Moke study of amorphous microwires for temperature sensors

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MOKE Study of Amorphous Microwires for Temperature Sensors

Abstract: We report investigations on temperature temperature-induced induced transformation of magnetic domain structures and magnetization reversal process in as as-cast cast and annealed coco rich amorphous glass covered microwires. The images of domain structures and hysteresis loops were obtained using magneto magneto-optical optical Kerr microscopy. The directed shift of the hysteresis loop along the field axis was observed during the temperature increase and decrease in the annealed w wire. ire. The mechanism of the observed effect is based on the strong influence of the temperature-induced temperature transformation of the internal stresses in the outer shell of the microwire. The studied microwires could be considered as candidates for the active element eleme of the temperature sensor.


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