The Future Metrology Hub An EPSRC Manufacturing Research Hub
EPSRC Future Metrology Hub UK Metrology Research Roadmap
Contents
EPSRC Future Metrology Hub Roadmap
Section 1 Introduction 3 Section 2 Landscape 4 Trends and Drivers
5
Research Themes
6
Capabilities and Enablers
7
Linkage Chart
8
Section 3 Key Themes
9
Metrology as an enabling technology
9
Novel technologies or approaches necessary to create the next generation of sensors/systems
10
Metrology as a fundamental aspect of simulation, and by extension the design process
11
Metrology as a key component of sustainable manufacture
12
Growing metrology skills gap
13
Section 4 Conclusions
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Appendix 16
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SECTION 1
EPSRC Future Metrology Hub Roadmap
Welcome and Introduction Welcome to the Future Metrology Hub Research Roadmap report. The Future Metrology Hub is a 7 year EPSRC funded programme which brings together experts in the fields of sensor development, data analytics, embedded metrology and metrology techniques and applications. The Hub is based within the Centre for Precision Technologies at the University of Huddersfield with research spokes at the Universities of Bath, Loughborough and Sheffield. In addition to the core consortium, the Hub is supported by a wide range of partners from across academia and industry. This report has been created to detail the key findings from our first roadmapping event which took place in early 2020. The event was facilitated by the Institute for Manufacturing, based at the University of Cambridge, and held over a full day at Loughborough University. Taking part were delegates from across the Hub consortium along with representatives from the HVM Catapult Centres, other Manufacturing Hubs, the National Physical Laboratory (NPL) and from across the UK Academic community. In total, 20 external organisations were represented. External delegates were invited based on their specialist knowledge or experience working in metrology research or in a related manufacturing field with unique metrology challenges. Much work has taken place recently around developing roadmaps for metrology, especially in the fields of advanced manufacturing and industry. The High Value Manufacturing Catapult (HVMC) Centres are currently working on a roadmap for UK manufacturing1 while a recent report2 published by HVMC investigated a systematic approach to integrated measurement and control for advanced manufacturing over a 10 year period. These exercises have generally covered the whole spectrum of metrology but have focussed on identifying the key challenges facing industry and the associated metrology applications and techniques which can be used to address them.
To build on the existing body of work, the Hub decided to focus our roadmapping event very specifically on the research landscape to determine the best ways in which the research community, comprising Academia, Industrial R&D and Policymakers/Funding Bodies, could meet the needs that have been previously identified. In preparation for the event, we worked closely with the HVM Catapult team to examine their highly detailed roadmap and used our Industrial Metrology Forum to determine the highest priority topics which we could include for discussion. I would like to take this opportunity to thank the teams at the HVM Catapult Centres, the Institute for Manufacturing and all the participants who attended the event. The activities and discussion on the day were immensely helpful in developing the Hub’s ongoing strategy and helping initiate a national strategy for metrology research. I also hope the external delegates found the event interesting and that the new relationships and ideas for collaboration that were discussed bear fruit. We hope that you find this report informative and useful in formulating your future plans and that you will continue to engage with the Future Metrology Hub over the coming years.
Professor Dame Xianqian (Jane) Jiang
Simon Cavill, Metrology Technical Lead, Nuclear AMRC, Project Lead for Metrology Roadmap Richard Leach, Integrated Metrology: 10-year Roadmap for Advanced Manufacturing (High Value Manufacturing Catapult, 2020)
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2
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SECTION 2
EPSRC Future Metrology Hub Roadmap
Landscape The initial draft landscape consisted of approximately 120 items which were derived from the highly detailed HVM Catapult Roadmap and the outputs of the 2019 Industrial Metrology Forum.
The landscape on its own is relatively limited and is only really suitable in identifying priority items. To enable a more strategic approach to planning, to determine a route to an end goal, a linkage chart is provided which shows the interdependencies and relationships between the three areas.
These individual topics were then separated into three areas: Trends & Drivers, Research Themes and Capabilities & Enablers. The list was further expanded at the event to include inputs from the delegates and in total approximately 150 items were available for consideration. The full list of discussion items is provided in Appendix A. Items were further subdivided into three timescales: Short Term (1-2 years), Medium Term (3-5 years) and Long Term (5-10 years). It should be noted that items were placed in the timescale where they would be most prominent. It does not imply that activities are limited solely to this window.
Linkage Chart
In order to refine the landscape into a more manageable size, each area was discussed both in small groups and as a whole before delegates were asked to cast their votes for the most important items. Each delegate was allowed a limited number of votes, forcing them to prioritise. The tables shown over the next three pages illustrate the final prioritised landscape. Icons have been added to the Trend & Drivers and Capabilities & Enablers table to indicate the audience these items are most relevant to.
Figure 1 (below) shows the method used to interpret the Linkage Chart. The heatmap shows the links that delegates identified between areas and the strength of the relationship is a reflection of the number of delegates who identified the link. The chart can be used to identify the direct links between areas in order to make plans to address a specific need. The chart can also be used to evaluate the strategic importance of any element by considering the columns and rows as a whole. For example, considering the ‘World Class Optical Sensor Research Base’ we can see that this is linked to 13 research topics with very strong links to at least 5. This indicates that putting effort into building and developing this capability has wide ranging potential and could yield significant impact across multiple areas.
Figure 1: Linkage chart process
Open access materials database
AI and autonomous technology
Digital platform for digital twin
Real-time metrology
HPC systems
Real time error compensation during manufacturing
Software tool to predict errors prior to manufacturing
Optical compressed sensing techniques as alternative to big data
High speed secure and robust communications networks (e.g. 5G)
Infrastructure technology for AM GDT, design manufacture, metrology
Industrial partnerships and industry engagement
Engagement with ISO (and other national/international organisations)
Rapid 3D surface mapping for comparison and micron nano level
World class data science research base
End users working with metrology institutes
Technology developers working with metrology institutes
National and/or regional metrology centres
World class optical sensor research base
Modelling & Simulation (e.g. Digital Twin)
Tracability
Automation, metrology system for assisted machining and assembly
ology, Sensornets
including international standards
Smart products processes and big data and analytics
Understanding and improving tolerancing
Impact of Brexit on international cooperation (e.g. creation of standards)
Embedded Sensors
XCT
increased automation for global competitiveness
In process measurement
Reduced waste and scrappage
Non contact measurement of light absorbing materials e.g. carbo
Portable metrology
Error Mapping and compensation
Optical Technology
Research Themes
Volumetric NDT scanning technologies and calibration
Capabilities and Enablers
Trends and Drivers
Automatic defect recognition New sensor technology (eg miniaturisation, low cost etc) Process monitoring In-process metrology system integration and calibration Miniaturisation of devices Portable metrology systems (in situ) Measurement system integration to machine In-process measurement of surface etc Real time systems Sensor integration into manufacturing processes Adaptive control AI Closed loop control from process inspection True digital twin AND Virtual manufacturing and metrology system Meta-materials measurement and photonic integration
Heatmap Trends and Drivers push research themes
Shows the relationship between factors and the weighting they were given by participants. Can be used to identify high priority research areas and the most crucial capabilities that must be developed
Capabilities and Enablers facilitate the research
4
SECTION 2: Landscape
EPSRC Future Metrology Hub Roadmap
5
Trends & drivers Table 1 shows the priority trends and drivers. These are the driving goals for the development or refinement of new and existing technologies. In terms of a roadmap, these represent the destination that must be reached.
Icon key Policymakers
Industry
Academia
Table 1: Trends & Drivers Short term (1-2 years) Trends & drivers Global and national trends & drivers
Industry trends & drivers
Industry needs
Medium term (3-5 years)
Long term (5-10 years)
Reference code Social, technical, political, environmental, TD1 economic, legal (including sustainability)
Reduced waste and scrappage
Other (standards, traceability, etc.)
TD2
Including market, technology and business trends and drivers, product and service programmes (including industrial strategy)
TD3
Understanding and improving tolerancing
TD3
Traceability
In-process metrology
TD4
Digital metrology
TD5
Metrology for non-controlled environments
Portable metrology In process measurement
Reduced lead times and costs, faster more efficient manufacturing processes Embedded sensors Smart product processes and big data and analytics
TD6 Sensornets
Metrology for additive manufacture
TD7
Metrology for composites
TD8
Other
TD9
Non contact measurement of light absorbing materials e.g. carbon fibre
New science
Quantum, photonics, etc.
TD10
Increased automation for global competitiveness
Fundraising and REF scores
e.g. UKRI, industry and funding agency
TD11
Competitors
TD12
UK
TD13
Automation, metrology system for assisted machining and assembly
National strategy Global and national
Hub strategy
TD14
Other
TD15
Optical technology Error mapping and compensation of multi cooperating platforms
XCT
Modelling & simulation (e.g. digital twin) Machine learning & AI (inc. category semantic language
SECTION 2: Landscape
EPSRC Future Metrology Hub Roadmap
Research Themes Table 2 shows the prioritised research themes. These represent the highest value avenues for research activities and are analogous to the route that must be taken to reach the destination. Table 2: Research Themes Short term (1-2 years)
Medium term (3-5 years)
Long term (5-10 years)
Reference code
Research Themes
Product technology,. i.e. related to delivery of product functionalities
RT1
New Sensor Technology (e.g. Miniaturisation, Low Cost, Uncontrolled Environments, Challenging Materials) Miniaturisation of devises
Technology
Materials technology, e.g. Nano materials, Hybrid materials
RT2
Enabling technology e.g. testing, ICT, modelling/simulation, Software Other
RT3
Meta-materials measurement and photonic integration Portable metrology systems (in-situ analysis)
Adaptive control Artificial intelligence RT4 In-process metrology system integration and calibration
Production process technologies
Real Time Systems (Measurement, Uncertainty, Analytics)
RT5
Process monitoring
In-process measurement of surface/ subsurface geometry and other characteristics
Automatic defect recognition (NDT) Manufacturing
Design for Verification
RT6
System engineering/integration competencies
RT7
True digital twin Measurement system integration to machine (accuracy vs machine and in-process environment)
Management/operational competences RT8 Other Supply Chain and value chain Integrated systems Skills Other
e.g. Integration along networks of suppliers across the product life cycle e.g. Combinations of technologies which create end effects e.g. training, academia-industry engagement
RT9 RT10 RT11 RT12 RT13
Skills and proficiency standard for metrology
Sensor integration into manufacturing process
Closed loop control from process inspection
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SECTION 2: Landscape
EPSRC Future Metrology Hub Roadmap
Capabilities & Enablers Table 3 shows the prioritised capabilities and enablers. These are the most valuable resources and connections that can be drawn upon to facilitate research and may be considered the tools that make the journey possible.
Icon key Policymakers
Industry
Academia
Table 3: Capabilities & Enablers Short term (1-2 years) Capabilities & Enablers
XCT scanning technologies and calibration Skills
Government and processes
Medium term (3-5 years)
Rapid 3D surface mapping for comparison at micron scale
Real time error compensation during manufacturing
oftware tool to predict errors S prior to manufacturing
Real time metrology
CE1
CE2 Infrastructure technology for AM GDT, design manufacture, metrology
Research capability
Community education measurement/metrology Infrastructure (e.g Asset/facility requirements, etc.)
CE3
Acoustic NDT H igh speed secure and robust communications networks (e.g. 5G) AI and autonomous technology N ational and/or regional metrology centre (e.g. Hub, NPL, Metrology Institutes, HVM Captapults)
Metrology Community
Current Hub Consortium (Hub/Spokes, Feasibility Partners, CE4 NPL, HVM Catapult, Industry R&D) including international collaboration
class optical sensor World research base Technology developers working with metrology institutes users working with End metrology institutes class data science World research base
Key performance indicators Policy Other
Wider Metrology Community (New relationships required to enhance research and delivery Targets and measurement for research and development Recommend changes to national policy, standards, incentives etc.
Long term (5-10 years)
Reference code
CE5
partnerships and Industrial industry engagement
CE6 CE7 CE8
ngagement with ISO (and other E national/international organisations)
7
ology,
Modelling & Simulation (e.g. Digital Twin)
Tracability Automatic defect recognition New sensor technology (eg miniaturisation, low cost etc) Process monitoring In-process metrology system integration and calibration Miniaturisation of devices Portable metrology systems (in situ) Measurement system integration to machine In-process measurement of surface etc. Real time systems Sensor integration into manufacturing processes Adaptive control AI Closed loop control from process inspection True digital twin AND Virtual manufacturing and metrology system
Research Themes
Meta-materials measurement and photonic integration
EPSRC Future Metrology Hub Roadmap
Open access materials database
AI and autonomous technology
Digital platform for digital twin
Real-time metrology
HPC systems
Real time error compensation during manufacturing
Optical compressed sensing techniques as alternative to big data
High speed secure and robust communications networks (e.g. 5G)
Software tool to predict errors prior to manufacturing
Infrastructure technology for AM GDT, design manufacture, metrology
Rapid 3D surface mapping for comparison and micron nano level
Engagement with ISO (and other national/international organisations)
Industrial partnerships and industry engagement
World class data science research base
End users working with metrology institutes
Technology developers working with metrology institutes
Volumetric NDT scanning technologies and calibration
World class optical sensor research base
Trends and Drivers
National and/or regional metrology centres
processes
Automation, metrology system for assisted machining and assembly
Sensornets
including international standards
Understanding and improving tolerancing
Smart products processes and big data and analytics
XCT
Impact of Brexit on international cooperation (e.g. creation of standards)
Embedded Sensors
Increased automation for global competitiveness
In process measurement
Reduced waste and scrappage
Non contact measurement of light absorbing materials e.g. carbo
Portable metrology
Error Mapping and compensation
Optical Technology
SECTION 2: Landscape 8
Linkage Chart Figure 2 shows the linkages chart which represents the connections between the Trends & Drivers, Research Themes and Capabilities & Enablers
Figure 2: Linkage chart
Capabilities and Enablers
SECTION 3
EPSRC Future Metrology Hub Roadmap
Key Themes Over the course of the roadmapping event, several key themes emerged which encapsulated multiple topics and covered broadly similar ideas across the prioritised research landscape. These key themes are outlined below along with key messages linked to particular demographics. To enable easier comparison, the landscape areas for each theme have also been identified. This section aims to provide an overview of the discussions which took place at the event and these key themes collect together related topics which may form the basis for high level strategic plans. However, you may find that some aspects are more relevant to your individual areas of concern than others and these themes are not exhaustive. Many of the landscape topics which were not prioritised would also fit within these key themes and could form the basis for ideas for further development. Metrology as an enabling technology
Trends & Drivers
Research Themes
Capabilities & Enablers
TD4
RT3
CE3
TD9
RT5
CE4
TD10
This approach is also only well suited to measurement by sampling for anything other than very low volume production. True in-process/embedded metrology systems would significantly improve productivity by eliminating the time taken moving between manufacturing and measurement functions while also allowing for continuous measurement throughout all manufacturing stages, leading to reduced re-work, redundant processing and scrappage. In this way, advanced metrology is crucial in facilitating autonomous manufacture by allowing the development of smart systems capable of real time decision making for process control. New production technologies and processes spreading due to the influence of Industry 4.0, inevitably bring with them new metrology challenges. It is also the case that these measurement techniques may have additional applications outside the fields of traditional manufacturing. For example, technologies developed for autonomous defect detection on large volume parts have been adapted for use on autonomous vehicles. Without the coordinated activities of industry and academia and the accompanying investment, it is likely progress in several sectors will be substantially delayed.
CE5
TD15 Metrology has long been recognised as an enabling technology for engineering innovation. Previously, improvements in metrology technology have focussed on increasing measurement accuracy and resolution which can be achieved, this has allowed manufacture of items to ever increasing degrees of precision. However, the impact of advanced measurement capability is rarely obvious or fully understood to those outside the metrology community. Currently, significant interest is being paid to the potential for metrology to drive productivity improvements. As an end of line process, conventional metrology carried out as a Quality Assurance (QA) activity, increases production times while also significantly increasing cost.
Key message Metrology is a crucial element of all scientific, manufacturing and industrial processes. Breakthroughs in these areas are often closely related to developments in metrology technology and techniques though the role of metrology is often significantly less visible.
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SECTION 3
EPSRC Future Metrology Hub Roadmap
Key Themes Novel technologies or approaches necessary to create the next generation of sensors/systems
Trends & Drivers
Research Themes
Capabilities & Enablers
TD5
RT1
CE1
TD6
RT2
CE3
TD15
RT3
CE4
RT4
CE5
RT7 Factors such as accuracy and precisions are of course still of primary importance to industrial metrology. However, as industry moves more towards fully autonomous manufacture and servitisation as a business model, integrated metrology solutions are increasingly in demand to meet these new challenges. In order to adapt existing technologies to be suitable for in-process measurement, it is necessary to both miniaturise and enhance the ruggedness of sensors to be capable of operating within the manufacturing environment while minimising the impact on production capability. Optical measurement techniques are well suited to a wide variety of operating environments and are capable of achieving the speed and precision of measurement necessary. Ideally, to avoid disruption to the manufacturing process, methods for in-situ traceable self-calibration must be developed which require minimal user input or be capable of being completed automatically. There are limits to what can be achieved through the use of conventional sensors or measurement devices and new approaches which make use of novel technologies will be necessary to overcome fundamental physical barriers. These novel approaches may draw on technologies in other fields, such as semi-conductor manufacturing techniques to develop “on-a-chip” optical systems or making use of the unique optical properties of metamaterials to enable photonic integration. In addition to the physical challenges of developing sensors which can be incorporated into manufacturing processes, the trend towards continuous monitoring generates substantially greater quantities
of data. New approaches to how this data is handled, curated and processed will need to be developed to create software capable of dealing with vast quantities of synchronous data autonomously to produce an accessible and useable output. Achieving this will require expertise from a variety of disciplines such as mathematics, data science and cyber security. Ultimately, the aim is to use metrology driven data to autonomously monitor and control manufacturing processes in real time. Even with advanced software, the challenge of monitoring all but the most basic manufacturing environment is beyond even highly skilled operatives. Artificial Intelligence (AI) and machine learning show the greatest potential to maximise the value of this data however there are significant challenges which must be overcome before AI can be a viable, widespread solution. Autonomous systems must be capable of dealing with uncertainty in the measured data and using it to make robust, traceable, informed decisions.
Key message Industry can often be reluctant to move away from established technology and tends to “stick with what they know”. Meanwhile, translating novel approaches to metrology from lab based experiments into industry ready solutions is often as challenging as the fundamental science. Building strong links with academia should enable much more rapid access to cutting edge technology and yield a competitive advantage.
Key message The field of metrology offers a wealth of opportunities to deploy novel science or technology into real world applications. Researchers in metrology should stay abreast of developments in scientific fields and actively recruit researchers from a diverse range of subjects by maintaining a broad network of connections.
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SECTION 3
EPSRC Future Metrology Hub Roadmap
Key Themes Metrology as a fundamental aspect of simulation, and by extension the design process
Trends & Drivers
Research Themes
Capabilities & Enablers
TD3
RT3
CE1
TD6
RT5
CE3
TD10
RT7
CE4
TD15
RT11
CE5
Modelling and simulation are established engineering techniques and are often used as part of the design process to evaluate the function and performance of engineering designs. By using known variables such as the geometry of a part, the material qualities, operational environment and loading conditions, it is possible to simulate a part and predict with significant accuracy, how the part will behave in service. The same ideas can be applied to manufacturing processes to simulate the tool workpiece interaction and predict the impact on the finished part. However, quantifying all variables in the manufacturing environment presents a substantial challenge. Metrology is a key element in overcoming these challenges. However, it not just the case that the manufacturing variables must be measured once and then used in isolation as values in a calculation. A historic database of previously measured data can be used to develop a model, but variables change in real time. Closed loop control requires a process to be continually monitored, with an estimate of the data uncertainty, to account for the dynamic situation. A holistic approach to manufacture which integrates metrology into all stages of design, production and evaluation must become the norm. Consequently, advances will come in stages with the development of true digital twins being a long term goal. Generating this data can present a significant barrier at the research stage. Companies can often be reluctant to share process data and performance results due to commercial sensitivities. Crucial to overcoming this barrier is the formation of strong partnerships between academia and industry. Research teams must be supported by competent and sympathetic business engagement teams who can help guide the process and develop robust contractual agreements which build confidence.
The ability to simulate manufacturing processes presents opportunities across many fields but it will be fundamental in facilitating agile manufacture, optimally choosing the right machine and process within a set of given performance constraints. This is especially attractive to companies engaged in the low volume/one off manufacture of extremely high value components. In these scenarios, there is little opportunity to observe the manufacturing process and make incremental improvements; there is a need to get it ‘right first time’. In these situations, any time saved in the design, machine set up and machining stages can represent significant productivity gains with waste, cost and lead times all reduced. Companies engaged in low volume/high value manufacture are often tier 1 and 2 suppliers to high value industries such as aerospace and defence. The ability to pass these cost savings up through the supply chain may provide a significant competitive advantage when attracting new business.
Key message The ability to accurately simulate and predict the outcome of machine/ workpiece interactions presents a substantial opportunity for manufacturers. Embracing this technology will enable more efficient, agile manufacture to reduce waste, cost and lead times.
Key message Developing true digital twin systems presents a significant challenge due to the vast number of processes, materials and environmental conditions which must be understood. Crucial to achieving this is the ability to gather real world data from a broad range of manufacturing environments. Universities must build strong partnerships with industry where both parties have a willingness to share data and have close interaction if this is to be possible.
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SECTION 3
EPSRC Future Metrology Hub Roadmap
12
Key Themes Metrology as a key component of sustainable manufacture
Trends & Drivers
Research Themes
TD1
RT5
TD4
Capabilities & Enablers CE3 CE4 CE5 CE7
Sustainable manufacture is a topic of great interest to society, while climate change and the green revolution will continue to have a pre-eminent place in the public conscious. Great attention is being paid to how energy is generated and used. Metrology has significant direct and indirect roles to play in reducing energy usage in the manufacturing sector.
As with all technological improvement, there is an initial trade off to be made. Developing integrated metrology systems for an established manufacturing environment requires significant investment by industry in terms of capital outlay and upskilling of the workforce. However, the increased productivity and reduced lead times can offset this to manufacturers and yield a substantial return. Large companies who already enjoy strong relationships with universities and the metrology community through industrial R&D programmes are well placed to take advantage of this technology as ‘early adopters’ however, the benefits are potentially even more relevant for small to medium size companies which engage in the manufacture of high value components at very low volumes. These smaller companies often do not have access to the resources necessary to run an R&D programme. Access to innovation grants administered either directly through funding bodies such as Innovate UK or indirectly through academic institutions is crucial to overcoming this barrier to participation.
The energy efficiency of any manufacturing process is directly linked to the operating efficiency of that process. If a process can be completed more quickly or with fewer stages, less energy will be used overall. The ability to accurately model and simulate manufacturing processes at the design stage, through a true digital twin, would allow a process to be optimised in advance of machining, without having to go through a trial and error approach. This is especially important for low volume manufacture of high value parts where production run times are long per part but are too short for empirical data to be generated for a number of similar parts. The ability to autonomously control manufacturing in real time, as a result of in-process measurement, offers the potential for further efficiency gains as processes can be kept in their optimum range throughout changing manufacturing conditions. The direct efficiency benefits are obvious. However, there are also substantial indirect benefits. By reducing the need for rework or corrective machining, energy use is further reduced. Meanwhile, material waste is reduced through optimised stock removal and fewer scrap parts. This yields a downstream benefit in the form of reduced embedded emissions as a result of raw material manufacture and transport.
Key message An increased ability to quantify and evaluate various aspects of the manufacturing process can help companies achieve significant gains in efficiency. However, developing and adopting new metrology technologies and techniques is capital intensive and few companies have access to world leading knowledge and expertise in the field.
SECTION 3
EPSRC Future Metrology Hub Roadmap
Key Themes Growing metrology skills gap
Trends & Drivers
Research Themes
TD13
RT12
TD14
Capabilities & Enablers CE3 CE4 CE5 CE7
For the most part, engineers and workers are unfamiliar with all but the most basic principles of good metrology practice and knowledge of concepts such as repeatability, traceability and uncertainty are limited to metrology specialists. This approach is effective only when measurement takes place as a separate, end of process activity. As in-process systems become more common place and continuous monitoring rather than sampling becomes the norm, design, manufacturing and production engineers will need a strong understanding of metrology theory in order to understand the new concepts of optimising their manufacturing processes. Metrology as a subject is rarely taught as part of undergraduate engineering courses. For most engineers, this means that the first time they encounter anything more than basic measurement, is when a serious challenge presents itself, meaning that metrology training is treated almost like vocational education. Furthermore, the lack of a well-developed and recognised framework for metrology training prevents academia and industry from developing a coordinated and standardised approach to developing a skilled workforce. This lack of knowledge and experience in early career hinders those with aptitude and talent for metrology from identifying it as a potential career choice. In this way, the future rising stars of metrology are only identified after they have entered and become established in the profession, this may lead the metrology community to miss out on a great deal of young talent.
Due to the reasons stated, recruiting qualified candidates into roles with a strong metrology focus is well known to be a challenge. This problem affects both industry and academia and is likely to become increasingly difficult if current trends continue. It is difficult to estimate the cost to the UK economy of this growing skills gap. As an enabling technology, the direct value of metrology systems and technology is small when compared to the value of the potential breakthroughs and improvements in manufacturing capability and productivity which these technologies may bring. Further research into the total value of metrology to the UK economy may prove crucial to raising its profile.
Key message The previous model of having a select few individuals, typically a QA department, trained in good metrology theory and practice will no longer be efficient or effective as in-process systems become more widespread. Knowledge and understanding of metrology will need to be a core element of a production/manufacturing engineer’s training.
Key message Training in good metrology practice is uncommon for undergraduate students. Typically, students and researchers are only trained in metrology when they encounter a specific issue. By incorporating metrology more broadly into the syllabus, graduates will gain a highly valuable skill and the pool of talent which the metrology community can draw upon to find talented researchers will be expanded.
Key message The true impact of the skills gap is not fully understood and could be significantly hampering the growth of high value manufacturing capacity in the UK. Meanwhile, the lack of a recognised framework for metrology training hampers both academia and industry in developing a strategic approach to addressing the skills gap.
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SECTION 4
EPSRC Future Metrology Hub Roadmap
Conclusions At the start of the roadmapping event, delegates were presented with approximately 120 items, derived from the original HVM Catapult roadmap, for discussion which were separated into the three landscape areas. These lists were further expanded as delegates added items they thought had been overlooked. In total, approximately 150 items were available for consideration, which encompasses most, if not all, of metrology for manufacture. Such an expansive list is useful when trying to look at the big picture but it is less useful for strategic decision making. From the outset, the primary objective of the roadmapping event was to provide a degree of prioritisation to identify the most strategically valuable areas for the metrology community to focus its efforts.
The final activity of the roadmapping event involved small groups working on project plans to address the prioritised research themes. The detailed project plans will not be given in this report to allow the project teams the opportunity to progress their ideas further, however, a list of these projects is shown in Table 4. The project plans were made available at the end of the session for other delegates to examine, provide comment and rate for opportunity and feasibility. The average score that each project received for Feasibility vs Opportunity are shown in Figure 3. As these projects were generated from an already refined list of high priority topics, it is natural that they all scored relatively high in both criteria. However, it is notable that there is a reasonable spread of averages and that within those, the extreme spread of scores varied substantially.
The landscape and key themes which have emerged have achieved this goal and give a strong indication of which needs are the most important to fill, what research is necessary to meet those needs and what resources are required to support that research. It is important to remember that this landscape is prioritised based on the sector as a whole. If an item does not appear on the landscape, that does not imply that it is unimportant. To an individual facing a specific challenge, it may be crucial. Only a third of topics made it to the final landscape. This is useful when carrying out strategic planning activities such as resource allocation but may not fully meet the very specific needs of an individual organisation. Many of the items which do not appear on the final landscape are closely related to others that do. Similarly, most of these topics would sit comfortably within the key themes identified.
Table 4: Project Titles Key Theme
Project
Title
Enabling Technology
13
Portable metrology systems
Enabling Technology
4
High value component machining controller
Enabling Technology
5&6
Sensor integration to facilitate process monitoring
Enabling Technology
7
Intelligent data analysis and decision making and closed loop control
Novel Technologies
1
In-process metrology system integration and calibration
Novel Technologies
2
New sensor technology
Novel Technologies
3
In-process measurement of surfaces
Novel Technologies
8
Measurement system integration to machine
Novel Technologies
10
Automated defect recognition
Novel Technologies
11
Adaptive control/AI
Novel Technologies
12
Miniaturisation of metrology devices
Novel Technologies
15
Meta-materials measurement and photonic integration
Simulation & Modelling
9
Digital twin
Skills Gap
14
Skills and proficiency standards for metrology
14
SECTION 4
EPSRC Future Metrology Hub Roadmap
Conclusions Figure 3: Feasibility vs Opportunity
12 2
9
4 8
13
Opportunity
9
5+6
10
11
15
7
12
3
1
14
6
3
0
0
3
6
9
12
Feasibility
The Future Metrology Hub will be incorporating the findings from the event into its strategic plans both for the Hub consortium and for the individual organisations when considering future projects. However, the breadth of topics is beyond the scope of the Hub acting on its own. Areas in the landscape that are outside of the Hub’s core research themes or beyond the existing skill set within the consortium will form the basis for future Feasibility Calls aimed at addressing specific areas and drawing on the expertise from a variety of disciplines. The Hub will also continue to grow its network of partner organisations and is always keen to engage with other academics or industrialists with metrology challenges.
We hope that this report has highlighted the crucial role metrology has to play as an underpinning technology and its importance to the UK’s manufacturing capability. Beyond the Hub, we hope that this will serve as a call to action for other research groups, industrialists and policymakers to review and adapt their future plans to address the strategic challenges that have been identified. To be fully effective, the metrology community should continue to develop a more collaborative approach and engage with organisations such as the Future Metrology Hub or the HVM Catapult network to ensure they remain informed and up to date with the most recent developments in an ever evolving field.
The Hub team would like to once again thank the teams at the HVM Catapults, the Institute for Manufacturing and all the participants for their support. The Hub also gratefully acknowledges the support of the Engineering and Physical Sciences Research Council (EPSRC) in funding the Future Metrology Hub (Grant ref:EP/P006930/1)
The Future Metrology Hub An EPSRC Manufacturing Research Hub
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Appendix 1
EPSRC Future Metrology Hub Roadmap
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Full landscape options/discussion topics list The following table lists all the options available for discussion or voting at the roadmapping event. They were generated in advance from the HVM Catapult Industrial Metrology Roadmap, ideas suggested at the Future Metrology Hub’s 2019 Industrial Metrology Forum or added on the day by participants at the roadmapping event. Trends & drivers Additive/Hybrid manufacturing (including fast, complex parts, safety critical applications Automated self fabrication Automation, metrology system for assisted machining and assembly Autonomous Manufacturing Carbon neutral sustainable manufacturing Data analysis supporting systems Data Analytics Data security, ownership in remote diagnostics Data visualisation using augmented reality Design for Verification Development of metrology apprentice programme - lack of skills Embedded Sensors Error Mapping and compensation HVM vs. low cost overseas high volume Identifying future trends for UKRI funding priorities Identifying suitable avenues to deploy Hub Flexible Funding Impact of Brexit on international cooperation (e.g. creation of standards) In process measurement In process measurement for complex processes (multiscale, through-life) Increased automation for global competitiveness Live Uncertainty Evaluation Machine Learning & AI (inc. Category Semantic Language) Machine learning and data analytics Making sensors safe in any environment Mass customisation and batch size reduction Metrology assisted large volume materials recycling Metrology for emerging energy sources Miniaturisation (inc. Photonic Integration) Modelling & Simulation (e.g. Digital Twin) New Materials (Graphene, Metamaterials etc.) Non contact measurement of light absorbing materials e.g. carbon fibre Open access of research papers and data Optical Technology Overcome temperature limitations portable metrology Product through-life monitoring reduced lead times and cost, faster more efficient manufacturing processes Reduced waste and scrappage Repurposing parts and monitoring to extend life Self aware and self compensating measurement systems Sensornets Smart products processes and big data and analytics Standardisation - Leading the development of future standards for measurement Supply chain collaboration Technology for space missions including in space Traceability Uncertainty in data quality Understanding and improving tolerancing verified language for design, manufacturing and dimensional metrology, including international standards XCT XCT XCT XCT
Research Themes
Capabilities & Enablers
Adaptive control AI
Access to state of the art facilities (inc. metal AM, XCT, Ultra-precision machining)
Automatic defect recognition Calibration of XCT Calibration optimisation strategies Cloud based data processing for remote sensing systems Compensating for challenging operating conditions Connectivity solutions for metrology Correlation to verification process Data fusion and structures fast data processing technology Defect specification, definition and impact Design for AM Design for inspection/verification Design for manufacturing and inspection Digital inspection planning Efficient and secure analysis and evaluation of diverse data End of life inspection Energy efficient self powered sensors Environmental simulation to understand non-controlled environmental measurement Full process influence in complex assemblies Full volumetric temperature measurement GD&T and location strategies (eg for composition forming processes) Improved communication and accessibility of data Increased measurement speed of non-contact measurement devices for in-situ measurement Indirect measurement modelling In-process measurement of surface etc In-process metrology system integration and calibration Integration of data of decadal basis Intelligent data analysis and decision making AND closed loop control Low cost, flexible hardware design for metrology devices Material characterisation and variability (eg powders, composites) Measurement of non-rigid components Measurement system integration to machine Meta-materials measurement and photonic integration Metrology for environment optimisation Miniaturisation of devices Miniaturised reference standards in embedded systems/sensors Model based definition/3D digital tolerances Multi-material AM component inspection New sensor technology (eg miniaturisation, low cost etc) Non-contact measurement system traceability Portable metrology systems (in situ) Post-process material characterisation Process monitoring Real time systems RF integration Sensor integration into manufacturing processes Simulation and verification of design Skills and proficiency standard for metrology
Acoustic NDT AI and autonomous technology Coherent government support for UK mfg Community education measurement/metrology Continuous programme of researcher skills development - contract continuity Cross disciplinary consortia Data communication compatibility Digital platform for digital twin End users working with metrology institutes Engagement with ISO (and other national/international organisations) High speed secure and robust communications networks (e.g. 5G) HPC systems Industrial partnerships and industry engagement Infrastructure technology for AM GDT, design manufacture, metrology Knowledge representation and reasoning tool Machine readable semantics National and/or regional metrology centres (e.g. Hub, NPL, Metrology Institutes, HVM Catapults) (including funding) Open access materials database Open access, technology demonstrators Optical compressed sensing techniques as alternative to big data Outreach to public and policy makers
Software for compensating for adverse measurement conditions Swarm bot metrology Tolerance analysis True digital twin AND Virtual manufacturing and metrology system XCT of multi material AM (Inc. metal)
Photonic integrated circuit fabrication facilities Proficiency standards Rapid 3D surface mapping for comparison and micron nano level Real time error compensation during manufacturing Real-time metrology Recognition gained from high quality research outputs Research funding and finances Software agents for smart analytics and big data Software tool to predict errors prior to manufacturing Support from the Scientific Advisory Board Technology developers working with metrology institutes Universal data format for 3D Volumetric NDT scanning technologies and calibration World class AI research base World class applied mathematics research base World class data science research base World class optical sensor research base World class process optimisation and control research base XCT Measurement capability and standardisation
The Future Metrology Hub An EPSRC Manufacturing Research Hub
For more information please contact: Mr Christian Young Hub Manager
EPSRC Future Metrology Hub Centre for Precision Technologies University of Huddersfield Huddersfield HD1 3DH Tel. 01484 473709 Email. metrology@hud.ac.uk Website. www.metrology.org.uk Twitter. @HudMetrology
