X-Ray Spectroscopic Analysis Apparatus X-ray spectroscopic analysis apparatus utilizes X-rays to measure and analyze constituent elements. Energy Dispersive X-ray fluorescence spectrometers (EDX) detect X-ray fluorescence to identify the type of elements contained in samples (qualitative analysis) and measure the concentration of each (quantitative analysis). Shimadzu’s EDX systems provide an easy way to measure the six substances (five elements) regulated by the RoHS/ELV directives in Europe. As a result, Shimadzu has gained extensive experience providing EDX systems to customers for the screening of electrical/electronic parts or automotive parts to determine to what degree they contain these regulated substances.
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Energy Dispersive X-Ray Fluorescence Spectrometers X-ray fluorescence spectrometers irradiate samples with X-rays and measure the characteristic wavelengths or energy in the secondary X-rays (X-ray fluorescence) generated from the sample. They are able to identify the type of constituent elements in samples and measure the concentration of each. Since samples can be analyzed non-destructively and without contacting the sample, X-ray fluorescence spectrometers can be used for a wide range of applications, regardless of whether the sample is a solid, liquid, powder or other form. The EDX-720 is the most optimum tool for RoHS and ELV. New filters and a high-count-rate circuit produce twice the sensitivity of previous models. In addition, the time-reduction function and switching calibration-curve function make this model easy to use and a more efficient tool for screening assessment.
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EDX-720/800HS
Designed for WEEE, RoHS, and ELV applications, these models also satisfy the demands of a wide range of other applications, such as trace analysis, rapid analysis, and thin film analysis.
Energy Dispersive X-Ray Fluorescence Spectrometer Applications Ferrous & Non-Ferrous Metals Petroleum Industry Agriculture & Food Semiconductors RoHS/WEEE/ELV
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