Surface Contamination Meter

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SURFACE CONTAMINATION METER MODEL NO.- ACM-SCM-2637

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SURFACE CONTAMINATION METER MODEL NO.- ACM-SCM-2637 There have been developed some classical methods for study of surfaces which are in use even today. These include adsorption isotherms, measurements of surface roughness, ellipsometry, reflectivity, and microscopy.

All real-world samples are contaminated as a result of atmospheric contact. A metal sample when kept in normal atmospheric conditions for an hour will attract a contamination layer of carbon on its surface. The easily oxidized metals get on their surface a contamination of oxide layer.

IMPORTANCE OF CONTAMINATION CONTROL Ÿ

Pharmaceuticals

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Food Processing

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Electronics

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Surface Plating and coating

CATEGORIES OF SURFACE CONTAMINANTS Ÿ

Film Type surface contaminants

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Particulate surface contaminant

PRODUCT OVERVIEW Weiber Surface Contamination Meter is ideal equipment for research and general applications in the field of analysis of surface contamination. Our equipment measures alpha, beta, gamma and x-

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radiation using a 2-inch pancake GM Detector with high sensitivity to common beta and alpha sources.

The easy-to-read digital display shows readings in your choice of mR/hr, CPM, CPS, or mSv/hr. The Total/Timer feature allows timed readings from one minute to 24 hours for precise measurement of low-level contamination.

PRODUCT FEATURES Ÿ Improves safety in laboratories and in the field Ÿ Automaticallycompensates forGM tube dead time Ÿ Anti-saturation circuitry prevents jamming in high radiation fields Ÿ Meets CE certification requirements for Europe Ÿ Safety-first calibration feature can eliminate personnel exposure during calibration.

APPLICATIONS Ÿ Our equipment is of foremost importance in the following processes: Ÿ Research and Development Ÿ Manufacturing Ÿ Quality Control Ÿ Aerospace Ÿ Optics Ÿ Biomedical Ÿ Xerography

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Surface cleanliness is essential when applying the replication methods; it is less significant when viewing the specimen directly by the scanning electron microscope. Surface damage any analytical measurement should not change the sample being measured. If the condition of the measurement or the probe with which the analysis is being done changes or damages the sample, the results of the analysis will be incorrect.

PRODUCT FEATURES 타

4 digit LCD with mode indicators

TECHNICAL FEATURES LCD displays updates every 3 seconds, showing the average for the past 30 second time period at normal levels.

OPTIONAL ACCESSORIES 타 Wipe Test Plate 타 External scintillation probe

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OPERATING RANGE mR/hr

.001 to 100.0

CPM

0 to 300,000

Total

1 to 9,999,000 counts

mSv / hr

.01 to 1,000

CPS

0 to 5,000

Efficiency

Sr-90 (546KeV, 2.3MeV bmax

Sensitivity

3500 CPM / mR / hr referenced to Cs-137

Accuracy

±15% 0-50 mR / hr; ± - 20 % 50 - 100 mR / hr

Timer : Can set 1-10 minute sampling periods in 1-minute increments, 10-50 minute sampling periods in 10minute increments, and 1-24 hour sampling periods in 1-hour increments Temperature Range

-10 ºC to +50C (14 ºF to 122 ºF)

Power

One 9-volt alkaline battery; battery life is minimum 200 hours at normal background, minimum 24 hours at 1 mR / hr

An ISO 9001 : 2208 | ISO 14001 : 2008 | ISO 13485 WHO: GMP Products | GLP Compliant Products

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