Materials Australia Magazine | September 2021 | Volume 54 | No.3

Page 30

INDUSTRY NEWS

Generate Stunning Ultra-High Resolution Images Of Structures As Small As Two Nanometres Using The Tabletop Phenom Pharos G2 Feg-Sem Source: By Dr Cameron Chai, Peter Airey and Dr Kamran Khajehpour from AXT PTY LTD

While optical and conventional (tungsten) Scanning Electron Microscopes (SEM) provide highresolution imaging of surfaces for many types of samples, only a field emission SEM (FEG-SEM) can reveal the finest details. The morphology of nanoparticles, small defects in thin films, insulating materials, or materials sensitive to high energy electron beams can all be adequately studied using a FEGSEM. However, FEG-SEM systems are large—they often require a dedicated room as well as special infrastructure and connections. Additionally, FEG-SEM can be difficult to use and master. As a result, many institutions that own a FEGSEM will restrict its use to highly trained personnel. Many research groups, departments and companies outsource their FEGSEM needs to service labs or central facilities to avoid these inconveniences. The Phenom Pharos G2 Desktop FEGSEM helps overcome these challenges with ease. The Phenom Pharos G2 Desktop FEGSEM combines all the capabilities of a floor-standing FEG-SEM in a tabletop system with the simplicity, speed and ease-of-use for which Phenom desktop SEMs are known. The desktop Phenom Pharos enables research groups or companies to own their own FEG-SEM and no longer rely on external services.

A (solid) table and a regular power outlet are all that you need to install the Phenom Pharos. In under 30 seconds after sample loading, full screen high quality images are presented on a wide 24 inch monitor at 2.0 nanometer resolution and with acceleration voltage up to 20 kilovolts. With a range of high, medium and low vacuum capabilities, users can image soft, beam-sensitive, or insulating samples at energy levels as low as 1 kilovolt without needing to apply a coating (Figure 1). The Phenom Pharos G2 Desktop FEGSEM also offers multiple fully integrated detectors. The elemental contrast of the backscatter detector can be used to better understand material differences within the sample. A secondary electron detector is optimal for applications where topography and morphology are important, while the energy dispersive spectroscopy detector provides comprehensive elemental analysis. Phenom Pharos G2 Feg-Sem Delivers • High-resolution imaging: 2.0 nm resolution • A wide acceleration voltage range of 1-20 kV to image a wide range of samples • Integrated low, medium and high vacuum modes • Images can be obtained in under 30 seconds for high sample throughput.

Figure 2: Particles of Halloysite-Kaolinite mixture, a clay material, show a distinct, highly organised layered structure. While this challenging and uncoated sample was imaged well using the Phenom XL G2 (left), the superior performance of the Field Emission source of Phenom Pharos G2 is clear (right).

• Ease-of-use with an intuitive user interface on a widescreen, 24 inch monitor •Q uick installation (40% faster than the previous version) speeding time to results • I ntegrated power supply and robust parts designed to ensure reproducible data Still Not Excited About The Pharos? Check Out These Images. Figure 2 Will Surprise You! Send us your samples or book a remote demonstration with one of our specialist staff today.

Figure 1: Sensitive materials require gentle conditions. With an acceleration voltage down to 1 kV, the Phenom Pharos G2 Desktop FEG-SEM images beam-sensitive samples without sample coating or other sample preparation. Left: pharmaceutical powder, imaged without damage at 1 kV. Right: the same sample imaged at 5 kV, with damage, illustrating the need for low-kV imaging.

30 | SEPTEMBER 2021

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