MCL SAMM Scopes by Microrep Precision (M) Sdn Bhd

lssue date: 24 November 2009

schedule valid until: 20 Octobet 2012 NO. SAMM 282 Page:

LABORATORY LOCATION:

I of

IlIICROREP CALIBRATION LABORATORY MTcRoREP PRECTSTON (M) SDN. BHD. l5-1, JALAN 1/'149J BANDAR BARU SERI PETALING 57OOO KUALA LUMPUR MALAYSIA

(PERI\,IANENT LABORATORY)

The standard used for assessment of this laboratory is MS ISO/lEC 17025:2005 FIELD OF CALIBRATION: DIllIENSIONAL SCOPE OF ACCREDITATION: instrument calibrated/ Measurement parameter Vernier/Dial/Digital caliper

Externalmicrometer

Ranqe

Best measurement capability expressed as an uncertaintv lt) *

Documented calibration method / Procedures /

Eouipment techniques

0 to 150 mm 0 to 200 mrn 0 to 300 mm

T1 pm

[,4C1 Procedure: CI\,4P-001

11 !m 12 pm

B.O T.: BS

0to25mm

12pn

[,4C1 Procedure: CI\,4P 002

25 to 50 mm

16pm

B O T.: BS 8701 1950

887

1982

Precision Vern er Calper (as per Appendix B, except 82.5 and 83)

External lvlicrometers as per Appendix A

Screw/Thread plug gauge - parallel

0to50mm

19pm

BOT.:AS2710

dlameter)

0to50mm

2.9 pm

0to10mm

12pn

10 to 50 mm

13pm

(lvlalor diameter, pitch diameter and step limits)

Plain plug gauge/Pin gauge (D ameier only)

1984

SCREW GAUGE _ VERIFICATION (clause 212,213 3 21 and 3 2 31)

(lvlajor diameter and pitch

ScreWThread pluq garige - taper

MCL Procedure: CN,4P-003

MCL Procedure: C[,4P-006 B O T: A.S 2710 : 1984 SCREW GAUGE _ VERIFICATION (clause 3.5 2.'1 and 3.5.2 3) Procedure: C[,4P-004 (for Pin Gauge) MCL Procedure: Cl\,4P 005 (for Plain Plug Gauge) B.O.T. A.S. 1997: 1977 Plain L mit Gauge (lvletric 1\,4C1

Ser es)as perAppendix B (Clause B1 or 82 except 83, 84 and B5).

The uncertainties are based on an estimated confidence probability of not less than 95% unless otherwise stated.

SKIM AKREDIIASI MAXMAL MALAYSIA (SAMM) LABORATORY ACCREDITATION SCHEME OF MALAYSIA

g6hgduls

Issue Valid

24 November 2009 20 Octohet 2012

NO. SAMM 282 Page: 2 of 10

FIELD OF CALIBRATION: DIlllENSIoNAL SCOPE OF ACCREDITATION: lnstrument calibrated/ Measurcment parameter Dial indicator

Ranoe

Best measurement capability expressed

Documented calibration method / Procedures /

as3-!_q-!.scl3i!E-14:

Equioment technioues

0to10mm

24tm

(GradLration: 0.01 rnm)

IICL Procedure CMP-014 B.O.T:JlS B 7503 : 1997 DIAL GAUGE as perTab e 2

(No 1 2 3and4exceptNo 5)

Dialtest indicator

oto1mm

25lLm

(Graduation: 0 01 mm)

[/CL Procedure CI\lP 008 BOT:.11S87533:1990 DIAL TEST INDICATOR (LEVER TYPE) as per Table 5

(No 1 2 3 4andsexcept No 6) Master disc/Setting qauge

Plain plug gauge

Plain ring gauge

Thread measuring wire' (.instrument upgraded)

0to30mm

08trm

30 to 60 mm 60 to 100 mm

13tLm 18trm

0to30mm

08[m

30 to 60 mm 60 to 100 mrn

13llm

1to20mm

12tm 19[m

18Im

20 to 50 mm 50 to 90 mm

2.7

0io65mm

05trm

ItrlCl Procedrrre CMP 037

BOT

ASI,IF88q1519S8

I\4easurement of P ain Externa Diameters for use as [,4aster Discs or Cyl ndrlcal Plug Gages as per clause 6.1 1 [,4C1 Procedure:

C[/P-005

B.O A S 1997: 1977 Pla n L mit Gauge (l\,4etrc Seres)as perAppend x B (ClaLrse 91 or 82 except 83. 84 and 85) [/]CL Proced!re: CMP-038 B.O.T.:JlS B 7420: 1997 Plain Limit Gauge as per Table 24 (Number 4, Method 2) [/]CL Procedu.e: Ctr4P-023

B.O.T. ASME 889.1.17 2001 IVleasurement Of Thread Ivleasur ng wires (Clause 7 5 & 7 5.2).

Thread plug gauge parallel

0to30mm 30 to 60 mm 60 to 100 mm

17lm 20lm 23[m

f]idi) ,.'",t,

sKtM At<REDlfASl MAI<MAa MALAyS'A (SAll/tll/l) LABORATORY ACCREOITATTON SCHEME OF IlIALAYSIA

[/]CL Procedure: C[4P-003-1 B.O.T.: JIS B 0261: 2004 Paralel screw thread gauges l\leasu rrng method of gauges (Table 1 P ug Gauge ftla]or Diameter & Ptch Diameter)

lssue date: 24 November 2009 Valid until: 20 October 2012 Schedule

NO. SAMM 282 Page:3 of 10 FIELD OF CALIBRATION: DIMENSIONAL SCOPE OF ACCREDITATION: lnstrument calibrated/ Nleasurement Darametet Thread plug gauge - taper

Ranqe 0 to 30 rnm 30 to 60 mm

60 to 100 mm

Best measurement capability expressed as an uncertaintv (1) i 2.8 nm

Documented calibration method / Procedures /

Equipment techniques I\,4C1

Procedurer Cl\lP-006

30!m

BOT AS2710: 1984

3.2

Screw

Gauge Verfcation

(cause 3 5 21) ASME 81 20 5 1991 Gag nq for Drysea Pipe Threads (Append x B, clause 81.1 81 2)

Univelsalhorizontal metroscope

up to 60 rnm

(0.2+2x105xL)rrm where L = measuring range in rrm)

IVCL Procedure: CIVIP 039 B O T. Universa Hoizontal

l\letroscope Operation lnstructions Clause 4.1

Dial lndicator (Long Stroke) - lnd calion error - Adjacent error - Retrace error Repeatabilly

Vernier/Dial/Digital Height Gauge - Lnstrurnentalerror - Flatness of reference surface ol base

0to20mm 0to30mm 0to50mm

13pm 1.3 pm

16pm

Dev at on of readinq

Vernier/Dial/Digital Caliper - Dev ation of reading - F atness of faces for external measurement - Para ie ism of faces for external Tneasurement - Para le ism of faces for niernal measurement

IVICL Procedure: C[,4P 017

I O T : l\,4in ature and Long Slroke Dia lnd cators. JMAS 2001 :1998 (except No. 5)

0 to 300 mm 0 to 600 mm

15 pm

[,4C1 Procedure: CL.4P-007 B O T : ,llS B 7517: 1993

Vernier, Dia and D gital Herghi Gauges as per Tab e 7 (No 1, 2 and 4, excepi No. 3l

Parallelism of reference surface of base to measuring surface of scriber.

Digitallndicator

0to25mm

10pm

0 to 50 mfir

12pn

0 to 100 mm

18pm

0 to 450 mm 0 to 600 mm 0 to 1000 mm

13 pm 15 pm

22 pm

MCL Procedure: CIVIP-009 1 B.O.T. [4icrorep Test Method for Electron c (Dig tal) ndicatori {VCLTIVI 1 [/]CL ProcedLrre: CMP-001-1

B.O.T. B.S 887 1982 Precision Vernler Calliper as

perAppendxB(causeBl 8.21, B 22, B 23 8.2.4 except c ause 8.2 5 and 8.3)

SI<IM AI<REDIIASI MAI<MAL MATAYS'A (SAMII/I) LABORATORY ACCREDITATION SCHEME OF MALAYSIA

lssue date: 24 November2009 Valid until: 20 Oclobet 2012 Schedule

NO. SAMM 282 Page: 4 of 10

FIELD OF CALIBRATION: DIMENSIONAL SCOPE OF ACCREDITATION: lnstrument calibrated/ MeasLrrement oarameter Feeler Gauge (Thickness Gauge)

Ranqe

Best measurement capability expressed as an uncertaintv (l) '

Documented calibration method / Procedures / Equipment techniques

0to3mn

09pm

[/]CL Procedure: CIVIP-029 B.O T. JtS B 7524 1992 Feeler Gauge as per Tab e

0to5mm

08!m

[,4C1 ProcedLrre: CMP-014

Thickness

Lateralwarp Dial lndicator (0.001mm graduation) - lnd cation error

BOT:JlSB7503

1997

DIAL GAUGE as per Tab e (No 1,2 3 and 4 except N

- Retrace erroT

'Repeatab lty - Backward error

Repeatab lity

DialTest lndicator (0.001/0.002 graduation)

Oto 1mm

'1.1

[,4c1Procedure: C[,4P-008

BOT:JlSB7533

1990 DIAL TEST INDLCATOR (LEVER TYPE) AS PET TAbI

W de-range forward accuracy

5(No 1,2,3,4and5

- Ne ghbouring error

except No 6)

- Naffow-range nerghbouring erroT

External lvlicrometer - Flatness of f xed anv I - Paralle ism of measuring

50 to 75 mm 75 to 100 mm

18pm 21pm

[/]CL Procedure: CIVIP 002 BO BS 870: 1950 ExteTnal IVI cromelers as

1.5 pm

I\4CL Procedure CIVP-01 5

2.2lJar 3.0 pm

B.O T : DIN 863-4: 1999 I\,4icrometer Part 4: lnterna IVlicrometers (Clause 6)

faces l\4icrometer screw accLrracy Setting rod accuracy

3-Point lnternal Micrometer - Deviation of read ng - Repeatab lity

DialThickness Gauge Dev at on of read ng - Paralle ism of rreasuring

From 6 io 20 mm Over 20 to 40 mm Over 40 to 63 mm Over 63 to 88 mm Over 88 to 100 mm

31pm 32pm

0 to 25 rnm (Graduation 0 01 mnr)

60pm

[/]CL Procedure CIvIP-019

0to5mm

1.3 pm

l\,4ethod for Dra Thickness

B.O

(Graduation: 0 001 mrn)

SKIM AKREDIIASI MAKMAL,'AIAYST^ (SAMM)ACCREDITATION SCHEII/lE OF MALAYSIA

-LABORATORY

Gauge

IMicrorep Test N/]CLT|M 5 2006

lssue date: 24 November 2009 Vaiid until:20 October 2012 SchedUle

NO. SAMM 282 Page:5 of 10 FIELD OF CALIBRATION: DIMENSIONAL SCOPE OF ACCREDITATION: lnstrument calibrated/ lvleasurement parameter Thread Ring Gauge Parallel

Best measurement capability expressed as an uncertaintv (il *

Ranqe Ivletricr

N43

1t433

20pm

(or nches equiva -.nt)

Documented calibration method / Procedures /

Eouipment techniques MCL Procedurer C,4P 018

B O T.:AS 2710: 1984

ScrewGauges Verifcation (clause 3.3 1 3.3.2 a and

Pitch diameter lvlinor d ameter

3.3 4.1).

Gauge block (mm) Deviation of centra length, ec - Variauon in length, v - Deviation foand f! from the centra length

Plain taper plug gauge - Cone diameter

Step dimension

From 0 5 to 10 mm Over 10 to 25 mm Over 25 to 50 mm Over 50 to 75 mm Over 75 io 100 rnm

010 pm 012 pm 0T4pm 017 pm 021 Um

For diameter From 0 to 30 mm Over 30 to 50 mm Over 50 to 100 mm

For diameter 1.6 pm

FoT step dimens on

For step dimension

From 0 to 30 mm

23pm

2.0 pm 3.1 pm

[,4C1 Procedure: CMP 026

BOTTVDUVDE/DGQ2618 - Part 1 2004 Test nstruction for gaLrge blocks (C ause 3)

MCL Procedure: Ct\4P-044

BOT:JlSB3301:1989' lnformative Reference (clause 1)

Remark:

BOT

SKIM AKREDIfASI MAKMAL M,4L,AyS,A {SAlVlll) LABORATORY ACCREDITATION SCHEME OF IIIALAYSIA

= Basis of test

lssue date: 24 November 2009 Valid until: 20 October 2012 Schedule

NO. SAMM 282 Page: 6 of

'10

FIELD OF CALIBRATION: DIMENSIONAL SCOPE OF ACCREDITATION: lnstrument calibrated/ lvleasurement parameter External

lvlicrometer

Ranqe Up to 300mm

Best measurement capability expressed as an uncertaintv {1) *

Documented calibration method / Procedures /

Equipment techniques

(0.81+0 0121) pm

IVICL

where L = nom nal ength

B O T.: BS 870 1950 External [,4icrometers as per

in mm

Procedure CI\4P 002

Appendix A

lnside Micrometer (Caliper / Tubular / Solid Rod type)

DiaUDigital" Thickness Gauge

Metal/Steel Ruler

25 mm travel wth frame / Sing e Rod (or Extens on Rod) size:Up to 500 mm Up to 25 mm - Graduation: 0.01 mm - GradLration 0.001

Up lo 1000 mm

(0.6+0.0131)!m where L = nom nal ength in mm

Ii/lCL Procedure CIIIP 002 3 B O T.: JIS B 7502:1994. Micrometer Cal iper (Table

14 No.2)

60!m 1.3

013mm

[,4C1 Procedure: C]\,4P-01 B O T.: lvlcrorep Test li,4ethod for D alTh ckness Gauge. lt4c LTIt/l-5:2 006

N4CL Procedurer CMP-022

B O T.: JIS B 7516: 2005 Meta Ru es (Table 6)

Snap Gauge / Width Gauge / Gap Gauge

Depth lvlicrometer

io 100 mm

Up to 150 mm

(1 1+0.0131)!m Where L= Nomina Length n mm

Procedure Cl\4P-024 B O T: VDI/ VDE/ DGO 261 'i,4CL Part 4.7 2005 (Clause 3)

(0 92+0 0'11)um

IVICL

Where L= Nomina Length n mm

B O.T.: .lls B 7544: 1994 Depth I\4icrorneter (Tab e 7

Procedure CIVP-032

and Annex Table 3)

Note *" = lnclude Diglta Thickness Gauge

Noter

"'=

Remark:

Extend up to

BOT =Baslsoftest

25nm

Signatory: Chong Yoon Chin

UC No.:670808-10-6063

SKIM AKREDIIASI MAKMAL MALAYSI (SAMM) I ABORATORY ACCREDITATION SCHEME OF MALAYSIA

lssue date: 24 November 2009 Valid until: 20 Octobet 2012 SChedule

NO. SAMM 282 Page: 7 of 10

FIELD OF CALIBRATION: DIMENSIONAL SCOPE OF ACCREDITATION: lnstrument calibrated/ Measurement parameter Caliper Checker

Ranqe Up to 600 mrn

Documented calibration method / Procedures /

Best measurement capability expressed as an uncertaintv lt)' (0 6+0 251) !m whereL=nornina length nmm

Equipment techniques [,4C1 Procedure: CMP-035

B.O T. I\/icrorep Test lvlethod for Cal per Checker.

[/]CLT[rl-10: 2008

Cylinder Gauge / Bore Gage

Up to 160 mm

15pm

IVICL Procedure: CIVIP-043

B.OT JSB7515 1982 Cy inder Gauges, Table 4 (No. 1 2 & 3, except No. 5 & 6)

Dial lndicator / Dial Test

lndicator (Ior linear measutements)

Up to 50.8 mm (or nches size equiva ent,

0to2)

lndicator Calibration Tester

Up to 50 mm

(0 7+0 021) pm

I\lCL Procedure: CIVIP 045 B O T:AS[/]E 889 1 '10[,4:

whereL=nomina length nmm

2001 Dial nd cator (Clause

(0 6+0 251) pm

I\lCL Procedure: CI\lP 048

whereL=nomina length

BOT:MicrorepTest

tn mm

I\,4ethod for

83&84)

lndicator

Ca ibrat on Tester, lt4oLT[/]-

9 tlp to 25.4 mm

Hex Plug Gauge

0.9

2008

Procedure C[,'lP-034 B O.T: Microrep Test lMethod - l\/lCLTlvl-7: 05-Apr IVICL

2007 for Hex Gage

Screw Ring Gauge Parallel(SCP)

Up to 64mm (or 2

(3.7+0.021)pm

nches)

[4CL Procedure CMP-018-2

O.T:JlS B 0261:2004 Paralle screw thread B

Diameter ln mm

gauges - IVleasurlng method of gauges (Tab e l)

Remark:

BOT

Signatory:

chong Yoon Chin

No.:670808'10'6063

SKIM AKREDIIAS] MAKMAI MA'AYSII (SAMM) LAAORATORY ACCREDITATION SCHEME OF MALAYSIA

= Easis of test

lssue date: 24 November 2009 Valid until: 20 October 2012 Schedule

NO. SAMM 282 Page: 8 of 10

FIELD OF CALIBRATION: DIlllENSIONAL SCOPE OF ACCREDITATION: lnstrument calibrated/ Measurement parameter

Vernier/Dial/Digital Caliper'*

Ranqe Up to 150 mm Up to 200 mm UP to 300 mm

Best measurement capability expressed as an uncertaintv {l) ' pm pm pm

Documented calibration method / Procedures /

Equipment techniques I\,4C1

Procedure

CI\,4P-001

BO BS 887 1982 Prec s on Vernier Caliper (as per Appendix B, except 82 5

and 83)

Precision Linear Height

Up to 700 mm

(1 5+0 0011)

Where L= Nomina

Gauge

Length in nm

MCL Procedure CMP-028 B O T: JIS B 7517: 1983 Vernier. Da and Digital Herght Gauge (as per Table

7-No Standard Bar/Setting Rod

tlp to 300 mm

(0.36a0 0131)p rn

MCI Procedure C[/P-031

Where L= Nomina

B O T.:

Length in mm

I\,4ethod for Standard

crorep Test

Barlsetting Rod [4CLTIVI-4: 2006

Film Thickness Standard (Thickness Foil)

Upto5mm

{0.4+0.21)LIn Where L= Nomina Length in mm

[,4C1 Procedure CIIP 042 B.O.T.: M crorep Test Method for F lm Thlckness Standard (Thickness Fo l).

I\,1CLTM-2 2006

Note: .'= To lnclude ca ibration steps for deviation of reading for internal rneasurement (upon request)

Remark:

BOT

Signatories:

1. 2.

Chong Yoon Chin Bay Hin Foo

UC No.:670808-10-6063

l/C No.: 740501-14-5843

SXIM AKREDITAS| MAAMAT MALIYSIA (SAMM) LABORATORY ACCREDITATION SCHEME OF MALAYSIA

= Bes s of test

lssue date: 24 November 2009 Valid until: 20 Octobet 2012 Schedule

NO. SAMM 282 9of10 FIELD OF CALIBRATION: Dl[IENSIONAL SCOPE OF ACCREDITATION: lnstrument calibrated/ Measurement parameter Plain Plug Gauge/Pin GauqslAr

Best measurement capability expressed as an uncertaintv (!l '

Ranoe

^ (0 8+0 0121) pm

tjp to 50 mm

where L = nomina diameter in mm

Plain Plug cauge(a)

Plain Ring Gauge

Up to 120 mm

1io90mm

^ (0 4+0.0141) Lrm where L = nomina diameter in mm

" (0 6+0

017

!r'T

where L = nominal dlameter n mm

Documented calibration method / Procedures / EquiDment techniques I\lCL Procedure: CIVP-004 (for Pin Gauge) ftrlCL Procedure: C[,4P-005 (for Plain Plug Gauge) B.O.T : AS 1997 1977 P ain L m t Gauge (lvletric Series) as per Appendix B (C ause 81 or 82, except 83 84 and Bs) VICL Procedure: CMP-005-1 B.O.T AS 1997 1977 Plain L mit Gauge (lvletric Serjes) as per Appendlx B (C a!se 81 or 82, except 83, 84 and B5) l\,4C1 Procedure: Cl\,4P-038

B O T. JtS B 7420 1997 Pla n L mit Gauge. Tab e 24

(No 4-lrlethod2) Note "=Extensionof range (from 100mm to

Note: ^=ReviseBIV]C

'120mm)

Remark: B O T. = Basis of test

Signatories:

1. 2. 3.

Chong Yoon Chin Bay Hin Foo Liew Hong Har

lic No.:670808{0-6063 lic No.: 740501-14-5843 ll

C No.: 7 3121

3-O7 -537 2

sKtM Al<REDlfASl MAI<MAa MATAyS/A {SAllrlllt) LAAORATORY ACCREDITATION SCHEIME OF IIIALAYSIA

(A only)

lssue date: 24 November 2009 Valid until: 20 October 2012 Schedule

NO. SAMM 282 Page: 10 of 10

FIELD OF CALIBRATION: DIMENSIONAL SCOPE OF ACCREDITATION: SITE CALIBRATION CATEGORY lnstrument calibrated/ Measurement parametet Precision Linear Gauge

Height

Best measutement capability expressed as an uncertaintv (!) i

Ranqe

(1.5+0.0011) pm Where L= Nominal Length in mm

Up to 700 mm

Documented calibrati method / Procedures /

Equipment techniques [,4C1 Procedure: CMP-028

B.O.T.: JIS B 7517: 1983 Vernier, Dial and Digital Height Gauge (as per Tab

No. 1)

Remark:

B.O.T = Basis of test

Weighing Machines / Balances

From 0 to 200 Over 200 to 500 Over 500 to 1000 Over'1000 to 2000 Over 2000 to 5000 Over 5000 to 20000 Over 20000 to 30000 Over 30000 to 50000 Over 50000 to 100000

g g g g g q g g

0.003 g 0 01 g 0 02 g 0.03 g 0.1 g

0.2 g 0.5 s 59 5g

Signatodes:

1. 2.

lic lic

Chong Yoon Chin Bay Hin Foo

No.: 670808-10-6063 No.: 740501-14-5843

SKIM AKREDITASI MAKMAT /T'AIAYs'A (SAIIiIM)ACCREDITATION SCHEME OF MALAYSIA

-LABORATORY

l\4CL Procedure: Cl\4P-M001

B.O.T.: UKAS LAB14i20 Calibration of Weighing N4achines [ClaL]se 4.3.3(a), 4.3.3(c) & 4.3.3(d)l