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Yield Management Seminar Series
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YMS
Since 1994, KLA-Tencor seminar series has provided customers with a valuable venue in which to share innovative ideas on how our products help solve manufacturing challenges. The new Yield Management Solutions Seminars, YMS2, will focus on value-added, integrated solutions for yield management, and process control. Key topics to be covered include CMP, Lithography, In-Line Monitoring and Yield Strategies. This section of the magazine will highlight a paper from a recent seminar and preview the upcoming session. We encourage you to attend and participate in our new seminar series. Your comments and feedback are welcome at any time.
YIELD
Call for papers
MANAGEMENT SOLUTIONS
YMS2 is always interested in proven application ideas, solutions to technical problems, new methodologies, and advanced techniques. The papers should focus on using KLA-Tencor tools and solutions to enhance yield through increased productivity and performance. The presentation does not have to be a formal published paper, just a synopsis of your testing and the results. Topics of interest
Defect Inspection, Lithography, CMP, Film Measurement, and Yield Management Strategies. If you are interested, please contact Janet Ely via email at janet.ely@kla-tencor.com.
SEMINAR â–
For additional information contact Janet Ely via e-mail at janet.ely@kla-tencor.com
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Autumn 1998
YMS2 at a Glance October 21
Austin, Hyatt Regency (during SEMICON Southwest)
December 3
Makuhari, Japan, New Otani Hotel (during SEMICON Japan)
February 23
Seoul, Korea, Inter-Continental Hotel (during SEMICON Korea)
March 17
Santa Clara, Westin Hotel (during SPIE)
April 14 July 13
Munich, Germany (during SEMICON Europa) San Francisco, ANA Hotel (during SEMICON West)
Yield Management Solutions