Yebes Technological Development Center
Services The Center for Technological Developments (CDT) is a branch of the National Geographic Institute of Spain. The new anechoic chamber is opened for the R+D community and antenna engineering companies interested in antenna design and measurement.
CDTAC
Yebes Technological Development Center
CDTAC Laboratory
Cerro de la Palera s/n 19141 - Yebes Guadalajara Spain Phone: (+34) 949290311 Fax: (+34) 949290063
Alignment Touching Probe
Centro de Desarrollos Tecnol贸gicos de Yebes Instituto Geogr谩fico Nacional (Spain) Phone: (+34) 949290311 Fax: (+34) 949290063 Email: f.tercero@oan.es
Antenna Measurements at the CDT
Anechoic Chamber Overview
Software: NSI 2000 Professional Edition Advanced scripting features, powerful beam table generator for multi–beam, multi-frequency measurements, error correction (drift check, MTI).
The CDT anechoic chamber dimensions are 11.5x5x5 meters and utilizes a 1.83x1.83 meters planar scanner with a positional accuracy and planarity after correction selected in order to have a maximum of λ/16 error at the higher working frequency
Acquisition, Processing and Presentation Software
(140GHz). A sliding rail allows the AUT displacement from the OEWG probe used to sample the field in either reception or transmission, depending on the configuration, in both the near and far field by up to 5.5 meters. The chamber is constructed from a modular panel system which guarantees a shielding
Positioning system Features
3D Radiation Pattern
X
Y
Z
AUT Z
Roll
Travel
1.83m
1.83m
0.25m
5.48m
360º
Resolution
25µm
25µm
6µm
50µm
0.0125º
25.4cm/s
38cm/s
1.3cm/s
25.4cm/s
40º/s
50µm
50µm
50µm
50µm
0.05º
performance of at least 90dB at 40GHz. The RF systems Speed
nominal design permits a dynamic range of at least 60-90dB in the
entire
2-140GHz
range
allowing
highly
sensitive
measurements to be performed. A completely automated system both pre and post measurement has been installed to facilitate the acquisition and processing of data and ensuring a quick turn-around time.
Accuracy Planarity
25µm rms
Radio Frequency System Design The RF system is based on the following Agilent instrumentation:
RF Components Measurement and Material Characterization
E8364B PNA up to 50GHz, 85309A LO/IF distribution unit, 85320A test mixer module, 85320B reference mixer module. The maximum measurement frequency is 140GHz . To achieve this value, three OML microwave heads are used: N5260AW15, N5260AW10 and N5260AW08.
OEWG Probe E8364B Agilent PNA X Band Feeding System
Optical bench WRWR-8 mmmm-wave Heads