A4 a A7, anche se restano in buona parte applicabili anche per le tabelle da A1 a A3 della stessa norma. Conclusioni L’adozione di un ricevitore completamente digitale per misure EMC può rappresentare un miglioramento significativo in termini di incertezza di misura. Paragonato ad un ricevitore tradizionale, uno strumento digitale pienamente conforme ha prestazioni di incertezza uguali o superiori in tutte le caratteristiche, col vantaggio che inoltre con esso è possibile diminuire moltissimo - o in qualche caso annullare completamente – alcuni dei contributi dovuti al ricevitore; l’adozione di un collegamento in fibra ottica per frequenze superiori a 30 MHz permette di estendere questi benefici anche alle situazioni in cui si usano elementi critici come cavi e antenne, a tutto vantaggio della figura di incertezza globale. Inoltre un ricevitore digitale si dimostra superiore anche in termini di costo di gestione, perché, ad esempio, non necessita di tarature della parte digitale, non ha bisogno di tempi di attesa all’accensione (“warm-up”), manutenzione e riparazioni sono immediate e possono essere fatte ovunque. In altri termini, la confidenza associata al risultato può essere maggiore quando si effettuano misure con un ricevitore digitale, con grande beneficio della qualità delle misure e della velocità di esecuzione delle stesse.

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Bibliografia

Expertise is one click away: www.ets-lindgren.com/filters

• [1.] CEI UNI ENV 13005:2005 Guida all’espressione dell’incertezza di misura • [2.] IEC 61000-4-6 Ed. 3 Electromagnetic compatibility (EMC) – Part 4-6: Testing and measurement techniques – Immunity to conducted disturbances, induced by radio-frequency fields • [3.] Bozza di norma CISPR 16-4-2 Specification for radio disturbance and immunity measuring apparatus and methods – Part 4-2: Uncertainties, statistics and limit modelling – Uncertainty in EMC measurements, IEC, 2010 (CISPR/A/901/CDV). • [4.] Domenico Festa, Roberto Grego, Michele Zingarelli “Better Measurement Uncertainty Using Fully Digital Receivers in EMC Emission Tests” - 2008 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC) & 19 th International Zurich Symposium On Electromagnetic Compatibility Dopo qualche anno di lavoro in IBM sui fenomeni elettromagnetici associati alla lettura e scrittura di dischi rigidi, floppy e ottici, il Dr. Domenico Festa si avvicina nel 1985 alla Compatibilità Elettromagnetica e dal 1987 svolge il ruolo di Coordinatore EMC per IBM Italia e Semea.

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Distortion Armonica en Sistemas de Ensayos de Inmunidad JASON SMITH, PAT MALLOY, SR,, AR / RF MICROWAVE INSTRUMENTATION

Translations available at www.interferencetechnology.eu

ESPAÑA | Productos y Servicios A

Adler Instrumentos

C/Antonio de Cabezón, 83 2ª planta, 28034 Madrid, España, Fax: 91 358 1383, 91 358 4046, www.adler-instrumentos.es, info@adler-instrumentos.es Productos y servicios: Instrumentación para pruebas

APPLUS

Campus de la UAB, s/n, apdo. de correos 18, 0819 3, Bellaterra, España; +3 4 935672000; www.appluscorp.com Productos y servicios: Pruebas

AR RF/Microwave Instrumentation

WAVECONTROL, S.L., C/ Pallars 65-71 Barcelona, España E-08018; +34-933-208055; Fax: +34-933-208-056; Jordi Accensi, jordi-accensi@wavecontrol.com; Ernest Cid, ernest-cid@wavecontrol.com; www.wavecontrol.com; www.ar-worldwide.com Productos y servicios: Amplificadores, Antenas, Cables y conectores, Habitaciones y recintos aislados, Sobrecargas y transitorios, Instrumentación para pruebas

Eldonvasa AB

P° de la Finca, 1 Edificio 13, Madrid 28223, España; +34 95 355 10 00; Fax: +34 95 355 15 39; eldon.es@eldon.com; www.eldon.com Productos y servicios: Habitaciones y recintos aislados

ALAVA Ingenieros S.A., C/ Albasanz 16 - Edificio Antalia, 28037 Madrid, España; +34 (0)91 567 97 00; Fax: +34 (0)91 570 26 61; alava@alava-ing.es; www.alava-ing.es Products and Services: Sobrecargas y transitorios, Pruebas Instrumentation, Pruebas

EMC Partner AG

WAVECONTROL, Pallars, 65 - 71 ES - 08018 Barcelona España; +34 933 20 80 55; Fax: +34 933 20 80 56; Jordi Accensi, info@wavecontrol.com;

www.wavecontrol.com Products & Services: Sobrecargas y transitorios, Instrumentación para pruebas

AT4 Wireless

Tecnológico de Andalucía, c / Severo Ochoa 2, Malaga, 229590 Campanillas España; (34) 95 261 91 22; www.at4wireless.com; Jacqueline Casinin, Marketing Director, jcasini@at4wireless.com Productos y servicios: Pruebas

C CATECHOM

Polytechnic Building, West Area, ground floor, L/02, Ctra. Madrid-Barcelona, Km. 33.600, 28871 Alcalá de Henares, Madrid, España; +34 91.885.6539; Fax: +34 91.885.6652; www2.uah.es/catechom; catechom@depeca.uah.es Productos y servicios: Pruebas

CEMITEC

Polígono Mocholí, Plaza Cein 4, 31110, Noain, España; +34 848420800; Fax: +34 948 31.77.54; www.cemitec.com; info@cemitec.com Productos y servicios: Pruebas

F Fair-Rite Products Corp.

Redislogar, Anabel Segura, 11 Centro de Negocios Albatros, Edificio B 28108 Alcobendas Madrid, España; +34 902 50 99 80; Fax: +34 91 659 1436; redislogar@redislogar.es; www.fair-rite.com Products and Services: Artículos con ferrita, Filtros, Habitaciones y recintos aislados, Aislamiento

G GCEM

UPC Campus Nord. Building C4, c/ Jordi Girona 1-3., 08034, Barcelona, España; +34

934011021; Fax: 34-934011021, www.upc.edu/web/gcem; info.gcem@upc.edu Productos y servicios: Pruebas

Dow Corning Corporation

Dow Corning Europe SA, Parc Industriel - Zone C, Rue Jules Bordet, 7180 Seneffe, Belgium, 32 64 511163, Fax: 32 64 888 401, Linda Coughlin, l.m.coughlin@dowcorning, www.dowcorning.com Productos y servicios: Pruebas

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c/. Vallès, 32 - Polígono Can Bernades, 08130, Santa Perpètua De Mogoda, Barcelona, España; +34 935 747 017; Fax: +34 935 448 433; info@lifasa.com; www.lifasa.com Productos y servicios: Filtros

P Premo Group

Grupo Premo C/. Conchita Supervía, 13

EM Test AG

AST

Advanced Shielding Technologies Europe S.L., C/ Albert Einstein, 43 E-08940 Cornella de Llob. (BCN) España; +34 93 475 14 81; Fax: +34 93 377 28 80; http://ast-global. com; info@ast-global.com Productos y servicios:

08190 Sant Cugat del Valles, España; +34 93 583 14 20; Fax: +34 93 583 14 22; Antoni Mas, antoni.mas@rohde-schwarz.com; www.rohde-schwarz.es Products & Services: Sobrecargas y transitorios, Instrumentación para pruebas

Haefely EMC Division

Rohde & Schwarz Espana S.A., Avda. Alcalde Barnils, 64-68, Edifici Testa Mod.C,

INTERFERENCE TECHNOLOGY

Ibertest International SA

C/ Ramon y Cajal, 35. Pol. Ind Gitesa I Daganzo de Arriba (Madrid) 28814, España; +34 91 8845430; Fax: +34 91 8845002; www.ibertestint.com; info@ibertest.es Productos y servicios: Pruebas

IFI - Instruments for Industry

Adler Instrumentos, S.L., C/Antonio de Cabezon, 83 28034 Madrid España; +34 913584046; Fax: +34 913581383; Millian Fernandez, millan@adler-instrumentos. es; www.adler-instrumentos.es Products & Services: Amplificadores, Antenas, Filtros, Habitaciones y recintos aislados, Instrumentación para pruebas, Pruebas

INTA

CTRA. AJALVIR, KM. 4 28850, Torrejon de Ardoz, España; +34 91 520 1200; www.inta.es

Productos y servicios: Pruebas

ITA

MARIA DE LUNA, 8 50018 Zaragoza, España; +34 976716250; www.ita.es

Productos y servicios: Pruebas

ITE

- 08028, Barcelona, España; +34 934 098 980; Fax: +34 934 906 682; www.grupopremo.com; info@grupopremo.com Productos y servicios: Filtros

S Schlegel Electronic Materials

RC Microelectrònica S. A ., Francesc Moragas 72 Nau 3, 08907 L’ Hospitalet de Llobregat Barcelona; +34 93 260 2166; Fax: +34 93 338 3602; Jordi Nogué, Ventas@ rcmicro.es; www.rcmicro.es Products & Services : Materiales conductores, Aislamiento

SGS TECNOS

C/ Trespaderne, 29. Edificio Barajas 1, 28042, Madrid, España; +34 913138000; Fax: +34 91 313 80 80, www.sgs.es Productos y servicios: Pruebas

Salicru S.A.

Avda de la Serra, 100, 08460 Santa María de Palautordera, España; 902 48 24 00; 902 48 24 01; Fax +34 93 848 11 51; www.salicru.com; salicru@salicru.com Productos y servicios: Filtros

Avda. Juan de la Cierva, 24. (Parque Tecnológico de Valencia ) , 4 6 9 8 0 Paterna, España; +34 961366670; www.ite.es

Productos y servicios: Pruebas

L Labien Tecnalia

Tecnologica

Parque Tecnológico de Bizkaia. C/Geldo, Edificio 700, 48160, Derio, España; +34 94 607 33 00; Fax: +34 94 607 33 49, www.labein.es Productos y servicios: Pruebas

C/ de la Majada, 3, 28760, Tres Cantos, Madrid, España; +34 91 804 18 93; www.alter-spain.com Productos y servicios: Pruebas

LACECAL

Adler Instrumentos S.L.; +34 91 358 40 46;

Teseq Ltd

E.T.S. Ingenieros Industriales, Paseo del Cauce s/n 47011, Valladolid, España; +34 983423343; Fax: 983 423 996; www.lacecal.es; emc@lacecal.es Productos y servicios: Pruebas

LCOE

José Gutiérrez Abascal, 2, 28006, Madrid, España; +34 91562511; Fax: 91 561 8818; www.ffii.es/lcoe/lcoe_portada.asp Productos y servicios: Pruebas

Lifasa International

millan@adler-instrumentos.es; www.adler-instrumentos.es Products & Services: Amplificadores, Antenas, Instrumentación para pruebas, Pruebas

EUROPE EMC GUIDE 2011

Adv er t or i a l

ESPAÑA | Los Recursos ASSOCIATIONS IEEE EMC SOCIETY CHAPTER SPAIN

Ferran Silva Martinez, GCEM. Universitat Politècnica de Catalunya, Campus Nord. Edifici C4, C. Jordi Girona 1-3, Barcelona 08034, España; +34 93-401-7826; Fax: +34 93-401-1021; Ferran. silva@upc.edu

NOTIFIED BODIES ALTER TECHNOLOGY GROUP SPAIN

C/ DE LA MAJADA, Nº 3 28760 TRES CANTOS, Madrid, España; +34 91 8043292; Fax: +34 91 8041664; www.alter-spain.com; enrique.galiana@alter-spain.com Notified Body number : 2031

AT4 WIRELESS CETRO DE TECNOLOGIA DE LAS COMUNICACIONES S.A.

Parque Tecnologico de Andalucia Calle Severo Ochoa, 2, 29590 Campanillas (Malaga), España; 34 952 619100;Fax: 34 952 619112; info@at4wireless.com; www.at4wireless.com Notified Body number : 1909

FUNDACION LABEIN

Parque Tecnológico de Vizcaya, Ed. 700, 48160 Derio (Vizcaya), España; +0034:94:607.33.00; Fax: +0034:94:607.33.49; javin@labein.es; www.labein.es Notified Body number : 1292

INSTITUTO NACIONAL DE TECNICA AEROESPACIAL

Carretera de Ajalvir, km. 4, 28850 Torrejon De Ardoz (Madrid), España; 34 91 5201396; Fax: 34 91 5202021; dejuancr@inta.es Notified Body number : 1910

LABORATORIO CENTRAL OFICIAL DE ELECTROTECNIA

Calle José Gutíerrez Abascal, 2, 28006 MADRID, Spain; 34 91 5625116; Fax: 34 91 5618818; www.ffii.es; rguirado@lcoe.etsii.upm.es Notified Body number : 1911

LABORATORIO ICEM. ASOCIACION ITACA

Universidad Politécnica de Valencia Camino de la Vera, s/n Edificio 8G. Acceso C. Nivel 3 46022, Valencia, España; +34 963879306; Fax: +34 963877279; icem@itaca.upv.es; www.itaca.upv.es Notified Body number : 2043

SECRETARÍA DE ESTADO DE TELECOMUNICACIONES Y PARA LA SOCIEDAD DE LA INFORMACION

c/ Capitan Haya, 41, 28071 Madrid, España; +34/91 346 27 92; Fax: +34/91 346 23 79; aaguilar@mityc.es; www.mityc.es Notified Body number : 0341

SECRETARÍA DE ESTADO DE TELECOMUNICACIONES Y PARA LA SOCIEDAD LGAI TECHNOLOGICAL CENTER, S. A./APPLUS

Campus UAB, Apto Correos 18, 08193 Bellaterra (Barcelona), España; +34 935 672 000; Fax: +34 935 672 001; ctc@appluscorp.com; www.appluscorp.com Notified Body number : 0370

SGS, TECNOS, S.A.

C/ Trespaderne, 29, 28042 Madrid, España; +34:91:313 80 00; Fax : +34:91:313 80 90; miguelangel.fernandez@sgs.com Notified Body number : 0096

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INTERFERENCE TECHNOLOGY

EUROPE EMC GUIDE 2011

España

Distorsion armónica en sistemas de Ensayos de inmunidad

Jason smith Applications Engineering Manager

Pat malloy, sr. Application Engineer AR/RF Microwave Instrumentation Souderton, Pennsylvania, USA * Traducido por Jordi Accensi, Wavecontrol, Barcelona, España

English translation available at www.interferencetechnology.eu

Harmonic Distortion in Immunity Test Systems

116

InTERFEREncE TEchnology

on las prisas de finalizar ensayos de inmunidad radiada a tiempo, es bastante usual pasar por alto las limitaciones de los equipos. Mientras algunas características de los equipos, como los armónicos de los amplificadores de potencia, son obviamente un factor de limitación, la característica de banda ancha de antenas, acopladores, vatimetros y sondas isotrópicas difícilmente se pueden considerar como factores limitadores en la mayoría de las aplicaciones. Sin embargo, cuando se utilizan con amplificadores de potencia que pueden generar niveles altos de armónicos durante los ensayos de inmunidad, sus características de banda ancha añaden incertidumbre y errores de medida inaceptables. Un ejemplo de ello son las sondas de campo isotrópicas que muestran una lectura del nivel de campo de la energía total de todas las frecuencias incluidas en su banda de funcionamiento. En el caso ideal de disponer de un tono puro sinusoidal, estas sondas ofrecen una lectura precisa, pero si tenemos en cuenta que otras frecuencias pueden estar presentes, se producen errores durante la lectura. Dependiendo de la

cantidad y el nivel de estas frecuencias existentes, se puede llegar a un punto donde la lectura del nivel de campo deja de ser representativa del nivel de campo requerido a la frecuencia deseada. Las frecuencias no deseadas mas problemáticas son los armónicos generados por las no linealidades del sistema RF. A menudo los amplificadores de potencia, especialmente aquellos que se utilizan hasta su punto de saturación, son la mayor fuente de armónicos. En un menor grado, las fuentes de señal, como los generadores, pueden mostrar alguna no linealidad que también provoca el aumento de los niveles de los armónicos. En consecuencia, la norma IEC/EN 61000-4-3 ha introducido requisitos en los sistemas de RF utilizados durante los ensayos para limitar los niveles de armónicos en el campo de ensayo. Si bien es imperativo considerar los niveles de armónicos suministrado por los fabricantes de cada instrumento, los ingenieros de ensayo también deben confirmar los datos del fabricante mediante verificaciones. ¿Qué son los armónicos? Armónicos son frecuencias no deseadas generadas por no linealidades del sistema. Son múltiplos de la frecuencia fundamental del ensayo, y normalmente a medida de aumenta el múltiplo de la frecuencia fundamental (numero de armónico) su nivel se reduce. Todos los sistemas reales tienen no linealidades y por eso todos generan distorsión armónica. El ingeniero de ensayo debe determinar los niveles EURoPE EMc gUIdE 2011

Tan fácil como coser y cantar.

CI00401A CI00400A CI00250A

Para realizar Pruebas de inmunidad conducida de radiofrecuencia según las normas IEC, militares y del sector de la automoción. Los Sistemas de prueba de inmunidad conducida originales de AR consiguieron facilitar un proceso complicado y aumentar su precisión. Simplificaron todos los aspectos que implica el proceso: calibración, pruebas, solución de problemas de DUT y generación de informes. El Sistema CI presenta la flexibilidad integrada de realizar pruebas personalizadas y control de software que incluye selección de normas, calibración, ejecución de pruebas y generación de informes directamente en Microsoft® Word o Excel. Estos excelentes sistemas presentan, además, un alcance de sensibilidad más amplio, excelente velocidad y la posibilidad de realizar precisas pruebas de margen. Ningún otro producto se le había, ni siquiera, acercado. Hasta ahora. Porque ahora AR presenta su nuevo Sistema de CI, el CI00401A. Gracias a los tres Sistemas de pruebas de inmunidad conducida que puede elegir, no tendrá que volver a realizar nunca más laboriosos procedimientos de prueba de CI manuales, ni tampoco tendrá que preocuparse de la fiabilidad de los resultados. Nadie puede mejorar los resultados de AR Systems: 1. Modelo CI00250A (amplificador de 75 vatios, 10 kHz – 250 MHz): soluciones de pruebas completa para las siguientes normas: EN/IEC 61000-4-6, IEC 60601-1-2, EN 50130-4, EN 61000-6-1/2 y EN 55024. 2. Modelo CI00400A (amplificador de 100 vatios, 10 kHz – 400 MHz): soluciones de pruebas completa para las siguientes normas: Pruebas MIL-STD-461D y E CS114, DO160D y E BCI, EN/IEC 61000-4-6, IEC 60601-1-2, EN 50130-4, EN 61000-6-1/2, EN 55024. 3. Modelo CI00401A (amplificador de 150 vatios, 100 kHz – 400 MHz): soluciones de pruebas completa para las siguientes normas: ISO 11452-4, GMW 3097, ES-XW7T-1A278-AC, DC-11224, BMW GS95002 y otras normas del sector de la automoción. AR distribuye una amplia variedad de soluciones de radiofrecuencia exclusivas a algunas de las empresas más conocidas de todo el mundo. Nuestros productos están respaldados por la garantía más potente y completa del sector, y por una red de asistencia técnica internacional sin igual. Llame a su asociado comercial de AR para solicitar una demostración. En España, póngase en contacto con WAVECONTROL, S.L., www.wavecontrol.com o llame al número de teléfono +34-933-208-055 Copyright © 2010 AR. La franja naranja en los productos AR está registrada en la Oficina de marcas registradas y patentes de EE.UU.

ar europe Otras divisiones de ar: • modular rf • receiver systems National Technology Park, Ashling Building, Limerick, Irlanda • 353-61-504300 • www.ar-europe.ie

ISO 9001:2008 Certified

España aceptables de armónicos. Esta determinación esta basada principalmente en las indicaciones de las normas. En aplicaciones como los ensayos EMC, la principal causa de armónicos son los amplificadores RF de potencia. EntEnDiEnDo armónicos En un amPlificaDor Todos los amplificadores de potencia generan distorsión armónica. Mientras algunas aplicaciones no se ven afectadas por estos armónicos, niveles altos de distorsión en la señal pueden introducir errores inaceptables en los ensayos de inmunidad durante ensayos de compatibilidad electromagnética (EMC). Por eso, la distorsión armónica es un parámetro crítico en las especificaciones de los amplificadores. Ha sido probado que un amplificador de clase A cuando se opera en su zona lineal genera niveles aceptables de armónicos y son una elección ideal para aplicaciones de compatibilidad electromagnética (EMC) en detrimento de otros diseños como los Clase AB o Clase B. Tenga en cuenta que incluso el mejor diseño de un amplificador de clase A no garantiza disponer de un ensayo libre de armónicos. Incluso con el sacrificio de disponer de una señal de salida de menor nivel es de vital importancia operar con los amplificadores dentro de su zona lineal. Hacer funcionar un amplificador mas allá de su zona lineal nos ayudará a disponer de mayores niveles de campo, pero la distorsión armónica generada en este caso nos introducirá incertidumbres y errores en las lecturas del campo generado. Al final, la pregunta que nos hacemos es “¿cual es el nivel máximo de la señal de entrada para asegurar la puridad deseada en una aplicación especifica?”. Las pruebas muestran que un amplificador para ensayos EMC no debe operarse por encima de 1dB de de compresión. De hecho, operar incluso en una zona mas lineal, por debajo de 1dB de compresión, reduce considerablemente los armónicos. Otra solución, no tan deseable, es utilizar filtros de armónicos a la salida de los amplificadores. Esta opción al aumentar el coste, aumentar las perdidas de inserción y añadir complejidad al sistema, solo debe considerarse cuando no hay ninguna otra opción posible. Por ejemplo, algunos amplificadores de tubos (TWTA) necesitan utilizar filtros de armónicos para reducir su distorsión. Al ser completamente imposible predecir los efectos acumulativos de cada uno de los componentes del sistema en la puridad del campo, es necesario realizar una verificación del nivel del sistema completo. Se tienen que consultar los datos suministrados por los fabricantes, y aunque nos fiemos de estos datos, para probar la viabilidad del diseño de un sistema, lo mejor es realizar una verificación mediante ensayos de los niveles del sistema completo. ¿como afEcta la influEncia DE múltiPlEs sEñalEs a las mEDiDas DE PotEncia? La mayoría de sondas de campo y sensores de potencia utilizan diodos con características de banda ancha. Estos equipos no son selectivos en frecuencia y miden todas las señales dentro de su margen de funcionamiento. La lectura resultante es la raíz cuadrada de la suma de los cuadrados de la amplitud de la señal fundamental y todos sus armónicos presentes. Claramente los armónicos introducen incertidum118

InTERFEREncE TEchnology

D ISTO R S I O N A R M Ó N I CA EN S IST EM AS

bres y errores en la medidas del campo. Los armónicos son inevitables y eliminarlos completamente sería una solución extremadamente costosa. Así pues, la interrogante es determinar cual es un nivel aceptable de armónicos. Afortunadamente, la norma IEC 61000-4-3 ofrece una guía en este sentido. La última versión de esta norma especifica que para todas las frecuencias en las que se producen armónicos a la salida del amplificador, el rechazo de estos armónicos en el campo en 6dB por debajo de la fundamental es adecuado. En otras palabras, ahora hay un requisito en cuanto a la distorsión armónica de -6 dBc. La unidad dBc es la medida del nivel de un armónico especifico respecto el nivel de la señal portadora. Una medida de - 6dBc por definición significa que la amplitud del armónico es 6 dB menor que el nivel de la portadora. Anteriores versiones de la norma IEC 61000-4-3 especificaban la distorsión armónica a la salida del amplificador. En la última versión de la norma toma en consideración el sistema completo al especificar los –6 dBc. Este nivel tiene en cuenta el hecho que una antena transmisora opera mas eficientemente en el 3er armónico que en la fundamental. Es usual ver hasta 5 dB de variación en la ganancia. Según las indicaciones del anexo D de la norma IEC 61000-4-3, limitar los armónicos en el campo de test hasta –6 dBc ayuda a contener el error de lectura del nivel de campo por debajo del 10%. Con un nivel de armónicos de -6 dBc una lectura de 10V/m de una sonda de hecho representa 9V/m de la portadora. Si el ensayo necesita mejor precisión, por ejemplo como máximo un 5% de error en la lectura del nivel de campo, la distorsión armónica deberá ser al menos de -10dBc. Las normas que no toman en consideración el efecto de las antenas transmisoras se enfocan en los armónicos generados por los amplificadores. Por ejemplo, versiones anteriores de la IEC 61000-4-3 limitaban la distorsión armónica del amplificador a -15dBc. Si lo comparamos con el nuevo requisito de -6dBc de distorsión total, la limitación de -15dBc ofrecía un error ligeramente inferior en la lectura del campo. Pat Malloy has been the sales application engineer at Amplifier Research, now AR, since 1987. Previous work experience includes four years with the U.S. Navy as a guided-missile electronic technician, seven years in an engineering group at AT&T Bell Laboratories, and 16 years as a senior sales engineer for Tektronix. He graduated from Lafayette College in 1972 with a B.S.E.E. He can be reached at pmalloy@ar-worldwide.com Jason Smith has been the applications engineering manager at AR since 2004. Previous work experience includes test engineer and EMC lab manager at Radiation Systems and EMC lab manager at Analalb, LLC. Jason has over 10 years experience in EMC testing experience with military, avionics, commercial, medical, telecom and automotive applications. He is a member of the USNC to SC77B and SC77C and a participating member of WG10 (IEC 61000-4-3, -6). He graduated from the University of Delaware in 1997 with a B.S. in Engineering Technology. He can be reached at jsmith@ar-worldwide.com

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EURoPE EMc gUIdE 2011

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PRODUKTY I USTUGI

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ZASOBY

ARŁYKUT

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Korekcja Niedopasowań W Torze Omiarowym Przewodzonych Zaburzeń Radioelektrycznych

JAN SROKA, EMC-TESTCENTER ZURICH AG

POLSKA | Produkty i Usługi National Institute of Telecommunications-Poland

ABC Elektronik Sp. z o.o.

38-300 Gorlice, ul. Kolejowa 10, Polska; +48 18 353-66-65; Fax: +48 18 353-68-33; www.abcpol.pl; info@abcpol.pl Produkty i usługi: Anteny, Filtry, Rdzenie ferrytowe, Ekranowanie

Fair-Rite Products Corp.

Industrial Electronics, Hauptstr. 71 - 79 D-65760 Eschborn, Polska; +49-6196-927900; Fax: +49-6196-927929; w.uhlig@industrialelectronics.de; www.fair-rite.com Produkty i usługi: Rdzenie ferrytowe, Filtry, Ekranowane pomieszczenia i obudowy, Ekranowanie

H AH Systems

AM Technologies, ul. Nakielska 3, 01-106 Warszawa, Polska; 48 22 53 22 801; Fax: 48 22 53 22 828; www.amt.pl; info@amt.pl; www.AHSystems.com Produkty i usługi: Anteny, Przyrządy pomiarowe, Testowanie

AR RF/Microwave Instrumentation

Urzadzenia Elektroniczne Import, ul. Kierbedzia 4 pok. 203, Warszawa, Polska 00-728; +48 (22) 313 17 35; Fax: +(022) 313 1736; Dr. inz Marek Synowiec, uei_war@uei.com.pl; www.ar-worldwide.com Produkty i usługi: Wzmacniacze, Anteny, Kable i złącza, Ekranowane pomieszczenia i obudowy, Zabezpieczenia przepięciowe i przebiegu przejściowego, Przyrządy pomiarowe

Szachowa Str. 1, 04-894 Warsaw, Polska; (+48 22) 51 28 100; Fax: (+48 22) 51 28 625; www.itl.waw.pl; info@itl.waw.pl Produkty i usługi: Testowanie

P Popek Elektronik

ul. Jasminowa 28,22-400 Zamosc Polska; 48 84 639-4984; Fax: 48 84 639-41-36; www.popek-elektronik.com; info@popek-elektronik.com Produkty i usługi: Wzmacniacze

R Haefely EMC Division

Radiotechnika Marketing

HIK-Consulting, Chabrowa 16, 01-934 Warsaw, Polska; +48 603 639 355; Fax: +48 22 864 9908; Krzysztof Kuc, ofﬁce@hik-consulting.pl, service@hik-consulting.pl; www.hik-consulting.pl Produkty i usługi: Zabezpieczenia przepięciowe i przebiegu przejściowego, Przyrządy pomiarowe

ul. Fabryczna 20, Pietrzykowice, 55-080 Kąty Wrocławskie, Polska; +48 71 327 07 00; Fax: +48 71 327 08 00; http://radiotechnika.com.pl; ofﬁce@radiotechnika.com.pl Produkty i usługi: Filtry, Kable i złącza

ul. Stawki 2, 00-193 Warszawa, Polska; (+48 22) 860 64 90 do 98; Fax: (+48 22) ,860-64-99; RS-poland@rohde-schwarz.pl; www.rohde-schwarz.com.pl Produkty i usługi: Przyrządy pomiarowe

Instytut Logistyki i Magazynowania

ul E. Estkowskiego 6, 61-755 Poznan, Poland, +48 61 850 49 89, 850 94, 850 48 90, Fax: +48 61 852 63 76, www.ilim.poznan.pl, la@ilim.poznan.pl Produkty i usługi: Testowanie

Rohde & Schwarz Oesterreich Sp. z o.o.

Schlegel Electronic Materials

ASTAT Sp. z o.o.

Dabrowskiego street 441, Posnan, 60-451 Polska; Fax: 48 61 849 80 61; 48 602 354 067; www.astat.com.pl; l.wilk@astat.com.pl Produkty i usługi: Testowanie

IFI - Instruments for Industry

Unitronex Corporation, Ul. Grzybowska 87, 00-844-Warsaw Polska; 4822-631-2643; Fax: 4822-632-7559; Marek Jachna, info@unitronex.pl; www.unitronex.com Produk ty i usługi: Wzmacniacze, Anteny, Filtr y, Ekranowane pomieszczenia i obudowy, Przyrządy pomiarowe, Testowanie

Ogrodowa 31/35, 00-893 Warszawa, Polska; +48 518 643 512; info.polska@emtest.de; www.emtest.com/pl Produkty i usługi: Zabezpieczenia przepięciowe i przebiegu przejściowego, Przyrządy pomiarowe, Testowanie

Astat sp z.o.o, Dabrowskiego 441, 60-451 Poznan, Polska; +48 61 848 88 71; Fax: +48 61 848 82 76; emc@astat-emc.com.pl; www.astat-emc.com.pl Produkty i usługi: Materiały przewodzące, Rdzenie ferrytowe, Filtry, Ekranowanie

EMC Partner

INTERFERENCE TECHNOLOGY

Teseq Ltd Kemtron

ASTAT sp. zo.o, ul. Dabrowskiego 441, PL - 60 451 Poznan Polska; +48 61 849 80 61; Fax: +48 61 848 82 76; Lukasz Wilk; l.wilk@astat.com.pl; www.astat.com.pl Produkty i usługi: Zabezpieczenia przepięciowe i przebiegu przejściowego, Przyrządy pomiarowe

Domar Mariusz Dowbor Sp.J., ul. Botaniczna 54/56, 04543 Warsaw Polska; +48228721200; Fax: +48228721205; Tomasz Gilewski, domar@domar.waw.pl; www.domar. waw.pl Produkty i usługi: Materiały przewodzące, Ekranowanie

EM TEST Polska, ul.

120

Astat sp. z o.o.; +48 61 849 80 61; emc@astat.com.pl; www.astat-emc.com.pl Produkty i usługi: Wzmacniacze, Anteny, Przyrządy pomiarowe, Testowanie

Tespol Sp. z o.o.

ul. Klecinska 125, 54-413 Wrocław, Polska; 71 783 63 60; Fax: 71 783 63 61; www.tespol.com.pl; tespol@tespol.com.pl Produkty i usługi: Przyrządy pomiarowe

M Meratronik S.A.

Ul. Indiry Gandhi 19, 02-776 Warszawa, Mazowieckie, Polska; (22)8553432; 6441207; Fax: (22)6442556; Janusz Rzysko, jrzysko@meratronik.pl; www.meratronik.pl Produkty i usługi: Przyrządy pomiarowe

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EUROPE EMC GUIDE 2011

Nagięliśmy zasady.

Technologia gięcia elementów firmy AR umożliwia ograniczenie rozmiarów aż do 75% oraz zapewnia doskonałe parametry techniczne. Nasza gama anten krzyżowych o giętych elementach, pracujących w zakresie od 26 MHz do 6000 MHz, to urządzenia mniejsze nawet o 75%, lżejsze i bardziej kompaktowe niż standardowe anteny logarytmiczno-okresowe. Obsługują one szeroki zakres częstotliwości, oferują wzmocnienie na poziomie 6 dB i wytwarzają wysokie pola nawet w najtrudniejszych aplikacjach. Małe wymiary to nie tylko większa mobilność, ale również mniejsze straty w zakresie „obciążenia pomieszczenia”. Dzięki tym innowacyjnym antenom, firma AR rozwinęła technologię anten logarytmiczno-okresowych. Konstrukcja jest na tyle rewolucyjna, że musieliśmy ją opatentować, aby ją chronić. Nasza najnowsza antena krzyżowa definiuje jeszcze śmielsze granice. Antena ATR26M6G-1 (zakres od 26 do 6000 MHz/moc wejściowa 5000 W) wykracza ponad obowiązujące wymagania w zakresie czułości, dzięki czemu jest dobrze przygotowana do przyszłych zastosowań. A solidna konstrukcja odpowiednio wspiera poziomy wysokiej mocy, które są wymagane do wytworzenia skutecznych pól typu E. Wszystkie anteny krzyżowe są dopasowane pod kątem częstotliwości i mocy do wzmacniaczy AR. Można je również kalibrować w celu przeprowadzenia testów emisyjnych. Nic dziwnego, że ta małe anteny cieszą się takimi powodzeniem! W Polsce należy skontaktować się działem Urządzenia Elektroniczne Import, uei_war@uei.com.pl lub zadzwonić pod numer +48 (022) 313 17 35 Prawa autorskie © 2010 AR. Pomarańczowy pasek na produktach AR jest chroniony patentem w Stanach Zjednoczonych i jest zastrzeżonych znakiem towarowym.

ar europe Inne działy ar: • modular rf • receiver systems National Technology Park, Ashling Building, Limerick, Ireland • 353-61-504300 • www.ar-europe.ie

Certyfikat ISO 9001:2008

POLSKA Zasoby ASSOCIATION Fryderyk Lewicki, Orange Labs, Telekomunikacja Polska S.A. ul. B. Prusa, 9, 50-319 Wroclaw, Poland; +48 71-321-0924; Fax: +48 71-321-0952; fryderyk.lewicki@telekomunikacja.pl

Notified Body number : 1455 Directives: 2000/14/EC Noise emission in the environment by equipment for use outdoors 2006/95/EC (ex-73/23/EEC) Low voltage directive 2004/108/EC Electromagnetic compatibility 2006/42/EC Machinery

NOTIFIED BODIES

INSTYTUT TELE- I RADIOTECHNICZNY

IEEE EMC SOCIETY CHAPTER

ELTEST M. JEWTUCH SPOLKA JAWNA

ul. Ratuszowa 11, 03-450 WARSZAWA, Poland ; +48 (22) 619 39 66; Fax: +48 (22) 619 39 66; sekretariat@eltest.com.pl; www. eltest.com.pl Notified Body number : 1465 Directives: 2006/95/EC (ex-73/23/EEC) Low voltage directive 2004/108/EC Electromagnetic compatibility

INSTYTUT ELEKTROTECHNIKI

ul. Pozaryskiego 28, 04-703 WARSZAWA, Poland; +48 22 812 00 21; Fax: +48 22 615 75 35; iel@iel.waw.pl; www.iel.waw.pl Notified Body number : 1460 Directives: 88/378/EEC Safety of toys 2000/14/EC Noise emission in the environment by equipment for use outdoors 2006/95/EC (ex-73/23/EEC) Low voltage directive 2004/108/EC Electromagnetic compatibility

INSTYTUT LOGISTYKI I MAGAZYNOWANIA

ul. E. Estkowskiego 6, 61-755 POZNAN, Poland; +48 61 850 48 90; Fax: +48 61 852 63 76; office@ilim.poznan.pl; www.ilim.poznan.pl Notified Body number : 1664 Directives: 99/5/EC Radio and telecommunications terminal equipment 2006/95/EC (ex-73/23/EEC) Low voltage directive 2004/108/EC Electromagnetic compatibility

INSTYTUT MECHANIZACJI BUDOWNICTWA I GORNICTWA SKALNEGO

ul. Racjonalizacji 6/8, 02-673 Warszawa, Poland; +48 22 843 27 03; Fax : +48 22 843 27 03; imb@imbigs.org.pl; www.imbigs.org.pl Notified Body number : 1454 Directives: 89/106/EEC Construction products 2000/14/EC Noise emission in the environment by equipment for use outdoors 2006/95/EC (ex-73/23/EEC) Low voltage directive 2004/108/EC Electromagnetic compatibility 2006/42/EC Machinery

INSTYTUT ZAAWANSOWANYCH TECHNOLOGII WYTWARZANIA

Ul. Wroclawska 37 A, 30-011 KRAKOW, Poland; +48 12 63 17 100; Fax: +48 12 63 39 490; ios@ios.krakow.pl; www.iztw.krakow.pl

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ul. Ratuszowa 11, 03-450 Warszawa, Poland; +48 22 619 22 41; Fax: +48 22 619 29 47; itr@itr.org.pl; www.itr.org.pl Notified Body number : 1941 Directives: 2006/95/EC (ex-73/23/EEC) Low voltage directive 2004/108/EC Electromagnetic compatibility

JEDNOSTKA OPINIUJACA, ATESTUJACA I CERTYFIKUJACA WYROBY TEST SP. Z O.O.

ul. Wyzwolenia 14, 41-103 Siemianowice Slaskie, Poland ; +48 32 73 08 200; Fax: +48 32 73 08 200; sekretariat@joac-test.pl; www.joac-test.pl Notified Body number : 2057 Directives: 94/9/EC Equipment and protective systems intended for use in potentially explosive atmospheres 2006/95/EC (ex-73/23/EEC) Low voltage directive 2004/108/EC Electromagnetic compatibility 2006/42/EC Machinery

OSRODEK BADAN ATESTACJI I CERTYFIKACJI OBAC SP. Z.O.O. ul. Jasna 31, 44-122 GLIWICE, Poland ; +48 32 239 44 82; Fax: +48 32 239 44 87; Email : biuro@obac.com.pl; www.obac.com.pl Notified Body number : 1461 Directives: 94/9/EC Equipment and protective systems intended for use in potentially explosive atmospheres 2000/14/EC Noise emission in the environment by equipment for use outdoors 2006/95/EC (ex-73/23/EEC) Low voltage directive 2004/108/EC Electromagnetic compatibility 2006/42/EC Machinery

OSRODEK BADAWCZO-ROZWOJOWY CENTRUM TECHNIKI MORSKIEJ S.A. ul. Dickmana 62, 81-109 Gdynia, Poland; +48 58 66 65 300; Fax: +48 58 66 65 304; sekretariat@ctm.gdynia.pl;www.ctm.gdynia.pl Notified Body number : 2075 Directive: 2004/108/EC Electromagnetic compatibility

OSRODEK BADAWCZO-ROZWOJOWY PREDOM-OBR

ul. Krakowiakow 53, 02-255 WARSZAWA, Poland ; +48 22 846 19 51; Fax: +48 22 846 19 51; obr@predom.com.pl; www.predom. com.pl Notified Body number : 1451 Directives: 2009/142/EC (ex-90/396/EEC) Appliances burning

eUroPe eMc gUiDe 2011

Zasoby | POLSKA

gaseous fuels 2006/95/EC (ex-73/23/EEC) Low voltage directive 2004/108/EC Electromagnetic compatibility

POLSKIE CENTRUM BADAN I CERTYFIKACJI S.A.

ul. Klobucka 23A, 02-699 Warszawa, Poland ; +48 22 464 52 01; Fax: +48 22 647 12 22; pcbc@pcbc.gov.pl; www.pcbc.gov.pl Notified Body number : 1434 Directives: 2006/95/EC (ex-73/23/EEC) Low voltage directive 2004/108/EC Electromagnetic compatibility

POLSKI REJESTR STATKOW S.A.

Al. Gen. Jozefa Hallera 126, 80-416 GDANSK, Poland; +48 58 346 17 00; Fax: +48 58 346 03 92; mailbox@prs.pl; www.prs.pl Notified Body number : 1463 Directives: 2006/95/EC (ex-73/23/EEC) Low voltage directive 2004/108/EC Electromagnetic compatibility

PRZEMYSLOWY INSTYTUT AUTOMATYKI I POMIAROW

Al. Jerozolimskie 202, 02-486 WARSZAWA, Poland; +48 22 874 04 02; Fax: +48 22 874 02 20; tmissala@piap.pl; www.piap.pl Notified Body number : 1548 Directives: 2006/95/EC (ex-73/23/EEC) Low voltage directive 2004/108/EC Electromagnetic compatibility

Other Ministry of Infrastructure, Department of Telecommunications

ul. Chałubińskiego 4/6, 00-928 Warszawa, +48 22 522 5006; Fax: +48 22 522 5045; Marek Wysocki, mwysocki@mi.gov.pl

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URZAD DOZORU TECHNICZNEGO

ul. Szczesliwicka 34, 02-353 Warszawa, Poland; +48 22 57 22 101, +48 22 57 22 110; Fax: +48 22 822 72 09, +48 22 57 22 129; udt@udt.gov.pl; www.udt.gov.pl; Notified Body number : 1433 Directives: 2006/95/EC (ex-73/23/EEC) Low voltage directive 2004/108/EC Electromagnetic compatibility

WROCLAW UNIVERSITY OF TECHNOLOGY

Institute of Telecommunications, Teleinformatics and Acoustics Electromagnetic Compatibility Laboratory Wybrzeze St. Wyspianskiego Str.27, PL50-370 Wroclaw, Poland ; Phone: +48 71 320 29 47, +48 71 320 42 96, +48 71 320 27 30; Fax: +48 71 320 31 89, +48 71 322 36 64; lke@ pwr.wroc.pl; http://zrt.pwr.wroc.pl/en/ Notified Body number : 1975 Directive: 2004/108/EC Electromagnetic compatibility

ZAKLADY BADAN I ATESTACJI “ZETOM” IM. PROF. F. STAUBA W KATOWICACH SP. Z O.O.

ul. Ks. Bpa Herberta Bednorza 17, 40-384 KATOWICE, Poland ; +48 32 256 92 57; Fax: +48 32 256 93 05; zetom@zetomkatowice.com.pl; www.zetomkatowice. com.pl Notified Body number : 1436 Directives: 88/378/EEC Safety of toys 89/106/EEC Construction products 2006/95/EC (ex-73/23/EEC) Low voltage directive 2004/108/EC Electromagnetic compatibility 2006/42/EC Machinery

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Status Dyrektwy EMC

The Status of EMC Directive

ASTAT Poznan, Polska

LAborATorium EmC (AkrEdyTowAnE, komErCyjnA inSTyTuCjA) Producenci ograniczają zakres realizowanych badań do min. (tak by zaoszczędzić koszty, czas), najczęściej kojarzą obowiązujące dyrektywy z koniecznością sprawdzenia bezpieczeństwa elektrycznego (dyrektywa LVD). Jeśli już inwestują w badania EMC to starają się ograniczyć program badań do ESD i przewodzonego RF (odporność i emisja) co świadczy o tym, że są świadomi problemów z tymi próbami lub tylko o takich testach wiedzą. Mało który Klient potrafi przygotować samodzielnie program badań. Małych firm nie stać na prowadzenie badań i one z nich rezygnuja (deklaracja zgodności jest podpisana bez badań) LAborATorium EmC (AkrEdyTowAnE, w STrukTurzE uCzELni wyżSzEj) w Polsce jest ustawa wdrażająca dyrektywę EMC o której nie wszyscy wiedzą , PKN prowadzi aktualny wykaz zharmonizowanych norm gdzie można uzyskać do nich dostęp (za opłatą), przy Polskiej Akademii Nauk jest Komitet EMC ktorego członkowie wspierają ideę propagowania wiedzy na temat EMC. Kliencie tego laboratorium przestrzegają norm EMC i nowo opracowane wyroby spełniają normy. LAborATorium EmC (AkrEdyTowAnE, w STrukTurzE inSTyTuTu nAukowEgo) Kwestie formalno-prawne związane z dyrektywą 2004/108/ EC są w Polsce uregulowane na podstawie odnośnych ustaw państwowych i rozporządzeń ministerialnych. W szczególności należy wymienić „Ustawę z dn. 13.04.2007 o kompatybilności elektromagnetycznej” (Dz. U. z dnia 11 maja 2007 r.) oraz „Rozporządzenie Ministra Transportu i Budownictwa z dnia 27 grudnia 2005 w sprawie dokonywania oceny zgodności aparatury z zasadniczymi wymaganiami dotyczącymi kompatybilności elektromagnetycznej oraz sposobu jej oznakowania”. Stan prawny w Polsce jest zgodny z prawem europejskim. Nadzór rynku krajowego w zakresie przestrzegania zgodności z wymienioną dyrektywą prowadzi Urząd Komunikacji Elektronicznej (Warszawa, ul. Kasprzaka 18). W ramach tego nadzoru prowadzi się kontrole w sklepach, hurtowniach i bezpośrednio u producentów. Większość kontroli polega tylko na sprawdzeniu dokumentacji wyrobów. W uzasadnionych przypadkach UKE wykonuje laboratoryjne badania wyrobów w zakresie EMC w celu stwierdzenia 124

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zgodności w wymaganiami podstawowymi dyrektywy 2004/108/EC. Źródłem informacji na temat stanu przestrzegania wymagań dyrektywy EMC w Polsce jest UKE, który jako jedyna instytucja ma podstawy do całościowej oceny w skali kraju. Proponuję zwrócić się do nich z prośbą o udostępnienie informacji na ten temat. O ile pamiętam z jakiegoś seminarium, rocznie UKE wykonuje kilka tysięcy kontroli oraz bada w swoim laboratorium kilkuset wyrobów. Stan przestrzegania wymagań dyrektywy EMC w Polsce polepsza się z roku na rok. Nadzór rynku krajowego skupia się głównie na wyrobach powszechnego użytku (np AGD) i jest raczej słabszy w sektorze aparatury do zastosowań przemysłowych. Na podstawie wieloletnich doświadczeń z pracy w laboratorium EMC można stwierdzić, że zdecydowana większość (> 70 %) nowych konstrukcji urządzeń elektronicznych nie spełnia początkowo wszystkich wymagań EMC i wymaga wprowadzenia jakiś (większych lub mniejszych) zmian konstrukcyjnych. Uzasadniona jest zatem teza, że firmy, które nie korzystają z usług laboratoriów badawczych EMC i nie posiadają również własnego zaplecza badawczego, z dość dużym prawdopodobieństwem mogą wprowadzać na rynek wyroby niezgodne z dyrektywą 2004/108/EC. Klienci naszego Laboratorium poważnie traktują kwestie zgodności z wymaganiami EMC, tzn. wyroby są poprawiane w sposób skuteczny, a ponadto z zachowaniem dostatecznie dużych marginesów EMC. W naszym laboratorium nigdy nie wystawia się pozytywnych świadectw badań w przypadkach wątpliwych technicznie. Takie podejście prowadzone konsekwentnie od wielu lat skupia wokół naszego laboratorium tylko takie firmy, które rzeczywiście dbają o poziom technicznych swoich wyrobów, także w zakresie EMC. Jednocześnie „odstrasza” to od nas firmy, którym zależy raczej tylko na dokumencie potwierdzającym badania. O tym, że takie mniej rzetelne firmy w Polsce również istnieją czasem słyszymy od naszych Klientów, ale nie potrafimy tego zweryfikować i ocenić skali zjawiska. Pewnym problemem na rynku krajowym są nadal wyroby dalekowschodnie, a ostatnio także raporty badań EMC pochodzące z tego obszaru. W przypadku produkcji wielkoseryjnej, problemem może być nadzór wyrobów w zakresie EMC w toku produkcji (czyli jak utrzymać parametry EMC prototypu wyrobu podczas wielkoseryjnej produkcji). Trudno oszacować skalę problemu, ale mieliśmy pojedyncze przykłady znacznych odstępstw wyrobu produkowanego od parametrów badanego wcześniej prototypu. euroPe emc guide 2011

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Korekcja Niedopasowań W Torze Pomiarowym Przewodzonych Zaburzeń Radioelektrycznych JAN SROKA EMC-Testcenter Zurich AG Zurich, Switzerland

English translation available at www.interferencetechnology.eu

Measurement Instrumentation Uncertainty of Radiated Disturbances Due to Antenna Receiver Transmission

STRESZCZENIE Napięcie zaburzeń przewodzonych z wrót EUT sieci sztucznej przekazywane jest torem pomiarowym do wejścia miernika. Współczynnik F wiążący te napięcia, zwany współczynnikiem toru pomiarowego, wyznaczany jest z pominięciem niedopasowań. Towarzyszy mu współczynnik niedopasowania toru pomiarowego δM. Współczynnik niedopasowania zależy od wszystkich elementów toru pomiarowego, w tym od sieci sztucznej. Fakt ten jest ignorowany w istniejących dokumentach [7], [8]. Ze względu na odbicia Γr na wejściu miernika, których tylko wartości graniczne dostępne są w dokumetacjach technicznych mierników, współczynnik niedopasowania nie może być wyznaczony, tylko oszacowany. Jego estymata wchodzi w skład bilansu niepewności pomiaru. W artykule przedstawione są dwa sposoby szacowania współczynnika niedopasowania: z pzodzielonym i ze zintegrowanym torem pomiarowym. Zamieszczone są szacowania numeryczne z wykorzystaniem metory Monte

Carlo. Różne postaci współczynników niedopasowania w pomiarach emisji przewodzonej i promieniowanej oraz wykazanie wad szacowania z podzielonym torem pomiarowym są głónymi przesłaniami artykułu. I. WSTĘP Przedmiotem badań zaburzeń przewodzonych jest napięcie we wrotach EUT (Equipment Under Test) sieci sztucznej (Artificial Mains Network) (złącze 1 na Rys. 1). Czwórnik między złączem 1 i wejściem miernika zaburzeń (złącze 3 na Rys. 1) nazywa się torem pomiarowym. Między złączami 1 i 2 występuje sieć sztuczna wraz z tłumikiem. Wiele konstrukcja sieci sztucznych ma wbudowane tłumiki. W przypadku braku wewnętrznego tłumika zaleca sie wstawienie w tor pomiarowy tłumika zewnętrznego, w celu zmniejszenia niedopasowania. Dla uproszczenia, elementy między złączami 1 i 2 będą nazwane siecią sztuczną, a wielkości z nią związane będą opatrzone górnym indeksem (A). Między złączami 2 i 3 znajdują się kable, przepust i ewentualnie ogranicznik przepięć. Dla uproszczenia, elementy między tymi złączami będą

Rys 1. Stanowisko do pomaru emisji przewodzonej.

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SROK A

nazwane kablem, a wielkości z nim związane będą opatrzone górnym indeksem (B). Wielkości odpowiadające całemu torowi pomiarowemu, między złączami 1 i 3 będą opatrzone górnym indeksem (AB) lub (A+B). Do wyznaczenia współczynnika F toru pomiarowego, pozwalającego przeliczyć napięcie złącza 3 na napięcie złącza 1, niezbędne jest pomierzenie parametrów rozproszeniowych S toru. Współczynnik F wyznaczany jest z pominięciem niedopasowania w torze. Implikuje to istnienie współczynnika niedopasowania toru δM. W efekcie, relacja między napięciami złącz 3 i 1 jest iloczynem współczynnika toru i współczynnika niedopasowania (F•δM). Współczynnik niedopasowania w emisji przewodzonej różni się od swojego odpowiednika w emisji promieniowanej. Zależy on od parametró S sieci sztucznej. Fakt ten jest ignorowany w istniejących dokumentach [7], [8], w których współczynnik niedopasowania w pomiarach emisji promieniowanej jest prezentowany jako jedyny, ogólny współczynnik niedopasowania. Sytuacja ta zmotywowała autora do zajęcia się tym zagadnieniem. Przy wyprowadzaniu wzoru na współczynnik niedopasowania toru w pomiarach emisji przewodzonej tor ten może być traktowany jako podzielony na kilka czwórników lub jako zintegrowany jeden czwórnik. W artykule omówione są wady podejścia z torem podzielonym. II. TOR PODZIELONY W podejściu tym tor traktowany jest jako kaskadowe połączenie sieci sztucznej, opisanej parametrami S(A) oraz kabla opisanego parametrami S(B). Gdyby sieć sztuczna była podłączona bezpośrednio do miernika, wtedy zależność między napięciami bramy EUT sieci sztucznej (U1), a napięciem na wejściu miernika (U2=3) wynikałaby ze stratności napięciowej [3], [11]

Ponieważ jednak między siecią sztuczną i odbiornikiem jest kabel, to napięcie (U2=3) trzeba zastąpić wyrażeniem wiążącym napięcia (U2) i (U3) po wtrąceniu czwórnika między złącze 2 i 3. Zależność ta wynika ze stratności wtrąceniowej [3], [11]

Równ.(2) w skali decybelowej jest sumą następujących składników

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Współczynnik F(A), to współczynnik podziału napięcia sieci sztucznej, którego metoda pomiaru przedstawiona jest w publikacjach [2], [3] i [6]. Współczynnik F(B), to po prostu tłumienność kabla. Współczynnik F(A)(B) całego toru pomiarowego, pomiędzy złączem 1 i 3 jest sumą obydwu współczynników (F(A)(B) = F(A) + F((B))1. Współczynnik δM(A) (B) niedopasowania całego toru jest sumą współczynników niedopasowania sieci sztucznej δM(A) oraz kabla δM(B) (δM(A) (B) =δM(A) + δM(B))2 Dużą niedogodnością tego podejścia jest występowanie odbić Γe na złączu 2, patrząc w kierunku sieci sztucznej. Odbicia te zależą od impedancji EUT. Muszą one być zatem mierzone dla każdego EUT z osobna, co jest nierealne lub muszą być traktowane jako druga zmienna losowa, obok odbić Γr na wejściu miernika. II. TOR ZINTEGROWANY Alternatywą do podzielenia toru pomiarowego jest wykorzystanie parametrów S dla całego toru. Parametry uzyskane bepośrednio z pomiarów całego toru będą opatrzone indeksem S(AB). Opcjonalnie można pomierzyć oddzielnie parametry S(A) dla sieci sztycznej i S(B) dla kabla, a następnie obliczyć S(A+B) korzystając ze wzorów na kaskadowe połączenie czwórników [10]. Dla czwórnika opisanego parametrami S(AB) relacja między napięciem U1 sieci sztucznej, a napięciem U3 na wejściu miernika jest analogiczna do wzoru (1)3

Stąd współczynnik toru pomiarowego w skali decybelowej będzie miał postać

oraz współczynnik niedopasowania toru

Dużą zaletą tego podejścia jest brak odbić Γe we współczynniku niedopasowania. IV. OBLICZENIA PROPAGACJI PARAMETRÓW ROZKŁADU W każdym z trzech współczynników niedopasowania (wzory (3c), (3d) i (6)) jest przynajmniej jedna zmienna losowa. Są to odbicia Γr na wejściu miernika. Dodatkowo we wspołczynniku niedopasowania opisanym wzorem (3d) może być druga zmienna losowa Γe. Oznacza to, że wartość żadnego ze współczynników niedopasowania nie może być wyznaczona. Co najwyżej może być oszacowana. Szacowanie z założeniem rozkładu kształtu U [3], [9] nie może być zastosowane4 . Również szacowanie wartości granicznych metodą podaną w rozdziale A.5 dokumentu [7] i rozdziale A.7 dokumentu [8] nie może być zastosowane. Podejście to można stosować gdy argument logarytmu jest sumą wartości jeden i innych składników, z których każdy INTERFERENCE TECHNOLOGY

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Figure 2. Niepewność standardowa u oraz wartość przeciętna E(X) współczynnika niedopasowania przy 0dB (VSWR<2,0) (Rys. a) i co najmniej 10dB (VSWR<1,2) (Rys. b) tłumieniu na wejściu miernika.

jest iloczynem modułów. Ułamki występujące we wzorach (3c), (3d) i (6) uniemożliwiają ten rodzaj szacowania. Jedynym, prawidłowym sposobem oszacowania wzorów (3c), (3d) i (6) jest metoda Monte Carlo [1], [4], [5]. Autor przeprowadził szacowanie programem Mathcad13, wykorzystując dostępny w nim generator pseudolosowy z rozkładem jednostajnym. Za wartość oczekiwaną (przeciętną) E(X) autor przyjął średnią arytmetyczna próbek. Odchylenie standardowe (niepewność standardowa) u została policzona zależnością Parametry rozproszeniowe pomierzono wektorowym analizatorem sieci ZVRE firmy R&S w przedziale częstotliwości od 9kHz do 30MHz w 201 logarytmicznie rozłożonych punktach częstotliwości. Do kalibracji analizatora sieci użyto zestawu kalibracyjnego 85032B TYPE-N firmy H&P. Przeanalizowano stanowisko pomiarowe z odbiornikiem ESIB40 firmy R&S. Producent tego odbiornika zapewnia współczynnik fali stojącej VSWR na wejściu miernika nie większy niż 2,0 przy wyborze tłumienia na wejściu 0dB (VSWR<2,0) oraz nie większy niż 1,2 jeśli tłumienie to wynosi Czynnik 1+Γr występujący we wzorach (1) i (2) nie występuje we wzorze (3a), bowiem jego wartość jest zapamiętana w EPROM miernika i wykorzstana do korekcji jego wskazania (patrz publikacje [2], [3]). 2 We wzorze (3d), w odróżnieniu do wzoru na współczynnik niedopasowania w emisji promieniowanej, jak to przedstawione jest w dokumentach [7] i [8] występuje mianownik 1+Γr Γe. W przypadku promieniowania mianownik ten skraca się po zastosowaniu współczynnika antenowego [3]. 3 W przypadku oddzielnego pomiaru S(A) i S(B) indeks górny S(AB) należy zastąpić indeksem S(A+B) 4 Z rozkładem kształtu U mamy do czynienia gdy moduł wielkości zespolonych, w tym wypadku |Γr | jest znany, natomiast zmienną losową jest argument. W przypadku Γr, z danych dostępnych w specyﬁkacji technicznej miernika można wyznaczyć jedynie wartości graniczne modułu. 1

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co najmniej 10dB (VSWR<1,2). Dotyczy to całego przedziału częstotliwości, od 20Hz do 40GHz. W przeliczeniu na moduł współczynnika odbicia |Γr| oznacza to |Γr|<0,34 dla 0dB tłmienia oraz |Γr|<0,092 dla co najmniej 10dB tłmienia na wejściu miernika. Przeanalizowany tor pomiarowy składa się z: jednofazowej sieci sztucznej typu ANS-25/2 firmy ElectroMetrics wraz z 10dB zewnętrzym tłumikiem, dwu kabli koncentrycznych o długościach 3m i 2m oraz przepustu. Współczynnik niedopasowania oszacowano dla obu granicznych wartości VSWR. W tym celu wygenerowano generatorem pseudolosowym dwa zbiory 180 elementowych próbek zmiennych losowych modułu |Γr| w przedziałach odpowiednio [0;0,34] oraz [0;0,092]. Każdorazowo próbkom tym towarzyszyły 180 elementowe próbki zmiennych losowych fazy |Γr| w przedziale [-π; π]. Przeprowadzono trzy rodzaje szacowania: jeden z podzielonym torem pomiarowym5 i dwa ze zintegrowanym torem pomiarowym wykorzystując raz parametry S(AB) pomierzone dla całego toru i drugi raz parametry S(A) i S(B) pomierzone oddzielnie. Przy szacowaniu z torem podzielonym użyto zdeterminowanego Γe, pomierzonego dla EUT z typowym filtrem podłączonego do wrót EUT sieci sztucznej. Wyniki szacowania, oznaczone indeksami (A), (B), (AB) oraz (A+B) przedstawione są na Rys. 2a i 2b. Maxima niepewności standardowej w paśmie częstotliwości A (9kHz – 150kHz) oraz B (150kHz – 30MHz) przedstawione są w Tabeli I dla (VSWR<2,0) oraz Tabeli II dla (VSWR<1,2). V. WNIOSKI Zarówno sieć sztuczna jak i kabel mają swój udział we współczynniku niedopasowania toru pomiarowego w badaniach emisji przewodzonej. Pomierzona wartość współczynnika dbić Γr na wejściu miernika jest niedostępna. Wykorzystuje EUROPE EMC GUIDE 2011

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Table 1. Maxima niepewności standardowej dla współczynnika fali stojącej na wejściu miernika VSWR<2,0.

•

Table 1.1. Maxima niepewności standardowej dla współczynnika fali stojącej na wejściu miernika VSWR<1,2.

sie natomiast wartości graniczne tych odbić, dostepne w dokumentacji technicznej miernika. Dlatego Γr jest zmienną losową. Do oszacowania propagacji rozkładu zmiennej losowej Γr na współczynnik niedopasowania toru pomiarowego nie można zastosować ani rozkładu kształtu U [3], [9], ani szacowania wartosci ekstremalnych metodą prezentowaną w dokumentach [7] i [8]. Jedynym prawidłowym sposobem jest zastosowanie metody Monte Carlo [1], [4], [5]. Odradza się szacowanie z podziałem toru pomiarowego na dwa lub więcej czwórników. Konsekwencją tego jest współczynnik niedopasowania zależny od Γe , czyli od odbić na wyjściu sieci sztucznej, patrząc w jej kierunku. Odbicia te zależą od impedancji EUT. Wymaga to każdorazowo pomiaru Γe i utworzenia bilansu niepewności pomiaru dla każdego EUT z osobna lub traktowania Γe jako kolejnej zmiennej losowej. Pierwsze podejście jest nierentowne. Drugie, czyni współczynnik niedopasowania toru zależny od dwu zmiennych losowych, z których każda jest wielkością zespoloną. Zwiększa to stopień złożoności procesu estymacji. Parametry rozproszeniowe toru zintegrowanego mogą być określone na dwa sposoby. W pierwszym mierzy się cały tor pomiarowy jako jeden czwórnik. Alternatywą jest pomiar parametrów S dla sieci sztucznej i kabla z osobna i zastosowanie wzorów na kaskadow połączenie czwórników. Wartości oczek iwane (przeciętne) E(X) współczynnika niedopasowania są we wszystkich trzech podejściach pomijalnie małe.

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of distributions using a Monte Carlo method. JCMG 101:2008. Dostępne bezpłatnie na OIML web side, www.oiml.org. [5] C.,F.,M. Carobbi: The GUM Supplement 1 and the Uncertainty Evaluations of EMC Measurements. IEEE EMC Society Newsletter, Issue No. 225, 2010. [6] CISPR 16-1-2: 2004 + A1:2005 + A2:2006, Specification for radio disturbance and immunity measuring apparatus and methods - Part 1-2: Radio disturbance and immunity measuring apparatus - Ancillary equipment - Conducted disturbances. IEC, 2006. [7] CISPR 16-4-2: 2003, Specification for radio disturbance and immunity measuring apparatus and methods - Part 4-2: Uncertainties, statistics and limit modelling - Measurement instrumentation uncertainty. IEC, 2003. [8] CISPR A/901/CDV, CISPR 16-4-2 Ed.2: Specification for radio disturbance and immunity measuring apparatus and methods - Part 4-2: Uncertainties, statistics and limit modelling - Measurement instrumentation uncertainty. IEC, 2010. [9] I.A.Harris, F.L.Warner,: Re-examination of mismatch uncertainty when measuring microwave power and attenuation. IEE Proc., Vol.128 No.1, February 1981. [10] D.M.Kerns: Basic theory of waveguide junctions and introductory microwave network analysis. Pergamon Press Ltd., London, 1967. [11] F.L.Warner: Microwave attenuation measurements. IEE Monograph Series 19, Peter Pergamon Ltd, 1977.

BIBLIOGRAFIA •

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[1] R. Bąbka: Niepewność pomiarów emisji przewodzonej w kompatybilności elektromagnetycznej Praca Doktorska. Politechnika Warszawska, 2009. [2] R.Bąbka, J.Sroka: Measurement instrumentation uncertainty of conducted disturbances due to AMN-receiver transmission 19th International Wrocław Symposium and Exhibition on EMC, 2008. [3] J. Sroka: Niepewność pomiarowa w badaniach EMC, pomiary emisyjności radioelektrycznej Oficyna Wydawnicza Politechniki Warszawskiej, Warszawa 2009. ISBN 978-7207837-7 [4] Joint Committee for Guides in Metrology (JCGM), Evaluation of measurement data - Supplement 1 to the “Guide to the expression of uncertainty in measurement” - Propagation

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Keiner weiss genau, wie es weitergeht mit der elektromagnetischen Kompatibilität und den Wirelesstests. Aber zwei Dinge sind gewiss: 1. Die Nachfrage nach mehr Leistung und höheren Frequenzen geht weiter. 2. AR ist immer ein paar Schritte voraus, mit Verstärkern und Zubehör, die all Ihre Testbedürfnisse befriedigen, selbst, wenn sich diese Bedürfnisse ständig ändern. Unsere Verstärker der Serie S sind schon bereit. Verstärker der AR „S“ Serie sind für die Zukunft geplant und gebaut. Mit den gewünschten Optionen und der benötigten Leistung und der benötigten Frequenz. Die Modelle 5S6G18A, 10S6G18A, 20S6G18 and 40S6G18A liefern 5, 10, 20 bzw. 40 Watt im ganzen 6-18 GHz Bereich. Und mit unserer Subampability-Funktion lassen sich die 5 Watt leicht auf 20 Watt und dann auf 40 Watt erweitern. Und alle Verstärker der Serie „S“ generieren 100 % der Nennleistung und stellen sie dem Verbraucher zur Verfügung, selbst bei einer erheblichen Fehlanpassung. Sie reproduzieren Signale mit aussergewöhnlicher Linearität. Störsignale, Rauschzahlen und Verzerrung sind extrem niedrig. Die erheblichen eigenen Kapazitäten von AR – darunter ein Mikroelektroniklabor nach dem neuesten Stand der Technik machen es möglich, diese neuen Festkörperverstärker mit einer Leistungsstufe und Zuverlässigkeit anzubieten, die in der Branche ihresgleichen suchen. Keiner schlägt die Qualität von AR. Niemals. Und natürlich besteht für alle AR-Erzeugnisse die umfassendste und weitestreichende Garantie der ganzen Branche und ein einmaliges globales Supportnetzwerk. Kontaktieren Sie für die Schweiz Emitec AG, info@emitec.ch oder Tel. +41-41-748-6010 Copyright © 2010 AR. The orange stripe on AR products is Reg. U.S. Pat. & TM. Off.

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the effects of the new eSD Standard on eSD Simulators

Bruno Straumann Senior Development Engineer Haefely Test AG Basel, Switzerland

IntroDuCtIon The new IEC 61000-4-2 Edition 2 standard which replaces IEC 61000-4-2 Edition 1 1995 was initially announced in December 2008. Based on the revised IEC standard, the identical European standard EN 61000-4-2:2009 was also released. The new EN standard can already be applied for ESD immunity testing, and testing according to the new standard will be mandatory starting 1st of March 2012. The following article focuses on the effects the new standard has on ESD simulators and the corresponding calibration procedures of such generators.

not actually true. On one hand, the enhanced lower tolerance limit of the rise time only takes into account the lower measurement values, which results from the increased measurement bandwidth. On the other hand, the new standard requires that per measurement level, 5 impulses are recorded at a time and individually evaluated. Every single measurement (i.e. tr, Ip, I30, I60) of each impulse must meet the required tolerance levels. It is now not permitted to use average values from several impulses, although the previous standard permitted using averaged measured values, a procedure which is often used. CorreCt meaSurement BeComeS more DIffICult Previously, if random measurement errors (in terms of measurement uncertainty) occurred, it was very likely that they would not appear in the final measurement results. The reason for this is because random measurement errors were averaged. With the new standard, random measurement errors are no longer aver-

mISleaDIng fIrSt ImpreSSIonS While comparing the previous and new standard ESD simulator specifications, one may easily get the wrong impression. The tolerance levels (table 1) along with the 61000-4-2 61000-4-2 rise time (tr) and current Edition 1 Edition 2 peak values (Ip), are clearly higher in the new stanRise time tr 0,7ns – 1,0ns 0,6ns – 1,0ns dard. ±10% ±15% Peak value Ip One would assume that ±30% Current at 30ns I30 ±30% the ESD simulator require±30% Current at 60ns I60 ±30% ments would now be reduced with the new stan- Table 1. Permitted ESD impulse tolerance levels according to dard, something which is previous and new standard. 134

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and should not be ignored because it influences the measurement values of I30 and I60.

Figure 1. Non-conforming measurement (above) and correct measurement (below).Insufficient shielding can lead to measurement errors of ±20% magnitude or more.

aged, and thus random errors will now clearly be shown in the final measurement results. An important source of random measuring errors could be an insufficiently shielded measuring system. In other words, the reason why the measured ESD impulse does not meet the standard specification could be due to the measurement system itself, and not the actual ESD simulator. Figure 1 shows the possible effects of a badly shielded measurement system. HIgHer meaSurement BanDwIDtH anD DefIneD teSt Setup To calibrate an ESD simulator according to the new standard, the following equipment is necessary: - Digital Oscilloscope, analogue Bandwidth ≥2GHz / Sampling rate ≥10GS/s - Measurement target, Bandwidth 4GHz / Impedance ≤2,1 Ohm - Attenuator, 20dB typically - Reference ground plane, dimensions ≥ 1,2m x 1,2m - Suitable shielded housing for the measurement system First, it is important to note that the new measurement target no longer has the 50 Ohm series resistor. Therefore, when taking measurements of the peak current with the oscilloscope the signal should no longer be cut in half. If data transfer is being performed between a PC and the Oscilloscope it should be done via fibre optics. A second important aspect of the new test setup is the shielded housing. This has to damp interference frequencies of up to GHz levels and all wiring leading into the shielded housing must be filtered accordingly. A properly shielded scope is even more important when taking measurements according to the new standard. This is because you can no longer average out random errors. If data transfer is being performed between a PC and the oscilloscope it should be done via fibre optics. Also, the position of the grounding connections on the ground reference plane is now exactly defined; 0.5m vertically below the measuring target. Finally, the position of the ESD simulator earth cable is now also defined. This is very important interferencetechnology.eu

ConSequenCeS for eSD SImulatorS Experience shows that there are significant differences between various ESD models. Because the new standard demands more from ESD simulators, it is clear that some ESD simulators will no longer be compliant to the new standard. Testing with such non-compliant ESD simulators can lead to over-testing or under-testing of EUTs. In practice this is not a desirable result. A decision on whether an existing ESD simulator meets the new requirements can only be made following calibration to the latest edition of the IEC standard. When purchasing a new ESD simulator, one should ensure that the new simulator meets the exact requirements of IEC 61000 4-2 edition 2. VerIfICatIon anD CalIBratIon In the previous standard, the term verification and calibration was used incorrectly, while the revised standard now correctly differentiates verification from calibration. Calibration is the exact measuring technique of the measurement values, and verification means verification of the ESD simulator. The verification is carried out before the actual testing takes place, whereas calibration period of the ESD simulator

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th e e f f e c t S o f t h e n e w e S D S ta n D a r D

However, this is an insufficient method as the length of the spark depends on the geometry of the discharging electrodes, the polarity, and the environmental conditions. Furthermore, a defective discharge relay will not be detected. This is the reason modern ESD simulators include self test routines, which within seconds can diagnose potential defects. It can generally be said that the new IEC/EN 61000-4-2 Edition 2 standard demands more from ESD simulators as well as from the measuring equipment used for calibrating the ESD simulator itself. Whether the ESD simulator meets the standard can only be determined through proper calibration. BRUNO STRAUMANN is currently working as senior development and application engineer in the EMC Division of HAEFELY. He has been with the company for more than 20 years in various roles, including project manager for design and development of EMC test equipment.

Figure 2. Modern ESD-Simulator built to meet exact requirements of the latest standard.

WeItere InformatIonen onlIne needs to be determined by the user, and is typically every 1-2 years. The new standard suggests that to determine whether the simulator is functioning correctly, the length of the spark should be checked during an air discharge.

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EEMCCOIMEX, Apolloweg 80, 8239 Da Lelystad, Nederland; 0320 295 395; Fax: 0320 413 133; info@eemc.nl; www.eemc.nl; www.AHSystems.com Producten en services: Antennes, Testinstrumenten, Testen

EEMCCOIMEX

Apolloweg 80, 8239 Da Lelystad, Nederland; 0320 295 395; Fax: 0320 413 133; www.eemc.nl; info@eemc.nl Producten en services: Ferrieten, Filters, Afscherming

AR Benelux B.V.

Frankrijklaan 7, ITC Boskoop, NL-2391 PX, Hazerswoude-Dorp, Nederland; +310-172-423-000, Fax: +31-0-172-423-009; www.arbenelux.com, Onno de Meyer info@arbenelux.com Producten en services: Versterkers, Antennes, Spanning en overgangen, Testinstrumenten

Schlegel Electronic Materials Haefely Test AG

Department AG, Lehenmattstrasse 353 CH-4052 Basel, Schweiz; +41 61 373 45 84; Fax: +41 61 373 4912; www.haefely.com; EMC-sales@haefely.com Producten en services: Spanning en overgangen, Testinstrumenten

Holland Shielding Systems

P.O Box 730, 3300 AS Dordrecht, Nederland; +31 78 613 13 66; Fax: +31 78 614 95 85; www.hollandshielding.com; info@hollandshielding.com Producten en services: Geleidende materialen, Filters, Afgeschermde ruimtes en afsluitingen, Afscherming, Testen

EM Test GmbH

Waterdijk 3a, 5705 CW Helmond, Nederland; +31 (0)492 390 911; Fax +31 (0)492 390 433; www.bicon.nl; bicon@bicon.nl Producten en services: Consultants, Testen

C CE-Test

CE-Test, Qualifi ed Testing bv, Kiotoweg 363, 3047 BG Rotterdam, Nederland; +31 10 4152426; Fax +31 10 4154953; www.cetest.nl; cetest@cetest.nl Producten en services: Testen

CN Rood bv

C.N. Rood B.V., Blauw-roodlaan 280, 2718 SK Zoetermeer, Nederland; +31-(0)79 360 00 18; Fax +31-(0)79 362 81 90; info.netherlands@cnrood.com; www.cnrood.com Producten en services: Testinstrumenten

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EMC Partner

RIMARCK, Mr. Jan Heerooms, Oosterleek 3, NL - 1609 GA Oosterleek Nederland; +31 229 503 478; Fax: +31 229 503 479; info@rimarck.nl; www.rimarck.nl Producten en services: Spanning en overgangen, Testinstrumenten

EMCMCC

HF Technology, Atalanta 5, 1562 LC Krommenie, Nederland; 31 75-628 37 17; Fax: 31 75-621 11 20; info@hftechnology.nl Producten en services: Geleidende materialen, Afscherming

IFI - Instruments for Industry

EEMC Coimex, Apolloweg 80 8239 DA Lecystad, Nederland; + 31 320295395; Fax: +31 320413133; Antoon Naus, anaus@eemc.nl; www.eemccoimex.nl Producten en services: Versterkers, Antennes, Filters, Afgeschermde ruimtes en afsluitingen, Testinstrumenten, Testen

European Test Services

INTERFERENCE TECHNOLOGY

A mer s foor t ses t raat weg 7, 1412 K A Naarden, Nederland; +31 (0)35 695 74 11; Fax: +31 (0)35 694 11 84; www.stork.com; info@stork.com Producten en services: Testen

Tech-Etch, Inc.

Sedanlaan 13a, Eindhoven, 5 6 2 7MS, Nederland; 31-40-2927936; Fax: 31-402927481; www.emcmcc.nl; Mart Coenen, mart.coenen@emcmcc.nl Produc ten en ser vic e s : Tes ten, Consultants Keplerlaan 1, PO Box 299, Noordwijk, 2200 AG, Nederland; +31(0)71 565 59 69; Fax: +31(0)71 565 56 59; www.european-test-services.net Producten en services: Testen

Stork Fokker AESB B. V.

L 端nener S trasse 211, 5 9174 Kamen, Deutschland; +49 (0)2307 260 700; Fax: + 4 9 ( 0 ) 2 3 0 7 170 5 0 ; info @ emtest .de; www.emtest.nl Producten en services: Spanning en overgangen, Testinstrumenten, Testen

B Bicon Laboratories

Dracon-Eltron, Herastraat 51, 5047 TX Tilburg; +31 13 5780800 Nederland; Fax: +31 13 5711369; Paul Jansen, paul.jansen@ dracon.nl; www.dracon.nl Producten en services: Geleidende materialen, Afscherming

Teseq Ltd

Accelonix BV; +31 40 750 1650; sales@ accelonix.nl; www.accelonix.nl Producten en services: Versterkers, Antennes, Testinstrumenten, Testen

Thales Nederland B.V.

Haaksbergerstraat 49, 7554 PA Hengelo, Nederland; +31 74 2488111; Fax: +31 74 2425936; www.thalesgroup.com; info@nl.thalesgroup.com Producten en services: Testen

MEER ONLINE Nexio

EEMC Coimex, Apolloweg 80 8239 Da Lelystad, Nederland; +31 320 295 395; Fax : +31 320 413 133; www.eemc.nl/eng; info@eemc.nl Producten en services: Testinstrumenten

Voor bijgewerkte producten servicevermeldingen en Engelse vertalingen van technische artikelen, ga naar www.interferencetechnology.eu.

EUROPE EMC GUIDE 2010

Middelen ASSOCIATIONS DuTCH EMC-ESD SOCIETy

Postbus 366, 3830 AK Leusden, 033 465 75 07, Fax: 033 461 66 38, www.emvt.nl, Leusden, Paul Petersen, p.petersen@fhi.nl

IEEE EMC SOCIETy CHAPTER BENELuX

Frank Leferink, Thales Nederland B.V., P.O. Box 42, 7550 GD Hengelo, Netherlands; +31 74-248-3132; Fax: +31 74-248-4037; leferink@ieee.org

NEDERLANDSE EMC-ESD VERENIGING

Postbus 366, 3830 AK Leusden; 033 - 465 75 07; Fax: 033 - 461 66 38; Bezoekadres, Dodeweg 6, gebouw B, 3832 RC Leusden; Paul Petersen, p.petersen@fhi.nl

NOTIFIED BODIES D.A.R.E.!! CONSuLTANCy

Vijzelmolenlaan 7, NL-3447 GX Woerden, Netherlands; +31(0)348 430 979; Fax: +31(0)348 430 645; consultancy@dare.nl; www. dare.nl Notified Body number : 1912 Directives: 2006/95/EC (ex-73/23/EEC) Low voltage directive 2004/108/EC Electromagnetic compatibility (31/07/2012)

KEMA QuALITy B.V.

Utrechtseweg 310, Postbus 5185, 6802 ED ARNHEM, Netherlands; +31:(0)26:356 20 00; Fax: +31:(0)26:352 58 00; products@ kema.com; www.kemaquality.com Notified Body number : 0344 Directives: 89/106/EEC Construction products 90/385/EEC Active implantable medical devices 93/42/EEC Medical devices 94/9/EC Equipment and protective systems intended for use in potentially explosive atmospheres 98/79/EC In vitro diagnostic medical devices 2000/14/EC Noise emission in the environment by equipment for use outdoors 2006/95/EC (ex-73/23/EEC) Low voltage directive 2004/22/EC Measuring Instruments Directive 2004/108/EC Electromagnetic compatibility (31/07/2012) 2006/42/EC Machinery (29/12/2013)

KIwA NEDERLAND B.V.

Wilmersdorf, 50 (PO Box 137, 7300 AC), 7327 AC APELDOORN, Netherlands; (055) 539 33 55; Fax : (055) 539 36 85; gas@kiwa. nl; www.1kiwa.com Notified Body number : 0063 Directives: 89/106/EEC Construction products 2009/142/EC (ex-90/396/EEC) Appliances burning gaseous fuels 92/42/EEC Hot-water boilers 2004/108/EC Electromagnetic compatibility (20/07/2012)

interferencetechnology.com

NEDERLAND

TELEFICATION B.V.

Edisonstraat 12 A , 6 9 0 2 PK ZE V ENA A R, Netherlands ; +31:316:583 180; Fax: +31:316:583 189; info@telefication.com; www.telefication.com Notified Body number : 0560 Directives: 89/106/EEC Construction products 96/98/EC Marine Equipmen 99/5/EC Radio and telecommunications terminal equipment (01/11/2011) 2006/95/EC (ex-73/23/EEC) Low voltage directive 2004/108/EC Electromagnetic compatibility (31/07/2012)

THALES NEDERLAND B.V.

Surface Radar, Environmental Competence Centre P.O. Box 42, 7550 GD Hengelo, Netherlands; +31 74 248 3219; Fax: +31 74 248 4037; info@nl.thalesgroup.com; www.thales-nederland.nl Notified Body number : 1914 Directives: 200 4 /108 / EC Electromagnetic compatibilit y (31/07/2012)

TĂ&#x153;V RHEINLAND EPS B.V.

Smidshornerweg 18, NL-9822 TL Niekerk, Netherlands; (+31) (0)594 505005; Fax: (+31) (0)594 504804; info@tuv-eps.com; www.tuv-eps.com Notified Body number : 1856 Directives: 89/106/EEC Construction products 99/5/EC Radio and telecommunications terminal equipment (01/03/2012) 2006/95/EC (ex-73/23/EEC) Low voltage directive 2004/108/EC Electromagnetic compatibility (30/06/2012)

OTHER AGENTSHAP TELECOM

Emmasingel 1, 9700 Al Groningen; +31 50 587 73 25; Fax: +31 50 587 74 00; Jean Paul van Assche, jean-paul.vassche@at-ez.nl

Meer online Voor bijgewerkte producten servicevermeldingen en Engelse vertalingen van technische artikelen, ga naar www.interferencetechnology.eu.

Wat vindt u er van Uw opmerkingen en feedback zijn van groot belang voor ons. Ga naar www.interferencetechnology.eu en vul een kort onderzoek in dat ons zal helpen de EMC Europa handleiding te verbeteren.

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Nederland

A Change in International EMC Legislation: Do Industrial Premises Become Outlawed? Mart Coenen EMCMCC bv Eindhoven, Nederland

uring the last years, many new EMC standards have been adopted but more and more are outside the scope of formal EMC legislation. The recent change of scope of IEC ACEC, CISPR and the new European EMC Directive creates new challenges for industry as their focus will be aimed at the protection of the general broadcasting and communication services and of serving the main public interest. During the last APEMC 2010 symposium in Beijing a contribution was given to a workshop about the EMC developments for the European Industry. As in Europe, large changes resulted from the recent update of the EMC Directive 89/336/CE to 2004/108/CE where the entire legislation on physically large systems and large installations, called “fixed installations” has been altered. Although the European EMC Directive explicitly state: “The equipment covered by this Directive should include both apparatus and fixed installations. However, separate provisions should be made for each. This is so because, whereas apparatus as such may move freely within the Community, fixed installations on the other hand are installed for permanent use at a predefined location, as assemblies of various types of apparatus and, where appropriate, other devices. The composition and function of such installations correspond in most cases to the particu140

lar needs of their operators”, by which exclusions are already claimed. By the last sentence, the requirements will be based on particular needs. It further reads that: “Fixed installations, including large machines and networks, may generate electromagnetic disturbance, or be affected by it. There may be an interface between fixed installations and apparatus, and the electromagnetic disturbances produced by fixed installations may affect apparatus, and vice versa. In terms of electromagnetic compatibility, it is irrelevant whether the electromagnetic disturbance is produced by apparatus or by a fixed installation. Accordingly, fixed installations and apparatus should be subject to a coherent and comprehensive regime of essential requirements. It should be possible to use harmonized standards for fixed installations in order to demonstrate conformity with the essential requirements covered by such standards.” On the one hand, it is assumed that “fixed installations” will cause electromagnetic disturbance and/ or may be affected by other nearby systems. On the other hand, no IEC nor CE harmonized standards exist which enable RF emission, RF immunity and impulse immunity testing at close proximity on site or in-situ. Even worse, RF immunity testing at most end-user premises is prohibited by law or restricted to the ISM frequency bands only. Conducted mains tests will not be performed at all as the power cabling to the “fixed installation” has to be adapted for the sake of a “few” measurements. Here,

interference technology europe emc guide 2011

Nauwkeurigheid, lineariteit & bandbreedte. Wat wilt u nog meer? Model FL7060 Bereik van 2 MHz – 60 GHz

Model FL7040 Bereik van 2 MHz – 40 GHz Eigenlijk wel. Deze nieuwe laseraangedreven E-Field-sondes van AR zijn ongelooflijk veelzijdig; Ze doen het werk van meerdere sondes, met uitstekende nauwkeurigheid en lineariteit voor uw veeleisende noden inzake veldcontrole. Ze bevatten een interne microprocessor met geavanceerde bedienings- en communicatiefuncties, en tegelijk automatisch corrigerend is voor meetafwijking door schommelingen in de omgevingstemperatuur. Onze nieuwste lasersondes zijn verkrijgbaar in twee modellen, met een uitzonderlijk omvangrijk frequentiebereik. Model FL7040 dekt een bereik van 2 MHz – 40 GHz, terwijl het model FL7060 het gehele bereik van 2 MHz – 60 GHz dekt. U hoeft dus geen genoegen te nemen met hetgeen wordt aangeboden, maar doet wat u wilt. De lasersonde heeft als extra handig kenmerk dat de batterijen nooit moeten worden vervangen of opnieuw moeten worden opgeladen. Daarnaast biedt AR de grootste serie sondes binnen de industrie aan. Net als alle AR-producten geven we op onze nieuwe sondes de beste en meest volledige garantie, samen en de krachtigste ondersteuning binnen de industrie.

In Nederland kunt u contact opnemen met AR Benelux BV, info@arbenelux.com of neem telefonisch contact op onder telefoonnummer +31-(0)172-423-000 OPMERKING: De FL7040- & FL7060-sondes vereisen een FI7000 voor vermogen en communicatie. Copyright © 2010 AR. De oranje streep op AR-producten is een in de VS gepatenteerd en geregistreerd handelsmerk.

ar europe Andere ar-divisies: • modular rf • receiver systems National Technology Park, Ashling Building, Limerick, Ireland • 353-61-504300 • www.ar-europe.ie

ISO 9001:2008 Gecertificeerd

Nederland the long system start-up and turn-down times are not being considered which might take several hours. For this reason, comparison between RF emissions measured with an active “fixed installation” and one turned-off doesn’t make sense due to the lag time between these events. “It is not pertinent to carry out the conformity assessment of apparatus placed on the market for incorporation into a given fixed installation, and otherwise not commercially available, in isolation from the fixed installation into which it is to be incorporated. Such apparatus should therefore be exempted from the conformity assessment procedures normally applicable to apparatus. However, such apparatus should not be permitted to compromise the conformity of the fixed installation into which it is incorporated. Should apparatus be incorporated into more than one identical fixed installation, identifying the electromagnetic compatibility characteristics of these installations should be sufficient to ensure exemption from the conformity assessment procedure.” The above gives a carte blanche to “fixed installation” contractors and subcontractors as they might leave all necessary EMC measures to the end-integrator, the one who or who’s company is bringing the full “fixed installation” under his brand name onto the market. Only for those apparatus which also will be brought as OEM on the market, the general apparatus requirements apply.

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A c h a n g e i n I n t e r n at i o n a l EMC l e g i s l at i o n

“Fixed installations” 1. Apparatus which has been placed on the market and which may be incorporated into a fixed installation is subject to all relevant provisions for apparatus set out in this Directive. However, the provisions of Articles 5, 7, 8 and 9 shall not be compulsory in the case of apparatus which is intended for incorporation into a given fixed installation and is otherwise not commercially available. In such cases, the accompanying documentation shall identify the fixed installation and its electromagnetic compatibility characteristics and shall indicate the precautions to be taken for the incorporation of the apparatus into the fixed installation in order not to compromise the conformity of that installation. It shall furthermore include the information referred to in Article 9(1) and (2). 2. Where there are indications of non-compliance of the fixed installation, in particular, where there are complaints about disturbances being generated by the installation, the competent authorities of the Member State concerned may request evidence of compliance of the fixed installation, and, when appropriate, initiate an assessment. Where non-compliance is established, the competent authorities may impose appropriate measures to bring the fixed installation into compliance with the protection requirements set out in Annex I, point 1. 3. Member States shall set out the necessary provisions for identifying the person or persons responsible for the establishment of compliance of a fixed installation with the relevant essential requirements.” In the first part it is again assumed that a single apparatus and a “fixed installation” shall be threated the same whereas in the following clauses exclusions are given. Then sub-clause 2 indicates that only EMC measures or corrective actions will or need to be taken in case of complaints. However, these complaints will only be governmental addressed when these stem from citizen living in the neighborhood of that industrial premise. No governmental actions will be taken on what is called intra-system or on-premises EMC issues. These need to be solved on a case-tocase base between the end-user and the apparatus and installation suppliers. However, there are no formal EMC measurement methods available to prove “guilt” when RF emission is exceeded, other than IEC CISPR 16-2-5. Above all, IEC CISPR/B claims that: “There is particular no meaning in requiring any emission measurements within the given large system or installation. Such testing is regarded as assessing the intra-system EMC which is however NOT in the scope of standardization work in CISPR. Globally spoken, user installation testing is a rather untypical case of application and use of CISPR standards and technical reports and its practice strongly depends on national (or regional) regulation. Some states recognize user installations as substitute for the traditional type test business for equipment which cannot be tested, for certain reasons, at standardized CISPR test sites. However, even in these circumstances the national authority will determine which limits shall be used, even if it EUrope emc guide 2011

Coenen

follows the advice of existing CISPR standards or technical reports”. The latter would mean that the industry has to rely on what is called the EMC competence of the Notified Bodies and accredited test houses. Here too, any relation of correlation between the findings of these “accredited” test houses is lacking though they are tempting to unify their Way-of-Working under the “Group of Notified Bodies under the EMC Directive (ECANB)”. They have issued their technical guidance Note; TGN 27, February 2010, regarding on-site tests of large products. Here, opposite to what has been recently stated by ACEC and CISPR (June 2010), conductive measurements are evoked. No reference is made to IEC CISPR-2-5 but EN 550162-3 (= Standard 3/10 m RF emission test method). Differences in in-situ test result with deviations over +/– 20 dB and aside are noted at exorbitant costs of 50.000,= Euro /test sequence. When in search for an intra-system solution at the end-user premises still no issue but when it comes to who’s taken the costs to solve these intra-system compatibility issues in-situ a serious point of conflict by lacking proper reference. Annex 1: ESSENTIAL REQUIREMENTS REFERRED TO 1. Protection requirements Equipment shall be so designed and manufactured, having regard to the state of the art, as to ensure that: a. the electromagnetic disturbance generated does not exceed the level above which radio and telecommunications equipment or other equipment cannot operate as intended; b. it has a level of immunity to the electromagnetic disturbance to be expected in its intended use which allows it to operate without unacceptable degradation of its intended use. 2. Specific requirements for fixed installations

Nederland limit levels will support intra-system issues for in-situ fixed installations. Fortunately, the new guidance on the EMC Directive, dated February 2010 indicates that alternative measures may be used as testing techniques to demonstrate compliance when correlation can be proven with the existing regulations. Alas, neither ACEC nor CISPR/B sees need in alternative test methods which could have a broad acceptance and which could be published as technical report (TR) rather than an international standard (for the time being). There is a call for a better defined reference such that endusers, fixed installation suppliers and their contractors and sub-contractors know what is or will be required rather than the Eldorado which is presently created to solve every issue on an ad-hoc bases with an arbitrary result at the end. The global market has not only opened up for small apparatus and appliances but should also become uniform accessible for the “fixed installation” market. MART COENEN (BSc ’79) has over 30 years experience in EMC in various fields and has published many papers and publications. He has been actively involved in international EMC standardization since 1988 and was given the IEC 1906 award in 2006. He is the former project leader of the standards: IEC 61000-4-6 and IEC 610004-2 but moved his focus towards EMC in integrated circuits. He has been the convener of IEC TC47A/WG9 and member of WG2.

Installation and intended use of components A fixed installation shall be installed applying good engineering practices and respecting the information on the intended use of its components, with a view to meeting the protection requirements set out in Point 1. Those good engineering practices shall be documented and the documentation shall be held by the person(s) responsible at the disposal of the relevant national authorities for inspection purposes for as long as the fixed installation is in operation.” This last statement from the Annex of the EMC Directive comes back to the initial title; I’m sure that all my EMC colleagues have all the best in mind (when they are or have been involved with the apparatus or system design up to the level of installation). Many system concepts have been developed with most intra-system constraints in mind but without considering the additional apparatus and systems which might appear adjacent at the end-user’s premises. Good engineering practice is hard to defend in case of dispute when it goes up into court. Although some standardization groups lead industry astray, an objective internationally agreed measurement method with accompanying interferencetechnology.eu

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BELGIQUE 146

PRODUITS ET SERVICES

148

RESSOURCES

BELGIQUE | Produits et Services A

E AR Benelux B.V.

AH Systems

E E MC C OIME X , A polloweg 8 0 , 8 2 3 9 DA , Lelystad, Nederland; 31 3 2 0 2 95 395; Fax: 31 320 413 133; info@eemc.nl; www.AHSystems.com Produits et services: Antennes, Instrument de contrôle, Contrôles

Frankrijklaan 7, ITC Boskoop, NL-2391 PX, Hazerswoude-Dorp, Nederland; +31(0)172-423-000; Fax: +31-(0)172-423-009; Onno de Meyer, info @ arbenelux.com; www.arbenelux.com Produits et services: Amplificateurs, Antennes, Câbles et connexions, Espaces sous protection et clôtures, Hausse et éléments temporaires, Instrument de contrôle

EM TEST GmbH, Lünener Strasse 211, 59174 Kamen, Deutschland; +49 (0)2307 / 26070-0; Fax: +49 (0)2307 / 17050; info@emtest.de; www.emtest.be Produits et services: Hausse et éléments temporaires , Contrôles Instrumentation, Contrôles

ANPI

Parc scientifique Fleming, Rue Granbonpré 1, 1348 Louvain-la-Neuve, Belgie; +32 (0) 10 47 52 11; Fax: +32 (0) 10 47 52 70; www.anpi.be; info@anpi.be Produits et services: Contrôles

EM Test AG

Bekaert Fibre Technologies

President Kennedypark 18, B-8500 Kortrijk Belgique; +32 56 23 05 11; Fax: +32 56 22 85 57; www.bekaert.com Produits et services: Protection

24 0 0 AG A lphen aan den Rijn, Kalkovenweg 12, 24 01 LK Alphen aan den Rijn, Nederland; +31 17242 2455 ; Fax: +31 172421022; Bert V.D. Luytgaarden, luy tgaarden.b @ air-par ts.com ; w w w. air-parts.com Produits et services: Amplificateurs, Antennes, Filtres, Espaces sous protection et clôtures, Instrument de contrôle, Contrôles

L Laborelec

Rodestraat 125, B -1630 Linkebeek, Belgique, +31 43 36 75 203, Fax: +32 2 382 02 41, www.laborelec.com, info@laborelec.com Produits et services: Contrôles

EMC Partner

DECATEL S.A., Mr. Bernard Decamp, Rue de la Technologie 31, BE - 1082 BerchemSte-Agathe, Belgique; +32 2 469 00 90; +32 2 469 06 07; info@decatel.be; www.decatel.be Produits et services: Hausse et éléments temporaires , Instrument de contrôle

Nexio

EEMC Coimex, Apolloweg 80 8239 Da Lelystad; +31 320 295 395; Fax : +31 320 413 133; www.eemc.nl/eng; info@eemc.nl Produits et ser vices : Instrument de contrôle

S Fair-Rite Products Corp.

HF Technology, Atalanta 5, 1562 LC Krommenie, Holland; (0031) (0)75 - 628 37 17; (0031) (0)75 - 621 11 20; info@hftechnology.nl; www.fair-rite.com Produits et services: Ferrite, Filtres, Espaces sous protection et clôtures, Protection

Schlegel Electronic Materials

SEM Belgium bvba, Slijpesteenweg 28, 8432 Middelkerke (Leffi nge), Belgique; +32 59 560 270; Fax: +32 59 560 271; www. schlegelemi.com; schlegelbe@schlegel.eu.com Produits et services: Matériaux conducteurs, Protection

T Haefely Test AG

Depar t ment AG, L ehenmat ts t rasse 3 5 3 CH- 4 0 5 2 Basel, Schweiz; +41 61 373 45 84; Fax: +41 61 373 4912, EMC-sales @ haefely.com; www.haefely.com

Produits et services : Hausse et éléments temporaires , Instrument de contrôle

Tech-Etch, Inc.

HF Technology, Atalanta 5, 1562 LC Krommenie, Nederland; 31 75-628 37 17; Fax: 31 75-621 11 20; info@hftechnology.nl

Produits et services: Matériaux conducteurs, Protection

Teseq Ltd IFI - Instruments for Industry

Air-Parts B.V., Postbus 255,

146

INTERFERENCE TECHNOLOGY

Accelonix BV; +31 40 750 1650; sales@accelonix.nl; www.accelonix.

Produits et services: Amplificateurs, Antennes, Instrument de contrôle, Contrôles

EUROPE EMC GUIDE 2011

Une collaboration qui profite à tous. AR Benelux Tél: 31-172-423-000 Belgique Luxembourg Pays-Bas AR France Tél: 33-1-47-91-75-30 France AR United Kingdom Ltd. Tél: 441-908-282766 Irlande Royaume Uni Caltest Oy Tél: 358-9-530-6070 Estonie Finlande Lettonie Lituanie CE-BIT Elektronik AB Tél: 46-8-7357550 Suède Emitec AG Tél: 41-41-748-6010 Suisse EMV Gmbh Tél: 49-89-614-1710 Autriche Allemagne Erik Blichfeld Tél: 45-7552-2020 Danemark H TEST Tél: 420-235365207 République tchèque Hongrie Slovaquie Nortelco Electronics Tél: 47-22-57-6100 Norvège

L’un existe pour l’autre. C’est fondamentalement simple. Et puissamment fructueux. Chez AR Europe, nous fournissons des amplificateurs de puissance, des antennes, et des modules pour les essais de CEM, et les applications sans fil, médicales et industrielles. Depuis ces 40 dernières années nous avons appris d’importantes leçons en ce qui concerne la collaboration. Nos partenaires nous ont appris que lorsqu’on vise haut, il n’y a pas de limite. Nous avons appris que lorsqu’on est disposé à faire des compromis avec les autres, ils sont généralement disposés à vous rendre la pareille. Nous avons appris que la solidité d’une entreprise se mesure à celle de son maillon le plus faible. C’est pourquoi nous ne forgeons des alliances qu’avec les meilleurs dans le domaine. La collaboration nous enseigne que le partage des produits ne constitue qu’un élément du succès. Le succès, c’est aussi le partage des ressources. Se donner un coup de main. Et même parfois prêter l’oreille. C’est là la différence entre une collaboration qui dépérit, et celle qui se solidifie. Si cela correspond aussi à votre idée d’un rapport mutuellement avantageux, nous vous invitons à en envisager la possibilité avec AR.

En Belgique, contactez AR Benelux BV, info@arbenelux.com ou appelez le +31-(0)172-423-000 Tous droits réservés © 2010 AR. La bande orange sur les produits AR est enregistrée au US Patent & Trademark Office

ar europe Autres divisions ar : • modular rf • receiver systems National Technology Park, Ashling Building, Limerick, Ireland • 353-61-504300 • www.ar-europe.ie

ORKO Tél: 90-312-438-2213 Turquie Radiant-Elcom Tél: 7495-725-0404 Biélorussie Russie Ukraine Teseo S.p.A. Tél: 39-011-994-1911 Italie Urzadzenia Elektroniczne Import Tél: 022-313-17-35 Pologne Vector Technologies Ltd. Tél: 30-210-6858008 Albanie Bulgarie Croatie Chypre Grèce Macédoine Roumanie Serbie Slovénie Wavecontrol, S.L. Tél: 34-933-208-055 Portugal Espagne

BELGIQUE Ressources ASSOCIATIONS

BLUE GUIDE EMC – MORE@MERE

IEEE EMC SOCIETY CHAPTER BENELUX

Frank Leferink, Thales Nederland B.V., P.O. Box 42, 7550 GD, Hengelo, Nederland; +31 74-248-3132; Fax: +31 74-248-4037; leferink@ieee.org

Joseph Cardijnstraat 21, BE-9420 Erpe-Mere, Belgique; +32 53 60 16 51; Fax: +32 53 60 16 50; www.bjemc.com Notified Body number: 2023

LABORATORIA DE NAYER

J.P. De Nayerlaan 9, BE-2860 Sint-Katelijne-Waver, Belgique; +32 15 31 33 22; Fax: +32 15 32 12 12; www.labodenayer.be; dirk.vantroyen@denayer.wenk.be Notified Body number: 0651

NOTIFIED BODIES AIB-VINÇOTTE INTERNATIONAL S.A.

Business Class Kantorenpark Jan Olieslagerslan, 35, 1800 Vilvoorde, Belgique; +32/2.674.57.11; Fax: +32-2-674-59-59; brussels@vincotte.be; www.vincotte.be Notified Body number: 0026

ASBL ANPI VZW

Parc scientifique Fleming, Rue Granbonpré 1, BE-1348 LouvainLa-Neuve, Belgique; +32:10:47 52 11; Fax: +32:10:47 52 70; info@anpi.be; www.anpi.be Notified Body number: 1134

LABORATOIRE COMPATIBILITÉ ÉLECTROMAGNÉTIQUE UNIVERSITÉ DE LIÈGE

Université de Liège Institut Montefiore B28 Sart-Tilman, BE4000 LIEGE, Belgique, + 32 4 366 37 46, Fax: + 32 4 366 29 10, V.Beauvois@ulg.ac.be Notified Body number: 1945

LABORELEC CENTRAAL LABORATORIUM VOOR ELEKTRICITEIT (CIE) / LABORATOIRE CENTRAL D’ELECTRICITÉ (LCE) Rodestraat, 125 / Rue de Rhode, 125, BE-1630 Linkebeek, Belgique; + 32 2 382 02 11; Fax: + 32 2 382 06 49; info@laborelec.com; www.laborelec.com Notified Body number: 1943

LEMCKO

Graaf Karel De Goedelaan 5, BE-8500 Kortrijk, Belgique; + 32 56 24 12 35; Fax: + 32 56 24 12 34; lemcko@howest.be Notified Body number: 1944

SGS BELGIUM NV - DIVISION CEBEC

Avenue F. Van Kalkenlaan 9A/1, 1070 Bruxelles, Belgique; +32 2 556 00 20; Fax: +32 2 556 00 36; info@cebec.be; www.cebec.sgs.com Notified Body number: 0649

OTHER SERVICE PUBLIC FÉDÉRAL ECONOMIE, PME, CLASSES MOYENNES & ENERGIE / FEDERALE OVERHEIDSDIENST ECONOMIE, KMO, MIDDENSTAND & ENERGIE DIRECTION GÉNÉRALE DE L’ÉNERGIE

Blvd. du Roi Albert II, 16, B-1000 Bruxelles / Brussel; +32 2 277 65 79; Fax: +32 2 277 52 05; Guibert Crevecoeur, guibert.crevecoeur@economie.fgov.be

INSTITUT BELGE DES SERVICES POSTAUX ET DES TÉLÉCOMMUNICATIONS / BELGISCH INSTITUUT VOOR POSTDIENSTEN EN TELECOMMUNICATIE (BIPT) Sterrenkundelaan 14b 21, B-1210 Bruxelles / Brussel; +32 22 26 87 33; Fax: +32 22 23 11 28; Eric Colpaert, Eric. Colpaert@BIPT.be

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Měření EMC v časové oblasti: Nová metoda CISPR vhodná pro analýzu přechodných rušivých vyzařování v oblasti průmyslu a automobilní elektroniky WOLFGANG WINTER, MARKUS HERBRIG, ZUZANA WOOD, EMV GMBH

ČESKÁ REPUBLIKA / SLOVENSKO Zdroje ASSOCIATIONS CZECHOSLOVAKIA IEEE SESSION MTT/AP/ED/EMC Joint Chapter (Česká Republika & Slovensko) RADIOENGINEERING SOCIETY (Česká Republika & Slovensko), www.radioeng.cz/

NOTIFIED BODIES EVPU A.S. Trencianska 19, 018 51 NOVA DUBNICA, Slovensko; +421:42:4403600; Fax: +421:42:4403502; sktc101@evpu.sk; www.evpu.sk Notified Body number: 1293 Directives: 99/5/EC Radio and telecommunications terminal equipment 2006/95/EC (ex-73/23/EEC) Low voltage directive 2004/108/EC Electromagnetic compatibility INSTITUT PRO TESTOVÁNI A CERTIFIKACI, A. S. T. Bati 299, 764 21 ZLIN – LOUKY, Česká Republika, +420-577 104 776; Fax: +420-577 104 855; pvanek@itczlin.cz; www.itczlin.cz Notified Body number: 1023 Directives: 88/378/EEC Safety of toys 89/106/EEC Construction products 89/686/EEC Personal protective equipment 90/385/EEC Active implantable medical devices 93/42/EEC Medical devices 98/79/EC In vitro diagnostic medical devices 2006/95/EC (ex-73/23/EEC) Low voltage directive 2004/108/EC Electromagnetic compatibility LEKTROTECHNICKÝ ZKUŠEBNÍ ÚSTAV, S.P. Pod Lisem 129, 171 02 PRAHA 71 – Troja, Česká Republika; +420:266104111; Fax: +420:284680037; info@ezu.cz; www.ezu.cz Notified Body number: 1014 Directives: 89/106/EEC Construction products 90/385/EEC Active implantable medi-

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cal devices 93/42/EEC Medical devices 95/16/EC Lifts 2000/14/EC Noise emission in the environment by equipment for use outdoors 2006/95/EC (ex-73/23/EEC) Low voltage directive 2004/108/EC Electromagnetic compatibility STATNI ZKUSEBNA ZEMEDELSK YCH POTRAVINARSK YCH A LESNICKYCH STROJU, AKCIOVA Tranovskeho 622/11, 163 04 PRAHA 6, Česká Republika, +420 235018111; Fax: +420 235315226; szzpls@szzpls.cz; www.szzpls.cz Notiﬁed Body number: 1016 Directives: 2000/14/EC Noise emission in the environment by equipment for use outdoors 2006/95/EC (ex-73/23/EEC) Low voltage directive 2004/108/EC Electromagnetic compatibility STROJIRENSKY ZKUSEBNI USTAV S.P. Hudcova 56b, 621 00 BRNO, Česká Republika; +420::541120111; Fax: +420::541211225; szu@szutest.cz; www.szutest.cz Notiﬁed Body number: 1015 Directives: 2009/105/EC (ex-87/404/ EEC) Simple pressure vessels 88/378/EEC Safety of toys 89/106/EEC Construction products 89/686/EEC Personal protective equipment 2009/142/EC (ex-90/396/EEC) Appliances burning gaseous fuels 92/42/EEC Hot-water boilers 93/42/EEC Medical devices 95/16/EC Lifts 99/36/EC Transportable pressure equipment 2000/14/EC Noise emission in the environment by equipment for use outdoors 2000/9/EC Cableway installations designed to carry persons 2006/95/EC (ex-73/23/EEC) Low voltage directive 2004/108/EC Electromagnetic compatibility

TECHNICKY SKUSOBNY USTAV PIESTANY S.P. Krajinska cesta 2929/9, 921 24 Piestany, Slovensko; +421:33:7957233; Fax: +421:33:7623503; tsu@tsu.sk; www.tsu.sk Notified Body number : 1299 Directives: 2009/105/EC (ex-87/404/ EEC) Simple pressure vessels 88/378/EEC Safety of toys 89/106/EEC Construction products 2009/142/EC (ex-90/396/EEC) Appliances burning gaseous fuels 92/42/EEC Hot-water boilers 2000/14/EC Noise emission in the environment by equipment for use outdoors 2006/95/EC (ex-73/23/EEC) Low voltage directive 2004/108/EC Electromagnetic compatibility TÜV SÜD CZECH S. R. O. Novodvorska 994, 142 21 PRAHA 4, Česká Republika; +420:239046800; Fax: +420:239046805; info@tuv-sud.cz; www.tuv-sud.cz Notified Body number: 1017 Directives: 2009/105/EC (ex-87/404/ EEC) Simple pressure vessels 89/106/EEC Construction products 99/36/EC Transportable pressure equipment 2000/14/EC Noise emission in the environment by equipment for use outdoors 2000/9/EC Cableway installations designed to carry persons 2006/95/EC (ex-73/23/EEC) Low voltage directive 2004/108/EC Electromagnetic compatibility TÜV SÜD SLOVENSKO S.R.O. Jasikova, 6 PO BOX 89, 821 03 BRATISLAVA, Slovensko; +421:2:48291286; Fax: +421:2:48291266; www.tuvslovakia.sk; tuvslovakia@tuvslovakia.sk Notified Body number: 1353 Directives: 2009/105/EC (ex-87/404/ EEC) Simple pressure vessels 99/36/EC Transportable pressure equipment 2000/9/EC Cableway installations designed to carry persons 2006/95/EC Low voltage directive 2004/108/EC Electromagnetic compatibility

EUROPE EMC GUIDE 2011

VOP-026 STERNBERK, S.P. Olomoucka 175, 785 01 STERNBERK, Česká Republika; +420 5850 83 111; Fax: +420 5850 83 115; vop026@vop.cz; www.vop.cz Notiﬁed Body number: 1380 Directives: 89/686/EEC Personal protective equipment 2006/95/EC (ex-73/23/EEC) Low voltage directive 2004/108/EC Electromagnetic compatibility VYSKUMNY USTAV SPOJOV N.O. Z v o l e n s k á C e s t a , 2 0 , 9 74 0 5 , BANSK A BYSTRICA, Slovensko; +421:48:4324133; Fax: +421:48:4161163; vus@vus.sk; www.vus.sk Notiﬁed Body number: 1355 Directives: 99/5/EC Radio and telecommunications terminal equipment

OTHER CZECH ACCREDITATION INSTITUTE +420 221 004 501; Fax: +420 221 004 408; mail@cai.cz; www.cai.cz CZECH OFFICE FOR STANDARDS, METROLOGY AND TESTING Gorazdova 24, P.O Box 02, CZ-225 02 Praha 025; +420 224 907 144; Ladislav Budik, budik@unmz.cz CZECH TELECOMMUNICATIONS OFFICE Sokolovská 219, P.O. Box 02, CZ -225 02 Praha 025; + 420 2 24 00 45 71; Fax: + 420 2 24 00 48 22; Jan Sedlacek, sedlacekj@ctu.cz CZECH URSI NATIONAL COMMITTEE www.ufa.cas.cz/html/ursi/ SLOVAK NATIONAL ACCREDITATION SERVICE (SNAS) P.O. Box 74, Karloveská 63, 840 00 Bratislava 4, Slovak republic; snas@ snas.gov.sk; www.snas.sk/e/ SLOVAK OFFICE OF STANDARDS, METROLOGY AND TESTING Štefanovičova 3, P. O. Box 76, 810 05 Bratislava 15; +421 2 5249 6847; Richard Cukovic, cukovic@normoff.gov.sk; www.unms.sk SLOVAK STANDARDS INSTITUTE Slovenský ústav technickej normalizácie, Karloveská 63, P.O.Box 246, 840 00 Bratislava; 02/602 94 452, 02/602 94 315; info@sutn.gov.sk www.sutn.sk

interferencetechnology.eu

Výrobky a služby 1-9 7 layers

Borsigstrasse 11, Ratingen 4 0880, Germany; +49 2102 749 0 ; Fax: +49 2102 749 350 ; www.7layers. com; info @7Layers.com; Brigitte Lewis, brigitte. lewis@7layers.com Výrobky a služby: Antény, Testovací nástroje, Testování

emv - Elektronische Meßgeräte Vertriebs GmbH

Wallbergstr. 7, Taufkirchen, 82024, Taufkirchen; +49 (0) 89 614171-0; Fax: +49 (0) 89 614171-71; www.emvgmbh.de; Ariane Wahrmann, info@ emvgmbh.de Výrobky a služby: Testovací nástroje, Zesilovace, Antény

Haefely Test AG AR / RF Microwave Instrumentation

H TEST a.s, Šafránkova 3, 15500 Praha 5 Česká Republika; +420 235365207; Fax: +420 23536893; David Koshuba, info@htest.cz; www.htest.cz; www.ar-worldwide.com Výrobky a služby: Zesilovače, Antény, Kabely a konektory, Odstíněné komory a pracoviště, Přepětí a přechodné jevy, Testovací nástroje

Petr Kratochvil, Nad lesnim divadlem 1114, 14 200 Praha 4 - Branik, Česká Republika; +420 2 414 93981; Fax: +420 2 414 71407; Petr Kratochvil, petrkrat@netforce.cz; www.haefely.com Výrobky a služby: Přepětí a přechodné jevy, Testovací nástroje

R RFspin s.r.o.

Jugoslávských partyzánů 1580/3, 160 00, Praha 6, Česká Republika, +420 224 353 124 – 125, Fax: +420 224 353 103, www.rfspin.cz, info@rfspin.cz Výrobky a služby: Antény

S EM Test AG

Testovaci Technika s.r.o., Hakenova 1423, 290 01 Podebrady, Česká Republika; +42 (0)325 610 123; Fax: +42 (0)325 610 134; teste@teste.cz; www.teste.cz Výrobky a služby: Přepětí a přechodné jevy, Testovací nástroje, Testování

Schlegel Electronic Materials

Dracon-Eltron, Herastraat 51, 5047 TX Tilburg; +31 13 5780800 Nederland; Fax: +31 13 5711369; Paul Jansen, paul.jansen@dracon.nl; www.dracon.nl Výrobky a služby: Vodivé materiály, Stínění

EMC Partner

TECTR A A .S., Herr Ing. Zbynek Sommer, Domkovska 2343/43 CZ - 193 00 Praha Česká Republika; +420 281 921 650; Fax: +420 281 921 649; tectra@tectra.cz; www.tectra.cz Výrobky a služby: Přepětí a přechodné jevy, Testovací nástroje

ŘEKNĚTE NÁM, CO SI MYSLÍTE Je pro nás velice důležité vědět, co si myslíte. Jděte prosím na www. interferencetechnology.eu a vyplňte krátký dotazník, který nám napomůže vylepšit Evropského průvodce EMC.

Teseq Ltd

Empos Spol s.r.o.; +420 2 4174 2084; info@empos. cz; www.empos.cz Výrobky a služby: Zesilovače, Antény, Testovací nástroje, Testování

VÍCE INFORMACÍ NALEZNETE ONLINE Aktualizované seznamy výrobků a služeb a překlady technických článků do angličtiny naleznete na www. interferencetechnology.eu.

INTERFERENCE TECHNOLOGY

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EMC Directive Update

emv GmbH Taufkirchen, Deutschland

Czech Republic n Czech Republic, EMC is treated in the following documents: 1) Act No. 22/1997 Coll., on technical requirements for products and amending some laws, in accordance with Act No. 205/2002 Coll. 2) Government Regulation No. 616/2006 Coll of 20 December 2006 on technical requirements for products in terms of their electromagnetic compatibility. A detailed assessment procedure is outlined in Annexes 2 and 3 of Government Decree No. 616/2006 Coll.

Slovakia In Slovakia since 1999, there has been a significant change in the assessment of performance of new products on the market. On 7 September 1999 an extremely important Act No. 264/99 Coll. z. (in acc. with Act No. 436/01 a 254/03) on technical requirements for products and conformity assessment and amending certain laws was adopted. Upon enforcement of this Act, all technical standards became non-mandatory. Status of standards aimed to electromagnetic compatibility (EMC) is slightly different. It is given by the government regulation No. 394/99 of 16 December 1999 (in acc. with No. 159/02 and 245/04 respectively the latest 194/05 of 27 April 2005) laying down the details of technical requirements for products in terms of electromagnetic compatibility. This regulation was issued as one of 152

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the implementing regulations of Law No. 264/99 Z. Coll. Government regulation No. 194/05 corresponds to the EU directive on EMC of 2004. StandaRdS In Czech Republic, the Czech Metrologic Institute CMI in Prague is responsible for coordination of works on all standards. The technical standard committee TNK 47 “Electromagnetic Compatibility” revises the Czech EMC standards (ČSN) and harmonizes these with the international standards IEC, CISPR and EN. Example of conversion between international and Czech standards: • CENELEC  EN 50 000  ČSN EN 50000 • CISPR  EN 55000  ČSN EN 55000, or ČSN CISPR XX • IEC  EN 60000  ČSN EN 60000, or ČSN IEC YYY • IEC 1000  EN 61000  ČSN EN 61000, or ČSN IEC 1000X-Y The EMC standards are split into three groups: EMC Standards, Immunity Standards and Emission Standards. More detailed information structure and classification can be obtained at Czech standard authorities. europe emc guiDe 2011

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German translation available at www.interferencetechnology.eu

EMV-Messungen im Zeitbereich: Neue CISPR-konforme Messverfahren zur Analyse transienter Störaussendungen im Bereich Industrieund Kraftfahrzeugelektronik

etoda měření v časové oblasti se používá k zachycení náhodných a časově omezených vf-rušení. V oblasti automobilní elektroniky se stávají tato rušení stále kritičtějšími. Komfortní vybavení automobilu, jako např. bluetooth připojení k externímu zařízení s komplexní vysokofrekvenční funkcionalitou (Automotive-WLAN, UMTS, GSM, WCDMA, MIMO, Multiband Smart Phones, Netbooks) musí komunikovat se systémem integrovaným v automobilu, aniž by bylo rušeno. Na základě technických koncepcí těchto bezdrátových komunikačních sítí, jsou používány procesy s rychlou změnou frekvence za účelem potlačení rušení a časově omezených náhodných vfsignálů. Tyto však mohou být rušeny překrývajícími se signály i přes komplexní ko rekci chyb. Tato rušení mo-

hou být širokopásmová a úzkopásmová, mohou ale také mít časově omezené a transientní vlastnosti. Cílem nových digitá lních radiokomunikačních přenosných systémů je, vedle lepšho využití frekvenčního spektra, také snížení zatížení životního prostředí vf-zářením. Z tohoto důvodu je vyzařovaný vf-výkon digitálních služeb zpravidla nižší než dříve používaných analogo vých systémů (např. DVB-T a analogové televize). Zachycení těchto signálů, anebo rušičů, a reprodukovatelné měření se správným nastavením (např. Dwell Time) je náročné a v yžaduje nové měřicí technologie. Nejnovější metodou je měření se systémy v časové oblasti a v ýpočet kmitočtového spektra pomocí Fourierovy transformace. V dnešní době jsou dostupné velmi rychlé analogově-digitální měniče s více než 109 vzorky za sekundu, a s velmi výkonnými a vysoce integrovanými FPGAs (Field Programmable Gate Arrays), které umožňují nepřetržité sledování analogového vstupního signálu a současnou kalkulaci až 4000

Obr. 1. Blokový diagram měřicího přijímače EMC

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frek-venčních bodů s požadovanými CISPR 16-1-1 detektory a šířkami pásem. Tradiční vysokofrekvenční měřicí přijí-mače zachycují transienty a časově omezené vf-rušiče jen náhodně, když se tyto právě nachází v pozorovaném kmitočtovém rozmezí, které směšovač přetransformuje na mezifrekvenční kmitočet. Aby mohl být tento rušič spoleh-livě zachycen, musí být známa šířka pásma a jeho kmitočet a pak tento změřen po velmi dlouhou dobu na jednotlivých kmitočtových bodech. I. ÚVOD Měření signálu v časové oblasti napomáhá porozumět příčině a působení komplexních elektromagnetických rušení moder-ních elektronických systémů. Mezinárodní normalizace, podle které se zajišťuje bez-poruchový provoz všech elektronických systémů, má na zák-ladě rychlého vývoje komerčně používaných vysokofrek-venčních aplikaci složitou úlohu. Např. se očekává, že zave-dením nejnovějšího standardu mobilního vysílání LTE vzni-kne nezanedbatelný rušivý příspěvek. Tato rušení by mohla ovlivnit televizní kabelovou síť, DVB-T-příjem, rádiové při-jímače a mobilní USB-přijímací jednotky. Rádiové přijímače nejsou připraveny na LTEsignály v pásmu 790 – 862 MHz, které se nachází nad frekvencí radiových vysílačů. Zde nor-motvorné orgány ještě nemají dostatečné množství namě-řených výsledků, aby se mohla případně omezit připustná úroveň LTE vysílačů, anebo zvýšit odolnost přípustná proti rušení v tomto kmitočtovém pásmu. Výpočet kmitočtového spectra prostřednictvím dat v časové oblasti za použití matematického postupu (Fourierovy tras-formace) uveřejnil J. Cooley a J.W.Tukey v roce 1965 na zák-ladě prací C.F. Gausse z roku 1805. Optima lizace algoritmů s potlačením možných chyb a nepřesnosti byla vypracována v 70. letech, jelikož byly v této době vyvinuty první výkonné analogově-digitální převodníky. K prvním oblastem použití těchto FFT-analyzátorů (Fast Fourier Transformation) došlo v nízkofrekvenční oblasti, např. u analýzy chvění mechanických systémů (např. u automobilů, letadel), audio-aplikací a iterpretaci městských meteorologických dat v oblasti ochrany životního prostředí. Zde se pracovalo s hraničními kmitočty v oblasti kHz a použití pro vysokokmitočtové aplikace se zdály ve vzdálené budoucnosti. Dynamický proces v ý voje analogově-digitálních převodníků umožňuje v současné době nasazení v GHz oblasti, např. u rychlých paměťových osciloskopů. Oscioloskop se však nemohl prosadit jako EMC měřicí systém, jelikož měření dle norem vyžaduje použití dalších hardwarových a soft-warových komponentů. Při vyhodnocení dat časové oblasti bez analýzy v ní obsažených kmitočtových podílů je těžké rozlišit užitečné signály od rušivých. Vyhodnocení vf rušivých emisí dále vyžaduje plynulé pozorování testovaného objektu alespoň na jednom kmitočtu. Toto nelze běžnými paměťovými oscilos kopy realizovat, jelikož jsou data nejprve uložena do paměti a teprve poté pomocí FFT transformována do kmitočtové oblasti. Zde se ztratí pozorování rušivého signálu v časové oblasti. EMC normy předepisují speciální hardware, jako např. automatické vf-útlumové články s dolní propustí, předselekce pásma A, B, C a vyhodnocovací filtry (např. interferencetechnology.eu

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Peak, Average, RMS, Quasi Peak, CISPR AVG, CISPR RMS), které všechny musí odpovídat příslušným normám. K dalším požadavkům patří normované mezifrekvenční filtry a mezifrekvenční pásma (např. 200 Hz, 9 kHz, 120 kHz, 1 MHz). Poté musí být STFFT (Short Term Fast Fourier Transformation) algoritmus a hardware implementovány tak, aby bylo zaručeno kontinuální pozorovaní vysokofrekvenčního signálu [7]. Požadavek na použítí Fourierovy transformace v oblasti EMC, byl odůvodněn přibývajícími přechodnými rušiči v prostředí automobilové elektroniky. První systémy byly založeny na bázi paměťových osciloskopů a byly navrženy jako single-shot systémy, aby mohly vyšetřovat časově omezené poruchy přesněji. Experimentální studie pak musely být doplněny o další hardwarové komponenty, aby bylo dosaženo jednoznačného znázornění v kmitočtovém rozsahu. Jelikož při vf měření není ma ximální frekvence většinou známa, vyžaduje vstup A/D stupně nízkofrekvenční propust (anti-aliasing filtr). Ten omezí maximalní frekvenci, která může být digitalizována tak, aby v časové oblasti byly sejmuty nejméně dva vzorky na periodu sinusového signálu. To zajišťuje rekonstrukci signálu (Nyquistův teorém). Zobrazení v kmitočtovém rozsahu je pak až do mezní frekvence jednoznačné. Běžný paměťový osciloskop je s jeho limitovanou hloubkou paměti pouze omezeně použitelný v oblasti měření EMC. Kromě toho je definice vzorkování problematická, protože rušiče mohou být překryty úzkopásmovými, širokopásmovými nebo jinými rušivými či užitečnými signály. Mikroprocesorem řízené bus-systémy v automobilovém průmyslu, jako je CAN, LIN, FlexRay a externí řídicí zařízení (motor, ABS, ESP, atd.) způsobují interfererence vyzařováním i po vedeních. Reprodukovatelné snímání potenciálních rušičů je zde pomocí konvenčních metod měření jen velmi obtížné. Širokopásmové měření vf emisí v kmitočtovém rozsahu vyžaduje speciální hardware a software. Aby bylo možné digitalizovaná data v GHz rozsahu s co největší šířkou pásma transformovat do kmitočtového rozsahu, jsou použity speciální programovatelná pole FPGAs (Field Programmable Gate Arrays), která provádí rychlou Fourierovu transformaci STFFT (Short Term Fourier Transform) v reálném čase. Kromě výpočtu kmitočtového spektra, jsou u EMC aplikací zapotřebí další funkce přístroje. Měřicí přístroje musí splnit normami předepsané charakteristiky filtrů, předdefinované IF šířky pásem, a detektory musi být k dispozici. Technik potřebuje navíc znát korelaci mezi oběmi metodami měření. To znamená, že naměřená frekvenční spektra, která jsou zaznamenána systémy měření v časové oblasti, musí být srovnatelná se spektry, které byly zaznamenány s konvenčními měřicími vf přijímači. Odchylky naměřených hodnot by neměly být větší než odchylky dvou přístrojů stejné technologie. To je nutné z důvodu právních aspektů připouštěcích měření, jako je CE certifikace a z ní odvozená odpovědnost výrobce výrobku. Poslední gene race systémů měření EMC v časové oblasti je obsluhovatelná jako konvenční měřicí vf přijímač, a také v prezentaci naměřených výsledků v přijímacím módu (start/stop frekvence, Limit Lines, IF pásma, doba prodlevy, atd.) se interference technology

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Obr. 2. Systém pro měření emisí v časové oblasti / Time Domain EMI Measurement. System (TDEMI) [5]

znázornění v dBmV, CISPR 16-1-1 kompatibilní vlastnosti vf přijímače, v f předzesilovač, předselekce a automatické EMC-kompatibilní vf atenuátory na vstupním modulu přístroje. Funkčnost všech těchto úloh a technických rámcových pod-mínek je realizována v nové ge neraci systemů měření EMC v časové oblasti (TDEMI). II. SYSTÉMY PRO MĚŘENÍ V čASOVÉ OBLASTI

Obr. 3. Srovnávací měření TDEMI/VF-měřicí přijímač

Obr. 4. VF emise zapnutého kuchyňského mixeru na bezdrátové frekvenci. (2,4 GHz) s odstupem 1 m od monopólové anteny

neodlišují od měřicích vf přijímačů. Ty pické vol itel né pa ra met r y těchto přístrojů jsou frek vence startu a zastavení skenování, dále normou CISPR [1, 2] stanovené 156

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rozlišení šířky pásma nebo IF pásma, doba setrvání, normu splňující detektory (peak, average, RMS, quasi peak , CISPR AVR), anténní faktory, hraniční hodnotové křivky,

A. VF přijímače pro měření EMC Konvenční měřicí VF přijímač je v dnešní době konfigurován jako heterodynov ý detektor (superhe terodynní přijímač). Tento přijímač zachycuje užitečný signál v daném kmitoč-tovém pásmu. Princip zapojení na trhu dostupných EMC měřicích přijímačů je zobrazen jako blokové schéma na obr. 1. 50 -ohmov ý vstupní v f signál z přijímací antény, nebo LISN je automat ick ý m atenuátorem na staven tak, aby další vstupní bloky byly chráněny před poškozením a přístoj byl ideálně laděn s cílem optimálně využít dostupnou dynamiku. Následující předvolba potlačí signály, které se nachází mimo pozorované frekvenční pásmo. Toto zlepšuje dynamický rozsah, pokud se v sousedství měřeného velmi nízkého užitečného signálu nachází vf signál s vysokou hladinou. VF signál je po předvolbě dále veden k vlastnímu směšovacímu stupni. Vstupní signál je poté smísen se signálem ladicího oscilátoru. Přitom se vytvoří celá řada nových frekvencí, z nichž některé jsou pro další zpracování nežádoucí. Poté následující mf fi ltr propustí dál jen úzký frekvenční rozsah střední frekvence filtru, a ostatní frekvence jsou maximálně u tlumeny. mf fi ltry jsou v jejich rozsahu a charakteru přesně defi novány normou CISPR 16-1-1. Následná demodulace fi ltrovaného IF signálu se děje pomocí normou určenými detektory. Měřicí přijímač u možňuje prost řed n ic t v í m předvolby a předzesílením mnohem vyšší dynamiku a vstupní citlivost než u běžných spektrálních analyzátorů. eUroPe eMc gUiDe 2011

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Předselekce a automatický tlumič jsou zde důležitou součástí koncepce, aby se dal přijímač použít v oblasti EMC, a aby se vyloučila saturace přístroje. Volitelné šířky EMC pásem, nastavitelná doba prodlevy a detektory, které musí být v souladu s normou CISPR 16-1-1, to jsou typické parametry, které musí splnit systém měření EMC. Ty p i c k ý m i n e v ý h o d a m i v f přijímačů jsou následující vlastnosti: • Dlouhé doby měření u úzkopásmových mf fi ltrů (200 Hz, 9 KHz) a Quasi Peak detektoru • Sekvenční zachycení frekvenčního spektra • Není možnost měření v íce frekvenčních bodů sou-časně • Není informace o fázi pro inverzní transformaci do časové oblasti • Problem at ické měřen í t r a nsientních signá lů a signá lů s frekvenčním posuvem B. Systémy pro měření EMC v časové oblasti (TDEMI) Základní provedení systémů měření EMC v časové oblasti je zobrazeno na obr. 2 VF signál je veden přes ate nuátor dá le k dolní propusti. Tato zajišťuje, že až do definované hraniční frekvence měřicího systému jsou digitalizovány všechny frekvenční složky bez zjevných frekvenčních komponentů (Nyquistův zákon). Toto zaručuje jednoznačnou zpětnou vazbu digitalizovaného vstupního signálu do původního analogového signálu. Omezení horní vstupní frekvence je vždy nutné, jelikož data v časové oblasti mohou obsahovat libovolné frekvenční složky. Použití dolní propusti pro vstupní vf signál je v podstatě základem každého digitálního měřicího systému. Automatický attenuator vyhodnotí úroveň vstupních VF signálů, které mohou obsahovat periodické, CW a pulzní komponenty. Poté se oslabí stupní vf signál tak, aby byl analogovědigitální převodníkový stupeň ideálně vyladěn. Normou CISPR 16-1-1 předepsaný rozsah (spurious free dy-namic range s minimálně 36 dB pro přechodné signály a 40 dB pro pevné signály) může být dodržen s dnes dostupnými A/D převodníky s rozlišením 10 bitů a s hraniční frekvencí ca. 2,3 GHz [3]. interferencetechnology.eu

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Obr. 5. Porovnání výsledků měření (41 MHz - 770 MHz) bez rušičů. Nahoře: Systém měření EMC v časové oblasti. Dole: vf-měřicí přijímač.

Obr. 6. Porovnání výsledků měření FM pásma (76 – 108 MHz), zapalování, současné uvedení do činnosti el. zadních dveří vozu (zavírání), Nahoře: Systém měření EMC v časové oblasti. Dole: vf-měřicí přijímač.

U digitálních systémů se zvláště musí dát pozor na případné artefakty ve frekvenčním spektru. Možné artefakty vstupního vf signálu vznikající během digitalizace a jsou závislé na počtu odběrů vzorků z ADC. Pokud dojde k intermodulaci mezi vnitřním taktem ADC a vstupním signálem, mohou se objevit nežádoucí prvky zdánlivé frekvence,. Těmto případným zdrojům chyb lze předejít zavedením techniky multiodběru

vzorků (multisampling technique). Zároveň se během každého měření mění v zorkovací r ych lost A DC, přičemž nežádoucí složky mění pak jejich polohu v kmitočtovém rozsahu a mohou tak být přesně zjištěny. Aby by lo mož né p osk y t nout srovnatelný dynamický rozsah bez intermodulací, tak jak jsou uživatelé VF měřicích při-jímačů zvyklí, jsou u nejmodernějších systémů pro měření v časové oblasti (např. TDEMI) použity interference technology

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mable Gate Arrays) a STFFT (Short Term Fast Fourier Transform) transformován do frekvenční oblasti. CISPR detektory jsou implementovány na paralelním FPGA, a umožňují v reálném čase výpočet 4000 frekvenčních bodů [4]. Implementace této techniky byla provedena Braunem a Russerem [5], spolu s příspěvky od Aidama [3]. První pokus, ve kterém byl použít paměťový osciloskop s následnou FFT pro měření EMC, provedl Keller a Feser [7]. CISPR normou předepsané kontinuální sledování VF signálu a potřebu poskytnout mf výstupní signál požadoval specifickou kon-strukci EMC systému měření v časové oblasti. Aby bylo možné získat ana logový mf signál z digitálních hodnot, je po-třeba použít výpočetní jednotka, Tabulka 1. CAS MĚŘENÍ CISPR 25, VF MĚŘICÍ PŘIJÍMAČ která dokáže zpracovat vstupní vf signály v reálném čase. Výhodou je (kromě analogového mf výstupu) sběr vf dat s nastavenou dobou setrvání v reálném čase, a to bez jakéhokoli zatemňovacího intervalu. Bylo prokázáno, že VF spektra naměřena s kon-venčním meřicím přijímačem, korelují velmi dobře se spektry naměřenými systémy v časové oblasti (TDEMI). Odchylka amplitudy se u provedených vyhodnocovacích zkoušek pohybuje na cca 1 dB (špičkový detektor), 0,4 dB (kvazišpičkový detektor) a 0,2 dB (detektor střední hodnoty). Odchylka je srovnatelná s odchylkou, kterou bychom obdrželi také mezi přístroji stejné výrobní série. U TDEMI systémů se používá stejné kalibrační metody jako u konvenčního měřicího vf přijímače (Schwarzbeck pulsní generátor IGUU2916, atd.). Zpětná vazba kalibrace Schwarzbeckova pulsního generátoru je prováděna u Tabulka 2. ČAS MĚŘENÍ CISPR 25 , SYSTÉM MĚŘENÍ EMC V Physikalische Technische Bundesanstalt (PTB) rychlým ČASOVÉ OBLASTI (TDEMI) paměťovým osciloskopem, který používá FFT k určení frek-venčního spektra.

Tabulka. SNÍŽEJNÍ DOBY MĚŘENÍ ZKOUŠEK DLE CISPR 25 SYSTÉM MĚŘENÍ V ČASOVÉ OBLASTI TDEMI VE SROVNÁNÍ S KONVENČNÍM VF MĚŘICÍM PŘIJÍMAČEM

paralelní ADC stupně. Zejména impulzní signály vyžadují ca. 20 bitové A/D převodníkové rozlišení, aby bylo dosaženo parametrů v souladu s CISPR16-1-1. Analogový vstupní VF signál je po průchodu low-pass fi ltrem prostřednictvím logaritmických výkonových děličů rozdělen na vícero A/D převodníků. Vyladění jednotlivých stupňů A/D převodníku následuje pak v závislosti na úrovni vstupního signálu. Poté, co vstupní signál prošel vstupní fází a A/Dpřevodníkem, je signál pomocí FPGA (Field Program158

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III. STRATEGIE EMC MĚŘENÍ Motivací pro další vývoj TDEMI systémů je požadavek lépe pochopit rušivé emise komplexních elektronických systémů a schopnost tyto rychleji analyzovat. Velmi důležitou výhodou této technologie je drasticky zkrácená doba celkového měření, a tudíž je předměření (takzvaný pre-scan) rušivých maxim zcela zbytečný. Kromě toho je jedno jediné měření dostačující k získání přehledu o všech přechodových rušičích ve frekvenční oblasti s ohledem na opakovací frekvenci a z ní odvozenou normou předepsanou dobu setrvání. Vzhledem k tomu, že toto vždy podstatně zvyšuje dobu měření, často se nenastavují ty časy prodlevy, které by aplikace vyžadovala. Uživatel se orientuje nejmenší povolenou dobou prodlevy na jednotlivých kmitočtech, neboť při malých frekvenčních krokách by měření trvalo i několik hodin. Velmi krátké doby měření TDEMI systémů umožňují ušetřením času uživateli téměř libovolný počet opakování měření. I tak je celková doba měření stále ještě nižší než u konvenčních měřicích přijímačů. Z ekonomického aspektu zvyšuje technologie měření v časové oblasti v souladu s CISPR 16-1-1 normou hospodárnost používání testovacího EMC zařízení, plně bezodrazové komory FAR (Fully Anech-oic Room) nebo automotive tlumící stíněné místnosti ALSE (Automotive Absorber Lined Shielded Rooms). Časově omezené a přechodné vf emise, způsobené například servo a regulačními motory u automobilových eUroPe eMc gUiDe 2011

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aplikací (kli-matizace, seřízení sedadla, elektricky o vládané zadní dveře, el. zrcátka, ABS, ESP), lze tak nyní přesně měřit a analyzovat. Obr. 4: VF emise zapnutého kuchyňského mixeru na bezdrátové frekvenci (2,4 GHz) s odstupem 1 m od monopólové anteny. TDEMI systémy jsou schopny také v spektrogramovém režimu s pásmy v reálném čase zaznamenávat po několik minut frekvenční data a tak vytvořit přímý časový vztah k vf rušení. K tomu je použito trojrozměrného zobrazení času/ frekvence/amplitudy (viz obr. 4). IV. MĚŘENÍ EMC A ÚSPORA čASU: MĚŘICÍ PŘIJÍMAč VE SROVNÁNÍ SE SYSTÉMEM MĚŘENÍ EMC V čASOVÉ OBLASTI (TDEMI) A. Typické doby měření: měřicí přijímač / EMC systém měření v časové oblasti Obr. 7. Spektrogram, CISPR 16-1-1 Peak-Detektor, IF šířka pásma a Typický čas měření potřebný při stejném nastavení 50 ms setrvání, FM pásmo (76 – 108 MHz), zapalování, automatické přístrojů pro standardní měření (CISPR 25) ukazuje zavírání zadních dveří., Nahoře: Frekvenční spektrum posledního na významné rozdíly mezi oběma koncepcemi. scanu. Dole: Průběh: čas/frekvence/signál amplituda Obě technologie byly měřeny pouze v módu kompatibilním s CISPR, přičemž nebylo použito funkce předměření (pre-scan) konvencionálního přijímače, protože tato vyžaduje předměření a přitom ke ztrátě informace. Různá měření ukazují, v závislosti na nastavení doby prodlení, šířky mf pásma, velikosti kroku a detektoru, časovou výhodu TDEMI systému danou faktorem 500x i větším. Srovnání bylo provedeno s jedním komerčně dostupným mě-řicím vf přijímačem a jedním systémem pro měření emisí v časové oblasti. Oba přístroje byly řízeny manuálně a propojeny se stejnou testovací sestavou. Bylo zjištěno, že čas měření metodou měření v časové oblasti může být snížen o několik řádů. To otevírá nové možnosti pro testování složitých moderních elektronických systémů. Provést konvenčními metodami rozsáhlou analýzu všech vf emisí je stěží ekonomicky uskutečnitelné, protože časy měření mohou být téměř libovolné. Další problém je nutnost opakování měření, s cílem přesně zjistit příčinu možných rušičů. Pakliže se jedná o přechodné nebo o frekvenčně nestabilní emise je metoda měření v časové oblasti výrazně lepší než metoda konvenčního suObr. 8 Proces startování vozidla, měřen systémem měření v perheterodynního přijímače. Některé rušiče lze skutečně časové oblasti TDEMI zaznamenat jen s těmito systémy. Pod le standardizace mají bý t zkušební vzork y tový motor) na volném prostranství OATS (Open Area Test testovány pouze za běžných provozních podmínek. Site) [9]. U první série měření bylo použito log-periodické Zkoušení kávového automatu, elektricky řízených zadantény, která byla umístěna ve vzdálenosti 3 m od zádi resp. ních dveří u vozu nebo elektrického otevírání oken není od motorové části vozidla. Tato byla pak střídavě připojena k u několikahodinového měření možné. Výše popsaná systému TDEMI nebo ke konvenčnímu měřicímu přijímači. testovaná zařízení by se důsledkem tepelného přetížení Okolní rušení jsou v tomto měřicím postupu příznivá, vypnula, a navíc by se nepředvídaným trvalým provozem protože jsou k dispozici stávající užitečné signály v ana změnilo emisní spektrum. logovém FM pásmu a digitální rozhlasové a televizní To by mohlo znamenat, že by se stanovily nesprávné signály, které umožňují reálnou kulisu prostředí. Lze kroky k potlačení emisí, které by technicky neměly smysl bezprostředně hodnotit, zda poruchy na palubě ovlivňují nebo by se zbytečně zvýšily náklady na výrobu. přijímač. Při srovnání výsledků obou měřicích metod zjistíme B. Výsledky měření dobrou shodu dat. Zejména stacionární signály, jako Jako příklad byl změřen osobní vůz horní střední třídy (nafinterferencetechnology.eu

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je např. vysílač FM (76 až 108 MHz), poskytují stejné výsledky. Odchylky vzniknou pokud signály nejsou časově a frekvenčně stacionární. Rozdíly lze rozeznat u DVB-T signálů (174 - 230 MHz a 470 - 862 MHz). Zde hraje roli nastavení doby měření a to že TDEMI systém poskytuje frekvenční data v reálném čase. Měřicí vf přijímač se přelaďuje samozřejmě jen velmi pomalu přes kmitočtové pásmo a nemůže zaznamenávat data v reálném čase. Další srovnávací měření mezi oběma technologiemi byly provedeny Braunem, Donauerem a Russerem [8]. Bylo provedeno srovnávací měření v přijímačovém režimu, podle CISPR 25, ve FM pásmu (76 MHz až 108 Obr. 9. Startování vozidla ve spektrogramovém MHz), se zapalováním a při zavření elektrických zadních režimu, měřeno se systémem TDEMI dveří vozu. Zde jsou systémem měření v časové oblasti velmi dobře zachycena širokopásmová rušení mezi 80 a 87 MHz (obr. 6), zatímco konvenční vf měřicí přijímač s 50 ms dobou měření nezobrazuje rušení tak rozsáhle. Tato rušení jsou způsobena nedokonalým rušením výkonové elektroniky servomotoru zadních dveří vozu. Časový průběh celého procesu zavírání je znázorněn na obr. 7. Kromě stacionárnich FM vysílačů lze rozpoznat širokopás-mové rušení pohonu zadních dveří. U FM pásem (76 – 108 MHz) se jedná o následující sta nice: 88.8 Radio FM, 89.5 B2, 90.1 B5, 92 OE1, 93.7 B1, 94 Kronehit, 94.8 Radio S, 96.7 Charivari, 97.7 DLF, 98.5 B3, 99.4 Bayernwelle, 100.1 DLF, 101.2 Radio, 101.8 Salzburg, 102.3 B4, 103.5 Antenne, 104.5 FM4, 105.1 Arabella, 105.7 B5, 106.2 Welle1, 107.2 Klassik, 107.7 Antenne. Další příklady měření, která lze dobře analyzovat systémem měření v časové oblasti, jsou například proces startování motorového vozidla se všemi poruchami palubní Obr. 10. Váhový spektrogram: GSM-pásmo (890.1 až 914.9 up link). Nahoře: elektroniky. Frekvenční spektrum posledního scanu. Dole: Časový průběh amplitudy a Měření bylo provedeno v souladu s CISPR frekvence, x-osa = frekvence, y-osa = čas, z-osa = amplituda 25 v jedné plně bezodrazové komoře FAC (fully anechoic room). Vlastní rušení bylo změřeno na anténě vozidla. Odpovídající spektrogram časového průběhu amplitudy a frekvence procesu startování vozidla je znázorněn na obr. 9. Při t = 6,5 s byl motor vypnut. Lze rozeznat „plochu“ rušení u běžícího motoru. Rušení způsobené starterem je zhruba o 25 dB nižší než rušení způsobené elektrickými zadními dveřmi vozu. Aplikace, u kterých se používá digitálních rozhlasových slu-žeb, mohou být ideálně změřeny právě se systémy v časové oblasti. Zde je zejména vhodné spektrogramové zobrazení s časovým průběhem vf signálu. Ve volném prostoru byla změřena nová pozice mezi základnovou a mobilní stanicí GSM. Nastavení se provádí s CISPR 16-1-1 detektory a mf pásmy. Frekvence 890,1 MHz a 914,9 frekvence jsou frekvencemi GSM900 buňkové sítě. Pro domácí spotřebiče lze tento postup měření velmi dobře použít také pro časově omezené poruchy. Obr. 11. Váhový spektrogram: Vyzařované rušivé emise Kuchyňský mixer, vyroben v roce 2009 pro USA trh, elektrického kuchyňského mixeru, které se překrývají s vytváří na vzdálenost 1 m širokopásmové spektrum užitečnými signály bezdrátových spojů. vyzařování, které je dostatečně silné, aby úplně překrylo 160

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česká

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metoda DKD používá pro obě technologie shodné právní a testovací předpisy a kalibrační přístroje. To také zajišťuje návaznosti kalibrace a použitého zkušebního zařízení. Metoda měření v časové oblasti ukazuje výhody, zejména pokud se jedná o velmi krátké časy měření nebo o hodnocení časově omezených přechodných a frekvenčně odchylných elektronických systémů. LITERATURA

Obr. 12. Váhový spektrogram: WLAN (2.400,0 - 2.483,5 GHz) Bluetooth (2.402,0 – 2.480,0) a širokopásmový rušič - kuchyňský mixer, x- osa = frekvence, y-osa = čas, z-osa = amplituda

• •

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Obr. 13. Váhový spektrogram: Posuv frekvence u energieúsporných zářivek x-ose = frekvence, y-osa = čas, z-osa = amplituda

slabé signály bezdrátového spoje. Při současném provozu mixeru a PC by uživatel např. nemohl z internetu stahnout recept. Nejedná se o v dnešní době neobvyklou aplikaci. Překrytí signálu Bluetooth a signálů WLAN jsou zřetelně porovnatelné před a po vypnutí mixéru na V oblasti vývoje a Obr. 12 výroby energeticky úsporných zářivek je frekvenční odstup oscilátorového modulu od tradičního měřicího přijímače jen velmi obtížně měřitelný. EMC systémy měření v časové oblasti zde poskytují další cenné informace. Za nepříznivých podmínek může dojít k intermodulaci mezi dálkovým ovládáním audio a video zařízení a oscilátorů úsporných zářivek. Tyto efekty jsou snadno zjistitelné právě metodou měření v časové oblasti V. ZÁVĚR Byly porovnány dostupné technologie přijímačů (superheterodynové přijímače, systémy měření EMC v časové oblasti) a tyto testovány z hlediska vhodnosti zachycení zvláště kritických rušení. Srovnávací měření prokázala, že oba postupy poskytují v souladu s CISPR 16-1-1 stejné naměřené výsledky. Rozdíly se pohybují v rozsahu 0,5 dB a jsou tím v rozmezí nejistoty měření mezi různými měřicími přijímači stejného provedení. Přechod od konvenčního vf přijímače k moderním systémům měření v časové oblasti je možný pro kontrolní i schvalovácí měření. Kalibrační interferencetechnology.eu

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• CISPR 25 Vehicles, boats and internal combustion enginesRadio disturbance characteristics- Limits and methods of measurement for the protection of on board receivers. Switzerland Int. Electrotech. Commiss., 2008. • CISPR 16-1-1, Specification for Radio Disturbance and Immunity Measuring Apparatus and Methods Part 1-1: Radio Disturbance and Immunity Measuring Apparatus-Measuring Apparatus. Switzerland: Int. Electrotech. Commiss., 2003. • S. Braun, M. Aidam, and P. Russer, “Development of a multiresolution time-domain EMI measurement system that fulfils CISPR 16-1,” in Proc. 2005 IEEE Int. Symp. Electromagn. Compat., Chicago, IL, pp. 388-393. A. V. Oppenheim and R.W. Schafer. Discrete-Time Signal Processing. Englewood Cliffs, NJ: Prentice-Hall, 1999. S. Braun and P. Russer, “A low-noise multiresolution high-dynamic ultra-broad-band time-domain EMI measurement system,” IEEE Trans. Microw. Theory Techn., vol. 53, no. 11, pp. 3354-3363, Nov. 2005. S. Braun, M. Al-Qedra, and P. Russer, “A novel realtime time-domain emi measurement system based on field programmable gate arrays,” in Proc. 17th Int. Zurich Symp. Electromagn. Compat., Digest, Signapore, Feb. 2006, pp. 501-505. C. Keller and K. Feser, “Fast emission measurement in time domain,” presentation at the 14th Int. Zurich Symp. Electromagn. Compat., Zurich, Switzerland, Feb. 20-22, 2001, Paper no. 70K7. Stephan Braun, Thomas Donauer and Peter Russer, “A Real-Time Time Domain EMI Measurement System for Full- Compliance Measurements According to CISPR 16-1-1, IEEE Trans. Electrom. Comp., vol. 50, no. 2, May 2008 W. Winter, M. Herbrig, “Time Domain Measurements in Automotive Applications,” in Proc. 2009 IEEE Int. Symp. Electromagn. Compat., Austin, TX, pp. 109-115.

WOLFGANG WINTER, Sales Manager at emv GmbH, can be reached at wwinter@emvgmbh.de. Markus Herbrig, Projects & Support at emv GmbH, can be reached at mherbrig@emvgmbh.de. Zuzana Wood, Sales Central & Eastern Europe at emv GmbH, can be reached at zwood@ emvgmbh.de.

Více informací naleznete online Aktualizované seznamy výrobků a služeb a překlady technických článků do angličtiny naleznete na www. interferencetechnology.eu.

Řekněte nám, co si myslíte Je pro nás velice důležité vědět, co si myslíte. Jděte prosím na www.interferencetechnology.eu a vyplňte krátký dotazník, který nám napomůže vylepšit Evropského průvodce EMC.

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Ă&#x2013;STERREICH 163

pRodukTE und SERvICES

164

RESSouRCEn

Translations available at www.interferencetechnology.eu

ÖSTERREICH Produkte und Services / Ressourcen A

EM Test AG AH Systems, Inc.

Pro Nova Elektronik GmbH, Ludwigsburg, Österreich; 49 7141-2858 20; Fax: 49 7141-2858 29; pne@pronovagmbh.de, www.AHSystems.com Produkte und Services: Antennen, Testausstattung, Testen

AR/RF Microwave Instrumentation

EMV GmbH, Wallbergstr.7, Taufkirchen, Deutschland, D-82024; +49-89-614-1710; Fax: +49-89-614-17171; Zuzana Wood, zwood@emvgmbh.de; www.emvGmbh. de; www.ar-worldwide.com Produkte und Services : Verstärker, Antennen, Kabel und Stecker, Abgeschirmte Räume und Gehäuse, Überspannung und Einschaltstöße, Testausstattung

UEI Universal Elektronik Import GmbH, Anton Freunschlag Gasse 49, 1230 Vienna, Österreich; +43 (0)1 545 1588; Fax: +43 (0)1 545 1464; sales@uei.vienna.com; www. uei-vienna.com Produkte und Services: Überspannung und Einschaltstöße, Testen

Haefely Test AG

Department AG, Lehenmattstrasse 353 CH-4052 Basel, Schweiz; +41 61 373 45 84; Fax: +41 61 373 4912, EMC-sales@haefely. com; www.haefely.com Produkte und Services: Überspannung und Einschaltstöße, Testausstattung

Pischzan Technologies, EMV Messtechnik und mehr, Thomas-Mann-Straße 57 D-63477 Maintal Deutschland; +49 (0) 61 09 - 77 19 48; Fax: +49 (0) 61 09 - 77 19 49; Gregor Pischzan, info@pischzan-technologies.de, g.pischzan@pischzan-technologies.de; www.pischzan-technologies.de Produkte und Services: Verstärker, Antennen, Filter, Abgeschirmte Räume und Gehäuse, Testausstattung, Testen

I Schlegel Electronic Materials

Fair-Rite Products Corp.

Industrial Electronics, Hauptstr. 71 - 79 D- 6 5 7 6 0 E schborn Ös terreich ; + 4 9 619 6-9 2 79 0 0 ; Fax : + 4 9 -619 6-9 2 79 2 9 ; w.uhlig@industrialelectronics.de; www. fair-rite.com Produkte und Services: Ferrit, Filter, A bgeschirm te Räume und Gehäuse, Abschirmung

IFI - Instruments for Industry

EMCO Elektronik, Bunsenstr. 5, D-82152 Planegg Deutschland; +49 898955650; Fax : + 4 9 8 9 8 9 5 9 0 3 7 6 ; Diego Waser, dwaser @ emco-elek tronik .de ; w w w. emco-elektronik.de

JiC Warenvertriebs-gesellschaft m.b.H., Theresianumgasse 13, Vienna 1040; John Wellems, john.wellems@jic-trading.com; www.jic-trading.com Produkte und Services: Leitungsmaterialien, Abschirmung

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Index of Advertisers AARONIA AG

29, 59, 83, bACK COVER

A.H. Systems, Inc.

33, 63, 97, 105, 129, 143, 148, 163

aLBATROSS PROJECTS GMBH

42, 43

GETELEC

22, 60, 93, 104

HAEFELY EMC DIVISION

25, 81, 135

IEEE 2011 EMC Symposium

AR Worldwide

21, 57, 79, 101, 117, 121, 133, 141, 147

ASTAT SP. Z.O.O.

125

item pUBLICATIONS

em SOFTWARE & sYSTEMS sa ltd

KEMTRON LIMITED

EM TEST AG

LP Instruments

103

EMC PARTNER AG

MESAGO MESSE FRANKFURT GMBH

5, 27, 61, 65, 85, 107, 113

EMCCONS DR. RASEK GMBH & cO

MONTROSE COMPLIANCE SERVICES

EMV ELEKTRONISCHE GMB

71, 153

iNSTRUMENTS FOR INDUSTRY

31, 64, 93, 108, 114, 123, 132, 142, 146, 163 Inside front Cover, 41, 48, 89, 130, 136, 144

73, 87

NEXIO

eos/esd aSSOCIATION

SCHLEGEL ELECTRONIC MATERIALS (EUROPE)

E-SONG EMC CO. LTD

SOLIANI EMC SRL

108

15, 69, 110, INSIDE BACK COVER

TECH-ETCH, INC.

ETS - LINDGREN FAIR-RITE PRODUCTS CORP.

13, 55, 80

FILTEMC ELECTRONIC EQUIPMENT CO., LTD

109

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S Seibersdorf Laboratories GmbH

Seibersdorf, A-2444, Österreich; 43 (0) 50550-2805; kurt.lamedschwandner@ seibersdorf-laboratories.at Produkte und Services: Testen

164

Teseq Ltd

deg-Messtechnik GmbH; +43 1 8135 3800; info@deg-messtechnik.at; www.deg-messtechnik.at Produkte und Services: Verstärker, Antennen, Testausstattung, Testen

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TESEQ HOLDING AG

45, 75, 91

WAVECONTROL

115

Ressourcen

Gerhard.Ludwar@bmwfj.gv.at

Austrian Research Centers

IEEE EMC Society Chapter

2444 SEIBERSDORF, Österreich; +43 (0) 50550-0; Fax: +43 (0) 50550-2201; seibersdorf@arcs.ac.at; www.arcs.ac.at Notified Body number: 0438

Kurt Lamedschwandner, Seibersdorf Labor GmbH, 2444 Seibersdorf, Österreich; +43 50-550-2805; Fax: +43 50-550-2813; kurt.lamedschwandner@ seibersdorflaboratories.at

Federal Ministry of Economy, Family, Youth

TÜV AUSTRIA SERVICES GMBH

Stubenring 1, A-1011 Vienna, Österreich; +43 1 71100 8220; Fax: +43 1 71100 713 7995; Gerhard Ludwar;

Krugerstrasse 16, 1015 WIEN, Österreich; +43(1)514 07-0; Fax: +43(1)514 07-6005; office@tuv.at; www.tuev.at Notified Body number: 0408

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EMC Wireless

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Systems and Solutions... For All Your Test Requirements! ETS-Lindgren has a long history of providing engineers with the tools they need to make accurate, repeatable test measurements. Little wonder we are now the worldâ&#x20AC;&#x2122;s largest integrated manufacturer of test equipment in the world.

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